Vacuum
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Table of contents
- 749
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Development of a new ionization gauge with Bessel Box type energy analyzerAkimichi, H. et al. | 1995
- 753
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Performance of reflector-carrying floats in mercury manometersAlasia, F. et al. | 1995
- 757
-
Some experiments on synchrotron radiation induced desorption at MAXAndersson, Å et al. | 1995
- 763
-
Gas flowrate measurements for leak calibrationBergoglio, M. et al. | 1995
- 767
-
Mass spectrometer system for in-vivo monitoring of gas exchange in plantsBohátka, S. et al. | 1995
- 767
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Mass spectrometer system for in-vivo monitoring of gas and exchange in plantsBohatka, S. / Langer, G. / Simon, M. et al. | 1995
- 769
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Mass spectrometric evaluation of the desorption properties of some glasses under high applied voltage conditionsCarretti, C. et al. | 1995
- 773
-
Performance of a rotating disc vacuum gauge in transitional and viscous flow regimesChew, A.D. et al. | 1995
- 777
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Ultra high vacuum technology applied for the design of warm EBIS or EBIT ion sourcesCongretel, G. et al. | 1995
- 781
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X-ray examination of liquid metal ion sourcesCzarczynski, W. et al. | 1995
- 785
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Vacuum requirements in high power microwave tubesDammertz, G. et al. | 1995
- 789
-
Reduction of water adsorption on technical surfaces in the atmosphereDobrozemsky, R. et al. | 1995
- 793
-
Rotary vane and roots pumps backed by diaphragm pumps -- Progress in corrosive applications and clean vacuum requirementsEckle, F.J. et al. | 1995
- 797
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Vacuum system for LHCGröbner, O. et al. | 1995
- 803
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Developments in the vacuum systems of AGS-RHICHseuh, H.C. et al. | 1995
- 811
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Helium leak testing on the steam condensator of a turbineHulek, Z. et al. | 1995
- 813
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Vacuum system of heavy ion isochronous cyclotron U-400MIvanenko, A.I. et al. | 1995
- 817
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A study of uncertainties at calibration of vacuum gaugesJenko, B. et al. | 1995
- 821
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Convenient primary gas flow meterJitschin, W. et al. | 1995
- 825
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Arc sources of metallic plasma for coatings in vacuum and for high speed vacuum pumpingKarpov, D. et al. | 1995
- 827
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Reduction of outgassing from silver alloy contacts surface by Au electroplated layer for use in hermetic relaysKoller, L. et al. | 1995
- 831
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Study of intergranular phase in alumina ceramicsKosmos, A.S. et al. | 1995
- 835
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Spinning rotor gauge for operation at free spatial orientationLindenau, B.E. et al. | 1995
- 839
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Vacuum insulating panelNemanic, V. et al. | 1995
- 843
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A model for diffusive gas flow through narrow channelsNorberg, P. et al. | 1995
- 845
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Leak rate measurements for large vacuum chambersNuss, H.E. et al. | 1995
- 849
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Stainless steel outgassing due to deformationRepa, P. et al. | 1995
- 853
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Vacuum system of the Dubna heavy ion storage ring facility K4-K10Rodin, A.M. et al. | 1995
- 859
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A series of high capacity turbomolecular pumps with pumping speed up to 40 m3 s-1Saksagansky, G.L. et al. | 1995
- 863
-
Numerical modelling of the molecular and transitional flow regimes in vacuum componentsScherer-Abreu, G. et al. | 1995
- 867
-
Layout and design of the vacuum system for the cooler synchrotron COSY at JuelichStechemesser, H. / Vau, V. et al. | 1995
- 867
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Layout and design of the vacuum system for the cooler synchrotron COSY at JülichStechemesser, H. et al. | 1995
- 871
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Application of a QMG-420 mass spectrometer for high temperature studiesStolyarova, V.L. et al. | 1995
- 875
