IEEE Transactions on Nuclear Science
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Table of contents
- 361
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Table of Contents| 2024
- 364
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Editorial Conference Summary by the General ChairFleetwood, Dan / Avery, Keith et al. | 2024
- 367
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Special NSREC 2023 Issue of the IEEE Transactions on Nuclear Science Editor CommentsFleetwood, Dan / Quinn, Heather / Moss, Steven et al. | 2024
- 368
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Nsrec 2023 Special Issue of the IEEE Transactions on Nuclear Science List of ReviewersFleetwood, Dan et al. | 2024
- 370
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2023 IEEE Nuclear and Space Radiation Effects Conference Awards: Comments by the ChairFleetwood, Dan et al. | 2024
- 372
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Outstanding Conference Paper Award: 2023 IEEE Nuclear and Space Radiation Effects ConferenceFleetwood, Dan et al. | 2024
- 375
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In Memoriam Clyde Combs, Jr.Fleetwood, Dan et al. | 2024
- 376
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In Memoriam Floyd CoppageFleetwood, Dan et al. | 2024
- 377
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Artificial Neural Networks for Space and Safety-Critical Applications: Reliability Issues and Potential SolutionsRech, Paolo et al. | 2024
- 405
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Origin of Post-Irradiation Vₜₕ-Shift Variability in 3-D NAND Memory ArrayKumar, Mondol Anik / Raquibuzzaman, Md / Buddhanoy, Matchima et al. | 2024
- 412
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Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory CellsBagatin, Marta / Gerardin, Simone / Paccagnella, Alessandro et al. | 2024
- 418
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Radiation-Induced Effects in SiC Vertical Power MOSFETs Irradiated at Ultrahigh DosesBonaldo, S. / Martinella, C. / Race, S. et al. | 2024
- 427
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Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETsBonaldo, Stefano / Wallace, Trace / Barnaby, Hugh et al. | 2024
- 437
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Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-Ionizing DosesXiong, Yoni / Pieper, Nicholas J. / Dodds, Nathaniel A. et al. | 2024
- 446
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Total Ionizing Dose Response of 128 Analog States in Computational Charge-Trap MemoryXiao, T. Patrick / Wilson, Donald / Bennett, Christopher H. et al. | 2024
- 454
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Radiation Response of Domain-Wall Magnetic Tunnel Junction Logic DevicesBennett, Christopher H. / Xiao, T. Patrick / Leonard, Thomas et al. | 2024
- 461
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Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO₂ Oxygen-Penetration LayersGuo, Zixiang / Zhang, En Xia / Chasin, A. et al. | 2024
- 469
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Impact of Back-Gate Bias and Body-Tie on the DSOI SRAMs Under Total Ionizing Dose IrradiationRen, Hongyu / Liu, Fanyu / Li, Bo et al. | 2024
- 477
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The Effects of Threshold Voltage and Number of Fins Per Transistor on the TID Response of GF 12LP TechnologyVidana, Aldo I. / Dodds, Nathaniel A. / Nowlin, R. Nathan et al. | 2024
- 485
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Analysis of SRAM PUF Integrity Under Ionizing Radiation: Effects of Stored Data and Technology NodeSurendranathan, Umeshwarnath / Wilson, Horace / Cao, Lei R. et al. | 2024
- 492
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Displacement and Transient Ionizing Synergistic Effects in μA741 Bipolar AmplifierWang, Chenhui / Li, Ruibin / Chen, Wei et al. | 2024
- 500
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On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICsD'Amico, Joseph V. / Vibbert, Sean T. / Cadena, Rick M. et al. | 2024
- 508
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Depth Dependence of Neutron-Induced Errors in 3-D NAND Floating Gate CellsGerardin, S. / Bagatin, M. / Paccagnella, A. et al. | 2024
- 515
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Single-Event Burnout in Vertical β-Ga₂O₃ Diodes With Pt/PtOₓ Schottky Contacts and High-k Field-Plate DielectricsIslam, S. / Senarath, A. S. / Farzana, E. et al. | 2024
- 522
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Single-Event Transient in Body-Contacted PDSOI Technology: Compact Modeling and Statistical Experimental CalibrationRostand, Neil / Lambert, Damien / Duhamel, Olivier et al. | 2024
- 535
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Contribution of Secondary Alpha Particles to Soft Error Rates in Space SystemsCadena, Rick M. / Warren, Kevin M. / Dodds, Nathaniel A. et al. | 2024
- 542
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Investigation of the Impact of Angles and Rotation of Low-Energy Protons in SRAM Cells Down to 16 nmArtola, L. / Glorieux, M. / Hubert, G. et al. | 2024
