The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume pp,
Issue 99
Volume 71,
Issue 6
Volume 71,
Issue 5
Volume 71,
Issue 4
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 12
Volume 70,
Issue 11
Volume 70,
Issue 10
Volume 70,
Issue 9
Volume 70,
Issue 8
Volume 70,
Issue 6
Volume 70,
Issue 5
Volume 70,
Issue 4
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 12
Volume 69,
Issue 11
Volume 69,
Issue 10
Volume 69,
Issue 9
Volume 69,
Issue 8
Volume 69,
Issue 7
Volume 69,
Issue 6
Volume 69,
Issue 5
Volume 69,
Issue 4
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 12
Volume 68,
Issue 11
Volume 68,
Issue 10
Volume 68,
Issue 9
Volume 68,
Issue 8
Volume 68,
Issue 7
Volume 68,
Issue 6
Volume 68,
Issue 5
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 12
Volume 67,
Issue 11
Volume 67,
Issue 10
Volume 67,
Issue 9
Volume 67,
Issue 8
Volume 67,
Issue 7
Volume 67,
Issue 6
Volume 67,
Issue 5
Volume 67,
Issue 4
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 12
Volume 66,
Issue 11
Volume 66,
Issue 10
Volume 66,
Issue 9
Volume 66,
Issue 8
Volume 66,
Issue 7
Volume 66,
Issue 6
Volume 66,
Issue 5
Volume 66,
Issue 4
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 12
Volume 65,
Issue 11
Volume 65,
Issue 10
Volume 65,
Issue 9
Volume 65,
Issue 8
Volume 65,
Issue 7
Volume 65,
Issue 6
Volume 65,
Issue 5
Volume 65,
Issue 4
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 12
Volume 64,
Issue 11
Volume 64,
Issue 10
Volume 64,
Issue 9
Volume 64,
Issue 8
Volume 64,
Issue 7
Volume 64,
Issue 6
Volume 64,
Issue 5
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 12
Volume 63,
Issue 11
Volume 63,
Issue 10
Volume 63,
Issue 9
Volume 63,
Issue 8
Volume 63,
Issue 7
Volume 63,
Issue 6
Volume 63,
Issue 5
Volume 63,
Issue 4
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 12
Volume 62,
Issue 11
Volume 62,
Issue 10
Volume 62,
Issue 9
Volume 62,
Issue 8
Volume 62,
Issue 7
Volume 62,
Issue 6
Volume 62,
Issue 5
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 12
Volume 61,
Issue 11
Volume 61,
Issue 10
Volume 61,
Issue 9
Volume 61,
Issue 8
Volume 61,
Issue 7
Volume 61,
Issue 6
Volume 61,
Issue 5
Volume 61,
Issue 4
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 12
Volume 60,
Issue 11
Volume 60,
Issue 10
Volume 60,
Issue 9
Volume 60,
Issue 8
Volume 60,
Issue 7
Volume 60,
Issue 6
Volume 60,
Issue 5
Volume 60,
Issue 4
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 12
Volume 59,
Issue 11
Volume 59,
Issue 10
Volume 59,
Issue 9
Volume 59,
Issue 8
Volume 59,
Issue 7
Volume 59,
Issue 6
Volume 59,
Issue 5
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 12
Volume 58,
Issue 11
Volume 58,
Issue 10
Volume 58,
Issue 9
Volume 58,
Issue 8
Volume 58,
Issue 7
Volume 58,
Issue 6
Volume 58,
Issue 5
Volume 58,
Issue 4
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 12
Volume 57,
Issue 11
Volume 57,
Issue 10
Volume 57,
Issue 9
Volume 57,
Issue 8
Volume 57,
Issue 7
Volume 57,
Issue 6
Volume 57,
Issue 5
Volume 57,
Issue 4
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 12
Volume 56,
Issue 11
Volume 56,
Issue 10
Volume 56,
Issue 9
Volume 56,
Issue 8
Volume 56,
Issue 7
Volume 56,
Issue 6
Volume 56,
Issue 5
Volume 56,
Issue 4
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 12
Volume 55,
Issue 11
Volume 55,
Issue 10
Volume 55,
Issue 9
Volume 55,
Issue 8
Volume 55,
Issue 7
Volume 55,
