The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
Issue 11
Volume 53,
Issue 10
Volume 53,
Issue 9
Volume 53,
Issue 8
Volume 53,
Issue 7
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
Issue 11
Volume 52,
Issue 10
Volume 52,
Issue 9
Volume 52,
Issue 8
Volume 52,
Issue 7
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
Issue 11
Volume 51,
Issue 10
Volume 51,
Issue 9
Volume 51,
Issue 8
Volume 51,
Issue 7
Volume 51,
Issue 6
Volume 51,
Issue 5
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 12
Volume 50,
Issue 11
Volume 50,
Issue 10
Volume 50,
Issue 9
Volume 50,
Issue 8
Volume 50,
Issue 7
Volume 50,
Issue 6
Volume 50,
Issue 5
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 12
Volume 49,
Issue 11
Volume 49,
Issue 10
Volume 49,
Issue 9
Volume 49,
Issue 8
Volume 49,
Issue 7
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
Issue 11
Volume 48,
Issue 10
Volume 48,
Issue 9
Volume 48,
Issue 8
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
695
Change of Editor-in-Chief
Zhao, Bin
et al.
| 2015
696
Atomic Level Modeling of Extremely Thin Silicon-on-Insulator MOSFETs Including the Silicon Dioxide: Electronic Structure
Markov, Stanislav
/ Aradi, Balint
/ Yam, Chi-Yung
et al.
| 2015
705
A New Physical Method Based on $CV$ – $GV$ Simulations for the Characterization of the Interfacial and Bulk Defect Density in High- $k$ /III-V MOSFETs
Sereni, Gabriele
/ Vandelli, Luca
/ Veksler, Dmitry
et al.
| 2015
713
Comprehensive Performance Benchmarking of III-V and Si nMOSFETs (Gate Length = 13 nm) Considering Supply Voltage and OFF-Current
Kim, Raseong
/ Avci, Uygar E.
/ Young, Ian A.
et al.
| 2015
722
Design of Band Engineered HgCdTe nBn Detectors for MWIR and LWIR Applications
Akhavan, Nima Dehdashti
/ Jolley, Gregory
/ Umana-Membreno, Gilberto A.
et al.
| 2015
729
Potential Benefits and Sensitivity Analysis of Dopingless Transistor for Low Power Applications
Sahu, Chitrakant
/ Singh, Jawar
et al.
| 2015
736
A Reduced-Order Method for Coherent Transport Using Green’s Functions
Hetmaniuk, Ulrich
/ Ji, Dong
/ Zhao, Yunqi
et al.
| 2015
743
Distributive Quasi-Ballistic Drift Diffusion Model Including Effects of Stress and High Driving Field
Kotlyar, Roza
/ Rios, Rafael
/ Weber, Cory E.
et al.
| 2015
751
RF Operation of Hydrogen-Terminated Diamond Field Effect Transistors: A Comparative Study
Russell, Stephen
/ Sharabi, Salah
/ Tallaire, Alexandre
et al.
| 2015
757
Versatile Compact Model for Graphene FET Targeting Reliability-Aware Circuit Design
Mukherjee, Chhandak
/ Aguirre-Morales, Jorge-Daniel
/ Fregonese, Sebastien
et al.
| 2015
764
AlN/SiO2 /Si3 N4 /Si(100)-Based CMOS Compatible Surface Acoustic Wave Filter With −12.8-dB Minimum Insertion Loss
Kaletta, Udo Christian
/ Wipf, Christian
/ Fraschke, Mirko
et al.
| 2015
769
Frequency-Modulated Charge Pumping With Extremely High Gate Leakage
Ryan, Jason Thomas
/ Zou, Jibin
/ Southwick, Richard
et al.
| 2015
776
High-performance enhancement-mode figure of merit
Qi Zhou
et al.
| 2015
776
High-Performance Enhancement-Mode Al2O3/AlGaN/GaN-on-Si MISFETs With 626 MW/ \mathrm^ Figure of Merit
Qi Zhou
et al.
