Applied Physics A
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 123
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Electrical properties and recombination activity of copper, nickel and cobalt in siliconIstratov, A.A. / Weber, E.R. et al. | 1998
- 137
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High quality GaAs quantum wires grown by flow rate modulation epitaxyHamoudi, A. / Ogura, M. / Wang, X.L. et al. | 1998
- 143
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Stochastic simulation of heat flow with application to laser–solid interactionsHoule, F.A. / Hinsberg, W.D. et al. | 1998
- 153
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Cylindrical spike model for the formation of diamondlike thin films by ion depositionHofsäss, H. / Feldermann, H. / Merk, R. et al. | 1998
- 183
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Crystalline SiC thin film deposition by laser ablation: influence of laser surface activationDiegel, M. / Falk, F. / Hergt, R. et al. | 1998
- 189
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Optical anisotropy in nonspherical quantum dotsTsitsishvili, E.G. et al. | 1998
- 193
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Grazing-incidence X-ray diffraction from multilayers, taking into account diffuse scattering from rough interfacesUlyanenkov, A. et al. | 1998
- 201
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Indium oxide thin-film holographic recorders grown by excimer laser reactive sputteringGrivas, C. / Gill, D.S. / Mailis, S. et al. | 1998
- 205
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A study of iso- and alio-valent cation doped Ag2SO4 solid electrolyteSingh, K. / Pande, S.M. / Anwane, S.W. et al. | 1998
- 205
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Anbsp;study of iso- and alio-valent cation doped Ag2SO4 solid electrolyte.Singh, K. et al. | 1998
- 217
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Characterization of (As.Te)1-xSex thin filmsHafiz, M.M. / Moharram, A.H. / Abu-Sehly, A.A. et al. | 1998
- 223
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Photoredox laser chemistry of transition metal oxidesOsman, J.M. / Bussjager, R.J. / Nash, F. et al. | 1998
- 229
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Photoconduction and polarization effects in anbsp;heat-treated Au-Pb2CrO5-SnO2 film device.Wishah, K.A. et al. | 1998
- 229
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Photoconduction and polarization effects in a heat-treated Au/Pb2CrO5/SnO2 film deviceWishah, K.A. / Abdul-Gader, M.M. et al. | 1998
- 229
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Photoconduction and polarization effects in a heat-treated Au/Pb~2CrO~5/SnO~2O film deviceWishah, K. A. / Abdul-Gader, M. M. et al. | 1998
- 235
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Effect of annealing on the optical properties of In2Te3 thin filmsHegab, N.A. / Bekheet, A.E. / Afifi, M.A. et al. | 1998
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AFM-tip-induced and current-induced local oxidation of silicon and metalsAvouris, Ph et al. | 1998
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Manipulation of C60 molecules on Cu(111) surfaces using a scanning tunneling microscopeCuberes, M.T. et al. | 1998
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Low-temperature manipulation of Ag atoms and clusters on a Ag(110) surface (61.16.Ch; 68.35.-p; 68.55.Jk)Li, J.T. et al. | 1998
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Ferroelectric domain switching in tri-glycine sulphate and barium-titanate bulk single crystals by scanning force microscopyEng, L.M. et al. | 1998
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STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo-Si multilayer by reactive ion etchingHartwich, J. et al. | 1998
- S689
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Indentation effects on atom manipulation on Si(111) surfaces investigated by STMHasunuma, R. / Komeda, T. / Tokumoto, H. et al. | 1998
- S695
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Scanning tunnelling spectroscopy of dangling-bond wiresfabricated on the Si(100)-2x1-H surfaceHitosugi, T. / Hashizume, T. / Heike, S. et al. | 1998
- S701
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STM-assisted manipulation of Ag nanoparticlesRadojkovic, P. / Schwartzkopff, M. / Gabriel, T. et al. | 1998
- S707
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Generation and analysis of nano-scale Al islands by STMHu, X. / Von Blanckenhagen, P. et al. | 1998
- S711
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Deposition of size-selected clusters at hyperthermal energies investigated by STMKaiser, B. / Bernhardt, T. M. / Rademann, K. et al. | 1998
- S715
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SPM-based nanofabrication using a synchronization techniqueSong, J. / Liu, Z. / Li, C. et al. | 1998
- S719
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Mechanism of tip-assisted migration and desorption of DNA base molecules on an SrTiO~3(100)-5 x 5 surfaceAkiyama, R. / Matsumoto, T. / Kawai, T. et al. | 1998
- S723
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Biomolecular approach to nanotube fabricationMertig, M. / Kirsch, R. / Pompe, W. et al. | 1998
- S729
