The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
Issue 11
Volume 53,
Issue 10
Volume 53,
Issue 9
Volume 53,
Issue 8
Volume 53,
Issue 7
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
Issue 11
Volume 52,
Issue 10
Volume 52,
Issue 9
Volume 52,
Issue 8
Volume 52,
Issue 7
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
Issue 11
Volume 51,
Issue 10
Volume 51,
Issue 9
Volume 51,
Issue 8
Volume 51,
Issue 7
Volume 51,
Issue 6
Volume 51,
Issue 5
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 12
Volume 50,
Issue 11
Volume 50,
Issue 10
Volume 50,
Issue 9
Volume 50,
Issue 8
Volume 50,
Issue 7
Volume 50,
Issue 6
Volume 50,
Issue 5
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 12
Volume 49,
Issue 11
Volume 49,
Issue 10
Volume 49,
Issue 9
Volume 49,
Issue 8
Volume 49,
Issue 7
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
Issue 11
Volume 48,
Issue 10
Volume 48,
Issue 9
Volume 48,
Issue 8
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
201
An investigation of graded and uniform base Ge(x)Sei(1-x) HBT's using a Monte Carlo simulation
Hughes, D.T.
/ Abram, R.A.
/ Kelsall, R.W.
et al.
| 1994
209
Breakdown analysis of an asymmetrical double recessed power MESFET's
Gaquiere, C.
/ Bonte, B.
/ Theron, D.
et al.
| 1994
215
Direct measurement of the carrier leakage out of the active region in InGaAsP/InP laser heterostructures
Belenky, G.L.
/ Kazarinov, R.F.
/ Lopata, J.
et al.
| 1994
219
Low frequency noise characteristics of self-aligned AlGaAs/GaAs power heterojunction bipolar transistors
Tutt, M.N.
/ Pavlidis, D.
/ Khatibzadeh, A.
et al.
| 1994
231
Cutoff frequency and responsivity limitation of AlInAs/GaInAs MSM PD using a two dimensional bipolar physical model
Ashour, I.S.
/ El Kadi, H.
/ Sherif, K.
et al.
| 1994
239
Evaluation of the bonded silicon on insulator (SOI) wafer and the characteristics of PIN photodiodes on the bonded SOI wafer
Usami, A.
/ Kaneko, K.
/ Fujii, Y.
et al.
| 1994
244
Monolithic CCD imagers in HgCdTe
Wasworth, M.V.
/ Borrelo, S.R.
/ Dodge, J.
et al.
| 1994
251
High performance poly-Si TFTs fabricated using pulsed laser annealing and remote plasma CVD with low temperature processing
Kohno, A.
/ Sameshima, T.
/ Sano, S.
et al.
| 1994
266
Precise extraction of emitter resistance from an improved floating collector measurement
Morizuka, K.
/ Hidaka, O.
/ Mochizuki, H.
et al.
| 1994
288
Transconductance enhancement due to back bias for submicron NMOSFET
Guo, J.C.
/ Chang, M.C.
/ Lu, C.Y.
et al.
| 1994
295
An advanced technique for fabricating hemispherical-grained (HSG) silicon storage electrodes
Watanabe, H.
/ Tatsumi, T.
/ Ikarashi, T.
et al.
| 1994
301
An improved analytical solution of energy balance equation for short-channel SOI MOSFET's and transverse-field-induced carrier heating
Omura, Y.
et al.
| 1994
307
Characteristics of self-induced lightly-doped-drain polycrystalline silicon thin film transistors with liquid-phase deposition SiO2 as gate-insulator and passivation-layer
Yeh, C.F.
/ Yang, T.Z.
/ Chen, T.J.
et al.
| 1994
321
Base current reversal phenomenon in a CMOS compatible high gain n-p-n gated lateral bipolar transistor
Huang, T.H.
/ Chen, M.J.
et al.
| 1994
334
Forward biased safe operating area of emitter switched thyristors
Iwamuro, N.
/ Shekar, M.S.
/ Jayant Baliga, B.
et al.
| 1994
340
Beam focusing for field-emission flat-panel displays
Kesling, W.D.
