The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 12
Volume 36,
Issue 11
Volume 36,
Issue 10
Volume 36,
Issue 9
Volume 36,
Issue 8
Volume 36,
Issue 7
Volume 36,
Issue 6
Volume 36,
Issue 5
Volume 36,
Issue 4
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 10
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 6
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue supp
Volume 13,
Issue a
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 9
Volume 13,
Issue 8a
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue sup
Volume 11,
Issue 12
Volume 11,
Issue 11s
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 12
Volume 10,
Issue 11
Volume 10,
Issue 10
Volume 10,
Issue 9
Volume 10,
Issue 8
Volume 10,
Issue 7
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
Volume 9,
Issue sup
Volume 9,
Issue s
Volume 9,
Issue 12
Volume 9,
Issue 11s
Volume 9,
Issue 11
Volume 9,
Issue 10
Volume 9,
Issue 9
Volume 9,
Issue 8
Volume 9,
Issue 7
Volume 9,
Issue 6
Volume 9,
Issue 5s
Volume 9,
Issue 5
Volume 9,
Issue 4
Volume 9,
Issue 3
Volume 9,
Issue 2
Volume 9,
Issue 1
Volume 8,
Issue sup
Volume 8,
Issue 12
Volume 8,
Issue 11
Volume 8,
Issue 10
Volume 8,
Issue 9
Volume 8,
Issue 8
Volume 8,
Issue 7
Volume 8,
Issue 6s
Volume 8,
Issue 6
Volume 8,
Issue 5
Volume 8,
Issue 4
Volume 8,
Issue 3
Volume 8,
Issue 2
Volume 8,
Issue 1s
Volume 8,
Issue 1
Volume 7,
Issue 12
Volume 7,
Issue 11
Volume 7,
Issue 10
Volume 7,
Issue 9
Volume 7,
Issue 8
Volume 7,
Issue 7
Volume 7,
Issue 6
Volume 7,
Issue 5
Volume 7,
Issue 4
Volume 7,
Issue 3b
Volume 7,
Issue 3
Volume 7,
Issue 2
Volume 7,
Issue 1a
Volume 7,
Issue 1
Volume 6,
Issue 12c
Volume 6,
Issue 12
Volume 6,
Issue 11
Volume 6,
Issue 10b
Volume 6,
Issue 10
Volume 6,
Issue 9a
Volume 6,
Issue 9
Volume 6,
Issue 8
Volume 6,
Issue 7
Volume 6,
Issue 6
Volume 6,
Issue 5
Volume 6,
Issue 4
Volume 6,
Issue 3
Volume 6,
Issue 2
Volume 6,
Issue 1
Volume 5,
Issue 12
Volume 5,
Issue 11
Volume 5,
Issue 10
Volume 5,
Issue 9
Volume 5,
Issue 8
Volume 5,
Issue 7
Volume 5,
Issue 6
Volume 5,
Issue 5
Volume 5,
Issue 4
Volume 5,
Issue 3s
Volume 5,
Issue 3
Volume 5,
Issue 2
Volume 5,
Issue 1
Volume 4,
Issue 12
Volume 4,
Issue 11
Volume 4,
Issue 10
Volume 4,
Issue 9
Volume 4,
Issue 8
Volume 4,
Issue 7
Volume 4,
Issue 6
Volume 4,
Issue 5
Volume 4,
Issue 4
Volume 4,
Issue 3
Volume 4,
Issue 2
Volume 4,
Issue 1
Volume 3,
Issue 12
Volume 3,
Issue 11
Volume 3,
Issue 10
Volume 3,
Issue 9
Volume 3,
Issue 8
Volume 3,
Issue 7
Volume 3,
Issue 6
Volume 3,
Issue 5
Volume 3,
Issue 4
Volume 3,
Issue 3
Volume 3,
Issue 2
Volume 3,
Issue 1
Volume 2,
Issue 12
Volume 2,
Issue 11
Volume 2,
Issue 10
Volume 2,
Issue 9
Volume 2,
Issue 8
Volume 2,
Issue 7
Volume 2,
Issue 6
Volume 2,
Issue 5
Volume 2,
Issue 4
Volume 2,
Issue 3
Volume 2,
Issue 2
Volume 2,
Issue 1
Volume 1,
Issue 6
Volume 1,
Issue 5
Volume 1,
Issue 4
Volume 1,
Issue 3
Volume 1,
Issue 2
Volume 1,
Issue 1
>
Table of contents
055001
Charge carrier lifetime degradation in Cz silicon through the formation of a boron-rich layer during BBr3 diffusion processes
Kessler, Michael Andreas
/ Ohrdes, Tobias
/ Wolpensinger, Bettina
et al.
