IEEE transactions on nuclear science
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Table of contents
- 1525
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Table of Contents| 2023
- 1529
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Comments by the EditorsFleetwood, Dan / Quinn, Heather / Robinson, William et al. | 2023
- 1530
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List of Reviewers RADECS 2022 Special Issue| 2023
- 1532
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In MemoriamPershenkov, Vyacheslav et al. | 2023
- 1533
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14 Years of In-Flight Experimental Data on CARMEN-MEXBezerra, Francoise / Ruffenach, Marine / Ecoffet, Robert et al. | 2023
- 1541
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DREAM: A Miniaturized Spectrometer for Measurement of Protons and Electrons on OrbitDufour, Arnaud / Ruffenach, Marine / Ecoffet, Robert et al. | 2023
- 1548
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Thermal Neutron Measurements Inside an Aircraft for SEE AssessmentWeulersse, C. / Mazurek, M. / Pinas, C. Delcher et al. | 2023
- 1555
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Multiscale Dynamic Modeling for Spatial Radiation Environment Specification ModelsBrunet, A. / Sicard, A. / Balcon, N. et al. | 2023
- 1564
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CARMEN 2 and 3 LEO Electron Flux Measurements Linear Projection Onto RBSP Elliptical OrbitGinisty, Francois / Wrobel, Frederic / Ecoffet, Robert et al. | 2023
- 1572
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Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERNLerner, Giuseppe / Pelissou, Pierre / Aguiar, Ygor Q. et al. | 2023
- 1580
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“Radiation to Materials” at CERNFerrari, Matteo / Alia, Ruben Garcia / Giles, Tim et al. | 2023
- 1587
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Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERNCecchetto, Matteo / Barbero, Mario Sacristan / Lerner, Giuseppe et al. | 2023
- 1596
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Heavy Ion Energy Deposition and SEE Intercomparison Within the RADNEXT Irradiation Facility NetworkAlia, Ruben Garcia / Coronetti, Andrea / Bilko, Kacper et al. | 2023
- 1606
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CERN Super Proton Synchrotron Radiation Environment and Related Radiation Hardness Assurance ImplicationsBilko, Kacper / Alia, Ruben Garcia / Francesca, Diego Di et al. | 2023
- 1616
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Characterization Measurements of Compact Neutron Generators of the New NILE FacilityCazzaniga, Carlo / Dapica, Paula Luna / Ngo, Khai et al. | 2023
- 1625
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A Lightweight Mitigation Technique for Resource- Constrained Devices Executing DNN Inference Models Under Neutron RadiationGava, Jonas / Hanneman, Alex / Abich, Geancarlo et al. | 2023
- 1634
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An Analysis of the Significance of the 14N(n, p) 14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMsCoronetti, Andrea / Alia, Ruben Garcia / Lucsanyi, David et al. | 2023
- 1643
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Bare-Metal Redundant Multi-Threading on Multicore SoCs Under Neutron IrradiationSerrano-Cases, A. / Martinez-Alvarez, A. / Bastos, R. Possamai et al. | 2023
- 1652
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A Terrestrial SER Estimation Methodology Based on Simulation Coupled With One-Time Neutron Irradiation TestingAbe, Shin-Ichiro / Hashimoto, Masanori / Liao, Wang et al. | 2023
- 1658
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Effectiveness of Attitude Estimation Processing Approaches in Tolerating Radiation Soft ErrorsKraemer Sarzi Sartori, Tarso / Laurini, Luiz Henrique / Fourati, Hassen et al. | 2023
- 1666
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Proton Dosimetry Using Radiation-Induced Luminescence in Micrometer-Core Germanosilicate Optical FibersBelanger-Champagne, Camille / Fricano, Fiammetta / Morana, Adriana et al. | 2023
- 1673
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Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET TechnologyPieper, N. J. / Xiong, Y. / Pasternak, J. et al. | 2023
- 1680
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Study of Proton-Induced Defects in 40-nm CMOS SPADsJouni, Ali / Malherbe, Victor / Mamdy, Bastien et al. | 2023
