IEEE Transactions on Nuclear Science
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Table of contents
- 1745
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SELECTED PAPERS FROM THE 2000 NUCLEAR SCIENCE SYMPOSIUM (NSS) - Lyon, France, October 15-20, 2000 - Part I 2001 NSREC Table of Contents.| 2001
- 1745
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SELECTED PAPERS FROM THE 2001 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) - Vancouver, British Columbia, Canada, July 16-20, 2001 - Part I 2001 NSREC Table of Contents.| 2001
- 1745
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Table of contents| 2001
- 1749
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SELECTED PAPERS FROM THE 2000 NUCLEAR SCIENCE SYMPOSIUM (NSS) - Lyon, France, October 15-20, 2000 - Part I NSREC papers| 2001
- 1749
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Guest Editorial - 2001 Special Nuclear and Space Radiation Effects Conference (NSREC) Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCEXapsos, M. et al. | 2001
- 1749
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2001 special nuclear and space radiation effects conference (NSREC) issue of the ieee Transactions on Nuclear Science [Guest Editorial]Xapsos, M.A. et al. | 2001
- 1749
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SELECTED PAPERS FROM THE 2001 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) - Vancouver, British Columbia, Canada, July 16-20, 2001 - Part I NSREC papers| 2001
- 1750
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2001 IEEE nuclear and space radiation effects conference (NSREC) general chairman's commentsShaneyfelt, M.R. et al. | 2001
- 1750
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Guest Editorial - 2001 Special Nuclear Science and Space Radiation Effects Conference (NSREC) General Chairman's CommentsShaneyfelt, M.R. et al. | 2001
- 1753
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Guest Editorial - 2001 Special Nuclear and Space Radiation Effects Conference (NSREC) Awards Chairman's CommentsOldham, T.R. et al. | 2001
- 1753
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2001 Nuclear and Space Radiation Effects Conference (NSREC 2001)| 2001
- 1755
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Outstanding conference paper award 2001 IEEE nuclear and space radiation effects conference (NSREC)| 2001
- 1755
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Guest Editorial - Outstanding Conference Paper Award 2001 IEEE Nuclear and Space Radiation Effects Conference (NSREC)| 2001
- 1759
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Guest Editorial - List of Reviewers| 2001
- 1759
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List of reviewers| 2001
- 1761
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Guest Editorial - In Memoriam: Itsu ArimuraCaldwell, R. et al. | 2001
- 1761
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In memoriam - Itsu ArimuraCaldwell, R. / Johnston, A. et al. | 2001
- 1762
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Guest Editorial - In Memoriam: Charles (Charlie) Brothers, Jr.| 2001
- 1762
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In memoriam - Charles (Charlie) Brothers, Jr.| 2001
- 1763
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Guest Editorial - In Memoriam: Joseph M. Killiany| 2001
- 1763
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In memoriam - Joseph M. Killiany| 2001
- 1764
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Proton damage in advanced laser diodesJohnston, A.H. / Miyahira, T.F. / Rax, B.G. et al. | 2001
- 1764
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Proton Damage in Advanced Laser DiodesJohnston, A.H. et al. | 2001
- 1773
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Correlation of proton radiation damage in InGaAs-GaAs quantum-well light-emitting diodesWalters, R.J. / Messenger, S.R. / Summers, G.P. et al. | 2001
- 1773
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Correlation of Proton Radiation Damage in InGaAs-GaAs Quantum-Well Light-Emitting DiodesWalters, R.J. et al. | 2001
- 1778
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Spectral Properties of Proton Irradiated Gallium Nitride Blue DiodesGaudreau, F. et al. | 2001
- 1778
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Spectral properties of proton irradiated gallium nitride blue diodesGaudreau, F. / Carlone, C. / Houdayer, A. et al. | 2001
- 1785
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Response of 100% internal carrier collection efficiency silicon photodiodes to low-energy ionsFunsten, H.O. / Ritzau, S.M. / Harper, R.W. et al. | 2001
- 1785
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Response of 100% Internal Carrier Collection Efficiency Silicon Photodiodes to Low-Energy IonsFunsten, H.O. et al. | 2001
- 1790
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Proton-induced CCD charge transfer degradation at low-operating temperaturesHopkinson, G.R. et al. | 2001
- 1790