/ Hunt, C.E.
et al.
| 1994
356
Characteristics of new dielectric isolation wafers for high voltage power IC's by single-Si poly-Si direct bonding (SPSDB) technique
Inoue, Y.
/ Sugawara, Y.
/ Kurita, S.
et al.
| 1994
360
Long-term bias temperature reliability of P(+) polysilicon gated FET devices
Abadeer, W.W.
/ Tonti, W.R.
/ Hänsch, W.E.
et al.
| 1994
367
The modified structure of the lateral IGBT on the SOI wafer for improving the dynamic latch-up characteristics
Sumida, H.
/ Hirabayashi, A.
/ Kumagai, N.
et al.
| 1994
2233
Currents and Current Gain Analysis of Passivated Heterojunction Bipolar Transistors (HBT)
Zebda, Y.
et al.
| 1994
2233
Currents and current gain analysis of passivated heterojunction bipolar transistor (HBT)
Zebda, Y.
/ Qasaimeh, O.
et al.
| 1994
2241
How to Make an Ideal HBT and Sell it Too
Luryi, S.
et al.
| 1994
2248
A New Physical Model of the Light Amplifying Optical Switch
Zebda, Y.
et al.
| 1994
2248
A new physical model of the light amplifying optical switch (LAOS)
Zebda, Y.
/ Qasaimeh, O.
et al.
| 1994
2256
Two-Dimensional Analysis of Substrate-Related Kink Phenomena in GaAs MESFET's
Horio, K.
et al.
| 1994
2262
Improved Model for Kink Effect in AlGaAs-InGaAs Heterojunction FET's
Hori, Y.
et al.
| 1994
2268
Physics of Breakdown in InAlAs-n+-InGaAs Heterostructure Field-Effect Transistors
Bahl, S.R.
et al.
| 1994
2276
Drawbacks to Using NIST Electromigration Test-Structures to Test Bamboo Metal Lines
Munari, I.De
et al.
| 1994
2281
Fabrication of Submicron Junctions--Proximity Rapid Thermal Diffusion of Phosphorus, Boron, and Arsenic
Zagozdzon-Wosik, W.
et al.
| 1994
2291
Analysis of Photoelectric Conversion Characteristics Under Knee Control Operation for CCD Imagers
Nakamura, N.
et al.
| 1994
2297
Room Temperature Electroabsorption in a GexSi1 - x PIN Photodiode
Murtaza, S.
et al.
| 1994
2301
Double-Drift Avalanche Photodetectors
Loach Jr, B.C.De
et al.
| 1994
2305
Analysis of Resistance Behavior in Ti- and Ni-Salicided Polysilicon Films
Ohguro, T.
et al.
| 1994
2318
A Quadruple Well, Quadruple Polysilicon BiCMOS Process for Fast 16 Mb SRAM's
Hayden, J.D.
et al.
| 1994
2326
Determining the Drain Doping in DMOS Transistors Using the Hump in the Leakage Current
Zupac, D.
et al.
| 1994
2337
A New Technique for Measuring Coupling Coefficients and 3-D Capacitance Characterization of Floating-Gate Devices
Choi, W.L.
et al.
| 1994
2343
Application of Selective Epitaxial Silicon and Chemo-Mechanical Polishing to Bipolar Transistors
Nguyen, C.T.
et al.
| 1994
2351
Hot-Carrier-Injected Oxide Region in Front and Back Interfaces in Ultra-Thin (50 nm), Fully Depleted, Deep-Submicron NMOS and PMOSFET's-SIMOX and their Hot Carrier Immunity
Tsuchiya, T.
et al.
| 1994
2357
On the Universality of Inversion Layer Mobility in Si MOSFET's: Part I--Effects of Substrate Impurity Concentration
Takagi, S.
et al.
| 1994
2363
On the Universality of Inversion Layer Mobility in Si MOSFET's: Part II - Effects of Surface Orientation
Takagi, S.
/ Toriumi, A.
/ Iwase, M.
et al.
| 1994
2363
On the Universality of Inversion Layer Mobility in Si MOSFETts: Part II--Effects of Surface Orientation
Takagi, S.
et al.
| 1994
2369
Characteristics of sub-1/4-micron gate surface channel PMOSFET's using a multilayer gate structure of boron-doped poly-Si on thin nitrogen-doped poly-Si
Okazaki, Y.
