The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume 269,
Issue 24
Volume 269,
Issue 23
Volume 269,
Issue 22
Volume 269,
Issue 21
Volume 269,
Issue 20
Volume 269,
Issue 19
Volume 269,
Issue 18
Volume 269,
Issue 17
Volume 269,
Issue 16
Volume 269,
Issue 15
Volume 269,
Issue 14
Volume 269,
Issue 13
Volume 269,
Issue 12
Volume 269,
Issue 11
Volume 269,
Issue 10
Volume 269,
Issue 9
Volume 269,
Issue 8
Volume 269,
Issue 7
Volume 269,
Issue 6
Volume 269,
Issue 5
Volume 269,
Issue 4
Volume 269,
Issue 3
Volume 269,
Issue 2
Volume 269,
Issue 1
Volume 268,
Issue 24
Volume 268,
Issue 23
Volume 268,
Issue 22
Volume 268,
Issue 21
Volume 268,
Issue 20
Volume 268,
Issue 19
Volume 268,
Issue 18
Volume 268,
Issue 17
Volume 268,
Issue 16
Volume 268,
Issue 15
Volume 268,
Issue 14
Volume 268,
Issue 13
Volume 268,
Issue 12
Volume 268,
Issue 11
Volume 268,
Issue 10
Volume 268,
Issue 9
Volume 268,
Issue 8
Volume 268,
Issue 7
Volume 268,
Issue 6
Volume 268,
Issue 5
Volume 268,
Issue 4
Volume 268,
Issue 3
Volume 268,
Issue 2
Volume 268,
Issue 1
Volume 267,
Issue 24
Volume 267,
Issue 23
Volume 267,
Issue 22
Volume 267,
Issue 21
Volume 267,
Issue 20
Volume 267,
Issue 19
Volume 267,
Issue 18
Volume 267,
Issue 17
Volume 267,
Issue 16
Volume 267,
Issue 15
Volume 267,
Issue 14
Volume 267,
Issue 13
Volume 267,
Issue 12
Volume 267,
Issue 11
Volume 267,
Issue 10
Volume 267,
Issue 9
Volume 267,
Issue 8
Volume 267,
Issue 7
Volume 267,
Issue 6
Volume 267,
Issue 5
Volume 267,
Issue 4
Volume 267,
Issue 3
Volume 267,
Issue 2
Volume 267,
Issue 1
Volume 266,
Issue 24
Volume 266,
Issue 23
Volume 266,
Issue 22
Volume 266,
Issue 21
Volume 266,
Issue 20
Volume 266,
Issue 19
Volume 266,
Issue 18
Volume 266,
Issue 17
Volume 266,
Issue 16
Volume 266,
Issue 15
Volume 266,
Issue 14
Volume 266,
Issue 13
Volume 266,
Issue 12
Volume 266,
Issue 11
Volume 266,
Issue 10
Volume 266,
Issue 9
Volume 266,
Issue 8
Volume 266,
Issue 7
Volume 266,
Issue 6
Volume 266,
Issue 5
Volume 266,
Issue 4
Volume 266,
Issue 3
Volume 266,
Issue 2
Volume 266,
Issue 1
Volume 265,
Issue 2
Volume 265,
Issue 1
Volume 264,
Issue 2
Volume 264,
Issue 1
Volume 263,
Issue 2
Volume 263,
Issue 1
Volume 262,
Issue 2
Volume 262,
Issue 1
Volume 261,
Issue 2
Volume 261,
Issue 1
Volume 260,
Issue 2
Volume 260,
Issue 1
Volume 259,
Issue 2
Volume 259,
Issue 1
Volume 258,
Issue 2
Volume 258,
Issue 1
Volume 257,
Issue 2
Volume 257,
Issue 1
Volume 256,
Issue 2
Volume 256,
Issue 1
Volume 255,
Issue 2
Volume 255,
Issue 1
Volume 254,
Issue 2
Volume 254,
Issue 1
Volume 253,
Issue 2
Volume 253,
Issue 1
Volume 252,
Issue 2
Volume 252,
Issue 1
Volume 251,
Issue 2
Volume 251,
Issue 1
Volume 250,
Issue 2
Volume 250,
Issue 1
Volume 249,
Issue 2
Volume 249,
Issue 1
Volume 248,
Issue 2
Volume 248,
Issue 1
Volume 247,
Issue 2
Volume 247,
Issue 1
Volume 246,
