The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
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Volume 53,
Issue 10
Volume 53,
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Volume 53,
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Volume 53,
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Volume 53,
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Volume 53,
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Volume 53,
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Volume 53,
Issue 3
Volume 53,
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Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
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Volume 52,
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Volume 52,
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Volume 52,
Issue 8
Volume 52,
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Volume 52,
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Volume 52,
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Volume 52,
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Volume 52,
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Volume 52,
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Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 51,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 50,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
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Volume 49,
Issue 3
Volume 49,
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Volume 49,
Issue 1
Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
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Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
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Volume 47,
Issue 10
Volume 47,
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Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
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Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
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Volume 44,
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Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
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Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
3504
Fabrication of Vertically Stacked Nanosheet Junctionless Field-Effect Transistors and Applications for the CMOS and CFET Inverters
Sung, Po-Jung
/ Chang, Shu-Wei
/ Kao, Kuo-Hsing
et al.
| 2020
3510
An Analytical Model for Distributed Capacitance in Up–Down Series Stacked Inductors
Tayenjam, Sobhana
/ Vanukuru, Venkata
/ Sundaram, Kumaravel
et al.
| 2020
3516
Refractory W Ohmic Contacts to H-Terminated Diamond
Vardi, Alon
/ Tordjman, Moshe
/ Kalish, Rafi
et al.
| 2020
3522
Impact of High-k Gate Dielectric on Self-Heating Effects in PiFETs Structure
Belkhiria, Maissa
/ Echouchene, Fraj
/ Jaba, Nejeh
et al.
| 2020
3530
Analysis of Surface Charge Effects and Edge Fringing Capacitance in Planar GaAs and GaN Schottky Barrier Diodes
Orfao, B.
/ Vasallo, B. G.
/ Moro-Melgar, D.
et al.
| 2020
3536
Modeling and Analysis of Normally-OFF p-GaN Gate AlGaN/GaN HEMT as an ON-Chip Capacitor
Abdulsalam, Azwar
/ Karumuri, Naveen
/ Dutta, Gourab
et al.
| 2020
3541
Improvement of Electron Transport Property and on-Resistance in Normally-OFF Al₂O₃/AlGaN/GaN MOS-HEMTs Using Post-Etch Surface Treatment
Zhu, Jiejie
/ Jing, Siqi
/ Ma, Xiaohua
et al.
| 2020
3548
Advantage of SiO2 Intermediate Layer on the Electron Injection for Ti/n-Al0.60 Ga0.40 N Structure
Shao, Hua
/ Che, Jiamang
/ Kou, Jianquan
et al.
| 2020
3553
Design and Fabrication of Vertical GaN p-n Diode With Step-Etched Triple-Zone Junction Termination Extension
Lee, Hyun-Soo
/ Zhang, Yuxuan
/ Chen, Zhaoying
et al.
| 2020
3558
Impact of AlInN Back-Barrier Over AlGaN/GaN MOS-HEMT With HfO₂ Dielectric Using Cubic Spline Interpolation Technique
Sandeep, V.
/ Pravin, J. Charles
/ Ramesh Babu, A.
et al.
| 2020
3564
Surface-Potential-Based Compact Model for the Gate Current of p-GaN Gate HEMTs
Wang, Jie
/ Chen, Zhanfei
/ You, Shuzhen
et al.
| 2020
3568
Surface Potential-Based Analytical Modeling of Electrostatic and Transport Phenomena of GaN Nanowire Junctionless MOSFET
Khan, Md. Irfan
/ Rahman, I. K. M. Reaz
/ Khosru, Quazi D. M.
et al.
| 2020
3577
Accurate Temperature Estimation for Each Gate of GaN HEMT With n-Gate Fingers
Al-Saman, Amgad A.