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Multi-step process control and characterization of scanning probe lithographyPeterson, C. A. / Ruskell, T. G. / Pyle, J. L. et al. | 1998
- S735
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I(V) characteristics of one-dimnsional tunnel junction arrangementsVolmar, U. E. / Weber, U. / Houbertz, R. et al. | 1998
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Atom extraction from an MoS2 surface with a scanning tunnelling microscope: An ab initio studyCaulfield, J.C. et al. | 1998
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Supramolecular assembly of individual C60 molecules on a monolayer of 4, 4'-dimethylbianthrone moleculesCuberes, M.T. et al. | 1998
- S749
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Electric field effect and atomic manipulation process with the probe tip of a scanning tunneling microscopeBouju, X. / Devel, M. / Girard, C. et al. | 1998
- S753
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Nanostructure fabrication with a point contact formation between a gold tip and a Si(111)-(7 x 7) surface with an ultrahigh vacuum scanning tunneling microscopeFujita, D. / Sheng, H.-Y. / Dong, Z.-C. et al. | 1998
- S757
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Nanoprocessing of metastable nm-period multilayersGorbunov, A. A. / Richter, J. / Pompe, W. et al. | 1998
- S763
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AFM observation of surface reconstruction of C~6~0 single crystalsKim, Y. / Jiang, L. / Iyoda, T. et al. | 1998
- S767
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Formation of new terraces via diffusion induced by the field gradient in scanning tunneling microscopyMendez, J. / Gomez-Herrero, J. / Pascual, J. I. et al. | 1998
- S771
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Tungsten silicide formation on an STM tip during atom manipulationShimizu, T. / Kim, J.-T. / Tokumoto, H. et al. | 1998
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Nano-hole formation on gold surface using scanning tunnelling microscopeLebreton, C. et al. | 1998
- S783
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The stability of nanostructues fabricated on Si(111)-7 x 7 surfaceGao, J. / Yang, H. / Zhao, Y. et al. | 1998
- S787
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STM-induced formation of Ag islands on Ag(111)Freund, J. E. / Edelwirth, M. / Grimminger, J. et al. | 1998
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Field induced oxidation of silicon by SPM: Study of the mechanism at negative sample voltage by STM, ESTM and AFMAbadal, G. et al. | 1998
- S799
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AFM investigations for development of printed circuit boardsBreuer, N. / Dietrich, G. / Haubold, S. et al. | 1998
-
Scanning probe microscopy on new dental alloysReusch, B. et al. | 1998
- S809
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Atomic force microscope-based data storage: track servo and wear studyTerris, B. D. / Rishton, S. A. / Mamin, H. J. et al. | 1998
- S815
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Nanoscale evaluation of surface roughness of metal films prepared by laser ablationSumomogi, T. / Sakai, H. / Nakata, M. et al. | 1998
- S819
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Correction of surface roughness measurements in SPM imagingDongmo, S. / Vautrot, P. / Bonnet, N. et al. | 1998
- S825
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Nanoindentation on polycarbonate/polymethyl methacrylate BlendsDrechsler, D. / Karbach, A. / Fuchs, H. et al. | 1998
- S831
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Two-dimensional nanometer-scale calibration based on one-dimensional gratingsGarnaes, J. / Nielsen, L. / Dirscherl, K. et al. | 1998
- S837
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A metrological scanning force microscope used for coating thickness and other topographical measurementsBienias, M. / Gao, S. / Hasche, K. et al. | 1998
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Nanohardness measurements for studying local mechanical properties of metalsKempf, M. et al. | 1998
- S847
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Lateral metrology using scanning probe microscopes, 2D pitch standards and image processingJoergensen, J. F. / Jensen, C. P. / Garnaes, J. et al. | 1998
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Two-dimensional positioning of the scanning tunneling microscope stage using a crystal as a scale referenceKawakatsu, H. et al. | 1998
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Design and construction of a high-resolution 3D translation stage for metrological applicationsKoops, K.R. et al. | 1998
- S861
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A three-dimensional scanner for probe microscopy on the millimetre scaleMariani, T. / Frediani, C. / Ascoli, C. et al. | 1998
- S867
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Characterizing wear processes on orthopaedic materials using scanning probe microscopyCampbell, P. A. / O'Rourke, B. / Dawson, P. et al. | 1998
- S875
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Theoretical study of the resistance of short (Xe)~n wires within an STM junction: the (Xe)~2 casePizzagalli, L. / Joachim, C. / Bouju, X. et al. | 1998