Issue 2
Volume 246,
Issue 1
Volume 245,
Issue 2
Volume 245,
Issue 1
Volume 244,
Issue 2
Volume 244,
Issue 1
Volume 243,
Issue 2
Volume 243,
Issue 1
Volume 242,
Issue 2
Volume 242,
Issue 1
Volume 241,
Issue 4
Volume 241,
Issue 1
Volume 240,
Issue 4
Volume 240,
Issue 3
Volume 240,
Issue 2
Volume 240,
Issue 1
Volume 239,
Issue 4
Volume 239,
Issue 3
Volume 239,
Issue 2
Volume 239,
Issue 1
Volume 238,
Issue 4
Volume 238,
Issue 1
Volume 237,
Issue 4
Volume 237,
Issue 3
Volume 237,
Issue 2
Volume 237,
Issue 1
Volume 236,
Issue 4
Volume 236,
Issue 1
Volume 235,
Issue 4
Volume 235,
Issue 1
Volume 234,
Issue 4
Volume 234,
Issue 3
Volume 234,
Issue 2
Volume 234,
Issue 1
Volume 233,
Issue 4
Volume 233,
Issue 1
Volume 232,
Issue 4
Volume 232,
Issue 1
Volume 231,
Issue 4
Volume 231,
Issue 1
Volume 230,
Issue 4
Volume 230,
Issue 1
Volume 229,
Issue 4
Volume 229,
Issue 3
Volume 229,
Issue 2
Volume 229,
Issue 1
Volume 228,
Issue 4
Volume 228,
Issue 1
Volume 227,
Issue 4
Volume 227,
Issue 3
Volume 227,
Issue 2
Volume 227,
Issue 1
Volume 226,
Issue 4
Volume 226,
Issue 3
Volume 226,
Issue 2
Volume 226,
Issue 1
Volume 225,
Issue 4
Volume 225,
Issue 3
Volume 225,
Issue 2
Volume 225,
Issue 1
Volume 222,
Issue 4
Volume 222,
Issue 3
Volume 222,
Issue 2
Volume 222,
Issue 1
Volume 217,
Issue 4
Volume 217,
Issue 3
Volume 217,
Issue 2
Volume 217,
Issue 1
Volume 215,
Issue 4
Volume 215,
Issue 3
Volume 215,
Issue 2
Volume 215,
Issue 1
Volume 211,
Issue 4
Volume 211,
Issue 3
Volume 211,
Issue 2
Volume 211,
Issue 1
Volume 210,
Issue 1
Volume 207,
Issue 4
Volume 207,
Issue 3
Volume 207,
Issue 2
Volume 207,
Issue 1
Volume 206,
Issue 1
Volume 205,
Issue 1
Volume 204,
Issue 1
Volume 203,
Issue 1
Volume 202,
Issue 1
Volume 201,
Issue 4
Volume 201,
Issue 3
Volume 201,
Issue 2
Volume 201,
Issue 1
Volume 199,
Issue 1
Volume 198,
Issue 4
Volume 198,
Issue 3
Volume 198,
Issue 2
Volume 198,
Issue 1
Volume 197,
Issue 4
Volume 197,
Issue 3
Volume 197,
Issue 2
Volume 197,
Issue 1
Volume 196,
Issue 4
Volume 196,
Issue 3
Volume 196,
Issue 2
Volume 196,
Issue 1
Volume 195,
Issue 4
Volume 195,
Issue 3
Volume 195,
Issue 2
Volume 195,
Issue 1
Volume 194,
Issue 4
Volume 194,
Issue 3
Volume 194,
Issue 2
Volume 194,
Issue 1
Volume 193,
Issue 4
Volume 193,
Issue 1
Volume 192,
Issue 4
Volume 192,
Issue 3
Volume 192,
Issue 2
Volume 192,
Issue 1
Volume 191,
Issue 4
Volume 191,
Issue 1
Volume 190,
Issue 4
Volume 190,
Issue 1
Volume 189,
Issue 4
Volume 189,
Issue 1
Volume 188,
Issue 4
Volume 188,
Issue 1
Volume 187,
Issue 4
Volume 187,
Issue 3
Volume 187,
Issue 2
Volume 187,
Issue 1
Volume 186,
Issue 4
Volume 186,
Issue 1
Volume 185,
Issue 4
Volume 185,
Issue 1
Volume 184,
Issue 4
Volume 184,
Issue 3
Volume 184,
Issue 2
Volume 184,
Issue 1
Volume 183,
Issue 4
Volume 183,
Issue 3
Volume 183,
Issue 2
Volume 183,