/ Pei, Yi
/ Ryndin, Eugeny A.
et al.
| 2020
3585
Ge–GaAs–Ge Heterojunction MOSFETs for Mixed-Signal Applications
Mech, Bhubon Chandra
/ Koley, Kalyan
/ Kumar, Jitendra
et al.
| 2020
3592
Investigating Ferroelectric Minor Loop Dynamics and History Effect—Part I: Device Characterization
Wang, Panni
/ Wang, Zheng
/ Sun, Xiaoyu
et al.
| 2020
3598
Investigating Ferroelectric Minor Loop Dynamics and History Effect—Part II: Physical Modeling and Impact on Neural Network Training
Wang, Panni
/ Wang, Zheng
/ Sun, Xiaoyu
et al.
| 2020
3605
Neuro-Inspired-in-Memory Computing Using Charge-Trapping MemTransistor on Germanium as Synaptic Device
Chou, Yu-Che
/ Tsai, Chien-Wei
/ Yi, Chin-Ya
et al.
| 2020
3610
Reaction-Drift Model for Switching Transients in Pr₀.₇Ca₀.₃MnO₃-Based Resistive RAM
Saraswat, Vivek
/ Prasad, Shankar
/ Khanna, Abhishek
et al.
| 2020
3618
JSW of 5.5 MA/cm2 and RA of 5.2-Ω · μm2 STT-MRAM Technology for LLC Application
Sakhare, Sushil
/ Rao, Siddharth
/ Perumkunnil, Manu
et al.
| 2020
3626
Operation Characteristics of Gate-All-Around Junctionless Flash Memory Devices With Si₃N₄/ZrO-Based Stacked Trapping Layer
Fang, Hsin-Kai
/ Chang-Liao, Kuei-Shu
/ Cheng, Chia-Hsin
et al.
| 2020
3632
Non-Volatile Field-Effect Transistors Enabled by Oxygen Vacancy-Related Dipoles for Memory and Synapse Applications
Peng, Yue
/ Xiao, Wenwu
/ Liu, Fenning
et al.
| 2020
3637
Analytical Drain Current and Capacitance Model for Amorphous InGaZnO TFTs Considering Temperature Characteristics
He, Hongyu
/ Xiong, Chao
/ Yin, Junli
et al.
| 2020
3645
Interface Defect Shielding of Electron Trapping in a-InGaZnO Thin Film Transistors
Lin, Chih-Chih
/ Tai, Mao-Chou
/ Chang, Ting-Chang
et al.
| 2020
3650
High Output Power GaN-Based Green Resonant-Cavity Light-Emitting Diodes With Trapezoidal Quantum Wells
Wu, Haocheng
/ Li, Heng
/ Kuo, Shiou-Yi
et al.
| 2020
3655
A Simple Method to Realize Millilens Array on Encapsulant Layer for Enhancing Light Efficiency of COB-LEDs
Yu, Xingjian
/ Xiang, Linyi
/ Pei, Naiqi
et al.
| 2020
3660
Study of Novel Dye-Sensitized Solar Cells With Modified Photoelectrode by ZrO2 and rGO Doped TiO2 Composite Nanofibers
Nien, Yu-Hsun
/ Hsu, Hui-Hsuan
/ Hu, Geng-Ming
et al.
| 2020
3667
Improving the Efficiency of GaInP/GaAs Light Emitters Using Surface Passivation
Tripathi, Tripurari S.
/ Radevici, Ivan
/ Dagyte, Vilgaile
et al.
| 2020
3673
Comparison of 2.3-kV 4H-SiC Accumulation-Channel Planar Power MOSFETs Fabricated With Linear, Square, Hexagonal, and Octagonal Cell Topologies
Agarwal, Aditi
/ Han, Kijeong
/ Baliga, B. J.
et al.
| 2020
3679
1200-V 4H-SiC Merged p-i-n Schottky Diodes With High Avalanche Capability
Liu, Li
/ Wu, Jiupeng
/ Ren, Na
et al.
| 2020
3685
SiC Trench MOSFET With Reduced Switching Loss and Increased Short-Circuit Capability
Yang, Tongtong
/ Wang, Yan
/ Yue, Ruifeng
et al.
| 2020
3691
Evaluation of Dynamic Avalanche Performance in 1.2-kV MOS-Bipolar Devices
Luo, Peng
/ Madathil, Sankara Narayanan Ekkanath
/ Nishizawa, Shin-Ichi
et al.