Issue 6
Volume 55,
Issue 5
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 12
Volume 54,
Issue 11
Volume 54,
Issue 10
Volume 54,
Issue 9
Volume 54,
Issue 8
Volume 54,
Issue 7
Volume 54,
Issue 6
Volume 54,
Issue 5
Volume 54,
Issue 4
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 12
Volume 53,
Issue 11
Volume 53,
Issue 10
Volume 53,
Issue 9
Volume 53,
Issue 8
Volume 53,
Issue 7
Volume 53,
Issue 6
Volume 53,
Issue 5
Volume 53,
Issue 4
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 12
Volume 52,
Issue 11
Volume 52,
Issue 10
Volume 52,
Issue 9
Volume 52,
Issue 8
Volume 52,
Issue 7
Volume 52,
Issue 6
Volume 52,
Issue 5
Volume 52,
Issue 4
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 12
Volume 51,
Issue 11
Volume 51,
Issue 10
Volume 51,
Issue 9
Volume 51,
Issue 8
Volume 51,
Issue 7
Volume 51,
Issue 6
Volume 51,
Issue 5
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 12
Volume 50,
Issue 11
Volume 50,
Issue 10
Volume 50,
Issue 9
Volume 50,
Issue 8
Volume 50,
Issue 7
Volume 50,
Issue 6
Volume 50,
Issue 5
Volume 50,
Issue 4
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 12
Volume 49,
Issue 11
Volume 49,
Issue 10
Volume 49,
Issue 9
Volume 49,
Issue 8
Volume 49,
Issue 7
Volume 49,
Issue 6
Volume 49,
Issue 5
Volume 49,
Issue 4
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 12
Volume 48,
Issue 11
Volume 48,
Issue 10
Volume 48,
Issue 9
Volume 48,
Issue 8
Volume 48,
Issue 7
Volume 48,
Issue 6
Volume 48,
Issue 5
Volume 48,
Issue 4
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 12
Volume 47,
Issue 11
Volume 47,
Issue 10
Volume 47,
Issue 9
Volume 47,
Issue 8
Volume 47,
Issue 7
Volume 47,
Issue 6
Volume 47,
Issue 5
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue pt2
Volume 42,
Issue pt1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue pt
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 11
Volume 36,
Issue 9
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 12
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
537
Changes in the Editorial Board
| 2002
538
What Is in a Page Charge?
| 2002
539
A Re-Introduction of a New Editorial Board Member
| 2002
540
Demonstration of low-knee voltage high-breakdown GaInP double HBTs using novel compound collector design
Zampardi, P.J.
/ Chang, C.E.
/ Fitzsimmons, S.
et al.
| 2002
540
PAPERS - Compound Semiconductor Devices - Demonstration of Low-Knee Voltage High-Breakdown GaInP Double Heterojunction Bipolar Transistors Using Novel Compound Collector Design
Zampardi, P.J.
et al.
| 2002
544
Effect of dead space on avalanche speed [APDs]
Ng, J.S.
/ Tan, C.H.
/ Ng, B.K.
et al.
| 2002
544
PAPERS - Optoelectronics, Displays, and Imaging - Effect of Dead Space on Avalanche Speed
Ng, J.S.
et al.
| 2002
550
PAPERS - Optoelectronics, Displays, and Imaging - Study of the Color Detection of a-Si : H by Transient Response in the Visible Range
Gradisnik, V.
et al.
| 2002
550
Study of the color detection of a-Si:H by transient response in the visible range
Gradisnik, V.
/ Pavlovic, M.
/ Pivac, B.
et al.
| 2002
557
PAPERS - Optoelectronics, Displays, and Imaging - Electroluminescent Devices Using a High-Temperature Stable GaN-Based Phosphor and Thick-Film Dielectric Layer
Heikenfeld, J.
et al.
| 2002
557
Electroluminescent devices using a high-temperature stable GaN-based phosphor and thick-film dielectric layer
Heikenfeld, J.