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Proton-Induced CCD Charge Transfer Degradation at Low-Operating TemperaturesHopkinson, G.R. et al. | 2001
- 1796
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Design and Characterization of Ionizing Radiation-Tolerant CMOS APS Image Sensors up to 30 Mrd (Si) Total DoseEid, E.-S. et al. | 2001
- 1796
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Design and characterization of ionizing radiation-tolerant CMOS APS image sensors up to 30 Mrd (Si) total doseEid, E.-S. / Chan, T.Y. / Fossurn, E.R. et al. | 2001
- 1807
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A comparison of charge transfer efficiency measurement techniques on proton damaged n-channel CCDs for the Hubble Space Telescope Wide-Field Camera 3Waczynski, A. / Polidan, E.J. / Marshall, P.W. et al. | 2001
- 1807
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - A Comparison of Charge Transfer Efficiency Measurement Techniques on Proton Damaged n-Channel CCDs for the Hubble Space Telescope Wide-Field Camera 3Waczynski, A. et al. | 2001
- 1815
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Low-angle scattering of protons on the XMM-Newton optics and effects on the on-board CCD detectorsNartallo, R. / Daly, E. / Evans, H. et al. | 2001
- 1815
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Session A PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Low-Angle Scattering of Protons on the XMM-Newton Optics and Effects on the On-Board CCD DetectorsNartallo, R. et al. | 2001
- 1822
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Single-event upset in the PowerPC750 microprocessorSwift, G.M. / Fannanesh, F.F. / Guertin, S.M. et al. | 2001
- 1822
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Single-Event Upset in the PowerPC750 MicroprocessorSwift, G.M. et al. | 2001
- 1828
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Complex SEU Signatures in High-Speed Analog-to-Digital ConversionHeidergott, W.F. et al. | 2001
- 1828
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Complex SEU signatures in high-speed analog-to-digital conversionHeidergott, W.F. / Ladbury, R. / Marshall, P.W. et al. | 2001
- 1833
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Catastrophic latchup in CMOS analog-to-digital convertersMiyahira, T.F. / Johnston, A.H. / Becker, H.N. et al. | 2001
- 1833
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Catastrophic Latchup in CMOS Analog-to-Digital ConvertersMiyahira, T.F. et al. | 2001
- 1841
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Analog and Digital Single-Event Effects Experiments in SpaceCrain, S.H. et al. | 2001
- 1841
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Analog and digital single-event effects experiments in spaceCrain, S.H. / Mazur, J.E. / Katz, R.B. et al. | 2001
- 1849
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Modeling of Single-Event Effects in Circuit-Hardened High-Speed SiGe HBT LogicNiu, G. et al. | 2001
- 1849
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Modeling of single-event effects in circuit-hardened high-speed SiGe HBT logicNiu, G. / Krithivasan, R. / Cressler, J.D. et al. | 2001
- 1855
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Application determination of single-event transient characteristics in the LM 111 comparatorSternberg, A.L. / Massengill, L.W. / Schrimpf, R.D. et al. | 2001
- 1855
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Application Determinance of Single-Event Transient Characteristics in the LM111 ComparatorSternberg, A.L. et al. | 2001
- 1859
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Design Considerations and Verification Testing of an SEE-Hardened Quad ComparatorVonno, N.W.van et al. | 2001
- 1859
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Design considerations and verification testing of an SEE-hardened quad comparatorvan Onno, N.W. / Doyle, B.R. et al. | 2001
- 1865
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - Impact of Substrate Thickness on Single-Event Effects in Integrated CircuitsDodd, P.E. et al. | 2001
- 1865
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Impact of substrate thickness on single-event effects in integrated circuitsDodd, P.E. / Shaneyfelt, M.R. / Fuller, E. et al. | 2001
- 1872
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An improved stripe-cell SEGR hardened power MOSFET technologySavage, M.W. / Burton, D.I. / Wheatley, C.F. et al. | 2001
- 1872
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - An Improved Stripe-Cell SEGR Hardened Power MOSFET TechnologySavage, M.W. et al. | 2001
- 1879
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - A Study of Ion Energy and Its Effects Upon an SEGR-Hardened Stripe-Cell MOSFET TechnologyTitus, J.L. et al. | 2001
- 1879
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A study of ion energy and its effects upon an SEGR-hardened stripe-cell MOSFET technology [space-based systems]Titus, J.L. / Wheatley, C.F. / Gillberg, J.E. et al. | 2001
- 1885