- 1687
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Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET NodesXiong, Yoni / Pieper, Nicholas J. / McCurdy, Michael W. et al. | 2023
- 1694
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Transient Current Simulations: Benchmark of Numerical Tools for Proton, Electron, and Alpha Irradiation in Solid-State DetectorsPinson, Maxime / Caron, Pablo et al. | 2023
- 1700
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Analysis of Kernel Redundancy for Soft Error Mitigation on Embedded GPUsSerrano-Cases, A. / Alcaide, S. / Romero, M. A. et al. | 2023
- 1708
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Evaluating Fault-Tolerant Techniques on COTS RISC-V NOEL-V Processor in Zynq UltraScale+ FPGA Under Proton Testingde Oliveira, Adria Barros / Kastensmidt, Fernanda Lima et al. | 2023
- 1716
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Single-Event Effects on Commercial-Off-the-Shelf Edge-Processing Artificial Intelligence ASICsCasey, Megan C. / Goodwill, Justin S. / Wyrwas, Edward J. et al. | 2023
- 1724
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An Analytical Model to Evaluate Well-Potential Modulation and Bipolar Amplification EffectsDing, Lili / Wang, Tan / Zhang, Fengqi et al. | 2023
- 1732
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PIPS Diode Test Setup for Heavy Ion Beam Spectral CharacterizationBorel, Thomas / Costantino, Alessandra / Muschitiello, Michele et al. | 2023
- 1740
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Supervised Deep Learning and Classification of Single-Event TransientsPeyton, T. / Carpenter, J. L. / Camp, S. et al. | 2023
- 1747
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Understanding the Link Between Complex Digital Devices Soft Error Rate and the Running SoftwareNoizette, Luc / Miller, Florent / Colladant, Thierry et al. | 2023
- 1755
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Voltage Dependence of Single-Event Cross Sections of FinFET SRAMs for Low LET ConditionTakeuchi, K. / Sakamoto, K. / Yukumatsu, K. et al. | 2023
- 1760
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SEU Performance of RHBD Flip-Flops Using Guard Gates at 22-nm FDSOI Technology NodeLi, Zongru / Elash, Christopher / Xing, Jiesi et al. | 2023
- 1768
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Impact of CnRx Structure on Soft Error Rates of Flip-Flop Designs at 22-nm FD SOI NodeElash, Christopher J. / Li, Zongru / Jin, Chen et al. | 2023
- 1775
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A Method of Predicting Muon-Induced SEUs Using Proton Tests and Monte Carlo SimulationDeng, Yifan / Watanabe, Yukinobu et al. | 2023
- 1783
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Medium-Earth-Orbit Spaceflight Radiation Effects in Triple Modular System on Programmable DevicePossamai Bastos, Rodrigo / Picas, Marti Gorchs / Velazco, Raoul et al. | 2023
- 1791
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Influence of the Guard Rings on the Response of SSD-Based Radiation Monitors in Space Environment: Applications to ICARE MonitorsCaron, P. / Pinson, M. / Bourdarie, S. et al. | 2023
- 1797
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The Effects of Carbon Doping on the Single-Event Transient Response of SiGe HBTsIldefonso, Adrian / Hales, Joel M. / Khachatrian, Ani et al. | 2023
- 1805
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Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-Constrained DeviceGava, Jonas / Moura, Nicolas / Lucena, Joaquim et al. | 2023
- 1814
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Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology NodesXiong, Yoni / Pieper, Nicholas J. / Narasimham, Balaji et al. | 2023
- 1821
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Parametric Evaluation of the See Rate on the SEU and SEL Monitors Aboard the Alphasat Using the IRPP ModelPinto, M. / Poivey, C. / Gupta, V. et al. | 2023
- 1829
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The Propagation of Extended SET Tails in RF Amplifiers Using 45-nm CMOS on PDSOITeng, Jeffrey W. / Ringel, Brett L. / Brumbach, Zachary R. et al. | 2023
- 1838
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Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFETNiskanen, K. / Kettunen, H. / Soderstrom, D. et al. | 2023
- 1844