/ Steckl, A.J.
et al.
| 2002
564
PAPERS - Silicon Devices - Characterization of the Novel Polysilicon TFT With a Subgate Coupling Structure
Chang, K.M.
et al.
| 2002
564
Characterization of the novel polysilicon TFT with a subgate coupling structure
Kow Ming Chang,
/ Yuan Hung Chung,
/ Chi-Gun Deng,
et al.
| 2002
568
PAPERS - Silicon Devices - Inverse Modeling of Sub-100 nm MOSFETs Using I-V and C-V
Djomehri, I.J.
et al.
| 2002
568
Inverse modeling of sub-100 nm MOSFETs using I-V and C-V
Djomehri, I.J.
/ Antoniadis, D.A.
et al.
| 2002
576
PAPERS - Silicon Devices - Floating-Island TFT Leakage Caused by Process Step Reduction
Tsujimura, T.
et al.
| 2002
576
Floating-island TFT leakage caused by process step reduction
Tsujimura, T.
/ Tokuhiro, O.
/ Morooka, M.
et al.
| 2002
584
Excellent cross-talk isolation, high-Q inductors, and reduced self-heating in a TFSOI technology for system-on-a-chip applications
Kumar, M.
/ Tan, Y.
/ Sin, J.K.O.
et al.
| 2002
584
PAPERS - Silicon Devices - Excellent Cross-Talk Isolation, High-Q Inductors, and Reduced Self-Heating in a TFSOI Technology for System-on-a-Chip Applications
Kumar, M.
et al.
| 2002
590
PAPERS - Silicon Devices - Technology and Reliability Constrained Future Copper Interconnects -- Part I: Resistance Modeling
Kapur, P.
et al.
| 2002
590
Technology and reliability constrained future copper interconnects. I. Resistance modeling
Kapur, P.
/ McVittie, J.P.
/ Saraswat, K.C.
et al.
| 2002
598
PAPERS - Silicon Devices - Technology and Reliability Constrained Future Copper Interconnects -- Part II: Performance Implications
Kapur, P.
et al.
| 2002
598
Technology and reliability constrained future copper interconnects. II. Performance implications
Kapur, P.
/ Chandra, G.
/ McVittie, J.P.
et al.
| 2002
605
PAPERS - Silicon Devices - An Anomalous Device Degradation of SOI Narrow Width Devices Caused by STI Edge Influence
Lee, H.
et al.
| 2002
605
An anomalous device degradation of SOI narrow width devices caused by STI edge influence
Hyeokjae Lee,
/ Jong-Ho Lee,
/ Hyungsoon Shin,
et al.
| 2002
613
Constant charge erasing scheme for flash memories
Chimenton, A.
/ Pellati, P.
/ Olivo, P.
et al.
| 2002
613
PAPERS - Silicon Devices - Constant Charge Erasing Scheme for Flash Memories
Chimenton, A.
et al.
| 2002
619
PAPERS - Silicon Devices - Macroscopic Simulation of Quantum Mechanical Effects in Two-Dimensional MOS Devices via the Density Gradient Method
Connelly, D.
et al.
| 2002
619
Macroscopic simulation of quantum mechanical effects in 2-D MOS devices via the density gradient method
Connelly, D.
/ Zhiping Yu,
/ Yergeau, D.
et al.
| 2002
627
Silicon single-electron transistors with sidewall depletion gates and their application to dynamic single-electron transistor logic
Dae Hwan Kim,
/ Suk-Kang Sung,
/ Kyung Rok Kim,
et al.
| 2002
627
PAPERS - Silicon Devices - Silicon Single-Electron Transistors With Sidewall Depletion Gates and Their Application to Dynamic Single-Electron Transistor Logic
Kim, D.H.
et al.
| 2002
636
Hot carrier-induced degradation of gate overlapped lightly doped drain (GOLDD) polysilicon TFTs
Valletta, A.
/ Mariucci, L.
/ Fortunato, G.
et al.
| 2002
636
PAPERS - Silicon Devices - Hot Carrier-Induced Degradation of Gate Overlapped Lightly Doped Drain (GOLDD) Polysilicon TFTs
Valletta, A.
et al.
| 2002
643
The design, characterization, and modeling of RF LDMOSFETs on silicon-on-insulator material
McShane, E.
/ Shenai, K.
et al.
| 2002
643
PAPERS - Silicon Devices - The Design, Characterization, and Modeling of RF LDMOSFETs on Silicon-on-Insulator Material
McShane, E.
et al.
| 2002
652
Simulation of quantum effects along the channel of ultrascaled Si-based MOSFETs
Wanqiang Chen,
/ Register, L.F.