Issue 1
Volume 182,
Issue 4
Volume 182,
Issue 1
Volume 181,
Issue 4
Volume 181,
Issue 1
Volume 180,
Issue 4
Volume 180,
Issue 1
Volume 179,
Issue 4
Volume 179,
Issue 3
Volume 179,
Issue 2
Volume 179,
Issue 1
Volume 178,
Issue 4
Volume 178,
Issue 1
Volume 175,
Issue 1
Volume 174,
Issue 4
Volume 174,
Issue 3
Volume 174,
Issue 2
Volume 174,
Issue 1
Volume 173,
Issue 4
Volume 173,
Issue 3
Volume 173,
Issue 2
Volume 173,
Issue 1
Volume 172,
Issue 4
Volume 172,
Issue 1
Volume 171,
Issue 4
Volume 171,
Issue 3
Volume 171,
Issue 2
Volume 171,
Issue 1
Volume 170,
Issue 4
Volume 170,
Issue 3
Volume 170,
Issue 2
Volume 170,
Issue 1
Volume 169,
Issue 4
Volume 169,
Issue 1
Volume 168,
Issue 4
Volume 168,
Issue 3
Volume 168,
Issue 2
Volume 168,
Issue 1
Volume 164,
Issue 1
Volume 161,
Issue 1
Volume 160,
Issue 4
Volume 160,
Issue 3
Volume 160,
Issue 2
Volume 160,
Issue 1
Volume 159,
Issue 4
Volume 159,
Issue 3
Volume 159,
Issue 2
Volume 159,
Issue 1
Volume 158,
Issue 4
Volume 158,
Issue 1
Volume 157,
Issue 4
Volume 157,
Issue 1
Volume 156,
Issue 4
Volume 156,
Issue 1
Volume 155,
Issue 4
Volume 155,
Issue 3
Volume 155,
Issue 2
Volume 155,
Issue 1
Volume 154,
Issue 4
Volume 154,
Issue 1
Volume 153,
Issue 4
Volume 153,
Issue 1
Volume 152,
Issue 4
Volume 152,
Issue 3
Volume 152,
Issue 2
Volume 152,
Issue 1
Volume 151,
Issue 4
Volume 151,
Issue 1
Volume 150,
Issue 4
Volume 150,
Issue 1
Volume 149,
Issue 4
Volume 149,
Issue 3
Volume 149,
Issue 2
Volume 149,
Issue 1
Volume 148,
Issue 4
Volume 148,
Issue 1
Volume 147,
Issue 4
Volume 147,
Issue 1
Volume 146,
Issue 4
Volume 146,
Issue 1
Volume 145,
Issue 4
Volume 145,
Issue 3
Volume 145,
Issue 2
Volume 145,
Issue 1
Volume 144,
Issue 4
Volume 144,
Issue 1
Volume 143,
Issue 4
Volume 143,
Issue 3
Volume 143,
Issue 2
Volume 143,
Issue 1
Volume 142,
Issue 4
Volume 142,
Issue 3
Volume 142,
Issue 2
Volume 142,
Issue 1
Volume 141,
Issue 4
Volume 141,
Issue 1
Volume 140,
Issue 4
Volume 140,
Issue 3
Volume 140,
Issue 2
Volume 140,
Issue 1
Volume 139,
Issue 4
Volume 139,
Issue 1
Volume 138,
Issue 4
Volume 138,
Issue 1
Volume 136,
Issue 4
Volume 136,
Issue 1
Volume 135,
Issue 4
Volume 135,
Issue 1
Volume 134,
Issue 4
Volume 134,
Issue 3
Volume 134,
Issue 2
Volume 134,
Issue 1
Volume 133,
Issue 4
Volume 133,
Issue 1
Volume 132,
Issue 4
Volume 132,
Issue 3
Volume 132,
Issue 2
Volume 132,
Issue 1
Volume 131,
Issue 4
Volume 131,
Issue 1
Volume 130,
Issue 4
Volume 130,
Issue 1
Volume 129,
Issue 4
Volume 129,
Issue 3
Volume 129,
Issue 2
Volume 129,
Issue 1
Volume 128,
Issue complete
Volume 127,
Issue complete
Volume 126,
Issue 4
Volume 126,
Issue 1
Volume 125,
Issue 4
Volume 125,
Issue 1
Volume 124,
Issue 4
Volume 124,
Issue 3
Volume 124,
Issue 2
Volume 124,
Issue 1
Volume 123,
Issue 4
Volume 123,
Issue 1
Volume 122,
Issue 4
Volume 122,
Issue 3
