The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume 122,
Issue part
Volume 122,
Issue a
Volume 86,
Issue 12
Volume 86,
Issue 11
Volume 86,
Issue 10
Volume 86,
Issue 9
Volume 86,
Issue 8
Volume 86,
Issue 7
Volume 86,
Issue 6
Volume 86,
Issue 5
Volume 86,
Issue 4
Volume 86,
Issue 3
Volume 86,
Issue 2
Volume 86,
Issue 1
Volume 85,
Issue 12
Volume 85,
Issue 11
Volume 85,
Issue 10
Volume 85,
Issue 9
Volume 85,
Issue 8
Volume 85,
Issue 7
Volume 85,
Issue 6
Volume 85,
Issue 5
Volume 85,
Issue 4
Volume 85,
Issue 3
Volume 85,
Issue 2
Volume 85,
Issue 1
Volume 84,
Issue 12
Volume 84,
Issue 11
Volume 84,
Issue 10
Volume 84,
Issue 9
Volume 84,
Issue 8
Volume 84,
Issue 7
Volume 84,
Issue 6
Volume 84,
Issue 5
Volume 84,
Issue 4
Volume 84,
Issue 3
Volume 84,
Issue 2
Volume 84,
Issue 1
Volume 83,
Issue 12
Volume 83,
Issue 11
Volume 83,
Issue 10
Volume 83,
Issue 9
Volume 83,
Issue 8
Volume 83,
Issue 7
Volume 83,
Issue 6
Volume 83,
Issue 5
Volume 83,
Issue 4
Volume 83,
Issue 3
Volume 83,
Issue 2
Volume 83,
Issue 1
Volume 82,
Issue 12
Volume 82,
Issue 11
Volume 82,
Issue 10
Volume 82,
Issue 9
Volume 82,
Issue 8
Volume 82,
Issue 7
Volume 82,
Issue 6
Volume 82,
Issue 5
Volume 82,
Issue 4
Volume 82,
Issue 3
Volume 82,
Issue 2
Volume 82,
Issue 1
Volume 81,
Issue 12
Volume 81,
Issue 11
Volume 81,
Issue 10
Volume 81,
Issue 9
Volume 81,
Issue 8
Volume 81,
Issue 7
Volume 81,
Issue 6
Volume 81,
Issue 5
Volume 81,
Issue 4
Volume 81,
Issue 3
Volume 81,
Issue 2
Volume 81,
Issue 1
Volume 80,
Issue 12
Volume 80,
Issue 11
Volume 80,
Issue 10
Volume 80,
Issue 9
Volume 80,
Issue 8
Volume 80,
Issue 7
Volume 80,
Issue 6
Volume 80,
Issue 5
Volume 80,
Issue 4
Volume 80,
Issue 3
Volume 80,
Issue 1
Volume 79,
Issue 4
Volume 79,
Issue 3
Volume 79,
Issue 2
Volume 79,
Issue 1
Volume 78,
Issue 4
Volume 78,
Issue 2
Volume 78,
Issue 1
Volume 77,
Issue 4
Volume 77,
Issue 3
Volume 77,
Issue 2
Volume 77,
Issue 1
Volume 76,
Issue 4
Volume 76,
Issue 3
Volume 76,
Issue 2
Volume 76,
Issue 1
Volume 75,
Issue 4
Volume 75,
Issue 3
Volume 75,
Issue 2
Volume 75,
Issue 1
Volume 74,
Issue 4
Volume 74,
Issue 3
Volume 74,
Issue 2
Volume 74,
Issue 1
Volume 73,
Issue 4
Volume 73,
Issue 3
Volume 73,
Issue 2
Volume 73,
Issue 1
Volume 72,
Issue 4
Volume 72,
Issue 3
Volume 72,
Issue 2
Volume 72,
Issue 1
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 1
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 4
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 4
Volume 54,
Issue 1
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
Issue 11
Volume 48,
Issue 10
Volume 48,
Issue 9
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue 18
Volume 42,
Issue 17
Volume 42,
Issue 16
Volume 42,
Issue 15
Volume 42,
Issue 14
Volume 42,
Issue 13
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 9
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 1
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 12
Volume 36,
Issue 11
Volume 36,
Issue 10
Volume 36,
Issue 9
Volume 36,
Issue 7
Volume 36,
Issue 6
Volume 36,
Issue 5
Volume 36,
Issue 4
Volume 36,
Issue 3
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 10
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 9
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
Volume 9,
Issue 6
Volume 9,
Issue 5
Volume 9,
Issue 4
Volume 9,
Issue 3
Volume 9,
Issue 2
Volume 9,
Issue 1
Volume 4,
Issue 4
Volume 4,
Issue 3
Volume 4,
Issue 2
Volume 4,
Issue 1
Volume 3,
Issue 4
Volume 3,
Issue 3
Volume 3,
Issue 2
Volume 3,
Issue 1
Volume 2,
Issue 4
Volume 2,
Issue 3
Volume 2,
Issue 2
Volume 2,
Issue 1
Volume 1,
Issue 4
Volume 1,
Issue 3
Volume 1,
Issue 2
Volume 1,
Issue 1
>
Table of contents
277
Measurement of ultra high vacuum Part I. Total pressure measurements
Weston, GF
et al.
