Journal of synchrotron radiation
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 107
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Present state and perspectives of synchrotron radiation diffraction imagingBaruchel, J. / Härtwig, J. / Pernot-Rejmánková, P. et al. | 2002
- 107
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Research papers - Present state and perspectives of synchrotron radiation diffraction imaging - The impact of third-generation high-energy synchrotron radiation sources on the development of X-ray diffraction imaging is reported, with examples from the ESRF.Baruchel, J. et al. | 2002
- 115
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Characterization of a Fresnel zone plate using higher-order diffractionTakeuchi, Akihisa / Suzuki, Yoshio / Takano, Hidekazu et al. | 2002
- 115
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Research papers - Characterization of a Fresnel zone plate using higher-order diffraction - The performance of a Fresnel zone plate has been tested by observing the focusing property of higher-order diffraction.Takeuchi, A. et al. | 2002
- 119
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Parabolic refractive X-ray lensesLengeler, Bruno / Schroer, Christian G. / Benner, Boris et al. | 2002
- 119
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Research papers - Parabolic refractive X-ray lenses - The status of the development of parabolic refractive X-ray lenses is described, and the possibilities for micrometre and submicrometre focusing and for X-ray imaging in absorption and phase contrast are illustrated.Lengeler, B. et al. | 2002
- 125
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Zernike-type X-ray imaging microscopy at 25 keV with Fresnel zone plate opticsAwaji, M. / Suzuki, Y. / Takeuchi, A. et al. | 2002
- 125
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Research papers - Zernike-type X-ray imaging microscopy at 25 keV with Fresnel zone plate optics - A Zernike-type imaging microscope using a sputtered-sliced Fresnel zone plate has been developed and tested at an X-ray energy of 25 keV.Awaji, M. et al. | 2002
- 128
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Elemental analysis with a full-field X-ray fluorescence microscope and a CCD photon-counting systemOhigashi, Takuji / Watanabe, Norio / Yokosuka, Hiroki et al. | 2002
- 128
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Research papers - Elemental analysis with a full-field X-ray fluorescence microscope and a CCD photon-counting system - The performance of elemental analysis of a CCD photon-counting system in combination with a full-field X-ray fluorescence microscope has been evaluated. Two-dimensional elemental maps could be obtained with an energy resolution of 350 keV.Ohigashi, T. et al. | 2002
- 132
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Research papers - High-resolution hard X-ray phase-contrast microscopy with a large-diameter and high-numerical-aperture zone plate - High-resolution phase-contrast microscopy using Zernike's method has been demonstrated by the use of zone plate optics. Specimens transparent to hard X-rays have been successfully imaged with a high image contrast by the phase-contrast method.Kagoshima, Y. et al. | 2002
- 132
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High-resolution hard X-ray phase-contrast microscopy with a large-diameter and high-numerical-aperture zone plateKagoshima, Yasushi / Yokoyama, Yoshiyuki / Ibuki, Takashi et al. | 2002
- 136
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Research papers - Phase-contrast X-ray imaging based on interferometry - Principle and experimental demonstrations of phase-contrast X-ray imaging based on interferometry are described.Momose, A. et al. | 2002
- 136
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Phase-contrast X-ray imaging based on interferometryMomose, Atsushi et al. | 2002
- 143
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Research papers - Application of synchrotron X-ray imaging to phase objects in orthopedics - Novel imaging of the fine structures of the ribs of a pig and a specimen of human osteosarcoma utilizing the spatial coherence of X-rays was successfully performed with an incident X-ray energy of 30 keV at SPring-8, Japan.Mori, K. et al. | 2002
- 143
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Application of synchrotron X-ray imaging to phase objects in orthopedicsMori, K. / Sekine, N. / Sato, H. et al. | 2002
- 148
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Research papers - Quantitative analysis of two-component samples using in-line hard X-ray images - Three recently proposed methods for rapid quantitative in-line X-ray imaging are analyzed and tested on images of a model sample collected using synchrotron radiation.Gureyev, T.E. et al. | 2002
- 148
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Quantitative analysis of two-component samples using in-line hard X-ray imagesGureyev, T. E. / Stevenson, A. W. / Paganin, D. M. et al. | 2002
- 154
