IEEE Transactions on Nuclear Science
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
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Table of contents| 2020
- 1201
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Comments by the EditorsFleetwood, Dan / Brown, Dennis / Quinn, Heather et al. | 2020
- 1202
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List of Reviewers| 2020
- 1204
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Low-Energy Protons—Where and Why “Rare Events” MatterRodbell, Kenneth P. et al. | 2020
- 1216
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Total-Ionizing-Dose Effects, Border Traps, and 1/f Noise in Emerging MOS TechnologiesFleetwood, Daniel M. et al. | 2020
- 1241
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Phosphorus Versus Arsenic: Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph SignalLe Roch, Alexandre / Virmontois, Cedric / Paillet, Philippe et al. | 2020
- 1251
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Analysis of the Drift of the South Atlantic Anomaly From ICARE and SEM-2 Flight DataAubry, Marine / Costes-Ori, Vaihirau / Standarovski, Denis et al. | 2020
- 1256
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High Displacement Damage Dose Effects in Radiation Hardened CMOS Image SensorsRizzolo, Serena / Le Roch, Alexandre / Marcelot, Olivier et al. | 2020
- 1263
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Displacement Damage Effects in InGaAs Photodiodes due to Electron, