IEEE Transactions on Instrumentation and Measurement
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 1154
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PAPERS - New ADC with Piecewise Linear Characteristic: Case Study -- Implementation of a Smart Humidity SensorBucci, G. et al. | 2000
- 1167
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PAPERS - An Integrated Active-Quenching Circuit for Single-Photon Avalanche DiodesZappa, F. et al. | 2000
- 1176
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PAPERS - An Arbitrary Power Law Device Based on IntegratorsKiranon, W. et al. | 2000
- 1176
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An arbitrary power law device based on integratorsKiranon, W. / Loescharataramdee, C. / Petchakit, W. et al. | 2000
- 1183
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PAPERS - A Novel Intelligent Strategy for Improving Measurement Precision of FOGZhu, R. et al. | 2000
- 1189
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Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithmHandel, P. et al. | 2000
- 1189
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PAPERS - Properties of the IEEE-STD-1057 Four-Parameter Sine Wave Fit AlgorithmHändel, P. et al. | 2000
- 1194
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PAPERS - An Adaptive Window Function Method for Power MeasurementZhang, J.Q. et al. | 2000
- 1201
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PAPERS - Fuzzy Modeling of Measurement Data Acquired from Physical SensorsMauris, G. et al. | 2000
- 1206
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PAPERS - Stability Evaluation of High-Precision Multifunction Instruments for Traceability TransferCassiago, C. et al. | 2000
- 1211
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Application of a phase measurement algorithm to digitizing oscilloscope characterizationGori, S. / Narduzzi, C. et al. | 2000
- 1211
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PAPERS - Application of a Phase Measurement Algorithm to Digitizing Oscilloscope CharacterizationGori, S. et al. | 2000
- 1216
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PAPERS - An Orthogonal Peak Detector for Multiphase Sinusoidal SignalsWu, K.-D. et al. | 2000
- 1224
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PAPERS - Algorithmic Specification of a Specialized Processor for Spectrometric ApplicationsSlima, M.Ben et al. | 2000
- 1224
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Algorithmic specification of a specialized processor for spectrometric applicationsBen Slima, M. / Szczecinski, L.L. / Massicotte, D. et al. | 2000
- 1231
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PAPERS - A Comparison of Wavelength Dependent Polarization Dependent Loss Measurement in Fiber GratingsZhu, Y. et al. | 2000
- 1240
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Fast computation of maximum time interval error by binary decompositionBregni, S. / Maccabruni, S. et al. | 2000
- 1240
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PAPERS - Fast Computation of Maximum Time Interval Error by Binary DecompositionBregni, S. et al. | 2000
- 1245
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Measuring of slowly changing AC signals without sample-and-hold circuitPetrovic, P. / Marjanovic, S. / Stevanovic, M. et al. | 2000
- 1245
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PAPERS - Measuring of Slowly Changing AC Signals Without Sample-and-Hold CircuitPetrovic, P. et al. | 2000
- 1249
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PAPERS - A Generic Automated-Semiautomated Digital Multi-Electrode Instrument for Field Resistivity MeasurementsWerkema, D.D. et al. | 2000
- 1254
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Error analysis of an optical current transducer operating with a digital signal processing systemNiewczas, P. / Cruden, A. / Michie, W.C. et al. | 2000
- 1254
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PAPERS - Error Analysis of an Optical Current Transducer Operating with a Digital Signal Processing SystemNiewczas, P. et al. | 2000
- 1260
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PAPERS - Online Frequency Domain System Identification Based on a Virtual InstrumentNémeth, J.G. et al. | 2000
- 1264
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PAPERS - Characterization of Material Versus Temperature Using P(VDF-TrFE) SAW TransducersBenech, P. et al. | 2000
- 1264
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Characterization of material versus temperature using P(VDF-TrFE) SAW transducersBenech, P. / Dali-Ali, M. / Keradec, J.P. et al. | 2000
- 1267
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PAPERS - An In-Service Measurement System for the Quality Analysis of Facsimile TransmissionsBertocco, M. et al. | 2000
- 1272
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PAPERS - A Novel Current Mode Instrumentation Amplifier (CMIA) TopologyAzhari, S.J. et al. | 2000
- 1278
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Electronic error reduction system for clamp-on probes and measuring current transformersSlomovitz, D. et al. | 2000
- 1278
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PAPERS - Electronic Error Reduction System for Clamp-On Probes and Measuring Current TransformersSlomovitz, D. et al. | 2000
- 1282
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Maximum likelihood estimator for jitter noise models (HF sampling scopes)Vandersteen, G. / Pintelon, R. et al. | 2000
- 1282
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PAPERS - Maximum Likelihood Estimator for Jitter Noise ModelsVandersteen, G. et al. | 2000
- 1285
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PAPERS - A New Method to Measure the Distance Between Graduation Lines on Graduated ScalesPenzes, W.B. et al. | 2000
- 1289
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PAPERS - Selection of Test Nodes for Analog Fault Diagnosis in Dictionary ApproachPrasad, V.C. et al. | 2000
- 1298
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PAPERS - A Complex Nonlinear Exponential Autoregressive Model Approach to Shape Recognition Using Neural NetworksXiong, S. et al. | 2000
- 1305
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PAPERS - Broadband Coaxial Cavity Resonator for Complex Permittivity Measurements of LiquidsRaveendranath, U. et al. | 2000
- 1313
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PAPERS - A Microwave Frequency Reference Based on VCSEL-Driven Dark Line Resonances in Cs VaporKitching, J. et al. | 2000
- 1318
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PAPERS - Self-Balancing Linear Bridge Circuits with Resistive Mirrors for Resistance MeasurementTadic, N. et al. | 2000
- 1326
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PAPERS - A Tunable Vacuum-Gap Cryogenic Coaxial CapacitorOverney, F. et al. | 2000
- 1331
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PAPERS - Some Aspects of Pseudo Random Binary Array-Based Surface CharacterizationSpoelder, H.J.W. et al. | 2000
- 1337
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PAPERS - Automatic Test Equipment for the Measurement of Symmetrical and Asymmetrical RF Interference Based on Hybrid JunctionsBonitatibus, A.De et al. | 2000
- 1344
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PAPERS - Visual Measurement of Orientation Error for a Mobile RobotLang, S.Y.T. et al. | 2000
- 1344
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Visual measurement of orientation error for a mobile robotLang, S.Y.T. / Fu, Yili et al. | 2000
- 1358
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CORRESPONDENCE - Nanovoltmeter Offset Currents do not Explain Measured Deviations in the Quantized Hall ResistanceInglis, D. et al. | 2000
- 1358
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Comments on "Evanescent microwaves: a novel super-resolution noncontact nondestructive imaging technique for biological applications" [with reply]Kumar, A. / Tabib-Azar, M. et al. | 2000
- 1358
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Why nanovoltmeter offset currents do not explain measured deviations in the quantized Hall resistanceInglis, D. / Wood, B. et al. | 2000
- 1358
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CORRESPONDENCE - Author's ReplyTabib-Azar, M. et al. | 2000
- 1358
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CORRESPONDENCE - Comments on "Evanescent Microwaves: A Novel Super-Resolution Noncontact Nondestructive Imaging Technique For Biological Applications"Kumar, A. et al. | 2000
- 1360
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2000 INDEX| 2000
- 1360
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Information for Authors| 2000