The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume 432,
Issue pb
Volume 432,
Issue pa
Volume 427,
Issue pb
Volume 427,
Issue pa
Volume 424,
Issue 3
Volume 424,
Issue 2
Volume 424,
Issue 1
Volume 421,
Issue b
Volume 421,
Issue a
Volume 418,
Issue a
Volume 285,
Issue pb
Volume 258,
Issue 24
Volume 258,
Issue 23
Volume 258,
Issue 22
Volume 258,
Issue 21
Volume 258,
Issue 20
Volume 258,
Issue 19
Volume 258,
Issue 18
Volume 258,
Issue 17
Volume 258,
Issue 16
Volume 258,
Issue 15
Volume 258,
Issue 14
Volume 258,
Issue 13
Volume 258,
Issue 12
Volume 258,
Issue 11
Volume 258,
Issue 10
Volume 258,
Issue 9
Volume 258,
Issue 8
Volume 258,
Issue 7
Volume 258,
Issue 6
Volume 258,
Issue 5
Volume 258,
Issue 4
Volume 258,
Issue 3
Volume 258,
Issue 2
Volume 258,
Issue 1
Volume 257,
Issue 24
Volume 257,
Issue 23
Volume 257,
Issue 22
Volume 257,
Issue 21
Volume 257,
Issue 20
Volume 257,
Issue 19
Volume 257,
Issue 18
Volume 257,
Issue 17
Volume 257,
Issue 16
Volume 257,
Issue 15
Volume 257,
Issue 14
Volume 257,
Issue 13
Volume 257,
Issue 12
Volume 257,
Issue 11
Volume 257,
Issue 10
Volume 257,
Issue 9
Volume 257,
Issue 8
Volume 257,
Issue 7
Volume 257,
Issue 6
Volume 257,
Issue 5
Volume 257,
Issue 4
Volume 257,
Issue 3
Volume 257,
Issue 2
Volume 257,
Issue 1
Volume 256,
Issue 24
Volume 256,
Issue 23
Volume 256,
Issue 22
Volume 256,
Issue 21
Volume 256,
Issue 20
Volume 256,
Issue 19
Volume 256,
Issue 18
Volume 256,
Issue 17
Volume 256,
Issue 16
Volume 256,
Issue 15
Volume 256,
Issue 14
Volume 256,
Issue 13
Volume 256,
Issue 12
Volume 256,
Issue 11
Volume 256,
Issue 10
Volume 256,
Issue 9
Volume 256,
Issue 8
Volume 256,
Issue 7
Volume 256,
Issue 6
Volume 256,
Issue 5
Volume 256,
Issue 4
Volume 256,
Issue 3
Volume 256,
Issue 2
Volume 256,
Issue 1
Volume 255,
Issue 24
Volume 255,
Issue 23
Volume 255,
Issue 22
Volume 255,
Issue 21
Volume 255,
Issue 20
Volume 255,
Issue 19
Volume 255,
Issue 18
Volume 255,
Issue 17
Volume 255,
Issue 16
Volume 255,
Issue 15
Volume 255,
Issue 14
Volume 255,
Issue 13
Volume 255,
Issue 12
Volume 255,
Issue 11
Volume 255,
Issue 10
Volume 255,
Issue 9
Volume 255,
Issue 8
Volume 255,
Issue 7
Volume 255,
Issue 6
Volume 255,
Issue 5
Volume 255,
Issue 4
Volume 255,
Issue 3
Volume 255,
Issue 2
Volume 255,
Issue 1
Volume 254,
Issue 24
Volume 254,
Issue 23
Volume 254,
Issue 22
Volume 254,
Issue 21
Volume 254,
Issue 20
Volume 254,
Issue 19
Volume 254,
Issue 18
Volume 254,
Issue 17
Volume 254,
Issue 16
Volume 254,
Issue 15
Volume 254,
Issue 14
Volume 254,
Issue 13
Volume 254,
Issue 12
Volume 254,
Issue 11
Volume 254,
Issue 10
Volume 254,
Issue 9
Volume 254,
Issue 8
Volume 254,
Issue 7