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The use of proton testing for evaluating COTS: example of a commercial camera for ISSLum, G.K. / Robinette, L. / Howard, A. et al. | 2001
- 1885
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Session B SINGLE-EVENT EFFECTS, DEVICES, AND INTEGRATED CIRCUITS - The Use of Proton Testing for Evaluating COTS: Example of a Commercial Camera for ISSLum, G.K. et al. | 2001
- 1893
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - SEU-Sensitive Volumes in Bulk and SOI SRAMs From First-Principles Calculations and ExperimentsDodd, P.E. et al. | 2001
- 1893
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SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experimentsDodd, P.E. / Shaneyfelt, A.R. / Horn, K.M. et al. | 2001
- 1904
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Heavy-Ion-Induced Breakdown in Ultra-Thin Gate Oxides and High-k DielectricsMassengill, L.W. et al. | 2001
- 1904
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Heavy-ion-induced breakdown in ultra-thin gate oxides and high-k dielectricsMassengill, L.W. / Choi, B.K. / Fleetwood, D.M. et al. | 2001
- 1913
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Heavy-Ion-Induced Soft Breakdown of Thin Gate OxidesConley Jr, J.F. et al. | 2001
- 1913
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Heavy-ion-induced soft breakdown of thin gate oxidesConley, J.F. / Suehle, J.S. / Johnston, A.H. et al. | 2001
- 1917
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - A New Physics-Based Model for Understanding Single-Event Gate Rupture in Linear DevicesBoruta, N. et al. | 2001
- 1917
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A new physics-based model for understanding single-event gate rupture in linear devicesBoruta, N. / Lum, G.K. / O'Donnell, H. et al. | 2001
- 1925
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Ion-Induced Stuck Bits in IT-IC SDRAM CellsEdmonds, L.D. et al. | 2001
- 1925
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Ion-induced stuck bits in 1T/1C SDRAM cellsEdmonds, L.D. / Guertin, S.M. / Scheick, L.Z. et al. | 2001
- 1931
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Various SEU conditions in SRAM studied by 3-D device simulationCastellani-Coulie, K. / Palau, J.-M. / Hubert, G. et al. | 2001
- 1931
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Various SEU Conditions in SRAM Studied by 3-D Device SimulationCastellani-Coulié, K. et al. | 2001
- 1937
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Analytical Microdosimetry Model for Proton-Induced SEU in Modern DevicesBarak, J. et al. | 2001
- 1937
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Analytical microdosimetry model for proton-induced SEU in modern devicesBarak, J. et al. | 2001
- 1946
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Simulation of Nucleon-Induced Nuclear Reactions in a Simplified SRAM Structure: Scaling Effects on SEU and MBU Cross SectionsWrobel, F. et al. | 2001
- 1946
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Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sectionsWrobel, F. / Palau, J.-M. / Calvet, M.-C. et al. | 2001
- 1953
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Detailed Analysis of Secondary Ions' Effect for the Calculation of Neutron-Induced SER in SRAMsHubert, G. et al. | 2001
- 1953
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Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMsHubert, G. / Palau, J.-M. / Castellani-Coulie, K. et al. | 2001
- 1960
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SEU induced by pions in memories from different generationsDuzellier, S. / Falguere, D. / Tverskoy, M. et al. | 2001
- 1960
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - SEU Induced by Pions in Memories From Different GenerationsDuzellier, S. et al. | 2001
- 1966
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Critical charge for single-event transients (SETs) in bipolar linear circuitsPease, R.L. / Sternberg, A. / Massengill, L. et al. | 2001
- 1966
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Critical Charge for Single-Event Transients in Bipolar Linear CircuitsPease, R.L. et al. | 2001
- 1973
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - Charge-Collection Dynamics of AlSb-InAs-GaSb Resonant Interband Tunneling Diodes (RITDs)McMorrow, D. et al. | 2001
- 1973
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Charge-collection dynamics of AlSb-InAs-GaSb resonant interband tunneling diodes (RITDs) [for MOBILE logic circuits]McMorrow, D. / Magno, R. / Bracker, A.S. et al. | 2001
- 1980
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Session C SINGLE-EVENT EFFECTS, MECHANISMS, AND MODELING - SEE Analysis of Digital InP-Based HBT Circuits at Gigahertz FrequenciesWeatherford, T.R. et al. | 2001
- 1980
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SEE analysis of digital InP-based HBT circuits at gigahertz frequenciesWeatherford, T.R. / Schiefelbein, P.K. et al. | 2001
- 1987