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Development of a multilayer Fresnel zone plate for high-energy synchrotron radiation X-rays by DC sputtering depositionTamura, S. / Yasumoto, M. / Kamijo, N. et al. | 2002
- 154
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Research papers - Development of a multilayer Fresnel zone plate for high-energy synchrotron radiation X-rays by DC sputtering deposition - Cu-Al multilayer Fresnel zone plates (outermost zone width 0.25 mm) have been developed by DC sputtering deposition. At the undulator beamline BL47XU of SPring-8 an almost diffraction-limited microbeam of 0.3-0.35 mm has been attained and a clear image of the fine line-and-space resolution test pattern up to 0.2 mm was observed.Tamura, S. et al. | 2002
- 160
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Research papers - X-ray refraction-enhanced imaging and a method for phase retrieval for a simple object - Refraction-enhanced imaging for a simple object and complicated objects are described in simple projection image and tomographic reconstruction. An example of phase retrieval for a single projection image is presented, and some problems for applications to thick and complicated specimens are also discussed.Suzuki, Y. et al. | 2002
- 160
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X-ray refraction-enhanced imaging and a method for phase retrieval for a simple objectSuzuki, Yoshio / Yagi, Naoto / Uesugi, Kentaro et al. | 2002
- 166
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Synchrotron-radiation X-ray topography of surface strain in large-diameter silicon wafersKawado, S. / Iida, S. / Yamaguchi, S. et al. | 2002
- 166
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Research papers - Synchrotron-radiation X-ray topography of surface strain in large-diameter silicon wafers - The difference in surface-strain distribution caused by various steps of silicon-wafer manufacturing, i.e. slicing, lapping, etching, grinding and polishing, has been studied.Kawado, S. et al. | 2002
- 169
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Research papers - Plane-wave X-ray topography and its application at SPring-8 - X-rays with an angular divergence of about 0.01 arcsec were produced by using only one collimator crystal. Plane-wave X-ray topographic images of dislocations, growth striations and grown-in in microdefects in the CZ-Si crystals were obtained.Iida, S. et al. | 2002
- 169
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Plane-wave X-ray topography and its application at SPring-8Iida, Satoshi / Chikaura, Yoshinori / Kawado, Seiji et al. | 2002
- 174
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Synchrotron X-ray topography of electronic materialsTuomi, T. et al. | 2002
- 174
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Research papers - Synchrotron X-ray topography of electronic materials - Topography studies of electronic materials are presented, covering the range from voids and precipitates in almost perfect float-zone and Czochralski silicon, dislocations in gallium arsenide grown by the liquid-encapsulated Czochralski technique, the vapour-pressure controlled Czochralski technique and the vertical-gradient freeze techniques, stacking faults and micro-pipes in silicon carbide to misfit dislocations in epitaxic hetero-structures.Tuomi, T. et al. | 2002
- 179
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Research papers - Zernike-type phase-contrast hard X-ray microscope with a zone plate at the Photon Factory - A Zernike-type phase-contrast X-ray microscope with a zone plate and a phase plate has been constructed at the Photon Factory BL3C2. Tantalum line patterns as fine as 0.3 mm in width could be resolved.Yokosuka, H. et al. | 2002
- 179
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Zernike-type phase-contrast hard X-ray microscope with a zone plate at the Photon FactoryYokosuka, Hiroki / Watanabe, Norio / Ohigashi, Takuji et al. | 2002
- 182
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Hard X-ray microbeam experiments with a sputtered-sliced Fresnel zone plate and its applicationsKamijo, N. / Suzuki, Y. / Awaji, M. et al. | 2002
- 183
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Research papers - Hard X-ray microbeam experiments with a sputtered-sliced Fresnel zone plate and its applications - Sputtered-sliced Fresnel zone plates for hard X-ray focusing have been developed. As an example of the microbeam technique, a two-dimensional distribution of constituent elements in forensic samples has been obtained using fluorescent scanning microscopy.Kamijo, N. et al. | 2002
- 187
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Spain joins the SR world| 2002
- 187
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Progress on the Australian Light Source| 2002
- 187
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LCLS makes the FY2003 budget for project engineering and design| 2002
- 187
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DIAMOND company is launched| 2002
- 187
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Current events| 2002
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Forthcoming meetings and short courses| 2002