The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
Issue 11
Volume 53,
Issue 10
Volume 53,
Issue 9
Volume 53,
Issue 8
Volume 53,
Issue 7
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
Issue 11
Volume 52,
Issue 10
Volume 52,
Issue 9
Volume 52,
Issue 8
Volume 52,
Issue 7
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
Issue 11
Volume 51,
Issue 10
Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 12
Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
Issue 7
Volume 50,
Issue 6
Volume 50,
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Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 12
Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
Issue 8
Volume 49,
Issue 7
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
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Volume 48,
Issue 10
Volume 48,
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Volume 48,
Issue 8
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
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Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
2635
Parasitic Gate Resistance Impact on Triple-Gate FinFET CMOS Inverter
Solis Avila, Edgar
/ Tinoco, Julio C.
/ Martinez-Lopez, Andrea G.
et al.
| 2016
2643
Performance Enhancement in Bipolar Junction Transistors Using Uniaxial Stress on (100) Silicon
Gnanachchelvi, P.
/ Jaeger, R. C.
/ Wilamowski, B. M.
et al.
| 2016
2650
On Apparent Electron Mobility in Si nMOSFETs From Diffusive to Ballistic Regime
Antoniadis, Dimitri
et al.
| 2016
2657
Out-of-Plane Strain Effects on Physically Flexible FinFET CMOS
Ghoneim, Mohamed T.
/ Alfaraj, Nasir
/ Torres-Sevilla, Galo A.
et al.
| 2016
2665
High-Performance Germanium pMOSFETs With NiGe Metal Source/Drain Fabricated by Microwave Annealing
Zhang, Rui
/ Li, Junkang
/ Chen, Feng
et al.
| 2016
2671
Thermal Stability Concern of Metal-Insulator-Semiconductor Contact: A Case Study of Ti/TiO2 /n-Si Contact
Yu, Hao
/ Schaekers, Marc
/ Schram, Tom
et al.
| 2016
2677
Innovative SiGe HBT Topologies With Improved Electrothermal Behavior
D'Esposito, Rosario
/ Fregonese, Sebastien
/ Chakravorty, Anjan
et al.
| 2016
2684
Symmetric Lateral Doping-Free BJT: A Novel Design for Mixed Signal Applications
Sahu, Abhishek
/ Bramhane, Lokesh Kumar
/ Singh, Jawar
et al.
| 2016
2691
Experimental DC Extraction of the Base Resistance of Bipolar Transistors: Application to SiGe:C HBTs
d'Alessandro, Vincenzo
/ Sasso, Grazia
/ Rinaldi, Niccolo
et al.
| 2016
2700
An Analytical BTBT Current Model of Symmetric/Asymmetric 4T Tunnel Double Gate FETs With Ambipolar Characteristic
Dutta, Pradipta
/ Koley, Kalyan
/ Dutta, Arka
et al.
| 2016
2708
Effect of Pregate Carbon Implant on Narrow Width Behavior and Performance of High- $k$ Metal-Gate nMOS Transistors
Mohapatra, Nihar R.
/ Ganeriwala, Mohit D.
/ Sivanaresh M., Satya
et al.
| 2016
2714
Experimental Realization of a Ternary-Phase Alloy Through Microwave-Activated Annealing for Ge Schottky pMOSFETs
Hsu, Chung-Chun
/ Chi, Wei-Chun
/ Tsai, Yi-He
et al.
| 2016
2722
Plasma Charging Behavior of p-MOSFETs With Floating Bond Pads and Its Application to Charging-Safe Bond Pad Design
Lin, Wallace
et al.
| 2016
2729
Thermal Assessment of AlGaN/GaN MOS-HEMTs on Si Substrate Using Gd2 O3 as Gate Dielectric
Gao, Zhan
/ Romero, Maria Fatima
/ Pampillon, Maria Angela
et al.
| 2016
2735
Effects of Annealing Treatments on the Properties of Al/Ti/p-GaN Interfaces for Normally OFF p-GaN HEMTs
Greco, Giuseppe
/ Iucolano, Ferdinando
/ Di Franco, Salvatore
et al.
| 2016
2742
Nanometer-Scale Strain Measurements in AlGaN/GaN High-Electron Mobility Transistors During Pulsed Operation
Rosenberger, Matthew R.
/ Jones, Jason P.