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Monte Carlo Calculations of the Influence on Aircraft Radiation Environments of Structures and Solar Particle EventsDyer, C. et al. | 2001
- 1987
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Monte Carlo calculations of the influence on aircraft radiation environments of structures and solar particle eventsDyer, C. / Lei, F. et al. | 2001
- 1996
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Correlation of Inflight Neutron Dosimeter and SEU Measurements With Atmospheric Neutron ModelNormand, E. et al. | 2001
- 1996
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Correlation of inflight neutron dosimeter and SEU measurements with atmospheric neutron modelNormand, E. et al. | 2001
- 2004
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Predicting Dose-Time Profiles of Solar Energetic Particle Events Using Bayesian Forecasting MethodsNeal, J.S. et al. | 2001
- 2004
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Predicting dose-time profiles of solar energetic particle events using Bayesian forecasting methodsNeal, J.S. / Townsend, L.W. et al. | 2001
- 2010
-
Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Solar Cycle Variation of Outer Belt Electron Dose at Low-Earth OrbitBrautigam, D.H. et al. | 2001
- 2010
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Solar cycle variation of outer belt electron dose at low-Earth orbitBrautigam, D.H. / Dichter, B.K. / Ray, K.P. et al. | 2001
- 2016
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Fluxes of relativistic electrons in low-Earth orbit during the decline of solar cycle 22Pesnell, W.D. et al. | 2001
- 2016
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Fluxes of Relativistic Electrons in Low-Earth Orbit During the Decline of Solar Cycle 22Pesnell, W.D. et al. | 2001
- 2022
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Initial on-orbit results from the Compact Environmental Anomaly Sensor (CEASE)Dichter, B.K. / Turnbull, W.R. / Brautigam, D.H. et al. | 2001
- 2022
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Initial On-Orbit Results From the Compact Environmental Anomaly Sensor (CEASE)Dichter, B.K. et al. | 2001
- 2029
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Neutron Production From Polyethylene and Common Spacecraft MaterialsMaurer, R.H. et al. | 2001
- 2029
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Neutron production from polyethylene and common spacecraft materialsMaurer, R.H. / Roth, D.R. / Kinnison, J.D. et al. | 2001
- 2034
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Displacement damage in silicon due to secondary neutrons, pions, deuterons, and alphas from proton interactions with materialsInsoo Jun, / McAlpine, W. et al. | 2001
- 2034
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Session D SPACE AND TERRESTRIAL ENVIRONMENTS - Displacement Damage in Silicon Due to Secondary Neutrons, Pions, Deuterons, and Alphas From Proton Interactions With MaterialsJun, I. et al. | 2001
- 2039
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Session E DOSIMETRY AND FACILITIES - Single-Chip Dosimeters to Accompany Photometric Systems Flown in SpaceMcNulty, P.J. et al. | 2001
- 2039
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Single-chip dosimeters to accompany photometric systems flown in spaceMcNulty, P.J. / Scheick, L.Z. / Sushan Yow, et al. | 2001
- 2043
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Session E DOSIMETRY AND FACILITIES - Compact, Lightweight Spectrometer for Energetic ParticlesMatsumoto, H. et al. | 2001
- 2043
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Compact, lightweight spectrometer for energetic particlesMatsumoto, H. / Koshiishi, H. / Goka, T. et al. | 2001
- 2050
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FGMOS dosimetry: design and implementationMartin, M.N. / Roth, D.R. / Garrison-Darrin, A. et al. | 2001
- 2050
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Session E DOSIMETRY AND FACILITIES - FGMOS Dosimetry: Design and ImplementationMartin, M.N. et al. | 2001
- 2056
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High-energy particle irradiation of optically stimulated luminescent films at CERNDusseau, L. / Polge, G. / Mathias, S. et al. | 2001
- 2056
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Session E DOSIMETRY AND FACILITIES - High-Energy Particle Irradiation of Optically Stimulated Luminescent Films at CERNDusseau, L. et al. | 2001
- 2061
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Session E DOSIMETRY AND FACILITIES - Feasibility Study of Online High-Spatial-Resolution MOSFET Dosimetry in Static and Pulsed X-Ray Radiation FieldsRosenfeld, A.B. et al. | 2001
- 2061
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Feasibility study of online high-spatial-resolution MOSFET dosimetry in static and pulsed x-ray radiation fieldsRosenfeld, A.B. / Lerch, M.L.F. / Kron, T. et al. | 2001
- 2069
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Radiation effect in silica optical fiber exposed to intense mixed neutron-gamma radiation fieldBrichard, B. / Borgermans, P. / Fernandez, A.F. et al. | 2001
