The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume pp,
Issue 99
Volume im,
Issue 4
Volume im,
Issue 3
Volume im,
Issue 2
Volume im,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 6
Volume 51,
Issue 5
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 6
Volume 50,
Issue 5
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 4
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 6
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 1
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 1
Volume 13,
Issue 4
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
>
Table of contents
622
New digital signal-Processing approach for transmitter measurements in third generation Telecommunications systems
Angrisani, L.
/ D'Apuzzo, M.
/ D'Arco, M.
et al.
| 2004
630
Neuro-fuzzy TSK network for calibration of semiconductor sensor array for gas measurements
Osowski, S.
/ Linh, T.H.
/ Brudzewski, K.
et al.
| 2004
638
Neuro-fuzzy network for flavor recognition and classification
Osowski, S.
/ Linh, T.H.
/ Brudzewski, K.
et al.
| 2004
645
Finite sample properties of ARMA order selection
Broersen, P.M.T.
/ de Waele, S.
et al.
| 2004
652
Noncoherent spectral analysis of ADC using filter Bank
Rebai, C.
/ Dallet, D.
/ Marchegay, P.
et al.
| 2004
661
Using a CCD camera for the determination of the target size in radiation thermometry
Bojkovski, J.
/ Batagelj, V.
/ Pusnik, I.
et al.
| 2004
665
A DSP-based mixed-signal waveform generator
Yeary, M.B.
/ Fink, R.J.
/ Beck, D.
et al.
| 2004
672
Auto-evaluation of the uncertainty in virtual instruments
Ghiani, E.
/ Locci, N.
/ Muscas, C.
et al.
| 2004
678
A biaxial probe for nondestructive testing on conductive materials
Bernieri, A.
/ Betta, G.
/ Ferrigno, L.
et al.
| 2004
685
Evaluating phase noise power spectrum with variable frequency resolution
Angrisani, L.
/ Baccigalupi, A.
/ D'Arco, M.
et al.
| 2004
692
Reconstruction algorithms for electromagnetic imaging
Pastorino, M.
/ Caorsi, S.
/ Massa, A.
et al.
| 2004
700
Implementing uncertainty auto-evaluation capabilities on an intelligent FFT analyzer
Liguori, C.
/ Paolillo, A.
et al.
| 2004
709
Using the parametric time-varying analog filter to average-evoked potential signals
Jaskula, M.
/ Kaszynski, R.
et al.
| 2004
716
New digital multimeter for accurate measurement of synchronously sampled AC signals
Petrovic, P.
et al.
| 2004
726
Why are nonlinear microwave systems measurements so involved?
Rolain, Y.
/ Van Moer, W.
/ Vandersteen, G.
et al.
| 2004
730
Performance of simple response method for the establishment and adjustment of calibration intervals
Carbone, P.
et al.
| 2004
736
Digital Correction Techniques for Accuracy Improvement in Measurements of SnO2 Sensor Impedance
Fort, A.
et al.
| 2004
736
Digital correction techniques for accuracy improvement in measurements of SnO/sub 2/ sensor impedance
Fort, A.
/ Machetti, N.
/ Rocchi, S.
et al.
| 2004
744
Modeling of direction-dependent Processes using Wiener models and neural networks with nonlinear output error structure
Ai Hui Tan,
/ Godfrey, K.
et al.
| 2004
754
Entropy-based optimum test points selection for analog fault dictionary techniques
Starzyk, J.A.
/ Dong Liu,
/ Zhi-Hong Liu,
et al.
| 2004
762
Pre-estimation for better initial guesses
Shaw, S.R.
/ Keppler, M.
/ Leeb, S.B.
et al.
| 2004
770
Statistical comparison of algorithms
Kedem, B.
/ Wolff, D.B.
/ Fokianos, K.
et al.
| 2004
777
Experimental evaluation of a nested microphone array with adaptive noise cancellers
Zheng, Y.R.
/ Goubran, R.A.
/ El-Tanany, M.
et al.
| 2004
787
Measuring the sensitivity of microwave components to bias variations
Van Moer, W.
/ Rolain, Y.
et al.
| 2004
792
Measurement of the internal impedance of traction rails at audiofrequency
Mariscotti, A.
/ Pozzobon, P.
et al.
| 2004
798
Real-time adaptive image impulse noise suppression
Andreadis, I.
/ Louverdis, G.
et al.
| 2004
807
Unequalized currents in coaxial AC bridges
Schurr, J.
/ Melcher, J.
et al.
| 2004
812
Application of conformal mapping approximation techniques: parallel conductors of finite dimensions
Pesonen, N.
/ Kahn, W.K.
/ Allen, R.A.
et al.
| 2004
822
Accuracy of a cryocooler-based programmable Josephson Voltage standard
Behr, R.
/ Schubert, M.
/ May, T.
et al.
| 2004
826
The width of AC quantum Hall plateaus
Schurr, J.
/ Melcher, J.
/ Pierz, K.
et al.
| 2004
830
Block-oriented instrument software design
Rolain, Y.
/ Van Moer, W.
et al.
| 2004
839
Characterization of dynamic friction in MEMS-based microball bearings
Ta-Wei Lin,
/ Modafe, A.
/ Shapiro, B.
et al.
| 2004
847
An automatic detection scheme for periodic signals based on spectrum analyzer measurements
Rabijns, D.
/ Vandersteen, G.
/ Van Moer, W.
et al.
| 2004
854
Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations
Pintelon, R.
/ Vandersteen, G.
/ Ludwig De Locht,
et al.
| 2004
863
Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements
Pintelon, R.
/ Rolain, Y.
/ Vandersteen, G.
et al.
| 2004
877
A novel spin-valve bridge sensor for current sensing
Sebastia, J.P.
/ Munoz, D.R.
/ Paulo Jorge Peixeiro de Freitas,
et al.
| 2004
881
ANNOUNCEMENTS - IEEE Lightwave Technology in Instrumentation and Measurement Conference
| 2004
881
IEEE Lightwave Technologies in Instrumentation & Measurement Conference
| 2004
883
IEEE copyright form
| 2004
c1
Table of contents
| 2004
c2
IEEE Transactions on Instrumentation and Measurement publication information
| 2004
c3
IEEE Instrumentation and Measurement Society Information
| 2004