The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
Issue 11
Volume 53,
Issue 10
Volume 53,
Issue 9
Volume 53,
Issue 8
Volume 53,
Issue 7
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
Issue 11
Volume 52,
Issue 10
Volume 52,
Issue 9
Volume 52,
Issue 8
Volume 52,
Issue 7
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
Issue 11
Volume 51,
Issue 10
Volume 51,
Issue 9
Volume 51,
Issue 8
Volume 51,
Issue 7
Volume 51,
Issue 6
Volume 51,
Issue 5
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 12
Volume 50,
Issue 11
Volume 50,
Issue 10
Volume 50,
Issue 9
Volume 50,
Issue 8
Volume 50,
Issue 7
Volume 50,
Issue 6
Volume 50,
Issue 5
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 12
Volume 49,
Issue 11
Volume 49,
Issue 10
Volume 49,
Issue 9
Volume 49,
Issue 8
Volume 49,
Issue 7
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
Issue 11
Volume 48,
Issue 10
Volume 48,
Issue 9
Volume 48,
Issue 8
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
1193
EDITORIAL - Changes in the Editorial Board
Verret, D
et al.
| 2010
1193
Changes in the Editorial Board
Verret, Doug
et al.
| 2010
1194
Change in Submission Procedure
Verret, Douglas
et al.
| 2010
1195
Compound Semiconductor Devices - A Study on Pre-Oxidation Nitrogen Implantation for the Improvement of Channel Mobility in 4H-SiC MOSFETs
Dhar, S
et al.
| 2010
1195
A Study on Pre-Oxidation Nitrogen Implantation for the Improvement of Channel Mobility in 4H-SiC MOSFETs
Dhar, Sarit
/ Sei-Hyung Ryu,
/ Agarwal, Anant K
et al.
| 2010
1201
On the Partial Filling of the Intermediate Band in IB Solar Cells
Luque, Antonio
/ Martí, Antonio
et al.
| 2010
1208
AlGaN/GaN/AlGaN DH-HEMTs Breakdown Voltage Enhancement Using Multiple Grating Field Plates (MGFPs)
Bahat-Treidel, Eldad
/ Hilt, Oliver
/ Brunner, Frank
et al.
| 2010
1217
Optoelectronics Display and Imaging - The Effect of the Vertical Load Distribution on the Luminance of a Plasma Display Panel
Kim, J-S
et al.
| 2010
1217
The Effect of the Vertical Load Distribution on the Luminance of a Plasma Display Panel
Jin-Sung Kim,
/ Jae-Yeon Won,
/ Hyuk-Jae Lee,
et al.
| 2010
1224
Array of Two UV-Wavelength Detector Types
Ngu, Yves
/ Peckerar, M C
/ Sander, D
et al.
| 2010
1230
Analysis of Dark Current Mechanisms for Split-Off Band Infrared Detectors at High Temperatures
Lao, Y F
/ Jayaweera, P V V
/ Matsik, Steven G
et al.
| 2010
1237
Single-Layer InAs Quantum Dots for High-Performance Planar Photodetectors Near 1.3 $\mu\hbox{m}$
Persano, Anna
/ Nabet, Bahram
/ Currie, Marc
et al.
| 2010
1237
Single-Layer InAs Quantum Dots for High-Performance Planar Photodetectors Near 1.3 Formula Not Shown
Persano, A.
/ Nabet, B.
/ Currie, M.
et al.
| 2010
1237
Single-Layer InAs Quantum Dots for High-Performance Planar Photodetectors Near 1.3 μm
Persano, A
et al.
| 2010
1237
Single-Layer InAs Quantum Dots for High-Performance Planar Photodetectors Near 1.3 micrometer
Persano, Anna
/ Nabet, Bahram
/ Currie, Marc
et al.
| 2010
1243
Strained-Silicon Heterojunction Bipolar Transistor
Persson, Stefan
/ Fjer, Mouhine
/ Escobedo-Cousin, Enrique
et al.
| 2010
1243
Silicon and Column IV Semiconductor Devices - Strained-Silicon Heterojunction Bipolar Transistor
Persson, S
et al.
| 2010
1253
Investigation of Back-Bias Capacitance Coupling Coefficient Measurement Methodology for Floating-Gate Nonvolatile Memory Cells
Beug, M Florian
/ Rafhay, Quentin
/ van Duuren, Michiel J
et al.
| 2010
1261
Fabrication and Characterization of Through-Substrate Interconnects
Wu, Joyce H
/ del Alamo, Jesús A
et al.
| 2010
1269
High Effective Gummel Number of CVD Boron Layers in Ultrashallow Formula Not Shown Diode Configurations
Sarubbi, F.
/ Nanver, L. K.