- 2069
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Session E DOSIMETRY AND FACILITIES - Radiation Effect in Silica Optical Fiber Exposed to Intense Mixed Neutron-Gamma Radiation FieldBrichard, B. et al. | 2001
- 2074
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Session F BASIC MECHANISMS - Proton Radiation Response Mechanisms in Bipolar Analog CircuitsBarnaby, H.J. et al. | 2001
- 2074
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Proton radiation response mechanisms in bipolar analog circuitsBarnaby, H.J. / Schrimpf, R.D. / Sternberg, A.L. et al. | 2001
- 2081
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Session F BASIC MECHANISMS - The Effect of Network Topology on Proton Trapping in Amorphous SiO2Pineda, A.C. et al. | 2001
- 2081
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The effect of network topology on proton trapping in amorphous SiO/sub 2/Pineda, A.C. / Karna, S.P. / Kurtz, H.A. et al. | 2001
- 2086
-
Proton-induced defect generation at the Si-SiO/sub 2/ interfaceRashkeev, S.N. / Fleetwood, D.M. / Schrimpf, R.D. et al. | 2001
- 2086
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Session F BASIC MECHANISMS - Proton-Induced Defect Generation at the Si-SiO2 InterfaceRashkeev, S.N. et al. | 2001
- 2093
-
Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxidesCester, A. / Bandiera, L. / Ceschia, M. et al. | 2001
- 2093
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Session F BASIC MECHANISMS - Noise Characteristics of Radiation-Induced Soft Breakdown Current in Ultrathin Gate OxidesCester, A. et al. | 2001
- 2101
-
Session F BASIC MECHANISMS - Radiation-Induced Leakage Currents: Atomic Scale MechanismsLenahan, P.M. et al. | 2001
- 2101
-
Radiation-induced leakage currents: atomic scale mechanismsLenahan, R.M. / Campbell, J.P. / Kang, A.Y. et al. | 2001
- 2107
-
Comparison of charge trapping in undoped oxides made by low- and high-temperature deposition techniquesMrstik, B.J. / Hughes, H.L. / Lawrence, R.K. et al. | 2001
- 2107
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Session F BASIC MECHANISMS - Comparison of Charge Trapping in Undoped Oxides Made by Low- and High-Temperature Deposition TechniquesMrstik, B.J. et al. | 2001
- 2114
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Session F BASIC MECHANISMS - Bias and Frequency Dependence of Radiation-Induced Charge Trapping in MOS DevicesFelix, J.A. et al. | 2001
- 2114
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Bias and frequency dependence of radiation-induced-charge trapping in MOS devicesFelix, J.A. / Fleetwood, D.M. / Riewe, L.C. et al. | 2001
- 2121
-
Session F BASIC MECHANISMS - NIEL and Damage Correlations for High-Energy Protons in Gallium Arsenide DevicesMessenger, S.R. et al. | 2001
- 2121
-
NIEL and damage correlations for high-energy protons in gallium arsenide devicesMessenger, S.R. / Walters, R.J. / Burke, E.A. et al. | 2001
- 2127
-
Session F BASIC MECHANISMS - Photoluminescence Due to Boron-Related Defect in Solar Cell Silicon Irradiated With 1-MeV ElectronsTajima, M. et al. | 2001
- 2127
-
Photoluminescence due to boron-related defect in solar cell silicon irradiated with 1 MeV electronsTajima, M. / Warashina, M. / Hisamatsu, T. et al. | 2001
- 2131
-
Direct experimental evidence for atomic scale structural changes involved in the interface-trap transformation processLenahan, P.M. / Mishima, T.D. / Jumper, J. et al. | 2001
- 2131
-
Session F BASIC MECHANISMS - Direct Experimental Evidence for Atomic Scale Structural Changes Involved in the Interface-Trap Transformation ProcessLenahan, P.M. et al. | 2001
- 2136
-
Modeling high-energy heavy-ion damage in siliconSpratt, J.P. / Burke, E.A. / Pickel, J.C. et al. | 2001
- 2136
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Session F BASIC MECHANISMS - Modeling High-Energy Heavy-Ion Damage in SiliconSpratt, J.P. et al. | 2001
- 2140
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Section G ISOLATION TECHNOLOGIES - Gated-Diode Characterization of the Back-Channel Interface on Irradiated SOI WafersLawrence, R.K. et al. | 2001
- 2140
-
Gated-diode characterization of the back-channel interface on irradiated SOI wafersLawrence, R.K. / Ioannou, D.E. / Jenkins, W.C. et al. | 2001
- 2146
-
Anomalous radiation effects in fully depleted SOI MOSFETs fabricated on SIMOXYing Li, / Guofu Niu, / Cressler, J.D. et al. | 2001
- 2146
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Section G ISOLATION TECHNOLOGIES - Anomalous Radiation Effects in Fully Depleted SOI MOSFETs Fabricated on SIMOXLi, Y. et al. | 2001
- 2152
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Optimum laboratory radiation source for hardness assurance testingSchwank, J.R. / Shaneyfelt, M.R. / Paillet, P. et al. | 2001
- 2152
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Section H HARDNESS ASSURANCE - Optimum Laboratory Radiation Source for Hardness Assurance TestingSchwank, J.R. et al. | 2001
- 2158