Volume 122,
Issue 2
Volume 122,
Issue 1
Volume 121,
Issue 4
Volume 121,
Issue 1
Volume 120,
Issue 4
Volume 120,
Issue 1
Volume 119,
Issue 4
Volume 119,
Issue 3
Volume 119,
Issue 2
Volume 119,
Issue 1
Volume 118,
Issue 4
Volume 118,
Issue 1
Volume 117,
Issue 4
Volume 117,
Issue 3
Volume 117,
Issue 2
Volume 117,
Issue 1
Volume 116,
Issue 4
Volume 116,
Issue 1
Volume 115,
Issue 4
Volume 115,
Issue 1
Volume 114,
Issue 4
Volume 114,
Issue 3
Volume 114,
Issue 2
Volume 114,
Issue 1
Volume 113,
Issue 4
Volume 113,
Issue 1
Volume 112,
Issue 4
Volume 112,
Issue 1
Volume 111,
Issue 4
Volume 111,
Issue 3
Volume 111,
Issue 2
Volume 111,
Issue 1
Volume 110,
Issue com
Volume 109,
Issue com
Volume 108,
Issue 4
Volume 108,
Issue 3
Volume 108,
Issue 2
Volume 108,
Issue 1
Volume 107,
Issue 4
Volume 107,
Issue 1
Volume 106,
Issue 4
Volume 106,
Issue 1
Volume 105,
Issue 4
Volume 105,
Issue 1
Volume 104,
Issue 4
Volume 104,
Issue 1
Volume 103,
Issue 4
Volume 103,
Issue 3
Volume 103,
Issue 2
Volume 103,
Issue 1
Volume 102,
Issue 4
Volume 102,
Issue 1
Volume 101,
Issue 4
Volume 101,
Issue 3
Volume 101,
Issue 2
Volume 101,
Issue 1
Volume 100,
Issue 4
Volume 100,
Issue 3
Volume 100,
Issue 2
Volume 100,
Issue 1
Volume 99,
Issue 4
Volume 99,
Issue 1
Volume 98,
Issue 4
Volume 98,
Issue 1
Volume 97,
Issue 4
Volume 97,
Issue 1
Volume 96,
Issue 4
Volume 96,
Issue 3
Volume 96,
Issue 2
Volume 96,
Issue 1
Volume 95,
Issue 4
Volume 95,
Issue 3
Volume 95,
Issue 2
Volume 95,
Issue 1
Volume 94,
Issue 4
Volume 94,
Issue 3
Volume 94,
Issue 2
Volume 94,
Issue 1
Volume 93,
Issue 4
Volume 93,
Issue 3
Volume 93,
Issue 2
Volume 93,
Issue 1
Volume 92,
Issue 4
Volume 92,
Issue 1
Volume 91,
Issue 4
Volume 91,
Issue 1
Volume 90,
Issue 4
Volume 90,
Issue 1
Volume 89,
Issue 4
Volume 89,
Issue 1
Volume 88,
Issue 4
Volume 88,
Issue 3
Volume 88,
Issue 2
Volume 88,
Issue 1
Volume 87,
Issue 4
Volume 87,
Issue 1
Volume 86,
Issue 4
Volume 86,
Issue 3
Volume 86,
Issue 2
Volume 86,
Issue 1
Volume 85,
Issue 4
Volume 85,
Issue 1
Volume 84,
Issue 4
Volume 84,
Issue 3
Volume 84,
Issue 2
Volume 84,
Issue 1
Volume 83,
Issue 4
Volume 83,
Issue 3
Volume 83,
Issue 2
Volume 83,
Issue 1
Volume 82,
Issue 4
Volume 82,
Issue 3
Volume 82,
Issue 2
Volume 82,
Issue 1
Volume 81,
Issue 2
Volume 81,
Issue 1
Volume 80,
Issue 2
Volume 80,
Issue 1
Volume 79,
Issue 4
Volume 79,
Issue 1
Volume 78,
Issue 4
Volume 78,
Issue 1
Volume 77,
Issue 4
Volume 77,
Issue 1
Volume 76,
Issue 4
Volume 76,
Issue 1
Volume 75,
Issue 4
Volume 75,
Issue 1
Volume 74,
Issue 4
Volume 74,
Issue 3
Volume 74,
Issue 2
Volume 74,
Issue 1
Volume 73,
Issue 4
Volume 73,
Issue 3
Volume 73,
Issue 2
Volume 73,
Issue 1
Volume 72,
Issue 4
Volume 72,
Issue 3
Volume 72,
Issue 2
Volume 72,
Issue 1
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 4
Volume 70,
Issue 1