/ Scholtes, T. L.
et al.
| 2010
1269
High Effective Gummel Number of CVD Boron Layers in Ultrashallow p+n Diode Configurations
Sarubbi, F
et al.
| 2010
1269
High Effective Gummel Number of CVD Boron Layers in Ultrashallow $\hbox{p}^{+}\hbox{n}$ Diode Configurations
Sarubbi, Francesco
/ Nanver, Lis K
/ Scholtes, Tom L M
et al.
| 2010
1279
Contact Resistance Reduction Technology Using Aluminum Implant and Segregation for Strained p-FinFETs With Silicon–Germanium Source/Drain
Sinha, Mantavya
/ Lee, Rinus Tek Po
/ Eng Fong Chor,
et al.
| 2010
1287
A Novel Bottom Spacer FinFET Structure for Improved Short-Channel, Power-Delay, and Thermal Performance
Shrivastava, Mayank
/ Baghini, Maryam Shojaei
/ Sharma, Dinesh Kumar
et al.
| 2010
1295
Mobility and Velocity Enhancement Effects of High Uniaxial Stress on Si (100) and (110) Substrates for Short-Channel pFETs
Mayuzumi, Satoru
/ Yamakawa, Shinya
/ Kosemura, Daisuke
et al.
| 2010
1301
Performance and Area Scaling Benefits of FD-SOI Technology for 6-T SRAM Cells at the 22-nm Node
Changhwan Shin,
/ Min Hee Cho,
/ Tsukamoto, Yasumasa
et al.
| 2010
1310
Statistical Evaluation of Process Damage Using an Arrayed Test Pattern in a Large Number of MOSFETs
Watabe, Shunichi
/ Teramoto, Akinobu
/ Abe, Kenichi
et al.
| 2010
1319
LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide
Yan, Ran
/ Duane, Russell
/ Razavi, Pedram
et al.
| 2010
1327
Why the Universal Mobility Is Not
Cristoloveanu, Sorin
/ Rodriguez, Noel
/ Gamiz, Francisco
et al.
| 2010
1334
Compact and Distributed Modeling of Cryogenic Bulk MOSFET Operation
Akturk, A
/ Holloway, M
/ Potbhare, S
et al.
| 2010
1343
Understanding Strain-Induced Drive-Current Enhancement in Strained-Silicon n-MOSFET and p-MOSFET
Flachowsky, Stefan
/ Wei, Andy
/ Illgen, Ralf
et al.
| 2010
1355
Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure
Ming-Shing Chen,
/ Yean-Kuen Fang,
/ Feng-Renn Juang,
et al.
| 2010
1362
Performance Comparison of Silicon Steep Subthreshold FETs
Tura, Ahmet
/ Woo, Jason
et al.
| 2010
1369
Compact Modeling of Experimental n- and p-Channel FinFETs
Jooyoung Song,
/ Yu Yuan,
/ Bo Yu,
et al.
| 2010
1375
Silicon Devices - Investigation of Cell Stability and Write Ability of FinFET Subthreshold SRAM Using Analytical SNM Model
Fan, M-L
et al.
| 2010
1375
Investigation of Cell Stability and Write Ability of FinFET Subthreshold SRAM Using Analytical SNM Model
Ming-Long Fan,
/ Yu-Sheng Wu,
/ Hu, Vita Pi-Ho
et al.
| 2010
1382
Multiphysics Characterization of Transient Electrothermomechanical Responses of Through-Silicon Vias Applied With a Periodic Voltage Pulse
Xiao-Peng Wang,
/ Wen-Yan Yin,
/ Sailing He,
et al.
| 2010
1382
Solid-State Device Phenomena - Multiphysics Characterization of Transient Electrothermomechanical Responses of Through-Silicon Vias Applied With a Periodic Voltage Pulse
Wang, X-P
et al.
| 2010
1390
A Practical Model Assessing the Degradation of Polycrystalline Silicon TFTs Due to DC Electrical Stress
Kontogiannopoulos, Giannis P
/ Farmakis, Filippos V
/ Kouvatsos, Dimitrios N
et al.
| 2010
1399
Effective Surface Passivation by Novel SiH4-NH3 Treatment and BTI Characteristics on Interface-Engineered High-Mobility HfO2-Gated Ge pMOSFETs
Xie, R
et al.
| 2010
1399
Effective Surface Passivation by Novel $\hbox{SiH}_{4}$ –$\hbox{NH}_{3}$ Treatment and BTI Characteristics on Interface-Engineered High-Mobility $\hbox{HfO}_{2}$ -Gated Ge pMOSFETs
Ruilong Xie,
/ Thanh Hoa Phung,
/ Mingbin Yu,
et al.
| 2010
1399
Effective Surface Passivation by Novel Formula Not Shown – Formula Not Shown Treatment and BTI Characteristics on Interface-Engineered High-Mobility Formula Not Shown -Gated Ge pMOSFETs
Xie, R.
