Vacuum
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Table of contents
- 1
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IntroductionColligon, J.S. et al. | 1987
- 3
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High resolution electron spectroscopy—recent new achievementsKurepa, Milan V. et al. | 1987
- 21
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Cryopumps for research and industryBaechler, Werner G. et al. | 1987
- 31
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Mechanisms and applications of electron stimulated desorption in surface scienceMadey, Theodore E. et al. | 1987
- 35
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Recent trends in surface treatment using ion beam processesColligon, J.S. et al. | 1987
- 41
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Surface deformation due to high fluence helium irradiationMezey, G. / Pászti, F. / Pogány, L. et al. | 1987
- 47
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New developments in plasma edge diagnosticsWinter, Hannspeter et al. | 1987
- 53
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Present experimental approach and some recent measurements in ion-atom collision researchBerényi, D. et al. | 1987
- 61
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Structure and CO adsorption of small crystalsGillet, M. et al. | 1987
- 67
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Fundamentals and present state of surface decorationKrohn, M. et al. | 1987
- 75
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Monte Carlo calculations for gas flow through conical elementsFüstöss, L. et al. | 1987
- 79
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Ion counting device with dead-time correctionBerecz, I. / Bohàtka, S. / Diós, Z. et al. | 1987
- 81
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Mechanism and kinetics of vacuum chromizing of ironKansky, E. / Jenko, M. / Tavzes, R. et al. | 1987
- 85
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A microprocessor-controlled quadrupole mass spectrometer gas analyser systemBerecz, I. / Bohátka, S. / Diós, Z. et al. | 1987
- 89
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Growth of Ta-oxide on thin tantalum films containing grain boundary particlesLugomer, S. / Stipančić, M. / Kerenović, M. et al. | 1987
- 93
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The effect of oxygen on the structure and growth morphology of vapour deposited Cu filmsReicha, F.M. / El Hiti, M. / Barna, P.B. et al. | 1987
- 97
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Structure and growth morphology of SiOx films deposited on NaCl (001) facesEl Hiti, M. / Barna, P.B. / Reicha, F.M. et al. | 1987
- 101
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Optimum multilayer design selection in relation to production errorsZorc, H. et al. | 1987
- 103
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A model of substrate surface roughness effect on the electrical properties of thin filmsTóth, L. et al. | 1987
- 107
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Dielectric properties of ytterbium and dysprosium oxide films deposited by electron beam evaporationWiktorczyk, T. / Wesołowska, C. et al. | 1987
- 111
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The diffusion of oxygen vacancies and electrical properties of EuO thin films doped with EuLubecka, M. / Wȩgrzyn, A. et al. | 1987
- 115
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Some transport properties of granular metal films with rough surfacesWarkusz, F. et al. | 1987
- 119
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CrSiO cermet thin filmsSchabowska-Osiowska, E. / Ścigała, R. / Porada, Z. et al. | 1987
- 125
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XPS investigation of Pt-Si interfaces formed during heat treatments in different (H2, O2) atmospheresKövér, L. / Tóth, J. / Dávid, L. et al. | 1987
- 129
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Surface composition of glasses: modifications induced by chemical and thermal treatmentsBertóti, I. / Mohai, M. / Révész, M. et al. | 1987
- 133
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On the role of potassium additives in the chlorination of TiO2 by CCl4 and COCl2Mink, G. / Bertóti, I. / Pap, I.S. et al. | 1987
- 137
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Nitrogen bonding states on iron studied by PES and AESArabczyk, W. / Müssig, H-J et al. | 1987
- 141
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The influence of submonolayer silica on the surface properties of Y-aluminaBertóti, I. / Mink, G. / Varsányi, G. et al. | 1987
- 145
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A surface analysis station for investigation of the near wall plasma of tokamak T-15Behnke, M. / Herrmann, A. / Hildebrandt, D. et al. | 1987
- 149
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Angular corrections for determining the electron inelastic mean free path (IMFP) by elastic peak electron spectroscopyGergely, G. et al. | 1987
- 153
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Distorted wave Born-approximation for atom-metal surface scattering (NDWBA)Balázs, E. / Varga, G. et al. | 1987
- 157
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Energy distribution of secondary ions emitted from pure elements and amorphous alloysDüsterhöft, H. / Riedel, M. et al. | 1987
- 161
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Surface layer structure analysis of stainless steel tubing used in LWR primary circuit—an ESCA studyKöver, L. / Tóth, J. / Cserny, I. et al. | 1987