| 2010
055002
An in-depth simulation study of Coulomb mobility in ultra-thin-body SOI MOSFETs
Jiménez-Molinos, F
/ Roldán, J B
/ Balaguer, M
et al.
| 2010
055003
Effects of oxygen deficiency in the sol–gel ZrOx film on the electrical properties of Au/ZrOx /n-type Si/In devices
Chen, Wei-Chung
/ Lin, Yow-Jon
/ Chen, Ya-Hui
et al.
| 2010
055004
SOI nanowires as sensors for charge detection
Naumova, O V
/ Fomin, B I
/ Nasimov, D A
et al.
| 2010
055005
Lowered operation voltage in Pt/SBi2 Ta2 O9 /HfO2 /Si ferroelectric-gate field-effect transistors by oxynitriding Si
Horiuchi, Takeshi
/ Takahashi, Mitsue
/ Li, Qiu-Hong
et al.
| 2010
055006
A comparative study of amorphous InGaZnO thin-film transistors with HfOx Ny and HfO2 gate dielectrics
Zou, Xiao
/ Fang, Guojia
/ Yuan, Longyan
et al.
| 2010
055007
Effect of substrate temperature on the structural and electrical properties of CIGS films based on the one-stage co-evaporation process
Wang, H
/ Zhang, Y
/ Kou, X L
et al.
| 2010
055008
alpha -SiC nanoscale transit-time diodes: performance of the photo-irradiated terahertz sources at elevated temperature
Mukherjee, M.
/ Mazumder, N.
/ Roy, S.K.
et al.
| 2010
055008
α-SiC nanoscale transit-time diodes: performance of the photo-irradiated terahertz sources at elevated temperature
Mukherjee, Moumita
/ Mazumder, Nilratan
/ Roy, Sitesh Kumar
et al.
| 2010
055009
Characteristics of an oxidation-induced inversion layer in compensated p-type crystalline silicon
Rougieux, F E
/ Macdonald, D
/ McIntosh, K R
et al.
| 2010
055010
Nitride-based LEDs with oblique sidewalls and a light guiding structure
Kuo, D S
/ Chang, S J
/ Shen, C F
et al.
| 2010
055011
An improved empirical approach to introduce quantization effects in the transport direction in multi-subband Monte Carlo simulations
Palestri, P
/ Lucci, L
/ Tos, S Dei
et al.
| 2010
055012
Impact of the Al/Hf ratio on the electrical properties and band alignments of atomic-layer-deposited HfO2 /Al2 O3 on S-passivated GaAs substrates
Gong, You-Pin
/ Li, Ai-Dong
/ Li, Xue-Fei
et al.
| 2010
055013
A metal/Al2 O3 /ZrO2 /SiO2 /Si (MAZOS) structure for high-performance non-volatile memory application
Liu, Jing
/ Wang, Qin
/ Long, Shibing
et al.
| 2010
055014
Investigations of impurity-free vacancy disordering in (Al)InGaAs(P)/InGaAs quantum wells
Du, S C
/ Fu, L
/ Tan, H H
et al.
| 2010
055015
A comparative study on the structural properties and electrical characteristics of thin HoTix Oy , TmTix Oy and YbTix Oy dielectrics
Pan, Tung-Ming
/ Yen, Li-Chen
/ Wu, Xin-Chang
et al.
| 2010
055015/1
A comparitive study on the structural properties and electrical characteristics of thin HoTi(x)O(y), TmTi(x)O(y) and YbTi(x)O(y) dielectrics
Pan, Tung-Ming
/ Yen, Li-Chen
/ Wu, Xin-Chang
et al.
| 2010
055016
Investigation of excess 1/f noise in CdTe single crystals
Andreev, A
/ Grmela, L
/ Moravec, P
et al.
| 2010
055017
Minority carrier lifetime variations associated with misfit dislocation networks in heteroepitaxial GaInP
Haegel, Nancy M
/ Williams, Scott E
/ Frenzen, C L
et al.
| 2010
055018
A continuous current model of fully-depleted symmetric double-gate MOSFETs considering a wide range of body doping concentrations
Jin, Xiaoshi
/ Liu, Xi
/ Lee, Jung-Hee
et al.
| 2010