- S879
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Force interaction in low-amplitude ac-mode atomic force microscopy: cantilever simulations and comparison with data from Si(111)7x7Erlandsson, R. / Olsson, L. et al. | 1998
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Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulationAnczykowski, B. et al. | 1998
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Influence of tip geometry on fractal analysis of atomic force microscopy imagesMannelquist, A. et al. | 1998
- S897
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Electron transport in ballistic electron emission microscopyMenegozzi, R. / Reinhard, P.-G. / Schulz, M. et al. | 1998
- S901
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A simple adsorbate model in STMBracher, C. / Riza, M. / Kleber, M. et al. | 1998
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Electric field effects in scanning tunneling microscope imagingStokbro, K. et al. | 1998
- S911
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Noise-compliant tip-shape derivationWilliams, P. M. / Davies, M. C. / Roberts, C. J. et al. | 1998
- S915
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Reconstruction of the surface topography by detected SNOM/PSTM signalsJin, Z. / Wang, K. / Huang, W. et al. | 1998
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Dynamical effective potential for tunneling: An exact matrix method and a path-integral techniqueNess, H. et al. | 1998
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A theory of the energy dependent STM image of a charge density waveSacks, W. et al. | 1998
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Nonlinear tip-sample interactions affecting frequency responses of microcantilevers in tapping mode atomic force microscopyHoummady, M. et al. | 1998
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Computer simulations: Subwavelength resolution with an apertureless SNOMFreymann, G.v. et al. | 1998
- S947
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Scanning tunneling microscopy of the GaN(0001) surfaceSmith, A. R. / Feenstra, R. M. / Greve, D. W. et al. | 1998
- S953
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In situ observation of thermal annealing processes of nanoholes on Si(111) 7 x 7Kraus, A. / Hildebrandt, S. / Kulla, R. et al. | 1998
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Ordering in ternary compound semiconductors studied with cross-sectional scanning tunneling microscopyHeinrich, A.J. et al. | 1998
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Imaging insulating oxides by elevated-temperature STMCastell, M.R. et al. | 1998
- S969
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STM study of the initial oxidation stage of Ge(100) 2 x 1Fukuda, T. / Ogino, T. et al. | 1998
- S973
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Photovoltaic characterization of semiconductors with STMHagen, T. / Graftstroem, S. / Kowalski, J. et al. | 1998
- S977
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STM measurements of barrier height on Si(111)-7 x 7 and GaAs(110) cleaved surfaces using I(z), z(V) and I(z(V),V) techniquesGrandidier, B. / Nys, J. P. / Stievenard, D. et al. | 1998
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Role of Na in the promotion of the Ge(111) surface oxidationJeon, D. et al. | 1998
- S985
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STM observation of the atomic hydrogen interaction with the Si(111) 31 x 31-In surfaceKatayama, M. / Numata, T. / Kubo, O. et al. | 1998
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Monatomic step structure on the Si(001) surfaceKoo, J.-Y. et al. | 1998
- S993
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A UHV STM for in situ characterization of MBE/CVD growth on 4-inch wafersLeifield, O. / Mueller, B. / Gruetzmacher, D. A. et al. | 1998
- S999
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Topographical and structural investigations of phosphorous-doped silicon filmsSorschag, K. / Gold, H. / Lutz, J. et al. | 1998
- S1003
-
STM study of room temperature adsorption of Au on the Si(111)-(7 x 7) surface: evidence for the reaction of Au atoms with Si rest atomsChizhov, I. / Lee, G. / Willis, R. F. et al. | 1998
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Imaging of dopants in surface and sub-surface layers of the transition metal dichalcogenides WS2 and WSe2 by scanning tunneling microscopyMatthes, Th W. et al. | 1998
- S1013
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Self-organized network structure appearing in the B/Si(111)-(3 x 3)R30^- phase formation process studiedby scanning tunneling microscopyMiyake, K. / Shigekawa, H. et al. | 1998
- S1017
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STM observations of hydrogen-induced Pb clustering on Pb/Si(111) systemsOhba, Y. / Katayama, I. / Watamori, M. et al. | 1998
- S1021
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Thermal decomposition of tetraethoxysilane (TEOS) on Si(111)-(7 x 7)Spitzmueller, J. / Braun, J. / Rauscher, H. et al. | 1998
- S1025
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The role of antiphase domain boundaries in Si epitaxy by ultrahigh vacuum chemical vapor deposition from SiH~4 or SiH~2Cl~2 on Si(100)-(2 x 1)Spitztmueller, J. / Fehrenbacher, M. / Haug, F. et al. | 1998
