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Volume 25,
Issue 5
Volume 25,
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Volume 25,
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Issue 1
Volume 24,
Issue 6
Volume 24,
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Volume 24,
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Volume 18,
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Volume 18,
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Volume 18,
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Volume 12,
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Volume 12,
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Volume 12,
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Volume 11,
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Volume 11,
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Volume 11,
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Volume 11,
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Volume 10,
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Volume 1,
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Table of contents
209
Measuring Beam Sizes and Ultra-Small Electron Emittances Using an X-ray Pinhole Camera
Elleaume, P.
/ Fortgang, C.
/ Penel, C.
et al.
| 1995
215
Evaluation of Charge-Injection Devices for Use in Laue Diffraction Imaging
Hanley, Q. S.
/ True, J. B.
/ Denton, M. B.
et al.
| 1995
229
A Mirror Furnace for Synchrotron Diffraction Experiments up to 1600K
Proffen, Th.
/ Frey, F.
/ Plöckl, H.
et al.
| 1995
233
The High-Pressure Phase of Zincite
Gerward, L.
/ Olsen, J. S.
et al.
| 1995
236
Use of Anomalous Diffraction, DAFS and DANES Techniques for Site-Selective Spectroscopy of Complex Oxides
Vacínová, J.
/ Hodeau, J. L.
/ Wolfers, P.
et al.
| 1995
245
A Brief Review of the History and Use of the Daresbury `Miyake' Monochromator for Surface Science
Norman, D.
et al.
| 1995
252
Utilization of Photoemission Cross-Section Effects for Monitoring Thin-Film Growth in UHV
Tucker, N. P.
/ Blyth, R. I. R.
/ White, R. G.
et al.
| 1995
256
Electronic Band Structure of Monolayer Bi on GaP(110)
Whittle, R.
/ Murphy, A.
/ Dudzik, E.
et al.
| 1995
261
Gd/W(110) Interface Formation Studied by W 4f Surface Core-Level Spectroscopy
White, R. G.
/ Blyth, R. I. R.
/ Tucker, N. P.
et al.
| 1995
264
Resonant Photoemission from Complex Cuprates and Nickelates
Flavell, W. R.
/ Hollingworth, J.
/ Howlett, J. F.
et al.
| 1995
274
New Commercial Products
| 1995