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 4
Volume 68,
Issue 1
Volume 67,
Issue 4
Volume 67,
Issue 1
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 4
Volume 65,
Issue 1
Volume 64,
Issue 4
Volume 64,
Issue 1
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 55,
Issue 4
Volume 55,
Issue 1
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 1
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 4
Volume 50,
Issue 1
Volume 49,
Issue 4
Volume 49,
Issue 1
Volume 48,
Issue 4
Volume 48,
Issue 1
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 4
Volume 46,
Issue 1
Volume 45,
Issue 4
Volume 45,
Issue 1
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 39,
Issue 4
Volume 39,
Issue 1
Volume 36,
Issue 4
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 4
Volume 33,
Issue 1
Volume 32,
Issue 4
Volume 32,
Issue 1
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 1
Volume 25,
Issue 1
Volume 24,
Issue 1
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 1
Volume 21,
Issue 4
Volume 21,
Issue 1
Volume 18,
Issue 6
Volume 18,
Issue 1
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 1
Volume 15,
Issue 6
Volume 15,
Issue 1
Volume 14,
Issue 6
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 3
Volume 13,
Issue 1
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 9,
Issue 4
Volume 9,
Issue 3
Volume 9,
Issue 2
Volume 9,
Issue 1
Volume 6,
Issue 3
Volume 6,
Issue 2
Volume 6,
Issue 1
Volume 5,
Issue 3
Volume 5,
Issue 2
Volume 5,
Issue 1
Volume 4,
Issue 3
Volume 4,
Issue 2
Volume 4,
Issue 1
Volume 3,
Issue 3
Volume 3,
Issue 1
Volume 2,
Issue 3
Volume 2,
Issue 1
Volume 1,
Issue 3
Volume 1,
Issue 2
Volume 1,
Issue 1
>
Table of contents
1
Damage and defects from low-energy implants in Si
Eaglesham, D.J.
et al.
| 1996
5
Is there an effect of the proximity of a "free-surface" on the formation of End-Of-Range defects?
Omri, M.
et al.
| 1996
9
Room temperature migration of ion beam injected point defects in crystalline silicon
Privitera, V.
et al.
| 1996
14
Time scales of transient enhanced diffusion: Free and clustered interstitials
Cowern, N.E.B.
et al.
| 1996
19
Defect production mechanisms in metals and covalent semiconductors
Diaz de la Rubia, T.
et al.
| 1996
27
Defect evolution in MeV ion-implanted silicon
Lalita, J.
et al.
| 1996
33
119Sn Mössbauer spectroscopy investigation of heavily P-doped silicon
Vestergaard, H.C.
et al.
| 1996
33
^1^1^9Sn Moessbauer spectroscopy investigation of heavily P-doped silicon
Vestegaard, H. C.
/ Fanciulli, M.
/ Nylandsted Larsen, A.
et al.
| 1996
37
Evaluation and control of defects, formed by keV-MeV implantation
Saito, S.
et al.
| 1996
43
Strong segregation gettering of transition metals by implantation-formed cavities and boron-silicide precipitates in silicon
Myers, S. M.
/ Petersen, G. A.