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Conductance of orifices in the spherical and cylindrical chambers of calibration systemsSzwemin, P.J. et al. | 1995
- 879
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Refrigerator cryopump with a simple oil-free roughing pumpTimm, U. et al. | 1995
- 883
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Photoacoustic thermal characterization of a semiconductor (CdTe)-glass two layer systemAlvarado-Gil, J.J. et al. | 1995
- 887
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ALE deposition of indium tin oxide thin filmsAsikainen, T. et al. | 1995
- 889
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Elemental composition and structural properties of thin rf sputtered Ta2O5 layersAtanassova, E. et al. | 1995
- 893
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The role of Ru in improving Schottky and ohmic contacts to InPBarnard, W.O. et al. | 1995
- 899
-
Arsenic ion beam induced mixing in Ta-Pd thin film on siliconBibic, N. et al. | 1995
- 899
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Arsenic ion beam induced mixing in Ta/Pd thin films on siliconBibic, N. / Jafri, Z.H. / Milosavljevic, M. et al. | 1995
- 903
-
Elementary steps of the interaction of C:H film surfaces with thermal H-D atomsBiener, J. et al. | 1995
- 907
-
Field emission and surface conditioningBonin, B. et al. | 1995
- 913
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B-doped Si(001)2 x 1 gas-source molecular-beam epitaxy from Si~2H~6 and B~2~6Bramblett, T. R. / Lu, Q. / Karasawa, T. et al. | 1995
- 913
-
B-doped Si(001)2 x 1 gas-source molecular-beam epitaxy from Si 2)H6 and B2H6Bramblett, T.R. et al. | 1995
- 917
-
Raman studies of the ternary semiconducting ZnxCd1-xSe systemCastillo-Alvarado, F.L. et al. | 1995
- 919
-
The modification of alloys by low energy ion-assisted depositionColligon, J.S. et al. | 1995
- 923
-
Scanning electrical resistometry (SER) of Cr thin film oxidationCvelbar, A. et al. | 1995
- 927
-
Synthesis of zirconium nitride films monitored by in situ soft X-ray spectrometryDauchot, J.P. et al. | 1995
- 931
-
Simulation of thin film growth and in situ characterization by RHEED and photoemissionRouhani, M.Djafari et al. | 1995
- 935
-
New effective medium models and their applicationsDligatch, S. et al. | 1995
- 939
-
Growth of tantalum oxide and lithium tantalate thin films by molecular beam epitaxyGitmans, F. et al. | 1995
- 943
-
Microstructural properties of amorphous silicon alloys deposited by dc magnetron sourceGracin, D. et al. | 1995
- 947
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SiGe-Si quantum wells with abrupt interfaces grown by atmospheric pressure chemical vapor depositionGrützmacher, D.A. et al. | 1995
- 951
-
Phase formation in the N-B-Ti systemGuzman, L. et al. | 1995
- 955
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Scattered light investigation during LCVD of W from WF6-H 2)-Ar gas mixtureHeszler, P. et al. | 1995
- 959
-
Electrical behaviour of epitaxial A1-n-A10.25Ga0.75As junctions: Effect of the composition of undoped A1xGa 1-x)As cap layerHorváth, Zs J. et al. | 1995
- 963
-
Lateral distribution of Schottky barrier height: A theoretical approachHorváth, Zs J. et al. | 1995
- 967
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Growth and characterization of yttrium oxide thin layers on silicon deposited by yttrium evaporation in atomic oxygenHudner, J. et al. | 1995
- 971
-
Controlled topography production -- True 3D simulation and experimentJonsson, L.B. et al. | 1995
- 977
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Laser deposition of YBa2Cu3O7 films in a shadow regionJukna, A. et al. | 1995
- 979
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LPCVD silicon carbide and silicon carbonitride films using liquid single precursorsKleps, I. et al. | 1995
- 983
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Current-voltage anomalies in polycrystalline GdSi2-p-Si Schottky junctions due to grain boundariesKovács, B. et al. | 1995
- 987
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Atomic density changes in carbon due to carbon bombardmentLászló, J. et al. | 1995
- 991
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Laser reactive ablation deposition of TiC filmsLeggieri, G. et al. | 1995
- 997
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Physical characterization of In2Se3 thin films prepared by electron beam evaporationManno, D. et al. | 1995
- 1001
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Characterization of ZnO films prepared by dc reactive magnetron sputtering at different oxygen partial pressuresMeng, Li-Jian et al. | 1995
- 1005
-
SEM study of CRT screen propertiesMeznar, L.Z. et al. | 1995
- 1009