/ Phung, T. H.
/ Yu, M.
et al.
| 2010
1408
Compact Modeling of a Magnetic Tunnel Junction—Part I: Dynamic Magnetization Model
Kammerer, Jean-Baptiste
/ Madec, Morgan
/ Hébrard, Luc
et al.
| 2010
1416
Compact Modeling of a Magnetic Tunnel Junction—Part II: Tunneling Current Model
Madec, Morgan
/ Kammerer, Jean-Baptiste
/ Hébrard, Luc
et al.
| 2010
1425
SPICE Macromodel of Spin-Torque-Transfer-Operated Magnetic Tunnel Junctions
Harms, Jonathan D
/ Ebrahimi, Farbod
/ Xiaofeng Yao,
et al.
| 2010
1431
Compact Modeling of LDMOS Transistors for Extreme Environment Analog Circuit Design
Kashyap, Avinash S
/ Mantooth, H Alan
/ Vo, Tuan A
et al.
| 2010
1431
Solid-State Power and High Voltage - Compact Modeling of LDMOS Transistors for Extreme Environment Analog Circuit Design
Kashyap, A S
et al.
| 2010
1440
Analysis of Ridge-Loaded Folded-Waveguide Slow-Wave Structures for Broadband Traveling-Wave Tubes
Sumathy, M
/ Vinoy, K J
/ Datta, S K
et al.
| 2010
1440
Vacuum Electron Devices - Analysis of Ridge-Loaded Folded-Waveguide Slow-Wave Structures for Broadband Traveling-Wave Tubes
Sumathy, M
et al.
| 2010
1447
Simple Formulas for Stopband Attenuation Characteristics of Asymmetric Helical Slow-Wave Structures of Traveling-Wave Tubes
Datta, Subrata Kumar
/ Naidu, Vemula Bhanu
/ Rao, P Raja Ramana
et al.
| 2010
1455
Band-Gap Determination of the Native Oxide Capping Quantum Dots by Use of Different Kinds of Conductive AFM Probes: Example of InAs/GaAs Quantum Dots
Smaali, Kacem
/ El Hdiy, Abbdelillah
/ Molinari, Michael
et al.
| 2010
1455
BRIEFS - Band-Gap Determination of the Native Oxide Capping Quantum Dots by Use of Different Kinds of Conductive AFM Probes: Example of InAs/GaAs Quantum Dots
Smaali, K
et al.
| 2010
1460
Design of 2 × VDD-Tolerant Power-Rail ESD Clamp Circuit With Consideration of Gate Leakage Current in 65-nm CMOS Technology
Wang, C-T
et al.
| 2010
1460
Design of 2$\times$VDD-Tolerant Power-Rail ESD Clamp Circuit With Consideration of Gate Leakage Current in 65-nm CMOS Technology
Chang-Tzu Wang,
/ Ming-Dou Ker,
et al.
| 2010
1460
Design of 2 Formula Not Shown VDD-Tolerant Power-Rail ESD Clamp Circuit With Consideration of Gate Leakage Current in 65-nm CMOS Technology
Wang, C. T.
/ Ker, M. D.
et al.
| 2010
1466
Electron Transport Through Abrupt Type I Double Heterojunction Bipolar Transistors
Ramon, Dan
/ Lidji, Ron Liraz
/ Elias, Doron Cohen
et al.
| 2010
1470
Paper as a Substrate for Inorganic Powder Electroluminescence Devices
Jin-Young Kim,
/ Shang Hyeun Park,
/ Taewon Jeong,
et al.
| 2010
1475
High-Resistivity Thin-Film Resistors Grown Using CrB2-Si-SiC Materials by Radio-Frequency Magnetron Sputtering
Park, K-W
et al.
| 2010
1475
High-Resistivity Thin-Film Resistors Grown Using Formula Not Shown –Si–SiC Materials by Radio-Frequency Magnetron Sputtering
Park, K. W.
/ Hur, S. G.
/ Ahn, J. K.
et al.
| 2010
1475
High-Resistivity Thin-Film Resistors Grown Using $ \hbox{CrB}_{2}$–Si–SiC Materials by Radio-Frequency Magnetron Sputtering
Kyoung-Woo Park,
/ Sung-Gi Hur,
/ Jun-Ku Ahn,
et al.
| 2010
1481
Corrugated Rectangular Waveguide Tunable Backward Wave Oscillator for Terahertz Applications
Mineo, Mauro
/ Paoloni, Claudio
et al.
| 2010
C1
Table of contents
| 2010
C2
IEEE Transactions on Electron Devices publication information
| 2010
C3
IEEE Transactions on Electron Devices information for authors
| 2010