Volume 254,
Issue 6
Volume 254,
Issue 5
Volume 254,
Issue 4
Volume 254,
Issue 3
Volume 254,
Issue 2
Volume 254,
Issue 1
Volume 253,
Issue 24
Volume 253,
Issue 23
Volume 253,
Issue 22
Volume 253,
Issue 21
Volume 253,
Issue 20
Volume 253,
Issue 19
Volume 253,
Issue 18
Volume 253,
Issue 17
Volume 253,
Issue 16
Volume 253,
Issue 15
Volume 253,
Issue 14
Volume 253,
Issue 13
Volume 253,
Issue 12
Volume 253,
Issue 11
Volume 253,
Issue 10
Volume 253,
Issue 9
Volume 253,
Issue 8
Volume 253,
Issue 7
Volume 253,
Issue 6
Volume 253,
Issue 5
Volume 253,
Issue 4
Volume 253,
Issue 3
Volume 253,
Issue 2
Volume 253,
Issue 1
Volume 252,
Issue 24
Volume 252,
Issue 23
Volume 252,
Issue 22
Volume 252,
Issue 21
Volume 252,
Issue 20
Volume 252,
Issue 19
Volume 252,
Issue 18
Volume 252,
Issue 17
Volume 252,
Issue 16
Volume 252,
Issue 15
Volume 252,
Issue 14
Volume 252,
Issue 13
Volume 252,
Issue 12
Volume 252,
Issue 11
Volume 252,
Issue 10
Volume 252,
Issue 9
Volume 252,
Issue 8
Volume 252,
Issue 7
Volume 252,
Issue 6
Volume 252,
Issue 5
Volume 252,
Issue 4
Volume 252,
Issue 3
Volume 252,
Issue 2
Volume 252,
Issue 1
Volume 251,
Issue 4
Volume 251,
Issue 1
Volume 250,
Issue 4
Volume 250,
Issue 1
Volume 249,
Issue 4
Volume 249,
Issue 1
Volume 248,
Issue 4
Volume 248,
Issue 1
Volume 247,
Issue 4
Volume 247,
Issue 1
Volume 246,
Issue 4
Volume 246,
Issue 3
Volume 246,
Issue 1
Volume 245,
Issue 4
Volume 245,
Issue 1
Volume 244,
Issue 4
Volume 244,
Issue 1
Volume 243,
Issue 4
Volume 243,
Issue 1
Volume 242,
Issue 4
Volume 242,
Issue 3
Volume 242,
Issue 2
Volume 242,
Issue 1
Volume 241,
Issue 4
Volume 241,
Issue 3
Volume 241,
Issue 2
Volume 241,
Issue 1
Volume 240,
Issue 4
Volume 240,
Issue 1
Volume 239,
Issue 4
Volume 239,
Issue 3
Volume 239,
Issue 2
Volume 239,
Issue 1
Volume 238,
Issue 4
Volume 238,
Issue 1
Volume 237,
Issue 4
Volume 237,
Issue 1
Volume 236,
Issue 4
Volume 236,
Issue 1
Volume 235,
Issue 4
Volume 235,
Issue 3
Volume 235,
Issue 2
Volume 235,
Issue 1
Volume 234,
Issue 4
Volume 234,
Issue 1
Volume 233,
Issue 4
Volume 233,
Issue 1
Volume 232,
Issue jun
Volume 232,
Issue 2004
Volume 232,
Issue 15
Volume 231,
Issue jun
Volume 231,
Issue 2004
Volume 231,
Issue 15
Volume 230,
Issue 4
Volume 230,
Issue 1
Volume 229,
Issue 4
Volume 229,
Issue 1
Volume 228,
Issue 4
Volume 228,
Issue 1
Volume 227,
Issue 4
Volume 227,
Issue 1
Volume 226,
Issue 4
Volume 226,
Issue 3
Volume 226,
Issue 1
Volume 225,
Issue 4
Volume 225,
Issue 1
Volume 224,
Issue 4
Volume 224,
Issue 1
Volume 223,
Issue 4
Volume 223,
Issue 3
Volume 223,
Issue 1
Volume 222,
Issue 4
Volume 222,
Issue 1
Volume 221,
Issue 4
Volume 221,
Issue 1
Volume 220,