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Section H HARDNESS ASSURANCE - Aging and Baking Effects on the Radiation Hardness of MOS CapacitorsKarmarkar, A.P. et al. | 2001
- 2158
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Aging and baking effects on the radiation hardness of MOS capacitorsKarmarkar, A.P. / Choi, B.K. / Schrimpf, R.D. et al. | 2001
- 2164
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Section H HARDNESS ASSURANCE - Effect of Aging on Radiation Response of Bipolar TransistorsPershenkov, V.S. et al. | 2001
- 2164
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Effect of aging on radiation response of bipolar transistorsPershenkov, V.S. / Slesarev, A.Y. / Sogoyan, A.V. et al. | 2001
- 2170
-
Section H HARDNESS ASSURANCE - Evaluation of MOS Devices' Total Dose Response Using the Isochronal Annealing MethodSaigné, F. et al. | 2001
- 2170
-
Evaluation of MOS devices' total dose response using the isochronal annealing methodSaigne, F. / Dusseau, L. / Fesquet, J. et al. | 2001
- 2174
-
A methodology for identifying laser parameters for equivalent heavy-ion hitsXiaowei Zhu, / Bhuva, B. / Cirba, C.R. et al. | 2001
- 2174
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Section H HARDNESS ASSURANCE - A Methodology for Identifying Laser Parameters for Equivalent Heavy-Ion HitsZhu, X. et al. | 2001
- 2180
-
Development of a test methodology for single-event transients (SETs) in linear devicesPoivey, C. / Howard, J.W. / Buchner, S. et al. | 2001
- 2180
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Section H HARDNESS ASSURANCE - Development of a Test Methodology for Single-Event Transients (SETs) in Linear DevicesPoivey, C. et al. | 2001
- 2187
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Section H HARDNESS ASSURANCE - A Nondamaging Beam Blanking SEM Test Method and Its Application to Highly Integrated DevicesMakihara, A. et al. | 2001
- 2187
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A nondamaging beam blanking SEM test method and its application to highly integrated devicesMakihara, A. / Kuboyama, S. / Matsuda, S. et al. | 2001
- 2193
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Section H HARDNESS ASSURANCE - Backside Laser Testing of ICs for SET Sensitivity EvaluationLewis, D. et al. | 2001
- 2193
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Backside laser testing of ICs for SET sensitivity evaluationLewis, D. / Pouget, V. / Beaudoin, F. et al. | 2001
- 2202
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Assessing the impact of the space radiation environment on parametric degradation and single-event transients in optocouplersReed, R.A. / Poivey, C. / Marshall, P.W. et al. | 2001
- 2202
-
Section H HARDNESS ASSURANCE - Assessing the Impact of the Space Radiation Environment on Parametric Degradation and Single-Event Transients in Optocouplers.Reed, R.A. et al. | 2001
- 2210
-
Section H HARDNESS ASSURANCE - Exploiting Circuit Emulation for Fast Hardness EvaluationCivera, P. et al. | 2001
- 2210
-
Exploiting circuit emulation for fast hardness evaluationCivera, P. / Macchiarulo, L. / Rebaudengo, M. et al. | 2001
- 2217
-
Early lethal SEGR failures of VDMOSFETs considering nonuniformity in the rad-hard device distributionWheatley, T.H. / Wheatley, C.F. / Titus, J.L. et al. | 2001
- 2217
-
Section H HARDNESS ASSURANCE - Early Lethal SEGR Failures of VDMOSFETs Considering Nonuniformity in the Rad-Hard Device DistributionWheatley, T.H. et al. | 2001
- 2222
-
Radiation effects on floating-gate memory cellsCellere, G. / Pellati, P. / Chimenton, A. et al. | 2001
- 2222
-
Section I DEVICES AND INTEGRATED CIRCUITS - Radiation Effects on Floating-Gate Memory CellsCellere, G. et al. | 2001
- 2229
-
Section I DEVICES AND INTEGRATED CIRCUITS - The Effects of High-Dose Gamma Irradiation on High-Voltage 4H-SiC Schottky Diodes and the SiC-SiO2 InterfaceSheridan, D.C. et al. | 2001
- 2229
-
The effects of high-dose gamma irradiation on high-voltage 4H-SiC Schottky diodes and the SiC-SiO/sub 2/ interfaceSheridan, D.C. / Gilyong Chung, / Clark, S. et al. | 2001
- 2233
-
The effects of proton irradiation on SiGe:C HBTsShiming Zhang, / Guofu Niu, / Cressler, J.D. et al. | 2001
- 2233
-
Section I DEVICES AND INTEGRATED CIRCUITS - The Effects of Proton Irradiation on SiGe : C HBTsZhang, S. et al. | 2001
- 2238
-
Section I DEVICES AND INTEGRATED CIRCUITS - Proton Radiation Response of SiGe HBT Analog and RF Circuits and PassivesCressler, J.D. et al. | 2001
- 2238
-
Proton radiation response of SiGe HBT analog and RF circuits and passivesCressler, J.D. / Hamilton, M.C. / Krithivasan, R. et al. | 2001
- 2244
-
1/f noise in proton-irradiated SiGe HBTsZhenrong Jin, / Guofu Niu, / Cressler, J.D. et al. | 2001
- 2244
-
Section I DEVICES AND INTEGRATED CIRCUITS - 1 - f Noise in Proton-Irradiated SiGe HBTsJin, Z. et al. | 2001
- 2250
-
Section I DEVICES AND INTEGRATED CIRCUITS - Neutron Irradiation Effects in High Electron Mobility TransistorsJun, B. et al. | 2001
- 2250
-
Neutron irradiation effects in high electron mobility transistorsBongim Jun, / Subramanian, S. / Peczalski, A. et al. | 2001
- 2262
-