| 2020
3698
Impact of Varied Buffer Layer Designs on Single-Event Response of 1.2-kV SiC Power MOSFETs
Lu, Jiang
/ Liu, Jiawei
/ Tian, Xiaoli
et al.
| 2020
3705
Static and Transient Simulation of 4H-SiC VDMOS Using Full-Band Monte Carlo Simulation That Includes Real-Space Treatment of the Coulomb Interactions
Cheng, Chi-Yin
/ Vasileska, Dragica
et al.
| 2020
3711
Alcohol-Based Sulfur Treatment for Improved Performance and Yield in Local Back-Gated and Channel-Length-Scaled MoS₂ FETs
Sanjay, Sooraj
/ Sahoo, Krutikesh
/ Bhat, Navakanta
et al.
| 2020
3716
Thermoelectric Property Requirements for On-Chip Cooling of Device Transients
Nimmagadda, Lakshmi Amulya
/ Sinha, Sanjiv
et al.
| 2020
3722
Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides
Nicholls, Jordan R.
/ Vidarsson, Arnar M.
/ Haasmann, Daniel
et al.
| 2020
3729
Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions
Franchini, Giulio
/ Spinelli, Alessandro S.
/ Nicosia, Gianluca
et al.
| 2020
3736
Effect of Thermal Management on the Performance of VCSELs
Pan, Po-Chou
/ Nag, Dhiman
/ Khan, Zuhaib
et al.
| 2020
3740
Experimental Determination of Impact Ionization Coefficients Along 〈1120〉 in 4H-SiC
Stefanakis, Dionysios
/ Chi, Xilun
/ Maeda, Takuya
et al.
| 2020
3745
Analysis of Metal Work-Function Modulation Effect in Reconfigurable Field-Effect Transistor
Li, Xianglong
/ Sun, Yabin
/ Liu, Ziyu
et al.
| 2020
3753
On-Chip Fully Integrated Field Emission Arrays for High-Voltage MEMS Applications
Deka, Nishita
/ Subramanian, Vivek
et al.
| 2020
3761
Characterizations of Electrolyte–Insulator–Semiconductor Sensors With Array Wells and a Stack-Sensing Membrane
Chen, Henry J. H.
/ Huang, Yo-Chen
/ Lee, Tzu Nien
et al.
| 2020
3767
Graphene Oxide Wrapped Hollow SnO2 Sphere for Room Temperature Formaldehyde Sensing: An Insight Through Computational Analysis & Experimental Study
Manna, Bibhas
/ Acharyya, Snehanjan
/ Chakrabarti, Indrajit
et al.
| 2020
3775
A New Method to Correlate Human Body Model and Transmission Line Pulse Based on RC Thermal Equivalent Model
Wang, Yize
/ Wang, Yuan
et al.
| 2020
3781
A Novel Chevron-Shape Double-Staggered Grating Waveguide Slow Wave Structure for Terahertz Traveling Wave Tubes
Babaeihaselghobi, Akbar
/ Akram, Muhammad Nadeem
/ Ghavifekr, Habib Badri
et al.
| 2020
3788
Demonstration of a High-Power Ka-Band Extended Interaction Klystron
Zhao, Ding
/ Gu, Wei
/ Hou, Xiaowan
et al.
| 2020
3795
Competition of Oscillations at Different Cyclotron Harmonics in the Subterahertz Large-Orbit Gyrotron
Kalynov, Yuriy K.
/ Osharin, Ivan V.