Issue 4
Volume 220,
Issue 1
Volume 219,
Issue 4
Volume 219,
Issue 3
Volume 219,
Issue 2
Volume 219,
Issue 1
Volume 218,
Issue 4
Volume 218,
Issue 1
Volume 217,
Issue 4
Volume 217,
Issue 1
Volume 216,
Issue spec
Volume 216,
Issue 4
Volume 216,
Issue 1
Volume 215,
Issue spec
Volume 215,
Issue 4
Volume 215,
Issue 1
Volume 214,
Issue 4
Volume 214,
Issue 1
Volume 213,
Issue spec
Volume 212,
Issue spec
Volume 212,
Issue 1
Volume 211,
Issue 4
Volume 211,
Issue 1
Volume 210,
Issue spec
Volume 210,
Issue 4
Volume 210,
Issue 3
Volume 210,
Issue 2
Volume 210,
Issue 1
Volume 209,
Issue 1
Volume 208,
Issue 1
Volume 207,
Issue 4
Volume 207,
Issue 1
Volume 206,
Issue 4
Volume 206,
Issue 1
Volume 205,
Issue 4
Volume 205,
Issue 1
Volume 204,
Issue jan
Volume 204,
Issue 2003
Volume 204,
Issue 15
Volume 203,
Issue jan
Volume 203,
Issue 2003
Volume 203,
Issue 15
Volume 202,
Issue 4
Volume 202,
Issue 3
Volume 202,
Issue 2
Volume 202,
Issue 1
Volume 201,
Issue 4
Volume 201,
Issue 1
Volume 200,
Issue 4
Volume 200,
Issue 1
Volume 199,
Issue 4
Volume 199,
Issue 1
Volume 196,
Issue 4
Volume 196,
Issue 1
Volume 195,
Issue 4
Volume 195,
Issue 1
Volume 194,
Issue 4
Volume 194,
Issue 1
Volume 193,
Issue 4
Volume 193,
Issue 1
Volume 192,
Issue 4
Volume 192,
Issue 1
Volume 191,
Issue 4
Volume 191,
Issue 1
Volume 190,
Issue 4
Volume 190,
Issue 1
Volume 189,
Issue 4
Volume 189,
Issue 3
Volume 189,
Issue 2
Volume 189,
Issue 1
Volume 188,
Issue 4
Volume 188,
Issue 3
Volume 188,
Issue 2
Volume 188,
Issue 1
Volume 187,
Issue 4
Volume 187,
Issue 3
Volume 187,
Issue 2
Volume 187,
Issue 1
Volume 186,
Issue 4
Volume 186,
Issue 1
Volume 185,
Issue 4
Volume 185,
Issue 3
Volume 185,
Issue 2
Volume 185,
Issue 1
Volume 184,
Issue 4
Volume 184,
Issue 1
Volume 183,
Issue 4
Volume 183,
Issue 3
Volume 183,
Issue 2
Volume 183,
Issue 1
Volume 182,
Issue 4
Volume 182,
Issue 3
Volume 182,
Issue 2
Volume 182,
Issue 1
Volume 181,
Issue 4
Volume 181,
Issue 3
Volume 181,
Issue 2
Volume 181,
Issue 1
Volume 180,
Issue 4
Volume 180,
Issue 3
Volume 180,
Issue 2
Volume 180,
Issue 1
Volume 179,
Issue 4
Volume 179,
Issue 1
Volume 178,
Issue 4
Volume 178,
Issue 1
Volume 177,
Issue 4
Volume 177,
Issue 3
Volume 177,
Issue 2
Volume 177,
Issue 1
Volume 175,
Issue 1
Volume 174,
Issue 4
Volume 174,
Issue 3
Volume 174,
Issue 2
Volume 174,
Issue 1
Volume 173,
Issue 4
Volume 173,
Issue 3
Volume 173,
Issue 2
Volume 173,
Issue 1
Volume 172,
Issue 4
Volume 172,
Issue 3
Volume 172,
Issue 2
Volume 172,
Issue 1
Volume 171,
Issue 4
Volume 171,
Issue 3
Volume 171,
Issue 2
Volume 171,
Issue 1
Volume 168,
Issue 4
Volume 168,
Issue 1
Volume 167,
Issue 4
Volume 167,
Issue 3