- S1031
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Strain-induced formation of self-assembled nanostructures in the epitaxial growth of InAs and GaAs on InP(001)Robach, Y. / Phaner, M. / Soleere, A. et al. | 1998
- S1035
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Ambient AFM observations of the crater formation in InAs quantum dots on GaAs (001) vicinal surfaces after evaporation in UHVNakamura, A. / Titkov, A. N. / Ichida, M. et al. | 1998
- S1039
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Growth and transport of structure-controlled hydrogenated Si clusters for deposition on solid surfacesWatanabe, M. O. / Kanayama, T. et al. | 1998
- S1043
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STM observation of nickel silicides on Si(001)Yoshimura, M. / Ono, I. / Ueda, K. et al. | 1998
- S1047
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STM observation of Sn overlayers on Si(111)Yoshimura, M. / An, B. / Yokogawa, K. et al. | 1998
- S1051
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STM study of the interaction of atomic hydrogen with the Sn/Si(111) surfaceYoshimura, M. / An, B. / Yokogawa, K. et al. | 1998
- S1055
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Tunneling spectroscopic study of InAs-covered GaAs under laser irradiationTakahashi, T. / Yoshita, M. / Kamiya, L. et al. | 1998
- S1059
-
Surface potentials on Pd/GaAs contacts studied using scanning probe microscopyNie, H.-Y. / Masai, J. et al. | 1998
-
Analysis of electrical breakdown failures by means of SFM-based methodsBorn, A. et al. | 1998
- S1067
-
The effect of germane variation on microstructure in polycrystalline Si/Si~1~-~xGe~x thin films grown by rapid thermal chemical vapour deposition: fractal characterisation using scanning probe microscopyCampbell, P. A. / Walmsley, D. G. / Chong, R. L. F. et al. | 1998
-
STM study of epitaxial Dy silicides on Si(11 1) and Si(001) using ultra-sharp tips prepared by ion bombardmentKalka, T. et al. | 1998
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Domain boundaries on a Si(111) - 7 x 7 surface observed by an ultrahigh vacuum scanning tunneling microscopeYang, H.Q. et al. | 1998
- S1083
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An AFM-based surface oxidation process for heavily carbon-doped p-type GaAs with a hole concentration of 1.5 x 10^2^1 cm^-^3Shirakashi, J.-I. / Matsumoto, K. / Konagai, M. et al. | 1998
- S1089
-
Ex-situ atomic force microscopy studies of vicinal surfaces GaAs(001) grown by molecular beam epitaxyLelarge, F. / Laruelle, F. / Etienne, B. et al. | 1998
- S1095
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Metal dot structure buried in semiconductor quantum wires fabricated by STM electrically induced modificationsYamada, S. / Kikutani, T. / Aoki, N. et al. | 1998
- S1101
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In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline siliconFlewitt, A. J. / Froggatt, M. W. D. / Milne, W. I. et al. | 1998
- S1107
-
Long-range interaction between adatoms at the Cu(111) surface imaged by scanning tunnelling microscopyWahlstroem, E. / Ekvall, I. / Olin, H. et al. | 1998
- S1113
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Formation of mesostructures at the surface of ferritic steel and a nickel monocrystal under increasing load - an in situ AFM experimentMeissner, O. / Schreiber, J. / Schwab, A. et al. | 1998
- S1117
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Initial growth of Fe on Au(100): preferential nucleation, place exchange and enhanced mass transportHernan, O. S. / Gallego, J. M. / Vazquez de Parga, A. L. et al. | 1998
- S1121
-
Electronic structure of Gd and Tb on W(110) in the submonolayer coverage regime studied by STM and STSPascal, R. / Zarnitz, C. / Toedter, H. et al. | 1998
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Steps on the Au-Cu(111) surface studied by local work function measurement with STMJia, J.F. et al. | 1998
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The observation and new mechanism of an anomalous superperiod on a HOPG surfaceJin, Z. et al. | 1998
- S1133
-
Morphology of Ag(100) thin films on Fe/GaAs(100) substrates; the influence of film thickness and annealing processes studied by scanning tunneling microscopyLoesch, J. / Leinenbach, P. / Memmert, U. et al. | 1998
- S1137
-
Surface morphology of ion-irradiated Fe filmsAvasthi, D. K. / Ghosh, S. / Ganesan, V. et al. | 1998
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Atomically resolved AFM investigations of an amorphous barium silicate surfaceRaberg, W. et al. | 1998
- S1147
-
Heavy-ion induced modification of lithium fluoride observed by scanning force microscopyMueller, A. / Neumann, R. / Schwartz, K. et al. | 1998
- S1151
-
Scanning force microscopy on heavy-ion tracks in muscovite mica: track diameter versus energy loss and loading forceAckermann, J. / Mueller, A. / Neumann, R. et al. | 1998
- S1155
-
Lattice disorder and density of states change of graphite surface by single ion impactOgiso, H. / Mizutani, W. / Nakano, S. et al. | 1998
- S1159
-
Roughness transitions of diamond(100) induced by hydrogen-plasma treatmentKoslowski, B. / Strobel, S. / Wenig, M. J. et al. | 1998
- S1165
-
