The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
Issue 11
Volume 53,
Issue 10
Volume 53,
Issue 9
Volume 53,
Issue 8
Volume 53,
Issue 7
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
Issue 11
Volume 52,
Issue 10
Volume 52,
Issue 9
Volume 52,
Issue 8
Volume 52,
Issue 7
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
Issue 11
Volume 51,
Issue 10
Volume 51,
Issue 9
Volume 51,
Issue 8
Volume 51,
Issue 7
Volume 51,
Issue 6
Volume 51,
Issue 5
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 12
Volume 50,
Issue 11
Volume 50,
Issue 10
Volume 50,
Issue 9
Volume 50,
Issue 8
Volume 50,
Issue 7
Volume 50,
Issue 6
Volume 50,
Issue 5
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 12
Volume 49,
Issue 11
Volume 49,
Issue 10
Volume 49,
Issue 9
Volume 49,
Issue 8
Volume 49,
Issue 7
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
Issue 11
Volume 48,
Issue 10
Volume 48,
Issue 9
Volume 48,
Issue 8
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
2443
A Warm Welcome to a New T-ED Editor
Cressler, John D.
et al.
| 2013
2443
EDITORIAL - A Warm Welcome to a New T-ED Editor
Cressler, J D
et al.
| 2013
2444
Low-Field Behavior of Source-Gated Transistors
Shannon, John M.
/ Sporea, Radu Alexandru
/ Georgakopoulos, Stamatis
et al.
| 2013
2444
Silicon and Column IV Semiconductors Devices - Low-Field Behavior of Source-Gated Transistors
Shannon, J M
et al.
| 2013
2450
Characterization of RF-MOSFETs in Common-Source Configuration at Different Source-to-Bulk Voltages From S-Parameters
Zarate-Rincon, Fabian
/ Alvarez-Botero, German A.
/ Torres-Torres, Reydezel
et al.
| 2013
2457
Interface Trap Density of Gate-All-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model
Najam, Faraz
/ Yu, Yun Seop
/ Cho, Keun Hwi
et al.
| 2013
2457
Interface Trap Density of Gate-Ail-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model
Najam, F
et al.
| 2013
2464
Tunable Bandgap in Bilayer Armchair Graphene Nanoribbons: Concurrent Influence of Electric Field and Uniaxial Strain
Khaliji, Kaveh
/ Noei, Maziar
/ Tabatabaei, Seyed Mohammad
et al.
| 2013
2471
Complementary Role of Field and Temperature in Triggering ON/OFF Switching Mechanisms in ${\rm Hf}/{\rm HfO}_{2}$ Resistive RAM Cells
Govoreanu, Bogdan
/ Clima, Sergiu
/ Radu, Iuliana P.
et al.
| 2013
2471
Complementary Role of Field and Temperature in Triggering ON/OFF Switching Mechanisms in Hf/HfO2 Resistive RAM Cells
Govoreanu, B
et al.
| 2013
2479
The Effect of Germanium Fraction on High-Field Band-to-Band Tunneling in p+-SiGe/n+-SiGe Junctions in Forward and Reverse Biases
Li, J-Y
et al.
| 2013
2479
The Effect of Germanium Fraction on High-Field Band-to-Band Tunneling in ${\rm p}^{+}$-SiGe/${\rm n}^{+}$-SiGe Junctions in Forward and Reverse Biases
Li, Jiun-Yun
/ Sturm, James C.
et al.
| 2013
2485
Interplay Between Process-Induced and Statistical Variability in 14-nm CMOS Technology Double-Gate SOI FinFETs
Wang, Xingsheng
/ Cheng, Binjie
/ Brown, Andrew Robert
et al.
| 2013
2493
Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature
Der Agopian, Paula Ghedini
/ Martino, Joao Antonio
/ Rooyackers, Rita
et al.
| 2013
2498
Wideband Impedance Model for Coaxial Through-Silicon Vias in 3-D Integration
Liang, Feng
/ Wang, Gaofeng
/ Zhao, Deshuang
et al.
| 2013
2505
New Analysis Method for Time-Dependent Device-To-Device Variation Accounting for Within-Device Fluctuation
Duan, Meng
/ Zhang, Jian F.