- 548
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Using Track Structure Theory to Predict Heavy-Ion Cross Sections From Neutron Data and Vice VersaHansen, D. L. / Resor, S. / Vermeire, B. et al. | 2024
- 555
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Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS DevicesFleetwood, Daniel M. / Zhang, En Xia / Schrimpf, Ronald D. et al. | 2024
- 569
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Neutron Displacement Damage in Bipolar Junction Transistors Isolated From an Integrated CircuitYoung, Joshua M. / Banerjee, Sneha / Ho, Le Thanh Triet et al. | 2024
- 579
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Heavy-Ion-Induced Displacement Damage Effects on WOx ECRAMMarinella, Matthew J. / Bennett, Christopher H. / Zutter, Brian et al. | 2024
- 585
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Analysis of Total Ionizing Dose Effects Using Electron HolographyChang, C. T. / Apsangi, P. / Muthuseenu, K. et al. | 2024
- 591
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Low-Frequency Noise and Deep Level Transient Spectroscopy in n-p-n Si Bipolar Junction Transistors Irradiated With Si IonsLuo, Xuyi / Montes, Jossue / Koukourinkova, Sabina D. et al. | 2024
- 599
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Global Ionizing Radiation Environment Mapping Using Starlink Satellite DataShah, Hamil / Van Cleave, Russell / McAlpine, William et al. | 2024
- 607
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Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA ImplicationsBilko, Kacper / Alia, Ruben Garcia / Aguiar, Ygor et al. | 2024
- 618
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NAIRAS Atmospheric and Space Radiation Environment ModelMertens, Christopher J. / Gronoff, Guillaume P. / Zheng, Yihua et al. | 2024
- 626
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Quantitative Laser Testing for Predicting Heavy-Ion SEE Response—Part 1: Metrics for Assessing Response AgreementIldefonso, Adrian / Hales, Joel M. / Khachatrian, Ani et al. | 2024
- 641
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Quantitative Laser Testing for Predicting Heavy-Ion SEE Response—Part 2: Accurately Determining Laser-Equivalent LETHales, Joel M. / Ildefonso, Adrian / Khachatrian, Ani et al. | 2024
- 654
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In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe TechniqueKing, M. P. / Beutler, J. / Smith, N. et al. | 2024
- 663
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SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET TechnologyQian, Ying / Pieper, Nicholas J. / Xiong, Yoni et al. | 2024
- 670
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Measuring Zero: Neutron Testing of Modern Digital ElectronicsQuinn, Heather / Tompkins, George et al. | 2024
- 680
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Under-Constrained SEE Data: Implications for Estimating and Bounding SEE RatesLadbury, R. et al. | 2024
- 690
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A Confidence-Based Approach to Include Survivors in a Probabilistic TID Failure AssessmentChampagne, Chloe A. / Sierawski, Brian D. / Ladbury, Raymond L. et al. | 2024
- 698
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Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron FluxesRatti, L. / Brogi, P. / Collazuol, G. et al. | 2024
- 710
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Effect of Proton Energy and Bias Conditions During Irradiation on CMOS Single-Photon Avalanche DiodesJouni, Ali / Malherbe, Victor / Mamdy, Bastien et al. | 2024
- 719
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Impact of Irradiation Temperature, Doping, and Proton Energy on InGaAs PhotodiodesBenfante, Marco / Reverchon, Jean-Luc / Virmontois, Cedric et al. | 2024
- 728
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Effects of High Fluence Particle Irradiation on Germanium-on-Silicon PhotodiodesOlantera, Lauri / Scarcella, Carmelo / Lalovic, Milana et al. | 2024
- 736
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Analysis of Optical Single-Event Transients in Integrated Silicon Photonics Mach–Zehnder Modulators for Space-Based Optical CommunicationsHosseinzadeh, Mozhgan / Teng, Jeffrey W. / Nergui, Delgermaa et al. | 2024
- 744
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Temperature Cycling Effects on Infrared Radiation-Induced Attenuation of Silica-Based Optical FibersRoche, M. / Morana, A. / Balcon, N. et al. | 2024
- 752
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Influence of Hydrogen on the Radiation-Induced Attenuation of Ge-Doped Optical FibersMorana, A. / Roche, M. / Marin, E. et al. | 2024
- 759
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Alpha Particle-Induced Persistent Effects in a COTS 3-D-Integrated CMOS ImagerHu, M. D. / McCurdy, M. W. / Sierawski, B. D. et al. | 2024
- 770
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Ultra-Large Silicon Diode for Characterizing Low-Intensity Radiation EnvironmentsBilko, Kacper / Alia, Ruben Garcia / Girard, Sylvain et al. | 2024
- 777