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High-Energy Proton and Atmospheric-Neutron Irradiations of SiC Power MOSFETs: SEB Study and Impact on Channel and Drift ResistancesMartinella, C. / Race, S. / Stark, R. et al. | 2023
- 1852
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Evaluation of Neutron Radiation Impact for 1200-V Class 4H-SiC MOSFET at Gate Switching Mode With TCAD SimulationBae, Dongwoo / Kim, Kiseog / Lee, Hyeokjae et al. | 2023
- 1861
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Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMsSoderstrom, Daniel / Luza, Lucas Matana / de Mattos, Andre Martins Pio et al. | 2023
- 1870
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Neutron Displacement Damage Cross Section in GaN: Numerical Evaluations and Differences With SiLambert, Damien / Parize, Julien / Richard, Nicolas et al. | 2023
- 1878
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Impact of Particle Radiation and Temperature on the Retention Time of DDR4 SDRAM CellsBosser, Alexandre L. / Kohler, Pierre / Rodriguez, Axel et al. | 2023
- 1885
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Displacement Damage Equivalence of Neutron and Proton Radiations in Triple-Junction GaInP/GaAs/Ge Solar CellsLiu, Lina / Mei, Bo / Zheng, Zhongshan et al. | 2023
- 1892
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Investigation of Electrically Active Defects in SiC Power Diodes Caused by Heavy Ion IrradiationFur, N. / Belanche, Manuel / Martinella, C. et al. | 2023
- 1900
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Damage Separation in Proton-Irradiated Bipolar Junction Transistors as a Function of EnergyWitczak, Steven C. / Schrimpf, Ronald D. / Fleetwood, Daniel M. et al. | 2023
- 1908
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Calibration in the Visible and Infrared Domains of Multimode Phosphosilicate Optical Fibers for Dosimetry ApplicationsWeninger, Luca / Campanella, Cosimo / Morana, Adriana et al. | 2023
- 1917
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Radiation Induced Attenuation and Luminescence Study in Radioluminescent Optical FibersKerboub, Nourdine / Di Francesca, Diego / Morana, Adriana et al. | 2023
- 1925
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Reproducibility of Dose Rate Measurements With Radioluminescent Nitrogen-Doped Optical FibersFricano, Fiammetta / Boiron, Hugo / Morana, Adriana et al. | 2023
- 1933
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Radioluminescence Processes in Cerium-Doped Silica GlassesZghari, I. / Hamzaoui, H. El / Capoen, B. et al. | 2023
- 1942
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Proton Radiation-Induced Random Telegraph Signal in HgCdTe Photodiode ArrayDinand, Segolene / Goiffon, Vincent / Lambert, Damien et al. | 2023
- 1951
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Combined Photobleaching and Temperature Effects on 1550 nm Radiation-Induced Attenuation of Germanosilicate Optical FiberRoche, M. / Morana, A. / Balcon, N. et al. | 2023
- 1958
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Ionizing Radiation Effects on Hole Collection Backside-Illuminated p-Type Deep-Trench-Pinned Photo-MOS Pixels Under Image AcquisitionAntonsanti, Aubin / Goiffon, Vincent / Roy, Francois et al. | 2023
- 1966
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Calibration of the Deposited Energy in CMOS Imagers for Particle Detection on NanosatellitesFlorczak, Josua / Neubert, Tom / Zimmermann, Egon et al. | 2023
- 1973
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Radiation Effects on Si-Photonics-Integrated Passive Devices: Postirradiation MeasurementsReghioua, Imene / Girard, Sylvain / Morana, Adriana et al. | 2023
- 1982
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The Use of High-Energy X-Ray Generators for TID Testing of Electronic DevicesGirones, Vincent / Boch, Jerome / Carapelle, Alain et al. | 2023
- 1990
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Synergistic Effect of Negative Bias Instability and Total Ionizing Dose on SiC MOSFETsTang, Yun / Wang, Lei / Cai, Xiaowu et al. | 2023
- 1995
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TID Effect of MOSFETs in SOI BCD Process and Its Hardening TechniqueWang, Shiping / Li, Xiaojing / Cai, Xiaowu et al. | 2023
- 2002
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Total-Ionizing-Dose Effects in IGZO Thin-Film TransistorsGuo, Zixiang / Li, Kan / Li, Xun et al. | 2023