Atomic-scale structures of ceramic surfaces: reconstructions of TiO~2 (110)Wagner, M. / Bonnell, D. A. / Ruehle, M. et al. | 1998
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Identifying conducting phase from the insulating matrix in percolating metal-insulator nanocomposites by conducting atomic force microscopyLuo, E.Z. et al. | 1998
- S1175
-
Atomic force microscopy characterization of sputtered vanadium oxide thin films grown on Al~2O~3 substrateCricenti, A. / Girasole, M. / Generosi, R. et al. | 1998
-
Low-temperature magnetic force microscopy of colossal magnetoresistive filmsChen, C.-C. et al. | 1998
- S1185
-
Optimization of lateral resolution in magnetic force microscopyPorthun, S. / Abelmann, L. / Vellekoop, S. J. L. et al. | 1998
- S1191
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Ultrahigh vacuum magnetic force microscopy on in situ grown iron thin filmsLeinenbach, P. / Loesch, J. / Memmert, U. et al. | 1998
- S1195
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Morphology and electronic structure of Gd wires studied with scanning tunneling microscopyMuehlig, A. / Guenther, T. / Bauer, A. et al. | 1998
- S1199
-
Variable temperature STM and Kerr studies of ultrathin films of Co on Au(111): from self-organized clusters to continuous filmsPadovani, S. / Molinas-Mata, P. / Scheurer, F. et al. | 1998
- S1205
-
Correlation between magnetic properties and surface structure observed by scanning tunnelling microscopy in Tb epitaxial thin filmsKalinowski, R. / Baczewski, L. T. / Baran, M. et al. | 1998
-
Ultra-high-vacuum magnetic force microscopy of the domain structure of ultra-thin Co filmseyer, M. et al. | 1998
- S1213
-
Temperature-dependent vacuum tunneling spectroscopy of rare-earth manganates showing colossal magnetoresistance and charge orderingBiswas, A. / Raychaudhuri, A. K. / Arulraj, A. et al. | 1998
- S1219
-
YBa~2Cu~3O~7~-~ single crystals revisited: Scanning probe data on very pure samples grown in BaZrO~3 cruciblesHubler, U. / Jess, P. / Lang, H. P. et al. | 1998
- S1223
-
Screw-like structures in ex situ Tl~2Ba~2CuO~6 filmsErts, D. / Ivanov, Z. G. / Olin, H. et al. | 1998
- S1229
-
Adsorption of 1,13-tetradecadiene on St(111)7 x 7 studied by STM: possible electrostatic interactions between the aliphatic chain and the surfaceShachal, D. / Manassen, Y. et al. | 1998
- S1233
-
Investigation of morphologies and nanostructures of polymer blends by tapping mode phase imagingThomann, Y. / Cantow, H.-J. / Bar, G. et al. | 1998
- S1237
-
Investigation of laser-induced effects in molecular layers by scanning tunneling microscopyGrafstroem, S. / Schuller, P. / Kowalski, J. et al. | 1998
- S1241
-
Intermolecular electrical conductance in self-assembled monolayersInoue, A. / Mizutani, W. / Ishida, T. et al. | 1998
- S1245
-
Triple-chain phospholipid monolayers: a scanning force microscopy and grazing incidence X-ray diffraction studyLeporatti, S. / Akari, S. / Bringezu, F. et al. | 1998
- S1251
-
Scanning-force microscopy study of surface morphology and frictional properties of synthetic lubricant assemblies on a substrateMasai, J. / Shibata-Seki, T. / Murayama, H. et al. | 1998
- S1257
-
Phase separation of a self-assembled monolayer made from hydrocarbon-fluorocarbon disulfideMizutani, W. / Ishida, T. / Yamamoto, S.-I. et al. | 1998
- S1261
-
Monolayers of asymmetrical diethylalkanoat disulfides on gold(111): the influence of chain length difference on atomic force microscope imagesNelles, G. / Schoenherr, H. / Vancso, G. J. et al. | 1998
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Qualitative relationships describing height and phase images of tapping mode atomic force microscopy. An application to micro-contact-printed patterned self-assembled monolayersWhangbo, M.H. et al. | 1998
- S1271
-
Adhesive force mapping of friction-transferred PTFE film surfaceSuzuki, H. / Mashiko, S. et al. | 1998
-
Lateral force microscope and phase imaging of patterned thiol self-assembled monolayer using chemically modified tipsSasaki, K. et al. | 1998
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Photon stimulated intermolecular interaction of solid C60 and C84Kasuya, A. et al. | 1998
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AFM study of polymer lubricants on hard disk surfacesBao, G.W. et al. | 1998
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Nanostructure fabrication with a point contact formation between a gold tip and a Si(111)-(7 x 7) surface with an ultrahigh vacuum scanning tunneling microscope (68.35; 73.30)Fujita, D. et al. | 1998
-
Noise-compliant tip-shape derivation (87.64.D; 82.30.wt)Williams, P.M. et al. | 1998
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Reconstruction of the surface topography by detected SNOM-PSTM signals (42.80)Jin, Z. et al. | 1998
-
Photovoltaic characterization of semiconductors with STM (61.16.Ch; 73.25.+i; 73.50.Pz)Hagen, T. et al. | 1998
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STM observation of Sn overlayers on Si(111) (68.55)Yoshimura, M. et al. | 1998
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Heavy-ion induced modification of lithium fluoride observed by scanning force microscopy (07.79.Lh; 61.72.Ff; 61.80.Jh; 78.55.Fv)Müller, A. et al. | 1998
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Atomic force microscopy characterization of sputtered vanadium oxide thin films grown on Al2O3 substrate (61.16.Ch; 68.55.-a)Cricenti, A. et al. | 1998