| 2015
776
High-Performance Enhancement-Mode Al2 O3 /AlGaN/GaN-on-Si MISFETs With 626 MW/ $\mathrm{cm}^{2}$ Figure of Merit
Zhou, Qi
/ Chen, Bowen
/ Jin, Yang
et al.
| 2015
782
Temperature-Dependent Dynamic $R_{\mathrm {\mathrm{{\scriptstyle ON}}}}$ in GaN-Based MIS-HEMTs: Role of Surface Traps and Buffer Leakage
Meneghini, Matteo
/ Vanmeerbeek, Piet
/ Silvestri, Riccardo
et al.
| 2015
782
Temperature-dependent dynamic in GaN-Based MIS-HEMTs: role of surface traps and buffer leakage
Meneghini, M
et al.
| 2015
782
Temperature-Dependent Dynamic R}}} in GaN-Based MIS-HEMTs: Role of Surface Traps and Buffer Leakage
Meneghini, Matteo
et al.
| 2015
788
Effect of Body Thickness on the Electrical Performance of Ballistic n-Channel GaSb Double-Gate Ultrathin-Body Transistor
Guo, Yan
/ Zhang, Xiaoyi
/ Low, Kain Lu
et al.
| 2015
795
Parameter Extractions for a GaAs pHEMT Thermal Model Using a TFR-Heated Test Structure
Schwitter, Bryan K.
/ Fattorini, Anthony P.
/ Parker, Anthony E.
et al.
| 2015
802
Differentiated Doping Profile for Vertical Terahertz GaN Transferred-Electron Devices
Dalle, Christophe Francois
et al.
| 2015
808
Investigation of Junction Thermal Characteristics of Light-Emitting Transistors
Yang, Hao-Hsiang
/ Wang, Hsiao-Lun
/ Wu, Chao-Hsin
et al.
| 2015
813
A Unified Two-Band Model for Oxide Traps and Interface States in MOS Capacitors
Taur, Yuan
/ Chen, Han-Ping
/ Xie, Qian
et al.
| 2015
821
Normally off -AlGaN/GaN MIS-HEMT with transparent gate electrode for gate degradation investigation
Yunyou Lu
et al.
| 2015
821
Normally off Al2 O3 –AlGaN/GaN MIS-HEMT With Transparent Gate Electrode for Gate Degradation Investigation
Lu, Yunyou
/ Li, Baikui
/ Tang, Xi
et al.
| 2015
828
Advanced Methodology for Fast 3-D TCAD Device/Circuit Electrothermal Simulation and Analysis of Power HEMTs
Chvala, Ales
/ Donoval, Daniel
/ Satka, Alexander
et al.
| 2015
835
Trap-Profile Extraction Using High-Voltage Capacitance–Voltage Measurement in AlGaN/GaN Heterostructure Field-Effect Transistors With Field Plates
Liao, Wen-Chia
/ Chyi, Jen-Inn
/ Hsin, Yue-Ming
et al.
| 2015
840
Channel Temperature Analysis of GaN HEMTs With Nonlinear Thermal Conductivity
Darwish, Ali
/ Bayba, Andrew J.
/ Hung, Hingloi Alfred
et al.
| 2015
847
Pulse-Induced Crystallization in Phase-Change Memories Under Set and Disturb Conditions
Ciocchini, Nicola
/ Ielmini, Daniele
et al.
| 2015
855
Improved Technique for Quantifying the Bias-Dependent Mobility of Metal-Oxide Thin-Film Transistors
Zeumault, Andre
/ Subramanian, Vivek
et al.
| 2015
862
Compact Modeling of the Transient Carrier Trap/Detrap Characteristics in Polysilicon TFTs
Oodate, Yuhei
/ Tanimoto, Yuta
/ Tanoue, Hiroshi
et al.
| 2015
869
Effect of SiO2 and SiO2 /SiNx Passivation on the Stability of Amorphous Indium-Gallium Zinc-Oxide Thin-Film Transistors Under High Humidity
Chowdhury, Md Delwar Hossain
/ Mativenga, Mallory
/ Um, Jae Gwang
et al.