/ Follstaedt, D. M.
et al.
| 1996
43
Strong segregation gettering of transition rnetals by implantation-formed cavities and boron-silicide precipitates in silicon
Myers, S.M.
et al.
| 1996
51
Study of the trapping of Co-Fe impurities at the internal wall of nanosized Si voids
Deweerd, W.
et al.
| 1996
56
Voids in silicon as sink for interstitials
Raineri, V.
et al.
| 1996
60
Proximity gettering of copper in separation-by-implanted-oxygen structures
Yankov, R.A.
et al.
| 1996
64
Damage profiles in as-implanted <100> Si crystals: strain by X-ray diffractometry versus interstitials by RBS-channeling
Nipoti, R.
/ Servidori, M.
/ Bianconi, M.
et al.
| 1996
64
Damage profiles in as-implanted < 100 > Si crystals: Strain by X-ray diffractometry versus interstitials by RBS-channeling
Nipoti, R.
et al.
| 1996
68
Investigation of BF+-2 implants in silicon through SiO2 films Redistribution of fluorine and boron under rapid thermal annealing
Kaabi, L.
et al.
| 1996
74
Ion implantation doping of Si for optoelectronic applications
Coffa, S.
et al.
| 1996
81
EXAFS studies of thermal annealing effects on the local environment of erbium implanted in LiNbO3
Mignotte, C.
et al.
| 1996
84
Structural modifications in He-implanted waveguide layers of LiNbO3
Avrahami, Y.
et al.
| 1996
88
Refractive index and anisotropy measurements in He+ implanted KTiOPO4 (KTP) optical waveguides
Bindner, P.
et al.
| 1996
93
Effect of forming gas anneals on the photoluminescence from nanocrystalline silicon formed by Si+ implantation into SiO2 matrix
Komoda, T.
et al.
| 1996
97
Optical and structural properties of implanted silicon nanocrystals
Shimizu-Iwayama, T.
et al.
| 1996
101
Visible photoluminescence of SiO2 implanted with carbon and silicon
Garrido, B.
et al.
| 1996
106
A study of the blue photoluminescence emission from thermally-grown, Si+-implanted SiO2 films after short-time annealing
Skorupa, W.
et al.
| 1996
110
EXAFS study on Ag-doped silicate glasses irradiated with low-mass ions
d'Acapito, F.
et al.
| 1996
114
Ion beam processing of single crystalline silicon carbide
Skorupa, W.
et al.
| 1996
121
Carbon clustering in Si1 - xCx formed by ion implantation
Calcagno, L.
et al.
| 1996
125
Structure and strain measurements on SiC formed by carbon ion implantation
Preckwinkel, U.
et al.
| 1996
129
High temperature carbon implantation in SIMOX
Nejim, A.
et al.
| 1996
133
Ion beam induced amorphization and recrystallization of Si-SiC-Si layer systems
Volz, K.
et al.
| 1996
139
A comparative EPR study of ion implantation induced damage in Si, Si1 - xGex(x # 0) and SiC
Barklie, R.C.
et al.
| 1996
139
A comparative EPR study of ion implantation induced damage in Si, Si~1~-~xGe~x (x not equal to 0) and SiC
Barklie, R. C.
et al.
| 1996
147
Monte Carlo simulation of ion implantation in crystalline SiC
Albertazzi, E.
et al.
| 1996
151
Ion beam synthesis and recrystallization of amorphous SiGe-SiC structures
Pérez-Rodriguez, A.
et al.
| 1996
156
Characterization of extended defects in SiGe alloys formed by high dose Ge+ implantation into Si
Cristiano, F.
et al.
| 1996
161
Rapid thermal annealing of arsenic implanted relaxed Si1 - x)Gex
Nylandsted Larsen, A.
et al.
| 1996
165
2 MeV Si ion implantation damage in relaxed Si1 - xGex
O'Raifeartaigh, C.
et al.
| 1996
169
Characterization of Si-GexSi1 - x heterojunction bipolar transistors formed by Ge ion implantation in Si
Lombardo, S.
et al.
| 1996
173
High temperature high dose C ion implantation in epitaxial SiGe
Pérez-Rodriguez, A.
et al.
| 1996
177
Radiation damage and annealing behaviour of Ge+-implanted SiC
Pacaud, Y.
et al.
| 1996
181
Microstructural characterization of amorphized and recrystallized 6H-SiC
Pacaud, Y.
et al.
| 1996
186
Electron microscopy and Rutherford backscattering spectrometry characterisation of 6H SiC samples implanted with He+
Frangis, N.
et al.
| 1996
186
Electron microscopy and Rutherford backscattering spectrometry characterization of 6H SiC samples implanted with He^+
Frangis, N.