Correlation between nonionizing energy loss and the offset voltage shift in InP-InGaAs heterojunction bipolar transistorsShatalov, A. / Subramanian, S. / Klein, A. et al. | 2001
- 2262
-
Section I DEVICES AND INTEGRATED CIRCUITS - Correlation Between Nonionizing Energy Loss and the Offset Voltage Shift in InP-InGaAs Heterojunction Bipolar TransistorsShatalov, A. et al. | 2001
- 2270
-
Section I DEVICES AND INTEGRATED CIRCUITS - Low- and High-Energy Proton Irradiations of Standard and Oxygenated Silicon DiodesCandelori, A. et al. | 2001
- 2270
-
Low- and high-energy proton irradiations of standard and oxygenated silicon diodesCandelori, A. / Rando, R. / Bisello, D. et al. | 2001
- 2278
-
Section I DEVICES AND INTEGRATED CIRCUITS - Simulation of Heavy-Ion-Induced Failure Modes in nMOS Cells of ICsLoquet, J.-G. et al. | 2001
- 2278
-
Simulation of heavy-ion-induced failure modes in nMOS cells of ICsLoquet, J.-G. / David, J.-P. / Duzellier, S. et al. | 2001
- 2285
-
Section I DEVICES AND INTEGRATED CIRCUITS - Study of Radiation Effects in g-Ray Irradiated Power VDMOSFET by DCIV TechniquePark, M.-S. et al. | 2001
- 2285
-
Study of radiation effects in /spl gamma/-ray irradiated power VDMOSFET by DCIV techniqueMun-Soo Park, / Wie, C.R. et al. | 2001
- 2294
-
Conference author index| 2001
- 2297
-
SELECTED PAPERS FROM THE 2000 NUCLEAR SCIENCE SYMPOSIUM (NSS) - Lyon, France, October 15-20, 2000 - Part II 2000 NSS Table of Contents.| 2001
- 2297
-
SELECTED PAPERS FROM THE 2001 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) - Vancouver, British Columbia, Canada, July 16-20, 2001 - Part II 2000 NSS Table of Contents.| 2001
- 2299
-
SELECTED PAPERS FROM THE 2000 NUCLEAR SCIENCE SYMPOSIUM (NSS) - Lyon, France, October 15-20, 2000 - Part II NSS Papers| 2001
- 2299
-
SELECTED PAPERS FROM THE 2001 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) - Vancouver, British Columbia, Canada, July 16-20, 2001 - Part II NSS Papers| 2001
- 2299
-
Semiconductor Detectors - Recent Results for the CMS Tracker Silicon DetectorsDell'Orso, R. et al. | 2001
- 2299
-
Recent results for the CMS tracker silicon detectorsDell'Orso, R. et al. | 2001
- 2303
-
igh statistics study of radiation damage on silicon microstrip detectorsDutta, S. / Bortello, L. / Dell'Orso, R. et al. | 2001
- 2303
-
Semiconductor Detectors - High Statistics Study of Radiation Damage on Silicon Microstrip DetectorsDutta, S. et al. | 2001
- 2307
-
Spectroscopic response of coplanar diamond alpha particle detectorsSellin, P.J. / Breese, M.B.H. et al. | 2001
- 2307
-
Semiconductor Detectors - Spectroscopic Response of Coplanar Diamond Alpha Particle DetectorsSellin, P.J. et al. | 2001
- 2313
-
Semiconductor Detectors - Large-Volume Thallium Bromide Detectors for Gamma-Ray SpectroscopyHitomi, K. et al. | 2001
- 2313
-
Large-volume thallium bromide detectors for gamma-ray spectroscopyHitomi, K. / Muroi, O. / Matsumoto, A. et al. | 2001
- 2317
-
Gaseous Detectors - Development of a Multigrid-Type Microstrip Gas ChamberTakahashi, H. et al. | 2001
- 2317
-
Development of a multigrid-type microstrip gas chamberTakahashi, H. / Yokoi, K. / Yano, K. et al. | 2001
- 2321
-
Gaseous Detectors - Readout Responses of Inclined Strips in Position-Sensitive DetectorsJavanmardi, F. et al. | 2001
- 2321
-
Readout responses of inclined strips in position-sensitive detectorsJavanmardi, F. / Wakabayashi, G. / Minuchehr, A. et al. | 2001
- 2324
-
Optical and luminescence properties of complex lead oxidesKamenskikh, I.A. / Kirm, A. / Kolobanov, V.N. et al. | 2001
- 2324
-
Scintillation Detectors - Optical and Luminescence Properties of Complex Lead OxidesKamenskikh, I.A. et al. | 2001
- 2330
-
Scintillation Detectors - Structured Lil Scintillator for Thermal Neutron ImagingNagarkar, V.V. et al. | 2001
- 2330
-
Structured LiI scintillator for thermal neutron imagingNagarkar, V.V. / Tipnis, S.V. / Gaysinskiy, V. et al. | 2001
- 2335
-
Accuracy aspects in multiphase flow metering using X-ray transmissionBom, V.R. / Clarijs, M.C. / van Eijk, C.W.E. et al. | 2001
- 2335
-
Scintillation Detectors - Accuracy Aspects in Multiphase Flow Metering Using X-Ray TransmissionBom, V.R. et al. | 2001
- 2340
-
Scintillation Detectors - Small-Size Pulsed X-Ray Source for Measurements of Scintillator Decay Time ConstantsRodnyi, P.A. et al. | 2001
- 2340
-
Small-size pulsed X-ray source for measurements of scintillator decay time constantsRodnyi, P.A. / Mikhrin, S.B. / Mishin, A.N. et al. | 2001
- 2344
-
Timing properties of LuAP:Ce studied with large-area avalanche photodiodesBalcerzyk, M. / Moszynski, M. / Kapusta, M. et al. | 2001
- 2344
-
Scintillation Detectors - Timing Properties of LuAP:Ce Studied With Large-Area Avalanche PhotodiodesBalcerzyk, M. et al. | 2001
- 2348
-
Radiation distribution sensing with normal optical fiberNaka, R. / Watanabe, K. / Kawarabayashi, J. et al. | 2001
- 2348
-
Scintillation Detectors - Radiation Distribution Sensing With Normal Optical FiberNaka, R. et al. | 2001
- 2352
-
Photodetectors - Large-Area APDs and Monolithic APD ArraysShah, K.S. et al. | 2001