| 2015
869
Effect of Si passivation on the stability of amorphous indium-gallium zinc-oxide thin-film transistors under high humidity
Chowdhury, M.D.H
et al.
| 2015
875
Solution-Processed Low-Operating-Voltage Thin-Film Transistors With Bottom-Gate Top-Contact Structure
Li, Xifeng
/ Zhu, Leyong
/ Gao, Yana
et al.
| 2015
882
Novel Gate-All-Around High-Voltage Thin-Film Transistor With T-Shaped Metal Field Plate Design
Tsai, Jhen-Yu
/ Hu, Hsin-Hui
et al.
| 2015
888
A High-Speed Wafer-Scale CMOS X-Ray Detector With Column-Parallel ADCs Using Oversampling Binning Method
Kim, Jong-Boo
/ Hong, Seong-Kwan
/ Kwon, Oh-Kyong
et al.
| 2015
896
Thermal Analysis of High-Power Multichip COB Light-Emitting Diodes With Different Chip Sizes
Ying, Shang-Ping
/ Shen, Wei-Bo
et al.
| 2015
902
Diffusion Injection in a Buried Multiquantum Well Light-Emitting Diode Structure
Riuttanen, Lauri
/ Kivisaari, Pyry
/ Svensk, Olli
et al.
| 2015
909
Noise Suppression in Quantum-Dot Semiconductor Optical Amplifiers: A Bit Rate-SNR Analysis
Baghban, Hamed
/ Alimohammadi, Farzin
et al.
| 2015
914
Light-Emitting Diodes Fabricated From Carbon Ions Implanted Into p-Type Silicon
Purdy, Sarah K.
/ Knights, Andrew P.
/ Bradley, Michael Patrick
et al.
| 2015
919
An Improved Quasi-Saturation and Charge Model for SOI-LDMOS Transistors
Prasad, Nitin
/ Sarangapani, Prasad
/ Nikhil, Krishnan Nadar Savithry
et al.
| 2015
927
Device Characteristics of TSV-Based Piezoelectric Resonator With Load Capacitance and Static Capacitance Modification
Shih, Jian-Yu
/ Chen, Yen-Chi
/ Chiu, Chih-Hung
et al.
| 2015
934
Integration of TmSiO/HfO2 Dielectric Stack in Sub-nm EOT High- $k$ /Metal Gate CMOS Technology
Litta, Eugenio Dentoni
/ Hellstrom, Per-Erik
/ Ostling, Mikael
et al.
| 2015
934
Integration of TmSiO/Hf dielectric stack in sub-nm EOT High-k/metal gate CMOS technology
Dentoni Litta, E
et al.
| 2015
940
Evaluating Chip-Level Impact of Cu/Low- $\kappa $ Performance Degradation on Circuit Performance at Future Technology Nodes
Ceyhan, Ahmet
/ Jung, Moongon
/ Panth, Shreepad
et al.
| 2015
947
Investigation of Hole Mobility in Strained InSb Ultrathin Body pMOSFETs
Chang, Pengying
/ Liu, Xiaoyan
/ Zeng, Lang
et al.
| 2015
955
A SPICE Compact Model for Unipolar RRAM Reset Process Analysis
Jimenez-Molinos, Francisco
/ Villena, Marco A.
/ Roldan, Juan B.
et al.
| 2015
963
On the Origin of Steep $I$ – $V$ Nonlinearity in Mixed-Ionic-Electronic-Conduction-Based Access Devices
Padilla, Alvaro
/ Burr, Geoffrey W.