- 2008
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The Effects of Gamma Ray Integrated Dose on a Commercial 65-nm SRAM DeviceStirk, Wesley / Black, Dolores A. / Black, Jeffrey D. et al. | 2023
- 2018
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Capacitive Deep Trench Isolation-Based CCD-on-CMOS Image Sensor Sensitivity to Total Ionizing DoseSalih Alj, Antoine / Touron, Pierre / Roy, Francois et al. | 2023
- 2027
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Investigations on Ionizing Dose Deposition in Thin-Layered Devices: Sample-to-Sample Variability and Electronic Equilibrium DependenceGaillardin, Marc / Lambert, Damien / Girard, Sylvain et al. | 2023
- 2034
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Total Ionizing Dose Response of a 22-nm Compiled Fully Depleted Silicon-on-Insulator Static Random Access MemoryClark, Lawrence T. / Brown, William E. / Holbert, Keith E. et al. | 2023
- 2042
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Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN HEMTsBonaldo, Stefano / Zhang, En Xia / Mattiazzo, Serena et al. | 2023
- 2051
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Incorporating Component-Level Testing Into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure ProbabilitiesNederlander, Richard H. / Witulski, Arthur F. / Reed, Robert A. et al. | 2023
- 2060
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Evaluating Reduced Resolution Redundancy for Radiation Hardening in FPGA DesignsGarcia-Astudillo, Luis A. / Lindoso, Almudena / Entrena, Luis et al. | 2023
- 2068
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Exploring Radiation-Induced Vulnerabilities in RFICs Through Traditional RF MetricsScialdone, Antonio / Ferraro, Rudy / Dilillo, Luigi et al. | 2023
- 2076
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Aspect Ratio Modeling of Radiation-Hardened 8-Shape Enclosed Layout TransistorWu, Yucao / Luo, Ping / Zhang, Bo et al. | 2023
- 2085
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2023 IEEE Nuclear Science Symposium| 2023
- 2086
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IEEE Transactions on Nuclear Science| 2023
- 2087
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TechRxiv: Share Your Preprint Research with the World!| 2023
- 2088
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Member Get-A-Member (MGM) Program| 2023
- 2089
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Nonlinear Effects and Higher-Order Aberrations on Beam Optics of Energy Selection System for Proton TherapyHan, Manfen / Zheng, Jinxing / Shen, Junsong et al. | 2023
- 2097
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Simulation and Analysis of the Space Charge Effect in a Self-Powered Neutron DetectorShao, Ruizhi / Cao, Liangzhi / Li, Yunzhao et al. | 2023
- 2106
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Transient Dose Rate Effect Between System-in-Package and Printed Circuit Boards: A Comparative Experimental StudyLi, Yang / Guo, Yaxin / Li, Junlin et al. | 2023
- 2116
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Direct Measurement of Total-Ionizing-Dose-Induced Phase Shifts in Commercially Available, Integrated Silicon-Photonic WaveguidesTzintzarov, George N. / Teng, Jeffrey W. / Nergui, Delgermaa et al. | 2023
- 2125
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Large-Scale Detector Testing for the GAPS Si(Li) TrackerXiao, Mengjiao / Stoessl, Achim / Roach, Brandon et al. | 2023
- 2134
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The Performance of Large-Pitch AC-LGAD With Different N+ DoseLi, Mengzhao / Sun, Weiyi / Liang, Zhijun et al. | 2023
- 2139
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A Linear Recurrence-Based Pseudorandom Number Generator Optimized for Detector EmulatorsWen, Xincheng / Zhu, Renjie / He, Zongwu et al. | 2023
- 2148
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Simultaneous Detection of Energy and Flux for Neutron and Gamma by CLYC ScintillatorSong, Ruiqiang / Yan, Xiaoyu / Han, Jifeng et al. | 2023
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Front Cover| 2023
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IEEE Transactions on Nuclear Science publication information| 2023
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IEEE Transactions on Nuclear Science information for authors| 2023
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2023