- 2352
-
Large-area APDs and monolithic APD arraysShah, K.S. / Farrell, R. / Grazioso, R. et al. | 2001
- 2357
-
Real-time flat-panel pixel imaging system and control for X-ray and neutron detectionChapuy, S. / Dimcovski, M. / Dimcovski, Z. et al. | 2001
- 2357
-
Novel Detector Technologies - Real-Time Flat-Panel Pixel Imaging System and Control for X-Ray and Neutron DetectionChapuy, S. et al. | 2001
- 2365
-
Detection of prompt luminescence from an imaging plate with heavy particle injectionGunji, S. / Sakurai, H. / Tokanai, F. et al. | 2001
- 2365
-
Novel Detector Technologies - Detection of Prompt Luminescence From an Imaging Plate With Heavy Particle InjectionGunji, S. et al. | 2001
- 2370
-
Integrated low-noise low-power fast charge-sensitive preamplifier for avalanche photodiodes in JFET-CMOS technologyPichler, B.J. / Pimpl, W. / Buttler, W. et al. | 2001
- 2370
-
Read-out Electronics, Signal Processing, and Control Systems - Integrated Low-Noise Low-Power Fast Charge-Sensitive Preamplifier for Avalanche Photodiodes in JFET-CMOS TechnologyPichler, B.J. et al. | 2001
- 2375
-
Custom integrated front-end circuit for the CMS electromagnetic calorimeterWalder, J.P. / Bussat, J.M. / Denes, P. et al. | 2001
- 2375
-
Read-out Electronics, Signal Processing, and Control Systems - Custom Integrated Front-End Circuit for the CMS Electromagnetic CalorimeterWalder, J.P. et al. | 2001
- 2380
-
Digital signal processing and algorithms for /spl gamma/-ray trackingGast, W. / Lieder, R.M. / Mihailescu, L. et al. | 2001
- 2380
-
Read-out Electronics, Signal Processing, and Control Systems - Digital Signal Processing and Algorithms for g-Ray TrackingGast, W. et al. | 2001
- 2385
-
Trigger and Data Acquisition - Switchless Event Building Farm for the Belle Data Acquisition SystemNakao, M. et al. | 2001
- 2385
-
Switchless event building farm for the belle data acquisition systemNakao, M. / Itoh, R. / Suzuki, S.Y. et al. | 2001
- 2391
-
Trigger and Data Acquisition - A Two-Level Fanout System for the CDF Silicon Vertex TrackerBardi, A. et al. | 2001
- 2391
-
A two-level fanout system for the CDF silicon vertex trackerBardi, A. / Bari, M. / Belforte, S. et al. | 2001
- 2401
-
SELECTED PAPERS FROM THE 2001 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) - Vancouver, British Columbia, Canada, July 16-20, 2001 - Part III Regular papers| 2001
- 2401
-
PAPERS - A Counting CdTe Pixel Detector for Hard X-Ray and g-Ray ImagingFischer, P. et al. | 2001
- 2401
-
SELECTED PAPERS FROM THE 2000 NUCLEAR SCIENCE SYMPOSIUM (NSS) - Lyon, France, October 15-20, 2000 - Part III Regular papers| 2001
- 2401
-
A counting CdTe pixel detector for hard X-ray and /spl gamma/-ray imagingFischer, P. / Kouda, M. / Kruger, H. et al. | 2001
- 2405
-
Results from 3-D silicon sensors with wall electrodes: near-cell-edge sensitivity measurements as a preview of active-edge sensorsKenney, C.J. / Parker, S. / Walckiers, E. et al. | 2001
- 2405
-
PAPERS - Results From 3-D Silicon Sensors With Wall Electrodes: Near-Cell-Edge Sensitivity Measurements as a Preview of Active-Edge SensorsKenney, C.J. et al. | 2001
- 2411
-
A coded aperture for high-resolution nuclear medicine planar imaging with a conventional Anger camera: experimental resultsAccorsi, R. / Gasparini, F. / Lanza, R.C. et al. | 2001
- 2411
-
PAPERS - A Coded Aperture for High-Resolution Nuclear Medicine Planar Imaging With a Conventional Anger Camera: Experimental ResultsAccorsi, R. et al. | 2001
- 2418
-
PAPERS - Slotted Surface Treatment of Position-Sensitive NaI(TI) Detectors to Improve Detector PerformanceSurti, S. et al. | 2001
- 2418
-
Slotted surface treatment of position-sensitive NaI(Tl) detectors to improve detector performanceSurti, S. / Freifelder, R. / Karp, J.S. et al. | 2001
- 2424
-
PAPERS - On the Differential Nonlinearity of Time-to-Digital Converters Based on Delay-Locked-Loop Delay LinesBaronti, F. et al. | 2001
- 2424
-
On the differential nonlinearity of time-to-digital converters based on delay-locked-loop delay linesBaronti, F. / Fanucci, L. / Lunardini, D. et al. | 2001
- 2432
-
Correction to "Selection criteria for F and N-channel JFETs as input elements in low-noise radiation-hard charge preamplifiers"Manghisoni, M. / Ratti, L. / Re, V. et al. | 2001
- 2432
-
SHORT PAPERS - Correction to "Selection Criteria for P and N-Channel JFETs as Input Elements in Low-Noise Radiation-Hard Charge PreamplifiersManghisoni, M. et al. | 2001
- 2432
-
2000 INDEX| 2001
- c1
-
[Front cover]| 2001
- c2
-
IEEE Transactions on Nuclear Science publication information| 2001
- c3
-
Information for Authors| 2001
- c4
-
Affiliate plan of the IEEE Nuclear and Plasma Sciences Society| 2001
-
SELECTED PAPERS FROM THE 2000 NUCLEAR SCIENCE SYMPOSIUM (NSS) - Lyon, France, October 15-20, 2000 - Part III Table of Contents. - Cover for regular papers| 2001
-
SELECTED PAPERS FROM THE 2001 NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) - Vancouver, British Columbia, Canada, July 16-20, 2001 - Part III Table of Contents. - Cover for regular papers| 2001