/ Heller, Eric R.
et al.
| 2016
2749
Assessment of InAs/AlGaSb Tunnel-FET Virtual Technology Platform for Low-Power Digital Circuits
Strangio, Sebastiano
/ Palestri, Pierpaolo
/ Lanuzza, Marco
et al.
| 2016
2757
Analysis and Performance Study of III–V Schottky Barrier Double-Gate MOSFETs Using a 2-D Analytical Model
Schwarz, Mike
/ Kloes, Alexander
et al.
| 2016
2764
On the Impact of Time-Zero Variability, Variable NBTI, and Stochastic TDDB on SRAM Cells
Mishra, Subrat
/ Mahapatra, Souvik
et al.
| 2016
2771
Performance Enhancement of STT MRAM Using Asymmetric- $k$ Sidewall-Spacer NMOS
Verma, Shivam
/ Pal, Pankaj Kumar
/ Mahawar, Sanjay
et al.
| 2016
2777
Time-Efficient Curing of Printed Dielectrics via Infra-Red Suitable to S2S and R2R Manufacturing Platforms for Electronic Devices
Mitra, Kalyan Yoti
/ Weise, Dana
/ Hartwig, Melinda
et al.
| 2016
2785
Anomalous Increase in Field-Effect Mobility in In–Ga–Zn–O Thin-Film Transistors Caused by Dry-Etching Damage Through Etch-Stop Layer
Koretomo, Daichi
/ Toda, Tatsuya
/ Matsuda, Tokiyoshi
et al.
| 2016
2785
Anomalous Increase in Field-Effect Mobility in In-G-Zn-O Thin-Film Transistors Caused by Dry-Etching Damage Through Etch-Stop Layer
Daichi Koretomo
et al.
| 2016
2790
Estimation of Luminous Flux and Luminous Efficacy of Low-Power SMD LED as a Function of Injection Current and Ambient Temperature
Raypah, Muna E.
/ Sodipo, Bashiru K.
/ Devarajan, Mutharasu
et al.
| 2016
2796
GaSb-Based p-i-n Photodiodes With Partially Depleted Absorbers for High-Speed and High-Power Performance at 2.5- $\mu \text{m}$ Wavelength
Wun, Jhih-Min
/ Wang, Yu-Wen
/ Chen, Yi-Han
et al.
| 2016
2796
GaSb-Based p-i-n Photodiodes With Partially Depleted Absorbers for High-Speed and High-Power Performance at 2.5-μm Wavelength
Wun, J.-M.
/ Wang, Y.-W.
/ Chen, Y.-H.
et al.
| 2016
2802
Resonant-Cavity Light-Emitting Diodes (RCLEDs) Made From a Simple Dielectric Coating of Transistor Outline (TO)-Can Packaged InGaN LEDs for Visible Light Communications
Tsai, Chia-Lung
/ Lu, Yi-Chen
/ Ko, Sun-Chien
et al.
| 2016
2807
Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation
Huang, Jianlin
/ Golubovic, Dusan S.
/ Koh, Sau
et al.
| 2016
2815
Effect of Aging on the Photoelectrical Properties of AlGaInP LEDs
Meskauskas, Donatas
/ Dabasinskas, Laurynas
/ Zukauskas, Arturas
et al.
| 2016
2815
Effect of Aging on the Photoelectrical Properties of AlInGaP LEDs
Meškauskas, D.
/ Dabašinskas, L.
/ Žukauskas, A.
et al.
| 2016
2820
Energy Harvesting for GaAs Photovoltaics Under Low-Flux Indoor Lighting Conditions
Teran, Alan S.
/ Moon, Eunseong
/ Lim, Wootaek
et al.
| 2016
2826
Electrical Characteristics of SiO2 Deposited by Atomic Layer Deposition on 4H–SiC After Nitrous Oxide Anneal
Yang, Xiangyu
/ Lee, Bongmook
/ Misra, Veena
et al.
| 2016
2831
Characterization of Static and Dynamic Behaviors in AlGaN/GaN-on-Si Power Transistors With Photonic-Ohmic Drain
Tang, Xi
/ Li, Baikui
/ Zhang, Zhaofu
et al.
| 2016
2838
N2 -Plasma-Treated Ga2 O3 (Gd2 O3 ) as Interface Passivation Layer for Ge MOS Capacitor With HfTiON Gate Dielectric
Huang, Yong
/ Xu, Jing-Ping
/ Liu, Lu
et al.
| 2016
2844
Surface Nonuniformity-Induced Frequency Dispersion in Accumulation Capacitance for Silicon MOS(n) Capacitor
Lin, Huang-Hsuan
/ Hwu, Jenn-Gwo
et al.
| 2016
2852
Long-Term Stability of Epitaxial (Nd1–x Gdx )2 O3 Thin Films Grown on Si(001) for Future CMOS Devices
Ghosh, Kankat
/ Das, Sudipta
/ Fissel, Andreas
et al.
| 2016
2852
Long-Term Stability of Epitaxial for future CMOS devices
Ghosh, Kankat
et al.
| 2016
2858
Very Low-Work-Function ALD-Erbium Carbide (ErC2 ) Metal Electrode on High- $K$ Dielectrics
Ahn, Hyun Jun
/ Moon, Jungmin
/ Koh, Sungho
et al.
| 2016
2864
Remote Gate-Controlled Negative Transconductance in Gated MIS Tunnel Diode
Liao, Chien-Shun
/ Hwu, Jenn-Gwo
et al.
| 2016
2871
From Fowler–Nordheim to Nonequilibrium Green’s Function Modeling of Tunneling
Ilatikhameneh, Hesameddin
/ Salazar, Ramon B.