/ Savilov, Andrei V.
et al.
| 2020
3802
Modeling and Experiments of an Injection-Locked Magnetron With Various Load Reflection Levels
Chen, Xiaojie
/ Yang, Bo
/ Shinohara, Naoki
et al.
| 2020
3809
Theoretical Investigations on Forward-Wave and Backward-Wave Operation of a Frequency-Tunable Gyrotron
Huang, Jie
/ Song, Tao
/ Zhang, Chen
et al.
| 2020
3815
Effects of the Magnetic Field Taper on a Continuously Frequency-Tunable Gyrotron
Song, Tao
/ Wang, Wei
/ Zhang, Chen
et al.
| 2020
3821
Multioutput Circuit for Low Voltage Ultracompact W-Band Klystron
Zheng, Yuan
/ Sy, Ann
/ Weatherford, Brandon
et al.
| 2020
3828
ALD-Derived, Low-Density Alumina as Solid Electrolyte in Printed Low-Voltage FETs
Neuper, Felix Joachim
/ Marques, Gabriel Cadilha
/ Singaraju, Surya Abhishek
et al.
| 2020
3834
Modeling and Design of Thin-Film π-Type Micro Thermoelectric Generator Using Vacuum/Insulator-Hybrid Isolation for Self-Powered Wearable Devices
Shiotsu, Yusaku
/ Seino, Toshimasa
/ Kondo, Tsuyoshi
et al.
| 2020
3843
Sustained Benefits of NCFETs Under Extreme Scaling to the End of the IRDS
Cam, Thomas
/ Wang, Ji Kai
/ Wong, Michael
et al.
| 2020
3852
Modeling and Design of a New Piezoelectronic Transistor for Ultralow-Voltage High-Speed Integrated Circuits
Shiotsu, Yusaku
/ Yamamoto, Shuu'ichirou
/ Shuto, Yusuke
et al.
| 2020
3861
Scaling Trends of Monolithic 3-D Complementary Metal–Oxide–Semiconductor Nanoelectromechanical Reconfigurable Logic Circuits
Ko, Ji Wang
/ Baek, Gwangryeol
/ Choi, Woo Young
et al.
| 2020
3868
Limits on Hysteresis-Free Sub-60 mV/Decade Operation of MFIS Nanowire Transistor
Semwal, Sandeep
/ Reddy, Veldanda Pranay
/ Jaiswal, Nivedita
et al.
| 2020
3876
Impact of Switching Voltage on Complementary Steep-Slope Tunnel Field Effect Transistor Circuits
Kato, Kimihiko
/ Tanamoto, Tetsufumi
/ Mori, Takahiro
et al.
| 2020
3883
Dynamic Skyrmion-Mediated Switching of Perpendicular MTJs: Feasibility Analysis of Scaling to 20 nm With Thermal Noise
Rajib, Md Mahadi
/ Misba, Walid Al
/ Bhattacharya, Dhritiman
et al.
| 2020
3889
Vertically Stacked Gate-All-Around Structured Tunneling-Based Ternary-CMOS
Kim, Sihyun
/ Lee, Kitae
/ Lee, Jong-Ho
et al.
| 2020
3894
Sub-50-mV Nanoelectromechanical Switch Without Body Bias
Saha, Sumit
/ Baghini, Maryam Shojaei
/ Goel, Mayank
et al.
| 2020
3898
Numerical Solutions for Electric Field Lines and Breakdown Voltages in Superjunction-Like Power Devices
Huang, Haimeng
/ Hu, Ke
/ Xu, Wenjia
et al.
| 2020
3903
Quantitative Analysis of High-Pressure Deuterium Annealing Effects on Vertically Stacked Gate-All-Around SONOS Memory
Yu, Ji-Man
/ Park, Jun-Young
/ Yoo, Tae Jin
et al.
| 2020
3908
Complete Avalanche Process and Failure Mechanism of Trench-Gate FS-IGBT Under Unclamped Inductive Switching by Using Infrared Visualization Method
Tong, Xin
/ Liu, Siyang
/ Sun, Weifeng
et al.
| 2020
3912
Low Temperature Processing of Electronic Materials for Cutting Edge Devices
| 2020
3914
TechRxiv
| 2020
3915
Introducing IEEE Collabratec
| 2020
3916
IEEE Open Access Publishing
| 2020
C1
Table of contents
| 2020
C2
IEEE Transactions on Electron Devices publication information
| 2020
C3
IEEE Transactions on Electron Devices information for authors
| 2020