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Influence of arsenic ion implantation on the formation of Ti-silicidesMilosavljevic, M. et al. | 1995
- 1013
-
Structural studies on InP-GaAs heterostructures using multiple X-ray diffractionMorelhao, S.L. et al. | 1995
- 1017
-
Sustained self sputtering of different materials using dc magnetronPosadowski, W.M. et al. | 1995
- 1021
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Can epilayer tilt relieve misfit strain in lattice-mismatched heterostructures?Riesz, F. et al. | 1995
- 1025
-
Depth profiling of thin film heterostructure materials by secondary ion mass spectrometryRistolainen, E.O. et al. | 1995
- 1031
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Improvement of tribological properties of tool steels implanted with C+TiRomán, E. et al. | 1995
- 1035
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Microstructural study of epitaxially grown rhodium model catalyst particlesRupprechter, G. et al. | 1995
- 1041
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Spatially resolved microanalysis of thin films in the transmission electron microscopeSchenner, M. et al. | 1995
- 1043
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Interdiffusion effects in high-Tc superconducting structures by Auger electron spectroscopySeibt, E.W. et al. | 1995
- 1049
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Möss PAC: A UHV-system for surface and thin film investigations using nuclear probesSemple, M. et al. | 1995
- 1049
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Moess PAC: A UHV-system for surface and thin film investigations using nuclear probesSemple, M. / Min, P. / Hjoervarsson, B. et al. | 1995
- 1053
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In situ monitoring of HFCVD diamond growth on nickel using soft X-ray emission spectrocopySkytt, P. et al. | 1995
- 1053
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In situ monitoring of HFCVD diamond growth on nickel using soft X-ray emission spectroscopySkytt, P. / Johansson, E. / Carlsson, J.-O. et al. | 1995
- 1055
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Mobility variations in semiconducting Ag2Se layersSomogyi, K. et al. | 1995
- 1059
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Growth kinetics of refractory-metal thin films sputtered by r.f.-d.c. coupled magnetron sputtering in Ar or Ne gas plasmaTanaka, T. et al. | 1995
- 1063
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Electron beam mixing of W1-xSix-Si multilayersVavra, I. et al. | 1995
- 1065
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Growth of epitaxial GexSi1-x for infrared detectors by UHV-CVDVyas, S. et al. | 1995
- 1071
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Structural properties of Ge implanted Si1-xGex layersXia, Z. et al. | 1995
- 1077
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Early-stage diffusion processes at Si-Me and Me-Me interfacesZalar, A. et al. | 1995
- 1083
-
Band gap shift in CdS: Phase transition from cubic to hexagonal on thermal annealingZelaya-Angel, O. et al. | 1995
- 1087
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Electrical characterization of sputter-deposition-induced defects in epitaxially grown n-GaAs layersAuret, F.Danie et al. | 1995
- 1091
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The interaction Of C60 with hydrogen plasmaBeardmore, K. et al. | 1995
- 1097
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Electron spectrocopy at Diamond (100) 2x1:H with a scanning tunnelling microscopeBusmann, Hans-Gerd et al. | 1995
- 1097
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Electron spectroscopy at Diamond (100) 2 x 1: H with a scanning tunnelling microscopeBusmann, H.-G. / Zimmermann-Edling, W. / Brenn, R. et al. | 1995
- 1101
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Scanning tunneling microscopy of carbon- and sulfur-induced modifications of Ni(111) and Ni(110) surfacesBäcker, R. et al. | 1995
- 1105
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Anisotropic X-ray anomalous diffraction and forbidden reflections in a-Fe2O3Carra, P. et al. | 1995
- 1105
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Anisotropic X-ray anomalous diffraction and forbidden reflections in -Fe~2O~3Carra, P. / Thole, B. T. et al. | 1995
- 1109
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Water adsorption on graphite (0001)Chakarov, D.V. et al. | 1995
- 1113
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Fe-V superlattices: X-ray and neutron-scattering investigationsChristensen, M.J. et al. | 1995
- 1117
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Simulation of sharp needle heating due to electron bombardmentCzarczynski, W. et al. | 1995