/ Klimeck, Gerhard
et al.
| 2016
2879
Device-Circuit Cosimulation for Energy Efficiency in Sub-10-nm Gate Length Logic and Memory
Cho, Woo-Suhl
/ Roy, Kaushik
et al.
| 2016
2887
An Ultrathin Organic Insulator for Metal–Insulator–Metal Diodes
Etor, David
/ Dodd, Linzi E.
/ Wood, David
et al.
| 2016
2892
Development of a ToF Pixel With VOD Shutter Mechanism, High IR QE, Four Storages, and CDS
Tadmor, Erez
/ Cohen, David
/ Yahav, Giora
et al.
| 2016
2900
A Wideband Microfabricated Ka-Band Planar Helix Slow-Wave Structure
Zhao, Chen
/ Aditya, Sheel
/ Wang, Shaomeng
et al.
| 2016
2907
A millimeter wave high-order mode converter
Guo Liu
et al.
| 2016
2907
A Millimeter Wave High-Order TE13 Mode Converter
Liu, Guo
/ Wang, Yan
/ Pu, Youlei
et al.
| 2016
2912
A Novel Gap-Groove Folded-Waveguide Slow-Wave Structure for G-Band Traveling-Wave Tube
Tahanian, Esmaeel
/ Dadashzadeh, Gholamreza
et al.
| 2016
2919
Theoretical Research on a Multibeam-Modulated Electron Gun Based on Carbon Nanotube Cold Cathodes
Yuan, Xuesong
/ Wang, Bin
/ Cole, Matthew T.
et al.
| 2016
2925
Development of a Miniaturized $W$ -Band Spatial Harmonic Magnetron
Li, Shengen
/ Li, Fengling
/ Yang, Jinsheng
et al.
| 2016
2930
Impact of the NW-TFET Diameter on the Efficiency and the Intrinsic Voltage Gain From a Conduction Regime Perspective
Bordallo, Caio C. M.
/ Sivieri, Victor B.
/ Martino, Joao Antonio
et al.
| 2016
2936
Large-Signal Model of Graphene Field-Effect Transistors—Part I: Compact Modeling of GFET Intrinsic Capacitances
Pasadas, Francisco
/ Jimenez, David
et al.
| 2016
2942
Large-Signal Model of Graphene Field- Effect Transistors—Part II: Circuit Performance Benchmarking
Pasadas, Francisco
/ Jimenez, David
et al.
| 2016
2948
Investigation of Electrical Characteristics in Al/CdS-PVA/p-Si (MPS) Structures Using Impedance Spectroscopy Method
Ersoz, Gulcin
/ Yucedag, Ibrahim
/ Azizian-Kalandaragh, Yashar
et al.
| 2016
2956
Characterization of Graphene TFET for Subterahertz Oscillator
Mao, Xurui
/ Huang, Beiju
/ Zhang, Xu
et al.
| 2016
2963
Probabilistic Deep Spiking Neural Systems Enabled by Magnetic Tunnel Junction
Sengupta, Abhronil
/ Parsa, Maryam
/ Han, Bing
et al.
| 2016
2971
A Compact Subthreshold Model for Short-Channel Monolayer Transition Metal Dichalcogenide Field-Effect Transistors
You, Wei-Xiang
/ Su, Pin
et al.
| 2016
2975
Reduction of Kink Effect of Poly-Si TFT With Bottom Field Plate by Dispersing Current Density Technique
Kang, Tsung-Kuei
/ Chen, Yu-Han
/ Chien, Feng-Tso
et al.
| 2016
2980
Transactions on Electron Devices Special Issue on Flexible Electronics CFP
| 2016
2981
Power Semiconductor Devices and Smart Power IC Technologies CFP
| 2016
2982
IEDM Exhibits Program
| 2016
2983
2016 IEEE International Electron Devices Meeting
| 2016
2984
IEEE International Integrated Reliability Workshop
| 2016
C1
Table of contents
| 2016
C2
IEEE Transactions on Electron Devices publication information
| 2016
C3
IEEE Transactions on Electron Devices information for authors
| 2016
C4
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| 2016
Performance Enhancement of STT MRAM Using Asymmetric-[Formula Omitted] Sidewall-Spacer NMOS
Shivam Verma
et al.
| 2016