-
Long-range interaction between adatoms at the Cu(111) surface imaged by scanning tunnelling microscopy (34.50.Dy; 73.20.At; 61.16.Ch)Wahlström, E. et al. | 1998
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Temperature-dependent vacuum tunneling spectroscopy of rare-earth manganates showing colossal magnetoresistance and charge ordering (07.79.Cz; 72.15.Gd; 71.30.+h)Biswas, A. et al. | 1998
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Screw-like structures in ex situ Tl2Ba2CuO6 films (74.70; 68.55; 61.16.Ch)Erts, D. et al. | 1998
-
Force interaction in low-amplitude ac-mode atomic force microscopy: Cantilever simulations and comparison with data from Si(111)7 x 7 (61.16.Ch; 89.64.Dz; 34.20.Cf)Erlandsson, R. et al. | 1998
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Formation of new terraces via diffusion induced by the field gradient in scanning tunneling microscopy (68.35; 82.65)Méndez, J. et al. | 1998
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Tungsten silicide formation on an STM tip during atom manipulation (61.16.Ch; 61.16.Fk; 66.30.Fq)Shimizu, T. et al. | 1998
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Scanning tunnelling spectroscopy of dangling-bond wiresfabricated on the Si(100)-2 x 1-H surface (73.20.At; 73.61.-r; 61.16.Ch; 68.35.Bs)Hitosugi, Taro et al. | 1998
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Scanning-force microscopy study of surface morphology and frictional properties of synthetic lubricant assemblies on a substrate (07.79.Lh; 68.55.JK; 81.40.pq)Masai, J. et al. | 1998
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Scanning force microscopy on heavy-ion tracks in muscovite mica: Track diameter versus energy loss and loading force (7.79.Sp; 61.80.Jh; 61.82.Ms)Ackermann, J. et al. | 1998
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Adhesive force mapping of friction-transferred PTFE film surface (68.35)Suzuki, H. et al. | 1998
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In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline silicon (68.55; 72.20; 81.10)Flewitt, A.J. et al. | 1998
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Self-organized network structure appearing in the B-Si(111)-((bent radical)3 x (bent radical)3)R30(degree) phase formation process studied by scanning tunneling microscopy (61.16.Ch; 68.35.Bs; 68.35.Rh)Miyake, K. et al. | 1998
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SPM-based nanofabrication using a synchronization technique (85.40.Ux; 07.79.-v)Song, Jiaqing et al. | 1998
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Mechanism of tip-assisted migration and desorption of DNA base molecules on an SrTiO3(100)-(bent radical)5 x (bent radical)5 surface (87.64.Dz; 61.16.Ch; 81.15.Ef)Akiyama, R. et al. | 1998
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Strain-induced formation of self-assembled nanostructures in the epitaxial growth of InAs and GaAs on InP(001) (61.16.Ch; 68.65.+g; 81.15.-z)Robach, Y. et al. | 1998
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Ambient AFM observations of the crater formation in InAs quantum dots on GaAs (001) vicinal surfaces after evaporation in UHV (61.16.Ch; 61.46.+w; 61.50.Cj)Nakamura, A. et al. | 1998
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STM observation of nickel silicides on Si(001) (68.55)Yoshimura, M. et al. | 1998
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Characterizing wear processes on orthopaedic materials using scanning probe microscopy (61.16.Ch; 68.35.Bs; 68.35.Ct)Campbell, P.A. et al. | 1998
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Surface potentials on Pd-GaAs contacts studied using scanning probe microscopy (07.79.-v; 73.30.+y; 73.40.Cg)Nie, H.-Y. et al. | 1998
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Phase separation of a self-assembled monolayer made from hydrocarbon-fluorocarbon disulfide (02.70.Lq; 61.16.Ch; 68.55.Nq)Mizutani, W. et al. | 1998
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Correlation between magnetic properties and surface structure observed by scanning tunnelling microscopy in Tb epitaxial thin films (75.70.Ak; 68.55.-a; 68.60.Dv)Kalinowski, R. et al. | 1998
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Adsorption of 1,13-tetradecadiene on Si(111)7 x 7 studied by STM: Possible electrostatic interactions between the aliphatic chain and the surfaceShachal, D. et al. | 1998
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Investigation of morphologies and nanostructures of polymer blends by tapping mode phase imaging (61.16.Ch; 61.41.+e; 81.20.Sh)Thomann, Y. et al. | 1998
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AFM investigations for development of printed circuit boards (68.35.B; 81.15.P; 81.65)Breuer, N. et al. | 1998
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A three-dimensional scanner for probe microscopy on the millimetre scale (07.79.Lh; 07.79.-v; 89.20.+a)Mariani, T. et al. | 1998
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Theoretical study of the resistance of short (Xe)n wires within an STM junction: The (Xe)2 case (61.16.Ch; 61.20.Lc; 72.80.-r)Pizzagalli, L. et al. | 1998