/ Nakayama, S.
/ Miyake, M.
et al.
| 1994
2369
Characteristics of Sub-1/4-m Gate Surface Channel PMOSFET'sa using a Multilayer Gate Structure of Boron-Doped Poly-Si on Thin Nitrogen-Doped Poly-Si
Okazaki, Y.
/ Nakayama, S.
/ Miyake, M.
et al.
| 1994
2369
Characteristics of Sub-1-4-mm Gate Surface Channel PMOSFET's using a Multilayer Gate Structure of Boron-Doped Poly-Si on Thin Nitrogen-Doped Poly-Si
Okazaki, Y.
et al.
| 1994
2376
Electrical and Optical Speed Measurements on the Silicon Heterostructure Switch
Green, R.J.
et al.
| 1994
2385
Transient Base Dynamics of Bipolar Transistors in High Injection
Seitchik, J.A.
et al.
| 1994
2391
Influence of Lattice Self-Heating and Hot-Carrier Transport on Device Performance
Liang, M.
et al.
| 1994
2399
Inverter performance of 0.10 micron CMOS operating at room temperature
Inaba, S.
/ Mizuno, T.
/ Iwase, M.
et al.
| 1994
2399
Inverter Performance of 0.10 m CMOS Operating at Room Temperature
Inaba, S.
/ Mizuno, T.
/ Iwase, M.
et al.
| 1994
2399
Inverter Performance of 0.10 mm CMOS Operating at Room Temperature
Inaba, S.
et al.
| 1994
2405
A Room Temperature 0.1 m CMOS on SOI
Shahidi, G. G.
/ Anderson, C. A.
/ Chappell, B. A.
et al.
| 1994
2405
A Room Temperature 0.1 mm CMOS on SOI
Shahidi, G.G.
et al.
| 1994
2413
Investigation of Carrier Generation in Fully Depleted Enhancement and Accumulation Mode SOI MOSFET's
Sinha, S.P.
et al.
| 1994
2417
Stress-Induced Current in Nitride and Oxidized Nitride Thin Films
Mazumder, M.K.
et al.
| 1994
2423
Arriving at a Unified Model for Hot-Carrier Degradation in MOSFET's Through Gate-to-Drain Capacitance Measurement
Ghodsi, R.
et al.
| 1994
2430
Si-Si1 - xGex Valence Band Discontinuity Measurements Using a Semiconductor-Insulator-Semiconductor (SIS) Heterostructure
Gan, C.H.
et al.
| 1994
2440
General Drift-Diffusion Theory of the Current Density in Schottky Diodes
Mieghem, P.Van
et al.
| 1994
2448
Secondary Electron Emission Properties of Oxidized Beryllium CFA Cathodes
Shih, A.
et al.
| 1994
2455
Stochastic Extension of Synchronism Time
Davidovsky, V.Y.
et al.
| 1994
2460
Characterization of an Impregnated Scandate Cathode Using a Semiconductor Model
Raju, R.S.
et al.
| 1994
2468
Turnoff Transient Characteristics of Complementary Insulated-Gate Bipolar Transistor
Li, Z.
et al.
| 1994
2471
Miller's Approximation in Advanced Bipolar Transistors Under Nonlocal Impact Ionization Conditions
Kumar, M.J.
et al.
| 1994
2473
Simulation of High-Efficiency n+p Indium Phosphide Solar Cell Results and Future Improvements
Jain, R.K.
et al.
| 1994
2475
Interface Trap Effect on Gate Induced Drain Leakage Current in Submicron N-MOSFET's
Wang, T.
et al.
| 1994
2477
Nonuniform Reverse-Breakdown Characteristics of n+-Diodes Fabricated by LOCOS and Trench Isolation
Ohzone, T.
et al.
| 1994
2480
A New Approach to Current-Voltage Characteristics Formation for Short-Channel MOSFET's
Wong, H.
et al.
| 1994
2482
An Orthogonal-Transfer CCD Imager
Burke, B.E.
et al.
| 1994
2484
1994 INDEX
| 1994