| 1979
293
Some vacuum physics of steam condensers for turbines
Bloomer, RN
et al.
| 1979
303
On the difficulties in interpreting thermal evolution spectra
Donnelly, SE
/ Ingram, DC
/ Webb, RP
et al.
| 1979
309
Improvements in film quality through progress in vacuum generation and deposition technology
Pulker, HK
et al.
| 1979
313
The producrion of vacuum: Past, present and future
Yarwood, J
et al.
| 1979
319
Activities in vacuum science and technology in the USSR and in Eastern Europe
Yarwood, J
et al.
| 1979
323
4056. CAMAC-controlled system for the measurement of ion mobilities. (GB)
| 1979
323
4054. High-power discharge in Na-Xe vapor. (USA)
| 1979
323
4059. Recombination effects in an expanding laser-produced plasma. (USA)
| 1979
323
4057. A rotating-electrode system for improved reproducibility in spark source mass spectrometry. (GB)
| 1979
323
4055. Transmittance of cultured crystalline quartz in the vacuum ultraviolet before and after electron irradiation. (USA)
| 1979
323
4062. A cathode spot model and its energy balance for metal vapour arcs. (GB)
| 1979
323
4058. Multidipole plasma density. (USA)
| 1979
323
4060. Negative work-function correction at a positively-charged surface. (GB)
| 1979
323
4061. The effect of non-uniformities on the measured transport parameters of electron swarms in hydrogen. (GB)
| 1979
324
4071. Capabilities and limitations of pumps. Steam jet ejectors and liquid ring pumps. (GB)
| 1979
324
4070. The spatial and temporal development of the early phases of homogeneous discharges in N2. (GB)
| 1979
324
4072. Rotary pump back-migration. (GB)
| 1979
324
4065. The transition from the first to the second stage of the ring discharge. (GB)
| 1979
324
4063. Time-resolved studies of the electrical breakdown of a gas at radio frequencies. (GB)
| 1979
324
4064. Boltzmann equation analysis of the electron swarm development in nitrogen. (GB)
| 1979
324
4073. Controlled vapour growth of small particles of Pd and Fe on thin Al2O3 substrates. (USA)
| 1979
324
4067. Measurement of the traverse diffusion and Townsend's first ionisation coefficients from the observation of the photon flux produced in a Townsend discharge in molecular hydrogen. (GB)
| 1979
324
4068. Two modes of moving striations in neon glow discharges. (GB)
| 1979
324
4069. Observation of high-temperature electron injection in dense argon and mercury: application to cathode spots. (GB)
| 1979
324
4066. The motion of a low-pressure arc in a strong magnetic field. (GB)
| 1979
325
4080. Resistive toroidal equilibria of Tokamak plasmas. (GB)
| 1979
325
4078. An X-ray diffraction study on the lattice imperfections in vapour-deposited fcc (Ag-4.5 at % Ge) alloy films. (GB)
| 1979
325
4082. Ionic recombination of atomic and molecular ions in flowing afterglow plasmas. (GB)
| 1979
325
4077. Tin-doping effects in GaAs films grown by molecular beam epitaxy. (USA)
| 1979
325
4079. Beryllium thin films as optical filters in helium discharge lamps. (GB)
| 1979
325
4081. The anisotropic properties of rare-gas afterglow plasmas. (GB)
| 1979
325
4075. Evaporated films of arsenic trisulfide: physical model of effects of light exposure and heat cycling. (USA)
| 1979
325
4076. High-temperature substrate deposition of CdS thin films. (GB)
| 1979
325
4074. Radiation effects of electron-beam metal depositions on IGFET's. (USA)
| 1979
326
4083. A neutral-particle analyser for plasma diagnostics. (GB)
| 1979
326
4088. Systematic transformations of the asymptotic aberration coefficients of round electrostatic lenses (1). (USA)
| 1979
326
4087. Focusing and dispersing properties of a stigmatic crossed-field energy analyzer. (USA)
| 1979
326
4084. Design of a variable-aperture projection and scanning system for electron beam. (USA)
| 1979
326
4089. Electrostatic einzel lenses with reduced spherical aberration for use in field-emission guns. (USA)
| 1979
326
4090. Averaging of electron-beam aberrations. (USA)
| 1979
326
4085. Deflection distortion in scanning electron-beam systems. (USA)
| 1979
326
4086. Focusing of electron by laser-beam fields. (USA)
| 1979
327
4097. Imaging conditions for electron-beam micromavhining. (USA)
| 1979
327
4098. Projection ion lithography with aperture lenses. (USA)
| 1979
327
4093. Comprehensive analysis of gratings for ultraviolet space instrumentation. (USA)
| 1979
327
4094. Polarisation shift effect in high-density plasmas. (GB)
| 1979
327
4095. Three-body attachment in oxygen. (GB)