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Topographical and structural investigations of phosphorous-doped silicon films (68.35.Bs; 68.55.Jk; 72.20.Jv)Sorschag, K. et al. | 1998
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Atomic-scale structures of ceramic surfaces: Reconstructions of TiO2 (110) (61.16.Ch; 61.72.Ji; 81.05.Jc)Wagner, M. et al. | 1998
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Electronic structure of Gd and Tb on W(110) in the submonolayer coverage regime studied by STM and STS (73.20.At; 68.55.Jk; 61.16.Ch)Pascal, R. et al. | 1998
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Intermolecular electrical conductance in self-assembled monolayers (63.61.Ph; 85.15.Lm)Inoue, A. et al. | 1998
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A simple adsorbate model in STM (03.65.Nk; 61.16.Ch; 73.20.At)Bracher, C. et al. | 1998
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Scanning tunneling microscopy of the GaN(0001) surface (68.35.Bs; 68.55.Jk; 61.16.Ch)Smith, A.R. et al. | 1998
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In situ observation of thermal annealing processes of nanoholes on Si(11 1) 7 x 7 (61.16; 68.35; 68.90)Kraus, A. et al. | 1998
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Morphology of Ag(100) thin films on Fe-GaAs(100) substrates: The influence of film thickness and annealing processes studied by scanning tunneling microscopy (68.55.-a; 61.16.Ch)Lösch, J. et al. | 1998
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Lattice disorder and density of states change of graphite surface by single ion impact (61.80.Jh; 61.16.Ch)Ogiso, H. et al. | 1998
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Ex-situ atomic force microscopy studies of vicinal surfaces GaAs(001) grown by molecular beam epitaxy (81.15.Np; 68.35.Bs; 61.16.Ch)Lelarge, F. et al. | 1998
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Formation of mesostructures at the surface of ferritic steel and a nickel monocrystal under increasing load - An in situ AFM experiment (81.30; 61.55.F)Meissner, O. et al. | 1998
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The stability of nanostructures fabricated on Si(111)-7 x 7 surfaceGao, Juning et al. | 1998
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STM-induced formation of Ag islands on Ag(111) (87.64.Dz; 81.15.Np; 81.10.Aj)Freund, J.E. et al. | 1998
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Correction of surface roughness measurements in SPM imaging (07.79.-v; 06; 61.16.Ch)Dongmo, S. et al. | 1998
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Generation and analysis of nano-scale Al islands by STM (61.16.Di; 61.16.Fk; 68.35.Fx)Hu, Xiaoming et al. | 1998
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Deposition of size-selected clusters at hyperthermal energies investigated by STM (36.40.W; 34.50D; 79.20.R; 61.16.C)Kaiser, B. et al. | 1998
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STM study of the initial oxidation stage of Ge(100) 2 x 1 (61.16.-d; 68.35.Bs; 81.65.Mq; 82.65.My; 82.80.Pv)Fukuda, T. et al. | 1998
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Variable temperature STM and Kerr studies of ultrathin films of Co on Au(111): From self-organized clusters to continuous films (61.16.C; 75.70.Ak; 75.30.Pd; 75.60.Ej)Padovani, S. et al. | 1998
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YBa2Cu3O7-d single crystals revisited: Scanning probe data on very pure samples grown in BaZrO3 crucibles (61.16.Ch; 74.50.+r)Hubler, U. et al. | 1998
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Indentation effects on atom manipulation on Si(111) surfaces investigated by STM (61.16.Ch)Hasunuma, R. et al. | 1998
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Lateral metrology using scanning probe microscopes, 2D pitch standards and image processing (2.30.W; 06.20; 07.79)Jørgensen, J.F. et al. | 1998
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Triple-chain phospholipid monolayers: A scanning force microscopy and grazing incidence X-ray diffraction study (68.55; 68.55.Jk)Leporatti, S. et al. | 1998
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Roughness transitions of diamond(100) induced by hydrogen-plasmatreatment (61.16.Ch; 68.35.Ct; 52.75.Rx; 62.40.+i; 61.72.Hh)Koslowski, B. et al. | 1998
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Initial growth of Fe on Au(100): Preferential nucleation, place exchange and enhanced mass transport (61.16.Ch; 68.55.-a)Hernán, O.S. et al. | 1998
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Morphology and electronic structure of Gd wires studied with scanning tunneling microscopy (68.55; 73.20)Mühlig, A. et al. | 1998
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AFM observation of surface reconstruction of C60 single crystals (61.48.+c; 68.35.-p; 68.35.Bs)Kim, Y. et al. | 1998
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Nanoindentation on polycarbonate-polymethyl methacrylate Blends (87.64.Dz; 83.80.Es; 62.20.-x)Drechsler, D. et al. | 1998
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Monolayers of asymmetrical diethylalkanoat disulfides on gold(111): The influence of chain length difference on atomic force microscope images (68.45; 68.55)Nelles, G. et al. | 1998