- 1121
-
Characterization of silicon oxynitride multilayered systems for passive radiative cooling applicationDiatezua, M.D. et al. | 1995
- 1125
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Magnetic circular dichroism in soft X-ray emissionDuda, L.-C. et al. | 1995
- 1127
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Development of medium energy ion scattering and magneto-optic Kerr effect apparatus for characterizing ultrathin magnetic filmsFowler, D.E. et al. | 1995
- 1133
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Electronic structure of multilayers: Nature of the magnetic interlayer interactionHimpsel, F.J. et al. | 1995
- 1137
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LEED I (V) analysis and STM of the Si(111)-Pb systemJones, A.H. et al. | 1995
- 1139
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Helpful effect of residual gases upon the thermal positive ion emission from metal surfaces heated in high vacuaKawano, H. et al. | 1995
- 1145
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Determination of the rates of both work function change and residual gas adsorption on a tungsten surface heated in a high vacuumKawano, H. et al. | 1995
- 1149
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Relationship between the residual gas pressure and the lowest temperature keeping metal surfaces essentially clean in high vacuaKawano, H. et al. | 1995
- 1151
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Surface reactivity of the borided Pd(111) with respect to hydrogen, ethyne and etheneKrawczyk, M. et al. | 1995
- 1155
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Position-sensitive atom probe study of precipitates in high speed steelLeisch, M. et al. | 1995
- 1159
-
Alkali core level binding energy shifts from buried interfaces between alkali films and metallic substances with different surface indexLundgren, E. et al. | 1995
- 1165
-
Chemical vapour deposition of Cr,Mo and W thin films induced by synchroton radiationMancini, D.C. et al. | 1995
- 1165
-
Chemical vapour deposition of Cr, Mo and W thin films induced by synchrotron radiationMancini, D.C. / Skytt, P. / Nordgren, J. et al. | 1995
- 1171
-
The use of elastic peak spectroscopy in depth profilingMenyhard, M. et al. | 1995
- 1173
-
The growth and diffusion of Ag on Fe(110)Noro, H. et al. | 1995
- 1177
-
Normal incidence grating spectrometer for inverse photoemissionOllonqvist, T.E. et al. | 1995
- 1181
-
On the electronic structure of vanadium: the angular resolved photoelectron spectroscopy of V(100) surfacePeric, B. / Valla, T. / Milun, M. et al. | 1995
- 1181
-
On the electronic structure of vanadium: The angular resolved photoelectron spectrocopy of V(100) surfacePeric, B. et al. | 1995
- 1185
-
Giant magnetoresistance in silver-based magnetic multilayersRodmacq, B. et al. | 1995
- 1187
-
Polarized neutrons in studies of films and magnetic multilayersSarkissian, B. et al. | 1995
- 1189
-
Reorientation of the magnetization and the Curie temperature of Ni-Cu(001) ultrathin filmsSchulz, B. et al. | 1995
- 1195
-
Molecular dynamics simulations of particle-surface interactionsSmith, R. et al. | 1995
- 1201
-
Effect of outgassing treatments on the surface reactivity of Rh-CeO2 catalysts: CO adsorptionSoria, J. et al. | 1995
- 1205
-
Multitechnique surface analysis system: Apparatus descriptionTeodoro, O.M.N.D. et al. | 1995
- 1211
-
Local magnetism and element specific susceptibility for Ni-Cu(100)Tischer, M. et al. | 1995
- 1215
-
Angle resolved photoemission on NiO: On the nature of the valence bandTjernberg, O. et al. | 1995
- 1219
-
Thermal stability of ESD of O+ ions ejected from TiO 2)(110)Torquemada, M.C. et al. | 1995
- 1223
-
Characterization of the 1 and 2 ML silver films on the V(100) surfaceValla, T. et al. | 1995
- 1227
-
A mass spectrometric method for probing surface structureStipdonk, M.J.Van et al. | 1995
- 1231
-
A synchrotron photoemission study of the reaction of iodine with GaAs(001)Varekamp, P.R. et al. | 1995
- 1233
-
A structural determination using magnetic X-ray circular dichroism in spin-polarized photoelectron diffractionWaddill, G.D. et al. | 1995
- 1237
-
A membrane reactor for permeation and catalytic reaction studiesWilzen, L. et al. | 1995
- 1241
-
Gas-surface interactionsWinkler, A. et al. | 1995
- 1243
-
ARXPS study of amorphous Fe40Ni40B20 ribbonsZemek, J. et al. | 1995
- 1247
-
Modification of the barrier to hydrogen dissociation on aluminium (110)Zhukov, V. et al. | 1995
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ForewordHårsta, A. et al. | 1995
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VACUUM DIARY| 1995
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VACUUM PRODUCT NEWS| 1995