/ Ji, Zhigang
et al.
| 2013
2512
Sub-60-nm Extremely Thin Body InxGa1_xAs-On-Insulator MOSFETs on Si With Ni-InGaAs Metal S/D and MOS Interface Buffer Engineering and Its Scalability
Kim, S
et al.
| 2013
2512
Sub-60-nm Extremely Thin Body ${\rm In}_{x}{\rm Ga}_{1-x}{\rm As}$-On-Insulator MOSFETs on Si With Ni-InGaAs Metal S/D and MOS Interface Buffer Engineering and Its Scalability
Kim, Sanghyeon
/ Yokoyama, Masafumi
/ Taoka, Noriyuki
et al.
| 2013
2518
Scalable Virtual-Ground Multilevel-Cell Floating-Gate Flash Memory
Yamauchi, Yoshimitsu
/ Kamakura, Yoshinari
/ Matsuoka, Toshimasa
et al.
| 2013
2525
2-D Compact Model for Drain Current of Fully Depleted Nanoscale GeOI MOSFETs for Improved Analog Circuit Design
Mondal, Chandrima
/ Biswas, Abhijit
et al.
| 2013
2532
Minority Carrier Transport and Their Lifetime in InGaAs/GaAsP Multiple Quantum Well Structures
Carlin, Conrad Zachary
/ Bradshaw, Geoffrey Keith
/ Samberg, Joshua Paul
et al.
| 2013
2532
Compound Semiconductor Devices - Minority Carrier Transport and Their Lifetime in InGaAs/GaAsP Multiple Quantum Well Structures
Carlin, C Z
et al.
| 2013
2537
Thin Film Transistors - Hydrogenated IGZO Thin-Film Transistors Using High-Pressure Hydrogen Annealing
Oh, S-I
et al.
| 2013
2537
Hydrogenated IGZO Thin-Film Transistors Using High-Pressure Hydrogen Annealing
Oh, Se-I
/ Choi, Godeuni
/ Hwang, Hyunsang
et al.
| 2013
2542
Solution-Processed Logic Gates Based On Nanotube/Polymer Composite
Liu, Zhiying
/ Gao, Xindong
/ Zhu, Zhiwei
et al.
| 2013
2548
Measuring the Thermal Resistance in Light Emitting Diodes Using a Transient Thermal Analysis Technique
Natarajan, Shweta
/ Ha, Minseok
/ Graham, Samuel
et al.
| 2013
2548
Optoelectronics, Displays, and Imaging - Measuring the Thermal Resistance in Light Emitting Diodes Using a Transient Thermal Analysis Technique
Natarajan, S
et al.
| 2013
2556
Modification of a Driving Waveform in an AC Plasma Display Panel With Sc-doped MgO Protecting Layer
Kim, Joong Kyun
et al.
| 2013
2561
Low-Power CMOS Image Sensor Based on Column-Parallel Single-Slope/SAR Quantization Scheme
Tang, Fang
/ Chen, Denis Guangyin
/ Wang, Bo
et al.
| 2013
2567
Characterization of the First FBK High-Density Cell Silicon Photomultiplier Technology
Piemonte, Claudio
/ Ferri, Alessandro
/ Gola, Alberto
et al.
| 2013
2574
Investigation of Photo-Induced Hysteresis and Off-Current in Amorphous In-Ga-Zn Oxide Thin-Film Transistors Under UV Light Irradiation
Lee, Soo-Yeon
/ Kwon, Jang-Yeon
/ Han, Min-Koo
et al.
| 2013
2580
Characteristics of the GaAs Photoconductive Semiconductor Switch Operated in Linear-Alike Mode
Wang, Baojie
/ Zhang, Tian
/ Liu, Kefu
et al.
| 2013
2586
High Detectivity Uncooled Thermal Detectors With Resonant Cavity Coupled Absorption in the Long-Wave Infrared
Gawarikar, Anand S.
/ Shea, Ryan P.
/ Talghader, Joseph J.
et al.
| 2013
2592
Modified Pulsed MOS Capacitor for Characterization of Ultraclean Thin ${\rm p}/{\rm p}^{+}$ Silicon Epitaxial Layers
Elhami Khorasani, Arash
/ Alford, Terry Lynn
/ Schroder, Dieter K.
et al.
| 2013
2592
Solid State Device Phenomena - Modified Pulsed MOS Capacitor for Characterization of Ultraclean Thin p/p+ Silicon Epitaxial Layers
Elhami Khorasani, A
et al.
| 2013
2592
Modified Pulsed MOS Capacitor for Characterization of Ultraclean Thin p/p^+ Silicon Epitaxial Layers
Khorasani, A.E.
/ Alford, T.L.
/ Schroder, D.K.
et al.
| 2013
2598
Coupled Electro–Thermal Simulation for Self-Heating Effects in Graphene Transistors
Liu, Leitao
/ Lu, Yang
/ Guo, Jing
et al.
| 2013
2604
Impact of Single Charge Trapping on the Variability of Ultrascaled Planar and Trigate FDSOI MOSFETs: Experiment Versus Simulation
Subirats, Alexandre
/ Garros, Xavier
/ Husseini, Joanna El
et al.
| 2013
2611
A Novel p-i-n Inductor for Tunable Wideband Matching Network Application
Lee, Chie-In
/ Lin, Wei-Cheng
et al.
| 2013
2619
Photocapacitance Decay Technique for Interface Trap Characterization Near Inversion Band in Wide Bandgap MOS Capacitors
DasGupta, Sandeepan
/ Kaplar, Robert J.