Volume 167,
Issue 2
Volume 167,
Issue 1
Volume 166,
Issue 4
Volume 166,
Issue 1
Volume 165,
Issue 4
Volume 165,
Issue 3
Volume 165,
Issue 2
Volume 165,
Issue 1
Volume 164,
Issue 4
Volume 164,
Issue 1
Volume 162,
Issue 1
Volume 161,
Issue 4
Volume 161,
Issue 3
Volume 161,
Issue 2
Volume 161,
Issue 1
Volume 160,
Issue 1
Volume 159,
Issue 1
Volume 158,
Issue 4
Volume 158,
Issue 3
Volume 158,
Issue 2
Volume 158,
Issue 1
Volume 157,
Issue 4
Volume 157,
Issue 3
Volume 157,
Issue 2
Volume 157,
Issue 1
Volume 156,
Issue 4
Volume 156,
Issue 1
Volume 153,
Issue 4
Volume 153,
Issue 3
Volume 153,
Issue 2
Volume 153,
Issue 1
Volume 152,
Issue 4
Volume 152,
Issue 3
Volume 152,
Issue 2
Volume 152,
Issue 1
Volume 151,
Issue 4
Volume 151,
Issue 3
Volume 151,
Issue 2
Volume 151,
Issue 1
Volume 150,
Issue complete
Volume 150,
Issue 4
Volume 150,
Issue 1
Volume 149,
Issue 4
Volume 149,
Issue 1
Volume 148,
Issue 4
Volume 148,
Issue 3
Volume 148,
Issue 2
Volume 148,
Issue 1
Volume 147,
Issue 4
Volume 147,
Issue 1
Volume 146,
Issue 4
Volume 146,
Issue 1
Volume 144,
Issue 1
Volume 143,
Issue 4
Volume 143,
Issue 1
Volume 142,
Issue 4
Volume 142,
Issue 1
Volume 141,
Issue 4
Volume 141,
Issue 3
Volume 141,
Issue 2
Volume 141,
Issue 1
Volume 140,
Issue 4
Volume 140,
Issue 3
Volume 140,
Issue 2
Volume 140,
Issue 1
Volume 137,
Issue 4
Volume 137,
Issue 1
Volume 136,
Issue 4
Volume 136,
Issue 3
Volume 136,
Issue 2
Volume 136,
Issue 1
Volume 135,
Issue 4
Volume 135,
Issue 1
Volume 134,
Issue 4
Volume 134,
Issue 1
Volume 133,
Issue 4
Volume 133,
Issue 3
Volume 133,
Issue 2
Volume 133,
Issue 1
Volume 132,
Issue 4
Volume 132,
Issue 1
Volume 130,
Issue 4
Volume 130,
Issue 1
Volume 129,
Issue 4
Volume 129,
Issue 1
Volume 127,
Issue 4
Volume 127,
Issue 1
Volume 126,
Issue 4
Volume 126,
Issue 3
Volume 126,
Issue 2
Volume 126,
Issue 1
Volume 125,
Issue 4
Volume 125,
Issue 3
Volume 125,
Issue 2
Volume 125,
Issue 1
Volume 122,
Issue 4
Volume 122,
Issue 1
Volume 121,
Issue 4
Volume 121,
Issue 1
Volume 120,
Issue 4
Volume 120,
Issue 3
Volume 120,
Issue 2
Volume 120,
Issue 1
Volume 119,
Issue 4
Volume 119,
Issue 3
Volume 119,
Issue 2
Volume 119,
Issue 1
Volume 118,
Issue com
Volume 117,
Issue com
Volume 116,
Issue com
Volume 116,
Issue 1
Volume 115,
Issue 4
Volume 115,
Issue 3
Volume 115,
Issue 2
Volume 115,
Issue 1
Volume 114,
Issue com
Volume 113,
Issue com
Volume 112,
Issue com
Volume 111,
Issue complete
Volume 111,
Issue com
Volume 110,
Issue complete
Volume 110,
Issue com
Volume 110,
Issue 3
Volume 109,
Issue complete
Volume 109,
Issue com
Volume 108,
Issue 4
Volume 108,
Issue 3
Volume 108,
Issue 2
Volume 108,
Issue 1
Volume 107,