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Electric field effect and atomic manipulation process with the probe tip of a scanning tunneling microscope (34.20.Cf; 61.16.Ch; 61.20.Le; 68.35.Bs)Bouju, X. et al. | 1998
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Nanoprocessing of metastable nm-period multilayers (61.16C; 68.65; 85.42)Gorbunov, A.A. et al. | 1998
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STM-assisted manipulation of Ag nanoparticles (61.16.Ch; 61.46.+w; 85.42.+m)Radojkovic, P. et al. | 1998
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Two-dimensional nanometer-scale calibration based on one-dimensional gratings (06.20; 07.79)Garnaes, J. et al. | 1998
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STM observations of hydrogen-induced Pb clustering on Pb-Si(111) systems (68.55.-a)Ohba, Y. et al. | 1998
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STM measurements of barrier height on Si(111)-7 x 7 and GaAs(110) cleaved surfaces using l(z), z(V) and I(z(V), V) techniques (61.16.Ch; 73.30.+y)Grandidier, B. et al. | 1998
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Multi-step process control and characterization of scanning probe lithography (85.42.+m)Peterson, C.A. et al. | 1998
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Growth and transport of structure-controlled hydrogenated Si clusters for deposition on solid surfaces (36; 61.46.+w; 81.20.-n)Watanabe, M.O. et al. | 1998
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STM observation of the atomic hydrogen interaction with the Si(111)(bent radical)31 x (bent radical)31-In surface (68.35.Bs; 34.50.Dy; 82.65.My)Katayama, M. et al. | 1998
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The effect of germane variation on microstructure in polycrystalline Si-Si1-xGex thin films grown by rapid thermal chemical vapour deposition: Fractal characterisation using scanning probe microscopy (61.43.Hv; 61.16.Ch; 68.35.Bs-Ct; 68.55.Jk)Campbell, P.A. et al. | 1998
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Investigation of laser-induced effects in molecular layers by scanning tunneling microscopy (61.16.Ch; 73.50.Pz; 73.61.Ph)Grafström, S. et al. | 1998
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l(V) characteristics of one-dimensional tunnel junction arrangements (73.40.Gk; 73.23.Hk)Volmar, U.E. et al. | 1998
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A UHV STM for in situ characterization of MBE-CVD growth on 4-inch wafers (07.79.C; 81.15.H)Leifeld, O. et al. | 1998
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STM study of the interaction of atomic hydrogen with the Sn-Si(111) surface (61.16.Ch; 75.30.Pd; 75.60.Ch)Yoshimura, M. et al. | 1998
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An AFM-based surface oxidation process for heavily carbon-doped p-type GaAs with a hole concentration of 1.5 x 1021 cm-3 (81.65.Cf; 81.65.Mq; 85.30.-z; 85.40.Ux)Shirakashi, J.-I. et al. | 1998
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Ultrahigh vacuum magnetic force microscopy on in situ grown iron thin films (75.60.Ch; 75.70.-i; 61.16.Ch)Leinenbach, P. et al. | 1998
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Electron transport in ballistic electron emission microscopy (73.50.-h; 07.79.-v)Menegozzi, R. et al. | 1998
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Atomic force microscope-based data storage: Track servo and wear study (07.09.Lh; 81.40.Pq)Terris, B.D. et al. | 1998
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A metrological scanning force microscope used for coating thickness and other topographical measurements (06)Bienias, M. et al. | 1998
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Biomolecular approach to nanotube fabrication (6855; 81.15; 87)Mertig, M. et al. | 1998
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Surface morphology of ion-irradiated Fe films (61.16.P; 34.50.H; 79.20.N)Avasthi, D.K. et al. | 1998
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Optimization of lateral resolution in magnetic force microscopy (07.79.P)Porthun, S. et al. | 1998
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Nanoscale evaluation of surface roughness of metal films prepared by laser ablation (06; 68.55; 81.15.z)Sumomogi, T. et al. | 1998
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Thermal decomposition of tetraethoxysilane (TEOS) on Si(111)-(7 x 7) (68.35.Bs; 68.35.Dv; 82.65.My)Spitzmüller, J. et al. | 1998
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The role of antiphase domain boundaries in Si epitaxy by ultrahigh vacuum chemical vapor deposition from SiH4 or SiH2Cl2 on Si(100)-(2 x 1) (68.35.Bs; 68.35.Dv; 81.15.Gh)Spitzmüller, J. et al. | 1998
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Tunneling spectroscopic study of InAs-covered GaAs under laser irradiation (61.16.Ch; 73.20.At; 78.66.-w)Takahashi, Takuji et al. | 1998
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STM study of room temperature adsorption of Au on the Si(l 11)-(7x7) surface: Evidence for the reaction of Au atoms with Si rest atomsChizhov, I. et al. | 1998
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Metal dot structure buried in semiconductor quantum wires fabricated by STM electrically induced modifications (07.79.-v; 72.15.-v; 75.70.-Kw)Yamada, S. et al. | 1998