IEEE Transactions on Nuclear Science
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Table of contents
- 193
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Table of Contents| 2022
- 196
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Conference Comments by the General ChairMcClure, Steve et al. | 2022
- 199
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Special NSREC 2021 Issue of the IEEE Transactions on Nuclear Science Editor CommentsFleetwood, Dan / Brown, Dennis / Quinn, Heather et al. | 2022
- 200
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NSREC 2021 Special Issue of the IEEE Transactions on Nuclear Science List of Reviewers| 2022
- 201
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2021 IEEE Nuclear and Space Radiation Effects Conference Awards: Comments by the ChairBlack, Jeffrey et al. | 2022
- 203
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Outstanding Conference Paper Award: 2021 IEEE Nuclear and Space Radiation Effects Conference| 2022
- 205
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In Memoriam Tso-Ping (T.-P.) Ma| 2022
- 206
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In Memoriam George Clement Messenger, Jr.| 2022
- 207
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In Memoriam Frederick William Sexton| 2022
- 208
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A Comparison of Radiation-Induced and High-Field Electrically Stress-Induced Interface Defects in Si/SiO₂ MOSFETs via Electrically Detected Magnetic ResonanceSharov, Fedor V. / Moxim, Stephen J. / Haase, Gaddi S. et al. | 2022
- 216
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Effects of Ion-Induced Displacement Damage on GaN/AlN MEMS ResonatorsSui, Wen / Zheng, Xu-Qian / Lin, Ji-Tzuoh et al. | 2022
- 225
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Evolution and Mechanism of P-GaN Films Under Proton Irradiation and Its Influence on Electronic DeviceTang, Yun / Wang, Lei / Zhu, Huiping et al. | 2022
- 232
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An SRAM SEU Cross Section Curve Physics ModelKobayashi, Daisuke / Hirose, Kazuyuki / Sakamoto, Keita et al. | 2022
- 241
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Energy Deposition by Ultrahigh Energy Ions in Large and Small Sensitive VolumesBagatin, M. / Gerardin, S. / Paccagnella, A. et al. | 2022
- 248
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Analysis of Heavy-Ion-Induced Leakage Current in SiC Power DevicesJohnson, Robert A. / Witulski, Arthur F. / Ball, Dennis R. et al. | 2022
- 254
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Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter ExtractionLudeke, Sascha / Javanainen, Arto et al. | 2022
- 264
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Using Machine Learning to Determine Proton Cross-Sections From Heavy-Ion DataHansen, D. L. / Czajkowski, D. / Vermeire, B. et al. | 2022
- 273
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G4SEE: A Geant4-Based Single Event Effect Simulation Toolkit and Its Validation Through Monoenergetic Neutron MeasurementsLucsanyi, David / Alia, Ruben Garcia / Bilko, Kacper et al. | 2022
- 282
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Response of Integrated Silicon Microwave pin Diodes to X-Ray and Fast-Neutron IrradiationTeng, Jeffrey W. / Nergui, Delgermaa / Parameswaran, Hari et al. | 2022
- 290
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Radiation-Induced Junction-Leakage Random-Telegraph-SignalDewitte, Hugo / Goiffon, Vincent / Le Roch, Alexandre et al. | 2022
- 299
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Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETsRony, M. W. / Zhang, En Xia / Toguchi, Shintaro et al. | 2022
- 307
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Influence of Fin and Finger Number on TID Degradation of 16-nm Bulk FinFETs Irradiated to Ultrahigh DosesMa, Teng / Bonaldo, Stefano / Mattiazzo, Serena et al. | 2022
- 314
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Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand DevicesCao, Jingchen / Wang, Peng Fei / Li, Xun et al. | 2022
- 321
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Total Ionizing Dose Effects on Read Noise of MLC 3-D NAND MemoriesSurendranathan, Umeshwarnath / Wasiolek, Maryla / Hattar, Khalid et al. | 2022
- 327
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Effect of Frequency on Total Ionizing Dose Response of Ring Oscillator Circuits at the 7-nm Bulk FinFET NodeFeeley, Alex / Xiong, Yoni / Guruswamy, Nithin et al. | 2022
- 333
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Reliability Improvement on SRAM Physical Unclonable Function (PUF) Using an 8T Cell in 28 nm FDSOISu, Zexin / Li, Bo / Zhang, Weidong et al. | 2022
- 340
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Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply VoltagesLi, Tongde / Zhao, Yuanfu / Wang, Liang et al. | 2022
- 349
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Effects of Total Ionizing Dose on SRAM Physical Unclonable FunctionsLawrence, S. P. / Smith, S. C. / Cannon, J. M. et al. | 2022
- 359
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Comparison of Total Ionizing Dose Effects in SOI FinFETs Between Room and High TemperatureZhang, Xu / Liu, Fanyu / Li, Bo et al. | 2022
- 367
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In Situ Measurement of TID-Induced Leakage Using On-Chip Frequency ModulationVibbert, S. T. / Watkins, A. C. / D'Amico, J. V. et al. | 2022
- 374
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Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI TransistorsWatkins, A. C. / Vibbert, S. T. / D'Amico, J. V. et al. | 2022
- 381
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Using Machine Learning to Mitigate Single-Event Upsets in RF Circuits and SystemsIldefonso, Adrian / Kimball, Jacob P. / Khachatrian, Ani et al. | 2022
- 390
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Total Ionizing Dose Effects on Long-Term Data Retention Characteristics of Commercial 3-D NAND MemoriesBuddhanoy, Matchima / Kumari, Preeti / Surendranathan, Umeshwarnath et al. | 2022
- 397
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Dealing With Ion LET Uncertainties: An Application of Generalized Linear ModelsLadbury, Raymond L. et al. | 2022
- 406