/ Shenoy, Rohit S.
et al.
| 2015
972
Refined Conformal Mapping Model for MOSFET Parasitic Capacitances Based on Elliptic Integrals
Hiblot, Gaspard
/ Rafhay, Quentin
/ Boeuf, Frederic
et al.
| 2015
980
A Comprehensive Study on the Frequency-Dependent Electrical Characteristics of Sm2 O3 MOS Capacitors
Kaya, Senol
/ Yilmaz, Ercan
et al.
| 2015
988
Impact of uniaxial strain on random telegraph noise in high-kappa/metal gate pMOSFETs
Po-Chin Huang
et al.
| 2015
988
Impact of Uniaxial Strain on Random Telegraph Noise in High- $k$ /Metal Gate pMOSFETs
Huang, Po-Chin
/ Chen, Jone F.
/ Tsai, Shih Chang
et al.
| 2015
994
Comparative Performance Analysis of the Dielectrically Modulated Full- Gate and Short-Gate Tunnel FET-Based Biosensors
Kanungo, Sayan
/ Chattopadhyay, Sanatan
/ Gupta, Partha Sarathi
et al.
| 2015
1002
Fully Inkjet Printed RF Inductors and Capacitors Using Polymer Dielectric and Silver Conductive Ink With Through Vias
McKerricher, Garret
/ Perez, Jose Gonzalez
/ Shamim, Atif
et al.
| 2015
1010
A 3-D Large Signal Model for Sheet Beam Traveling Wave Tubes
Xie, Wenqiu
/ Wang, Zi-Cheng
/ Luo, Jirun
et al.
| 2015
1017
Vane-Loaded Planar Helix Slow-Wave Structure for Application in Broadband Traveling-Wave Tubes
Swaminathan, Krithi
/ Zhao, Chen
/ Chua, Ciersiang
et al.
| 2015
1024
Linear Analysis of Helix Traveling-Wave Tubes With Nonnegligible Space Charge Using the Improved Helical-Harmonics Approximation
Mahmoudi, Ali
/ Kamarei, Mahmoud
/ Shahabadi, Mahmoud
et al.
| 2015
1032
Optimization of Klystron Designs Using Deterministic Sampling Methods
Tran, Hien
/ Lankford, George
/ Read, Michael E.
et al.
| 2015
1037
Comprehensive and Macrospin-Based Magnetic Tunnel Junction Spin Torque Oscillator Model-Part I: Analytical Model of the MTJ STO
Chen, Tingsu
/ Eklund, Anders
/ Iacocca, Ezio
et al.
| 2015
1045
Comprehensive and Macrospin-Based Magnetic Tunnel Junction Spin Torque Oscillator Model- Part II: Verilog-A Model Implementation
Chen, Tingsu
/ Eklund, Anders
/ Iacocca, Ezio
et al.
| 2015
1052
A Reconfigurable Low-Power BDD Logic Architecture Using Ferroelectric Single-Electron Transistors
Liu, Lu
/ Li, Xueqing
/ Narayanan, Vijaykrishnan
et al.
| 2015
1058
Series Stacked Multipath Inductor With High Self Resonant Frequency
Vanukuru, Venkata Narayana Rao
/ Chakravorty, Anjan
et al.
| 2015
1063
Modeling and Separate Extraction Technique for Gate Bias-Dependent Parasitic Resistances and Overlap Length in MOSFETs
Lee, Jungmin
/ Bae, Hagyoul
/ Hwang, Jun Seok
et al.
| 2015
1068
GaAsSb/InAlAs/InGaAs Tunnel Diodes for Millimeter Wave Detection in 220–330-GHz Band
Patrashin, Mikhail
/ Sekine, Norihiko
/ Kasamatsu, Akifumi
et al.
| 2015
1072
TCAD-Based Simulation Method for the Electrolyte–Insulator–Semiconductor Field-Effect Transistor
Choi, Bongsik
/ Lee, Jieun
/ Yoon, Jinsu
et al.
| 2015
1076
2015 IEEE international reliability physics symposium
| 2015
C1
Table of contents
| 2015
C2
IEEE Transactions on Electron Devices publication information
| 2015
C3
IEEE Transactions on Electron Devices information for authors
| 2015
C4
Blank page
| 2015
AlN/Si-based CMOS compatible surface acoustic wave filter with -12.8-dB minimum insertion loss
Kaletta, U.C
et al.
| 2015