/ Banerjee, S.K.
et al.
| 2002
652
PAPERS - Solid-State Device Phenomena - Simulation of Quantum Effects Along the Channel of Ultrascaled Si-Based MOSFETs
Chen, W.
et al.
| 2002
658
Status and prospects for SiC power MOSFETs
Cooper, J.A.
/ Melloch, M.R.
/ Singh, R.
et al.
| 2002
658
PAPERS - Solid-State Power and High Voltage - Status and Prospects for SiC Power MOSFETs
Cooper Jr, J.A.
et al.
| 2002
665
SiC power Schottky and PiN diodes
Singh, R.
/ Cooper, J.A.
/ Melloch, M.R.
et al.
| 2002
665
PAPERS - Solid-State Power and High Voltage - SiC Power Schottky and PiN Diodes
Singh, R.
et al.
| 2002
673
Fast-switching and shallow saturation bipolar power transistors using corrugated base junctions
Chanho Park,
/ Kwyro Lee,
et al.
| 2002
673
PAPERS - Solid-State Power and High Voltage - Fast-Switching and Shallow Saturation Bipolar Power Transistors Using Corrugated Base Junctions
Park, C.
et al.
| 2002
679
Generalized image method with application to the thermal modeling of power devices and circuits
Rinaldi, N.
et al.
| 2002
679
PAPERS - Solid-State Power and High Voltage - Generalized Image Method With Application to the Thermal Modeling of Power Devices and Circuits
Rinaldi, N.
et al.
| 2002
687
PAPERS - Solid-State Power and High Voltage - Experimental Comparison of RF Power LDMOSFETs on Thin-Film SOI and Bulk Silicon
Fiorenza, J.G.
et al.
| 2002
687
Experimental comparison of RF power LDMOSFETs on thin-film SOI and bulk silicon
Fiorenza, J.G.
/ del Alamo, J.A.
et al.
| 2002
693
BRIEFS - Effects of Wave Function Penetration Into the Gate-Oxide on Self-Consistent Modeling of Scaled MOSFETs
Kauser, M.Z.
et al.
| 2002
693
Effects of wave function penetration into the gate-oxide on self-consistent modeling of scaled MOSFETs
Kauser, M.Z.
/ Sayed Hasan, M.
/ Haque, A.
et al.
| 2002
695
BRIEFS - Determination of Deep Ultrathin Equivalent Oxide Thickness (EOT) From Measuring Flat-Band C-V Curve
Chen, C.H.
et al.
| 2002
695
Determination of deep ultrathin equivalent oxide thickness (EOT) from measuring flat-band C-V curve
Chen, C.H.
/ Fang, Y.K.
/ Yang, C.W.
et al.
| 2002
699
BRIEFS - Study of SILC and Interface Trap Generation Due to High Field Stressing and Its Operating Temperature Dependence in 2.2 nm Gate Dielectrics
Borse, D.G.
et al.
| 2002
699
Study of SILC and interface trap generation due to high field stressing and its operating temperature dependence in 2.2 nm gate dielectrics
Borse, D.G.
/ Vaidya, S.J.
/ Chandorkar, A.N.
et al.
| 2002
702
CORRESPONDENCE - On The Transport Equations in Popular Commercial Device Simulators
Levinshtein, M.E.
et al.
| 2002
702
On the transport equations in popular commercial device simulators
Levinshtein, M.E.
/ Mnatsakanov, T.T.
et al.
| 2002
704
ANNOUNCEMENTS - Call for Papers -- IEEE T-ED Special Issue on Solid-State Image Sensors
| 2002
705
ANNOUNCEMENTS - Call for Papers -- IEEE T-ED Special Issue on Device Integration Technology for RF and Mixed-Signal SOC
| 2002
706
ANNOUNCEMENTS - Call for Papers -- Joint Special Issue on Nanoelectronics
| 2002
707
ANNOUNCEMENTS - Call for Papers -- IEEE GaAs IC Symposium
| 2002
708
ANNOUNCEMENTS - Call for Papers -- International Integrated Reliability Workshop
| 2002