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Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode DetectorsBilko, Kacper / Alia, Ruben Garcia / Barbero, Mario Sacristan et al. | 2024
- 785
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Mitigation of Single-Event Upset Sensitivity for 6T SRAM in a 0.18 μm DSOI Technology Considering High LET Heavy Ions IrradiationWang, Yuchong / Chen, Siyuan / Liu, Fanyu et al. | 2024
- 793
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Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS TechnologyShen, Fan / Chen, Jianjun / Chi, Yaqing et al. | 2024
- 802
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In Situ Single-Event Effects Detection in 22-nm FDSOI Flip-FlopsAppels, Karel / Weigand, Roland / Dehaene, Wim et al. | 2024
- 809
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LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power DevicesSengupta, Arijit / Ball, Dennis R. / Sternberg, Andrew L. et al. | 2024
- 816
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Effects of Collector Profile on the SET Response of 130-nm High-Speed and High-Breakdown SiGe HBTsBrumbach, Zachary R. / Nergui, Delgermaa / Teng, Jeffrey W. et al. | 2024
- 823
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Comparing Digital Modulation Schemes in RF Receivers for Bit Errors Induced by Single-Event Transients in the Low-Noise AmplifierNergui, Delgermaa / Teng, Jeffrey W. / Brumbach, Zachary R. et al. | 2024
- 830
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SET-Induced Dropout and Recovery of Cross-Coupled and Differential-Colpitts Microwave Oscillators Using SiGe HBTsTeng, Jeffrey W. / Mensah, Yaw A. / Brumbach, Zachary R. et al. | 2024
- 839
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Single-Event Upset Cross Section at High Frequencies for RHBD Flip-Flop Designs at the 5-nm Bulk FinFET NodeXiong, Yoni / Pieper, Nicholas J. / Qian, Ying et al. | 2024
- 845
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Impact of High-Level Synthesis on Reliability of Artificial Neural Network Hardware AcceleratorsTraiola, Marcello / dos Santos, Fernando Fernandes / Rech, Paolo et al. | 2024
- 854
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Tensor Processing Unit Reliability Dependence on Temperature and Radiation SourceBodmann, Pablo R. / Rech, Paolo et al. | 2024
- 861
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Temperature Dependence of Critical Charge and Collected Charge in 5-nm FinFET SRAMPieper, Nicholas J. / Xiong, Yoni / Pasternak, John et al. | 2024
- 869
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MOLLER Spectrometer Magnet Design With Measured Mechanical Properties of Irradiated S2-Glass Reinforced Cyanate Ester Resin at Elevated TemperatureGopinath, S. / Sun, E. / Frey, W. et al. | 2024
- 876
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Spectrum Construction Methods Improving Gamma-Ray Detection Efficiency for Pixelated CZT DetectorsXiang, Yu / Jiang, Xiaopan / Feng, Baotong et al. | 2024
- 884
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Simulation Design of a New MCP-PMT With Large Photocathode Area and High Time ResolutionChen, Lin / Luo, Ting / Wang, Xingchao et al. | 2024
- 888
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Design and Implementation of a High-Voltage Radiation-Hard Hall Switch SensorLi, Guofeng / Zhang, Shuo / Yin, Longjing et al. | 2024
- 895
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Soft Error Tolerant Bandgap Reference Utilizing Single-Event Transient Filtering TechniqueLiu, Jingtian / Wang, Dongsheng / Liang, Bin et al. | 2024
- 902
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Heavy-Ion Radiation Effects in AlGaN/GaN High-Electron-Mobility TransistorsGao, Han / Asadi, Reza Farsad / Wang, Menglin et al. | 2024
- 912
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Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMsDeng, Yifan / Watanabe, Yukinobu / Manabe, Seiya et al. | 2024
- 921
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Composition and Spectral Characterization of Mixed-Radiation Fields With Enhanced Discrimination by Quantum Imaging DetectionGranja, C. / Solc, J. / Gajewski, J. et al. | 2024
- 932
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Characterization of a 28 nm CMOS Technology for Analog Applications in High Energy PhysicsTraversi, G. / Gaioni, L. / Ratti, L. et al. | 2024
- 941
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Versatile XLM72S Logic Module for Real-Time Event Filtering in Multidetector Systems: Implementation in Compton-Suppressed Gamma-Ray SpectroscopyMartin, M. S. / Badanage, M. D. H. K. G. / Asch, H. et al. | 2024
- 947
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IEEE Nuclear Science Symposium| 2024
- 948
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Introducing IEEE Collabratec| 2024
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Front Cover| 2024
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IEEE Transactions on Nuclear Science publication information| 2024
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IEEE Transactions on Nuclear Science information for authors| 2024
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2024