/ Van Landuyt, J.
/ Grimaldi, M. G.
et al.
| 1996
190
Channeled ion beam synthesis: A new technique for forming high-quality rare-earth silicides
Vantomme, A.
et al.
| 1996
198
Nuclear energy and cascade effects on the ion-assisted crystal nucleation in amorphous silicon
Spinella, C.
et al.
| 1996
203
Ion beam induced nucleation in amorphous GaAs layers during MeV implantation
Schulz, R.
et al.
| 1996
207
Thermal solid phase epitaxial growth and ion-beam induced crystallisation of Ge+ ion implanted layers in silicon
Songsiriritthigul, P.
et al.
| 1996
212
Irradiation induced growth of CoSi2 precipitates in Si at 650(degree)C: An in situ study
Palard, M.
et al.
| 1996
212
Irradiation induced growth of CoSi~2 precipitates in Si at 650C: An in situ study
Palard, M.
/ Ruault, M. O.
/ Kaitasov, O.
et al.
| 1996
216
Evolution of nanocluster ensembles: Computer simulation of diffusion and reaction controlled Ostwald ripening
Strobel, M.
et al.
| 1996
221
Ion-beam induced compositional changes in alloys at elevated temperatures
Sckerl, M.W.
et al.
| 1996
221
Ion-beam induced composition changes in aloys at elevated temperatures
Sckerl, M. W.
/ Sigmund, P.
/ Lam, N. Q.
et al.
| 1996
226
Surface regrowth of Sb ion implanted Si(100)
Pet~o, G.
et al.
| 1996
230
Damage production in GaAs during MeV ion implantation
Herre, O.
et al.
| 1996
236
Morphology of the implantation induced disorder in GaAs
Desnica, U.V.
et al.
| 1996
240
Radiation damage in neutron transmutation doped-InP
Mari, B.
et al.
| 1996
244
Radiation damage annealing of Hg implanted InP
Correia, J.G.
et al.
| 1996
248
Low temperature epitaxial regrowth of mercury implanted sapphire
Alves, E.
et al.
| 1996
252
Lattice location and electrical conductivity in ion implanted TiO2 single crystals
Fromknecht, R.
et al.
| 1996
257
Lattice disorder distribution and recovery in Hg implanted TiO 2)
Khubeis, I.
et al.
| 1996
262
Conversion of organic-inorganic polymers to ceramics by ion implantation
Pivin, J.C.
et al.
| 1996
266
Studies of Na-segregation at Ni-a-quartz interfaces
Haussalo, P.
et al.
| 1996
266
Studies of Na-segregation at Ni/-quartz interfaces
Haussalo, P.
/ Lieb, K.-P.
/ Bolse, W.
et al.
| 1996
270
Plasma immersion ion implantation for metallurgical and semiconductor research and development
Ensinger, W.
et al.
| 1996
270
Plasma immersion ion implantation for mettalurgical and semiconductor research and development
Ensinger, W.
et al.
| 1996
282
Investigation of plasma immersion ion implanted niobium oxide and titanium nitride films by nanohardness measurement
Königer, A.
et al.
| 1996
286
Influence of additional UV-light illumination on preparation of TiN by ion beam assisted deposition
Wengenmair, H.
et al.
| 1996
290
Large-area deposition of biaxially textured YSZ buffer layers using an IBAD-process
Wiesmann, J.
et al.
| 1996
293
Low energy nitrogen ion doping into GaAs using combined ion-beam and molecular-beam epitaxy method
Shima, T.
et al.
| 1996
298
Carbon nitride thin films prepared by a capacitively plasma jet
Dinescu, G.
/ Aldea, E.
/ Boieriu, P.
et al.
| 1996
298
Carbon nitride thin films prepared by a capacitively coupled RF plasma jet
Dinescu, G.
et al.
| 1996
303
Modern applications of high energy ion beams: From "single-event burnout" to human eye cancer treatment
Homeyer, H.
et al.
| 1996
311
Investigation of the ion acoustic effect during focused ion beam irradiation
Teichert, J.
et al.
| 1996
315
Author index
| 1996
Preface
| 1996
Sponsors
| 1996