Issue com
Volume 106,
Issue com
Volume 105,
Issue com
Volume 104,
Issue com
Volume 103,
Issue 4
Volume 103,
Issue 3
Volume 103,
Issue 2
Volume 103,
Issue 1
Volume 102,
Issue com
Volume 101,
Issue complete
Volume 101,
Issue com
Volume 100,
Issue complete
Volume 100,
Issue com
Volume 99,
Issue 4
Volume 99,
Issue 3
Volume 99,
Issue 2
Volume 99,
Issue 1
Volume 98,
Issue complete
Volume 98,
Issue com
Volume 96,
Issue complete
Volume 96,
Issue com
Volume 95,
Issue complete
Volume 95,
Issue com
Volume 94,
Issue complete
Volume 94,
Issue com
Volume 93,
Issue 4
Volume 93,
Issue 3
Volume 93,
Issue 2
Volume 93,
Issue 1
Volume 92,
Issue 4
Volume 92,
Issue 1
Volume 91,
Issue com
Volume 90,
Issue 4
Volume 90,
Issue 3
Volume 90,
Issue 2
Volume 90,
Issue 1
Volume 89,
Issue 4
Volume 89,
Issue 3
Volume 89,
Issue 2
Volume 89,
Issue 1
Volume 88,
Issue com
Volume 87,
Issue com
Volume 86,
Issue com
Volume 85,
Issue com
Volume 84,
Issue 4
Volume 84,
Issue 3
Volume 84,
Issue 2
Volume 84,
Issue 1
Volume 83,
Issue com
Volume 82,
Issue com
Volume 81,
Issue 4
Volume 81,
Issue 3
Volume 81,
Issue 2
Volume 81,
Issue 1
Volume 80,
Issue complete
Volume 80,
Issue com
Volume 79,
Issue complete
Volume 79,
Issue com
Volume 78,
Issue 4
Volume 78,
Issue 3
Volume 78,
Issue 2
Volume 78,
Issue 1
Volume 77,
Issue complete
Volume 77,
Issue com
Volume 77,
Issue 2
Volume 76,
Issue complete
Volume 76,
Issue com
Volume 76,
Issue 2
Volume 75,
Issue ii
Volume 75,
Issue com
Volume 75,
Issue 4
Volume 75,
Issue 1
Volume 74,
Issue i
Volume 74,
Issue 4
Volume 74,
Issue 3
Volume 74,
Issue 2
Volume 74,
Issue 1
Volume 73,
Issue complete
Volume 72,
Issue 4
Volume 72,
Issue 3
Volume 72,
Issue 2
Volume 72,
Issue 1
Volume 71,
Issue part
Volume 71,
Issue com
Volume 71,
Issue b
Volume 71,
Issue a
Volume 70,
Issue part
Volume 70,
Issue com
Volume 70,
Issue b
Volume 70,
Issue a
Volume 69,
Issue 4
Volume 69,
Issue 1
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue com
Volume 67,
Issue 4
Volume 67,
Issue 1
Volume 66,
Issue com
Volume 65,
Issue com
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 4
Volume 63,
Issue 1
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 4
Volume 61,
Issue 1
Volume 60,
Issue 4
Volume 60,
Issue 1
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 52,
Issue 4
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 4
Volume 50,
Issue 1
Volume 49,
Issue complete
Volume 48,
Issue complete
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 4
Volume 46,
Issue 1
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 1
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 4
Volume 43,
Issue 1