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Single-Event Effects Induced by Heavy Ions in SONOS Charge Trapping Memory ArraysXiao, T. Patrick / Bennett, Christopher H. / Agarwal, Sapan et al. | 2022
- 414
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Measuring and Modeling Single Event Transients in 12-nm InvertersAgarwal, Sapan / Clark, Lawrence T. / Youngsciortino, Clifford et al. | 2022
- 422
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Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology NodeXiong, Yoni / Feeley, Alexandra T. / Ball, Dennis R. et al. | 2022
- 429
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Pulsed-Laser Testing to Quantitatively Evaluate Latchup Sensitivity in Mixed-Signal ASICsHales, Joel M. / Khachatrian, Ani / Ildefonso, Adrian et al. | 2022
- 436
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Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUsdos Santos, Fernando Fernandes / Malde, Sujit / Cazzaniga, Carlo et al. | 2022
- 444
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Comparison of Parallel Implementation Strategies in GPU-Accelerated System-on-Chip Under Proton IrradiationBadia, Jose M. / Leon, German / Belloch, Jose A. et al. | 2022
- 453
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Total Ionizing Dose Radiation Effects Hardening Using Back-Gate Bias in Double-SOI StructureHuang, Yang / Han, Zhengsheng / Liu, Fanyu et al. | 2022
- 462
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Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOSAviles, Pablo M. / Lindoso, Almudena / Belloch, Jose A. et al. | 2022
- 470
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Analyzing Reduced Precision Triple Modular Redundancy Under Proton IrradiationGarcia-Astudillo, Luis A. / Entrena, Luis / Lindoso, Almudena et al. | 2022
- 478
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Analytical Bit-Error Model of NAND Flash Memories for Dosimetry ApplicationKumari, Preeti / Surendranathan, Umeshwarnath / Wasiolek, Maryla et al. | 2022
- 485
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Measurements of Low-Energy Protons Using a Silicon Detector for Application to SEE TestingCazzaniga, Carlo / Alia, Ruben Garcia / Coronetti, Andrea et al. | 2022
- 491
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Application of an SOI Microdosimeter for Monitoring of Neutrons in Various Mixed Radiation Field EnvironmentsPan, V. A. / Vohradsky, J. / James, B. et al. | 2022
- 501
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Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak During D-D Plasma OperationAutran, J. L. / Moindjie, S. / Munteanu, D. et al. | 2022
- 512
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Temperature Dependence of Low-Dose Radiation-Induced Attenuation of Germanium-Doped Optical Fiber at Infrared WavelengthsMorana, A. / Campanella, C. / Aubrey, M. et al. | 2022
- 518
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Modeling Transient Loss Due to Ionizing Particles in Silicon Photonic WaveguidesGoley, Patrick S. / Maggioni, Giovanni Maria / Preisler, Edward et al. | 2022
- 527
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Single-Event Transients in a Commercially Available, Integrated Germanium Photodiode for Silicon Photonic SystemsTzintzarov, George N. / Teng, Jeffrey W. / Bozovich, Amanda N. et al. | 2022
- 534
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Radiation Characterization of a Backside-Illuminated P-Type Photo-MOS Pixel With Gamma Rays and Fusion-Induced NeutronsMalherbe, Victor / Roy, Francois / Nier, Olivier et al. | 2022
- 542
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Member Get-A-Member (MGM) Program| 2022
- 543
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Introducing IEEE Collabratec| 2022
- 544
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TechRxiv: Share Your Preprint Research with the World!| 2022
- 545
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Announcing the New Senior Editor for the Real Time ConferenceBell, Zane W. et al. | 2022
- 546
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Radiation-Induced Transient Response Mechanisms in Photonic WaveguidesRyder, Landen D. / Schrimpf, Ronald D. / Reed, Robert A. et al. | 2022
- 558
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Estimation of the Trap Energy Characteristics of Row Hammer-Affected Cells in Gamma-Irradiated DDR4 DRAMBaeg, Sanghyeon / Yun, Donghyuk / Chun, Myungsun et al. | 2022
- 567
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High Energy and Thermal Neutron Sensitivity of Google Tensor Processing UnitsRech Junior, Rubens Luiz / Malde, Sujit / Cazzaniga, Carlo et al. | 2022
- 576
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The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon DiodesLiao, C. / Fretwurst, E. / Garutti, E. et al. | 2022
- 587
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Effects of Bias and Temperature on Interface-Trap Annealing in MOS and Linear Bipolar DevicesFleetwood, Daniel M. et al. | 2022
- 609
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Displacement Damage Effects of Pulse Discharge Circuit Switched by Anode-Short MOS-Controlled ThyristorLi, Lei / Chen, Xiao-Chi / Zeng, Guang et al. | 2022
- 620
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IDeF-X HDBD: Low-Noise ASIC for Imaging Spectroscopy With Semiconductor Detectors in Space Science ApplicationsBaudin, D. / Limousin, O. / Gevin, O. et al. | 2022
- 627
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Characterization of 8 MeV Cherenkov Thresholding of Carbon Dioxide GasChen, Xiang / Guan, Xing-Yin / Weng, Xiu-Feng et al. | 2022
- 634
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Design of the Front-End Electronics for Silicon Beam Profilometer Prototype for Light Ions at the BM@N ExperimentTopko, Y. / Khabarov, S. / Topko, B. et al. | 2022
- 639
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Diagnostic of Fusion Neutrons on EAST Tokamak Using 4H-SiC DetectorHong, B. / Zhong, G. Q. / Hu, L. Q. et al. | 2022
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Front Cover| 2022
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IEEE Transactions on Nuclear Science publication information| 2022
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IEEE Transactions on Nuclear Science information for authors| 2022
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2022