- 165
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AES analysis of reed switch contact surfaces and gas chromatographic analysis of filling gasesMurko-Jezovšek, M. / Brecelj, F. et al. | 1987
- 169
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Depth resolution of multilayer Cr/Ni thin film structures deposited on substrates with different roughnessZalar, A. / Hofmann, S. et al. | 1987
- 175
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Surface analysis of air pollutants collected in populated areasKövér, L. / Tóth, J. / Schág, J.B. et al. | 1987
- 179
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The use of the ion drift velocity for pressure indication in the rough vacuum range using a hot filament ionization gaugeEdelmann, Christian et al. | 1987
- 183
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Black aluminium filmsRiesenberg, R. / Schmidt, G. et al. | 1987
- 187
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Advances of a quadrupole-Derivatograph thermoanalytical instrumentBohátka, S. / Szöőr, G. et al. | 1987
- 187
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Oblique evaporated silicon oxide thin films studied by cross-sectional transmission electron microscopyGeszti, O. / Gosztola, L. / Seyfried, E. et al. | 1987
- 189
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Clean and adsorbate induced phase transitions at metal surfacesKing, D.A. et al. | 1987
- 189
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Application of high resolution ESCA to surface oxidation studiesMcIntyre, N.S. / Lau, W.M. / Johnston, D.D. et al. | 1987
- 189
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Vacuum tightness of materials and phase boundariesKansky, E. et al. | 1987
- 189
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Contributions of vacuum methods to the evaluation of long-range R&D in industryvan Ooij, W.J. et al. | 1987
- 190
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The calculation of the vapour density and velocity distributions in the jet of diffusion pumpsTóth, G. et al. | 1987
- 190
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Quadrupole mass spectrometric measurements in industrial fermentationsSzilágyi, J. / Bohátka, S. / Langer, G. et al. | 1987
- 190
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SOI materials and technologies towards three-dimensional integrationCroset, M. et al. | 1987
- 190
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Hard coatings prepared by PVD and CVDKarlsson, S-E / Sundgren, J-E / Hentzell, H.T.G. et al. | 1987
- 190
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Metallization films and systems for semiconductor devices and circuits: some problems and trendsLuby, S. et al. | 1987
- 191
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Leak detection below 10−12 mbar I s−1 with spinning rotor viscosity gaugeŠetina, J. / Zavašnik, R. et al. | 1987
- 191
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A new uv photoelectron spectrometer for investigation of molecular electronic structuresVeszprémi, T. / Zsombok, Gy. / Nyulászi, L. et al. | 1987
- 191
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Mass spectrometric investigation of the gas desorption in light sources and electron tubes under pumping and operating conditionsBiró, É. / Reznik, S. et al. | 1987
- 191
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Thermal gas desorption method in testing light source components and other materials for vacuum engineeringTräger, S. et al. | 1987
- 191
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Vacuum degassing of ceramic suspension for injection moldingRotar, D. / Kansky, E. et al. | 1987
- 192
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Thickness homogeneity vs target erosion of Penning-type sourceKarányi, J. / Vágó, Gy. / Szilágyi, M. et al. | 1987
- 192
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Diffusion pump construction in ATOMKIBerecz, I. / Bohátka, S. / Langer, G. et al. | 1987
- 192
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Mass spectrometric study of silver adsorption on tungsten (110)Gerth, G. et al. | 1987
- 192
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Investigation of getter parameters of non-evaporating gettersBelényessy, I. et al. | 1987
- 192
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Calibration of gauges and mass spectrometers by defined gas burstsDobrozemsky, R. / Breth, A. / Schwarzinger, G. et al. | 1987
- 193
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Possibility of photocurrent oscillation in Se-thin-layersKispéter, J. et al. | 1987
- 193
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Stability of sputtered NiCr thin films for strain gauge applicationBanovec, A. / Požun, K. / Kern, M. et al. | 1987
- 193
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Imaging of the microtopography of silicon (111) surfaces by gold decorationKatzer, D. / Sáfrán, G. et al. | 1987
- 193
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Quantitative thin film analysis by EELSBauer, H.D. / Scholz, W. et al. | 1987
- 193
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The deposition treatment influence on structure properties of amorphous metallic thin filmsChrzastowski, A. / Jankowski, H. et al. | 1987
- 193
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Application of layer systems for optical componentsEhrig, K. / Ehrlich, U. / Gerlach, G. et al. | 1987
- 194