| 1979
327
4091. Design of electron-beam scanning systems using the moving objective lens. (USA)
| 1979
327
4092. A gas-discharge atomic hydrogen source for electron-scattering experiments. (GB)
| 1979
327
4096. Mechanism of cavity formation in unfired ceramic by electron beam machining. (USA)
| 1979
328
4099. Imaging and alignment tests on an electron projection system. (USA)
| 1979
328
4103. Surface relief gratings of 3200 Å period fabrication techniques and influence on thin-film growth. (USA)
| 1979
328
4107. X-ray exposure system using finely position adjusting apparatus. (USA)
| 1979
328
4101. Optical manipulation of resist profile in conformable printing. (USA)
| 1979
328
4100. Recent progress on the electron image projector. (USA)
| 1979
328
4106. X-ray lithography by synchrotron radiation of INS-ES. (USA)
| 1979
328
4105. Polyimide membrane X-ray lithography masks—fabrication and distortion measurements. (USA)
| 1979
328
4102. Simulation of X-ray resist line edge profiles. (USA)
| 1979
328
4104. Fabrication of micro- and submicron-bubble memory devices by a mask transfer technique with subsequent gatter-ion etching. (USA)
| 1979
329
4112. Direct, electron lithographic fabrication of silicon devices and circuits. (USA)
| 1979
329
4108. Alignment of X-ray lithography masks using a new interferometric technique—experimental results. (USA)
| 1979
329
4110. Design of a medium-power X-ray lithography system. (USA)
| 1979
329
4114. Chrome mask fabrication with electron-beam lithographic system. (USA)
| 1979
329
4109. Fabrication of integrated injection logic using e-beam lithography. (USA)
| 1979
329
4111. Electron-beam fabrication of submicron gates for GaAs FET's (USA)
| 1979
329
4113. Two-phase high-density charge coupled devices fabricated by electron-beam lithography. (USA)
| 1979
330
4123. High-precision automatic alignment procedure for vector scan e-beam lithography. (USA)
| 1979
330
4122. Digitally positioned mechanical stage. (USA)
| 1979
330
4121. Qualty assurance procedures for MEBES. (USA)
| 1979
330
4117. Electron-beam exposure profiles in polymer films for metallic film mask fabrication. (USA)
| 1979
330
4116. Negative electron resists for direct fabrication of devices. (USA)
| 1979
330
4119. Control of pattern dimensions in electron lithography. (USA)
| 1979
330
4118. Self-consistent proximity effect correction technique for resist exposure (SPECTRE). (USA)
| 1979
330
4115. Sol-gel behaviour and image formation in poly(glycidil methacrylate) and its copolymers with ethyl acrylate. (USA)
| 1979
330
4120. High-contrast registration marks for electron-beam pattern exposure on (100) silicon. (USA)
| 1979
331
4127. Variable spot shaping for electron-beam lithography. (USA)
| 1979
331
4130. Surface analysis of WC-Co composite materials. (2) Quantitative Auger electron spectrometry. (USA)
| 1979
331
4124. Method of optimizing registration signals for electron-beam microfabrication. (USA)
| 1979
331
4128. Electron-beam lithographic pattern generation system. (USA)
| 1979
331
4126. Double-aperture method of producing variably shaped writing spots for electron lithography. (USA)
| 1979
331
4125. Design aspects of a scanning electron-beam-microfabrication instrument having 10 × 10 mm field coverage, normal substrate incidence and high throughput. (USA)
| 1979
331
4129. A refined ultra-high vacuum furnace for rare gas analysis. (GB)
| 1979
331
4131. Chemical characterization of WC-Co composite materials by AES and ISS. (1) Processing. (USA)
| 1979
332
4134. Inspection for defects of a mask containing one- to submicrometer patterns using a scanning electron microscope and feature extraction method. (USA)
| 1979
332
4137. Charge neutralization of insulating surfaces in the SEM by gas ionization. (GB)
| 1979
332
4135. Highly stable single-crystal LaB6 cathode for conventional electron microprobe instruments. (USA)
| 1979
332
4136. Improved integrated circuit failure analysis using SEM video processing. (USA)
| 1979
332
4133. Annealing and rolling behaviours of concentration profiles of Cr and Cu implanted into mild steel. (USA)
| 1979
332
4132. Comparison of Auger signals measured using differential and integral Auger spectra from C and O adsorbed on W. (USA)
| 1979
333
Atom and ion sources
Steckelmacher, W
et al.
| 1979
334
Physics of thin films
Steckelmacher, W
et al.
| 1979
335
Thin film processing
Steckelmacher, W
et al.
| 1979