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 4
Volume 39,
Issue 1
Volume 38,
Issue 4
Volume 38,
Issue 1
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 4
Volume 36,
Issue 1
Volume 35,
Issue 4
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 4
Volume 34,
Issue 1
Volume 33,
Issue 4
Volume 33,
Issue 1
Volume 32,
Issue 4
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 4
Volume 31,
Issue 1
Volume 30,
Issue 4
Volume 30,
Issue 1
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 4,
Issue 3
>
Table of contents
1
A new model for the replacement process in electron emission at high fields and temperatures
Cutler, P. H.
/ Chung, M. S.
/ Miskovsky, N. M.
et al.
| 1994
7
Space charge of field emission triode
Yun-Peng, L.
/ Enze, L.
et al.
| 1994
11
Field emission characteristics of a carbon needle made by use of electron-beam-assisted decomposition of methane
Adachi, H.
/ Nakane, H.
/ Katamoto, M.
et al.
| 1994
16
Field emission in microwave cavity
Tanabe, E.
/ McEuen, A.
/ Trail, M.
et al.
| 1994
21
Temperature dependence of the field-stimulated exoelectron emission
Mori, M.
/ Ogawa, E.
/ Tagawa, M.
et al.
| 1994
26
Field electron current noise of metal-film emitters
Suvorov, A. L.
/ Sheshin, E. P.
/ Dolin, D. E.
et al.
| 1994
31
Real-time measurement of vacuum pressure by field emission microscopy
Iwata, T.
/ Chang, K.-S.
et al.
| 1994
36
In situ HV-TEM observation of the liquid cone formation process in a liquid metal field emission gun
Hata, K.
/ Saito, Y.
/ Ohshita, A.
et al.
| 1994
41
Fabrication and emission characteristics of new wedge-shaped silicon emitters
Hashiguchi, G.
/ Sakamoto, H.
/ Kanazawa, S.
et al.
| 1994
47
Cone- and wedge-gated field emitter diode and microtriode modeling
Nicolaescu, D.
et al.
| 1994
58
A theoretical study on field emission diodes
Weidong, L.
/ Enze, L.
et al.
| 1994
61
Theory of field ionization
Lam, S. C.
/ Needs, R. J.
et al.
| 1994
70
Mass separation of image gas field ions in the field ion microscope
Drachsel, W.
/ Gorodetskii, V.
/ Block, J. H.
et al.
| 1994
73
Mass and energy spectra of Mo ions in field evaporation
Wang, J.-B.
/ Tsong, T. T.
et al.
| 1994
80
Use of the liquid metal ion source for focused beam applications
Swanson, L. W.
et al.
| 1994
89
Application of photoemission electron microscopy to the study of surface reactions
Ehsasi, M.
et al.
| 1994
101
Local electric fields above individual surface atoms in the presence of field-adsorbed rare gas atoms: an additional field enhancement
Suchorski, Y.
/ Schmidt, W. A.
/ Block, J. H.
et al.
| 1994
108
Field desorption of H~3 and field dissociation of H^+~3
Reckzuegel, M. C.
/ Drachsel, W.