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Reflection electron energy loss spectroscopy (REELS) of some oxide films on substratesGergely, G. / Sulyok, A. et al. | 1987
- 194
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The nature of the adsorption states of hydrogen on surfaces of thin transition metal filmsDuś, R. / Nowicka, E. et al. | 1987
- 194
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Adsorption and decomposition of NO on potassium promoted Rh(111)Bugyi, L. / Solymosi, F. et al. | 1987
- 194
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Adsorption of H2O and O2 on Rh surfaces studied by AES, ELS and TDSKiss, J. / Solymosi, F. et al. | 1987
- 195
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An SCF theory of surfaces, the intermediate electronic states and the quantum size effectsBiczó, G. et al. | 1987
- 195
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Adsorption properties of stepped surfacesKarner, H. / Luger, M. / Steinrück, H.P. et al. | 1987
- 195
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Ruthenium oxide single crystal-titanium interface (110) and (100) surface; a study by means of LEED, AES and XPS techniquesAtanasoska, Lj.D. / Ristić, M.M. / O'Grady, W.E. et al. | 1987
- 195
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Ir studies from the aspect of adsorbate-induced surface transitions of Pt/SiO2Sárkány, J. / Bartók, M. et al. | 1987
- 196
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Realization of a compact spectrometer for ISS and AES sputter depth profilingGisler, E. / Bas, E.B. et al. | 1987
- 196
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The applicability of the hard corrugated potential wall in calculations of surface scatteringFüstöss, L. / Varga, G. / Balázs, E. et al. | 1987
- 196
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A small modified cylindrical mirror analyser with additional preretardationSzuber, J. et al. | 1987
- 196
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Interaction of CO2 and HCOOH with Pd(100) surfaceBerkó, A. / Solymosi, F. et al. | 1987
- 197
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AES and XPS studies of Cl− ion penetration and the chemical composition of oxide films on aluminiumAtanasoska, Lj.D. / Zalar, A. et al. | 1987
- 197
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Some resultsof investigations into relationsip between a few elements of nodular graphite cast iron and nodular graphitePirs, J. / Zalar, A. et al. | 1987
- 197
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Composition and structure of passivated iron surfacesBauer, G. / Leisch, M. et al. | 1987
- 197
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Surface compositional changes of AuPd binary alloys during temperature excursions and sputteringHetzendorf, G. / Hertl, S. / Varga, P. et al. | 1987
- 197
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Application of ion-beam etching in microelectronicsEhrig, K. / Schlenk, R. / Falz, M. et al. | 1987
- 198
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Influence of crystal orientation on open circuit voltage and first diode factor at SIS solar cellsTasevski, M. et al. | 1987
- 198
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Fabrication and characterization of thin films for solar cellsDhere, N.G. et al. | 1987
- 199
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Hungarian-Austrian-Yugoslavian third joint vacuum conference| 1987
- 201
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Tegal attacks ‘high-end’ plasma etcher market| 1987
- 201
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New film deposition monitor from Edwards| 1987
- 202
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New low cost autoclave launched| 1987
- 202
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Mechanical booster pumps| 1987
- 202
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New vacuum/high pressure glands for manual or automatic orbital welding| 1987
- 203
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Latest EM equipment at MICRO '86| 1987
- 203
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New all digital mass spectrometer from Balzers| 1987
- 203
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Plasma oil 80 mechanical pump fluid| 1987
- 203
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Leak detector leasing offers extra benefits| 1987
- 204
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CVC 97 Silicone High vacuum grease-update| 1987
- 204
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CVC Celvaseal leak sealant| 1987
- 204
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Vacuum generators new factory official opening 16 September 1986| 1987
- 205
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IPAT 87—6th International Conference on Ion & Plasma Assisted Techniques Brighton, UK, 27–29 May 1987| 1987
- 205
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Testbourne now distributors for Ceramseal| 1987
- 205
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TEGAL announces oxide sidewall spacer process for salicides and lightly doped drain FETs| 1987
- 206
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A new journal| 1987
- 206
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Publications received| 1987
- 207
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New patents| 1987
- I
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Software survey section| 1987
- IFC
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Editorial Board| 1987