/ Atcitty, Stanley
et al.
| 2013
2626
Sub 0.5 V Operation of Performance Driven Mobile Systems Based on Area Scaled Tunnel FET Devices
Rajoriya, Anukool
/ Shrivastava, Mayank
/ Gossner, Harald
et al.
| 2013
2634
Fabrication of a 128$\,\times\,$ 128 Pixels Charge Transfer Type Hydrogen Ion Image Sensor
Futagawa, Masato
/ Suzuki, Daiki
/ Otake, Ryota
et al.
| 2013
2634
Sensors and Actuators - Fabrication of a 128 s 128 Pixels Charge Transfer Type Hydrogen Ion Image Sensor
Futagawa, M
et al.
| 2013
2634
Fabrication of a 128 x 128 Pixels Charge Transfer Type Hydrogen Ion Image Sensor
Futagawa, M.
/ Suzuki, D.
/ Otake, R.
et al.
| 2013
2640
Transfer Function of Interfacial Stress Sensor for Artificial Skin Applications
Lu, Xiaozhou
/ Sundara-Rajan, Kishore
/ Lu, Wenke
et al.
| 2013
2648
CPW Tunable Band-Stop Filter Using Hybrid Resonator and Employing RF MEMS Capacitors
Zhang, Naibo
/ Deng, Zhongliang
/ Sen, Fan
et al.
| 2013
2656
Temperature-Stable Silicon Oxide (SilOx) Micromechanical Resonators
Tabrizian, Roozbeh
/ Casinovi, Giorgio
/ Ayazi, Farrokh
et al.
| 2013
2664
Analysis of Multipactor Effect Using a Phase-Shift Keying Single-Carrier Digital Modulated Signal
Gonzalez-Iglesias, Daniel
/ Rodriguez, Maria Pilar Belloch
/ Belda, Oscar Monerris
et al.
| 2013
2664
Vacuum Electron Devices - Analysis of Multipactor Effect Using a Phase-Shift Keying Single-Carrier Digital Modulated Signal
González-Iglesias, D
et al.
| 2013
2671
Automatic Optimization of a Klystron Interaction Structure
Lingwood, Christopher James
/ Burt, Graeme
/ Gunn, Kester James
et al.
| 2013
2677
Effects of Pulsewidth and Area of Carbon Nanotube Films on Their Pulsed Field Emission Characteristics
Zhang, Yu
/ Deng, Shaozhi
/ Du, Jiale
et al.
| 2013
2682
Observation of the Ambient Effect in BTI Characteristics of Back-Gated Single Layer Graphene Field Effect Transistors
Liu, Wen Jun
/ Sun, Xiao Wei
/ Tran, Xuan Anh
et al.
| 2013
2682
Emerging Technologies and Devices - Observation of the Ambient Effect in BTI Characteristics of Back-Gated Single Layer Graphene Field Effect Transistors
Liu, W J
et al.
| 2013
2687
a-IGZO TFTs With Inductively Coupled Plasma Chemical Vapor Deposited ${\rm SiO}_{x}$ Gate Dielectric
Xiao, Xiang
/ Deng, Wei
/ He, Xin
et al.
| 2013
2687
a-IGZO TFTs With Inductively Coupled Plasma Chemical Vapor Deposited SiO~x Gate Dielectric
Xiao, X.
/ Deng, W.
/ He, X.
et al.
| 2013
2687
BRIEF PAPERS - a-IGZO TFTs With Inductively Coupled Plasma Chemical Vapor Deposited SiOx Gate Dielectric
Xiao, X
et al.
| 2013
2691
Quantum Confinement and Volume Inversion in MOS3 Model for Short-Channel Tri-Gate MOSFETs
Kloes, A
et al.
| 2013
2691
Quantum Confinement and Volume Inversion in ${\rm MOS}^{3}$ Model for Short-Channel Tri-Gate MOSFETs
Kloes, Alexander
/ Schwarz, Mike
/ Holtij, Thomas
et al.
| 2013
2695
Modeling of Temperature and Field-Dependent Electron Mobility in a Single-Layer Graphene Sheet
Verma, Rekha
/ Bhattacharya, Sitangshu
/ Mahapatra, Santanu
et al.
| 2013
2699
3rd Berkeley Symposium on Energy Efficient Electronic Systems
| 2013
2700
Special issue on vacuum electronic devices
| 2013
C1
Table of contents
| 2013
C2
IEEE Transactions on Electron Devices publication information
| 2013
C3
IEEE Transactions on Electron Devices information for authors
| 2013