/ Block, J. H.
et al.
| 1994
115
The effect of an externally applied electric field on the diffusion of Pt adatoms, dimers, and trimers on Pt(001)
Kellogg, G. L.
et al.
| 1994
122
The surface specificity of the oscillating CO oxidation on platinum investigated by field ion microscopy
Gorodetskii, V.
/ Drachsel, W.
/ Block, J. H.
et al.
| 1994
129
Isothermal oscillations of the hydrogen-oxidation reaction on platinum: investigations in the field electron and field ion microscope
Gorodetskii, V.
/ Block, J. H.
/ Drachsel, W.
et al.
| 1994
136
Investigations of the CO-oxidation on Pt with lithium field desorption microscopy
Medvedev, V. K.
/ Suchorski, Y.
/ Block, J. H.
et al.
| 1994
145
Investigation of some selected metallurgical problems with the tomographic atom probe
Deconihout, B.
/ Bostel, A.
/ Bas, P.
et al.
| 1994
155
Site occupation of iron in intermetallic NiAl
Duncan, A. J.
/ Kaufman, M. J.
/ Liu, C. T.
et al.
| 1994
160
Segregation of interstitial impurities in single-crystal NiAl
Duncan, A. J.
/ Kaufman, M. J.
/ Miller, M. K.
et al.
| 1994
165
A field-ion microscopy study of nanocrystalline Ni and Ni~3Al
Jayaram, R.
/ Jones, J. W.
/ Miller, M. K.
et al.
| 1994
172
APFIM characterization of single-crystal PWA 1480 nickel-base superalloy
Miller, M. K.
/ Jayaram, R.
/ Lin, L. S.
et al.
| 1994
177
The location of atoms in Re- and V-containing multicomponent nickel-base single-crystal superalloys
Murakami, H.
/ Harada, H.
/ Bhadeshia, H. K. D. H.
et al.
| 1994
184
An FIM/TEM study of ordered precipitates in a Ni-Mo-Al alloy
Yamamoto, M.
/ Takeshita, Y.
/ Tada, J.
et al.
| 1994
191
Atom-probe determination of interstitial element concentration in two-phase and single-phase TiAl-based alloys
Huguet, A.
/ Menand, A.
et al.
| 1994
198
An APFIM/TEM analysis of the discontinuous precipitation in a Ni-7.5at%In alloy
Geber, G. P.
/ Haasen, P.
et al.
| 1994
203
Atomic-scale characterisation of precipitation in copper-cobalt alloys
Setna, R. P.
/ Cerezo, A.
/ Hyde, J. M.
et al.
| 1994
213
Non-uniform distribution of manganese in recrystallized Cu-0.2at%Mn alloys: an atom-probe investigation
Liu, J.-M.
/ Funke, C.
/ Haasen, P.
et al.
| 1994
219
APFIM investigation of fine-scale precipitation in aluminium alloy 6061
Edwards, G. A.
/ Stiller, K.
/ Dunlop, G. L.
et al.
| 1994
226
Phase separation in amorphous Pd-17at%Si-5at%Cu
Abe, T.
et al.
| 1994
233
A critical comparison between experimental results and numerical simulations of phase separation in the Fe-Cr system
Hyde, J. M.
/ Cerezo, A.
/ Miller, M. K.
et al.
| 1994
242
APFIM characterization of 15Kh2MFA Cr-Mo-V and 15Kh2NMFA Ni-Cr-Mo-V type steels
Miller, M. K.
/ Jayaram, R.
/ Othen, P. J.
et al.
| 1994
248
Atom-probe investigation of precipitation in 12% Cr steel weld metals
Cai, G.-J.
/ Lundin, L.
/ Andren, H.-O.
et al.
| 1994
255
AP-FIM study on the effect of Mo addition on microstructure in Ti-Nb steel
Uemori, R.
/ Chijiiwa, R.
/ Tamehiro, H.
et al.
| 1994
261
POSAP analysis of the oxide-alloy interface in stainless steel
Ohkido, S.
/ Ishikawa, Y.
/ Yoshimura, T.
et al.
| 1994
266
Grain boundary segregation of boron in an austenitic stainless steel
Carinci, G. M.
et al.
| 1994
272
An AP/FIM and TEM study of the microstructural evolution of MANET steel after dual-beam irradiation
Wanderka, N.
/ Wahi, R. P.
et al.
| 1994
278
Atom-probe analysis of cemented carbides and cermets
Andren, H.-O.
/ Rolander, U.
/ Lindahl, P.
et al.
| 1994
285
FIM investigation of radiation damage in tungsten caused by 300 keV Ni^+ ions
Sato, S.
/ Kohyama, A.
/ Igata, N.
et al.
| 1994
291
Atom-probe and field emission electron spectroscopy studies of ordered structures and electronic properties of Ge overlayers on Ir-tips
Ashino, M.
/ Tomitori, M.
/ Nishikawa, O.
et al.
| 1994
297
Simulation of FIM images of precipitation-hardening alloys
Sano, N.
et al.
| 1994
303
Electron-impact-induced image contrast in FIM with organic image gases
Schmidt, U.
/ Roellgen, F. W.
et al.
| 1994
307
Negative field ion microscopy of the initial stages of polymerization of tetracyanoethylene
Theiss, A.
/ Roellgen, F. W.
et al.
| 1994
312
Theory of electron tunneling in scanning tunneling microscopy and field ion microscopy
Tsukada, M.
et al.
| 1994
322
STM study of the Ge growth mode on Si(001) substrates
Tomitori, M.
/ Watanabe, K.
/ Kobayashi, M.
et al.
| 1994
329
FI-STM study of the structure of Sc-encapsulated fullerenes
Wang, X.-D.
/ Xue, Q.
/ Hashizume, T.
et al.
| 1994
334
Thermal stability of fullerene (C~7~0) on the Si(100)2 X 1 surface studied with FI-STM
Wang, X.-D.
/ Xue, Q.
/ Hashizume, T.
et al.
| 1994
340
Giant adatom-like structures observed with scanning tunneling microscopy: super adatoms on Si(331)
Tanaka, H.
/ Yokoyama, T.
/ Sumita, I.
et al.
| 1994
347
Electronic properties of nanometer-size metal-semiconductor point contacts studied by STM
Hasegawa, Y.
/ Lyo, I.-W.
/ Avouris, P.
et al.
| 1994
353
Preparation and characterization of electrochemically etched Re tips for STM
Watanabe, M. O.
/ Kinno, T.
et al.
| 1994
359
Field ion microscope with photostimulable phosphor screen - new approach for quantitative analysis of FIM images
Nishikawa, O.
/ Akimoto, T.
/ Tsuchiya, T.
et al.
| 1994
367
The Rouen energy-compensated atom probe
Sarrau, J. M.
/ Danoix, F.
/ Deconihout, B.
et al.
| 1994
374
Improvements in three-dimensional atom probe design
Cerezo, A.
/ Godfrey, T. J.
/ Hyde, J. M.
et al.
| 1994
382
Lateral and depth scale calibration of the position sensitive atom probe
Hyde, J. M.
/ Cerezo, A.
/ Setna, R. P.
et al.
| 1994
392
Study of proper conditions for quantitative atom-probe analysis
Rolander, U.
/ Andren, H.-O.
et al.
| 1994
403
The evaluation of moments methods for fitting multiparameter sinusoidal models
Bowman, K. O.
/ Miller, M. K.
/ Shenton, L. R.
et al.
| 1994
409
Analysis of data from an optical atom probe
Cooper, A. S.
/ Cerezo, A.
/ Hyde, J. M.
et al.
| 1994
416
Median-style filters for noise reduction in composition analyses
Camus, P. P.
/ Larson, D. J.
et al.
| 1994
424
Toward a scanning atom probe - computer simulation of electric field
Nishikawa, O.
/ Kimoto, M.
et al.
| 1994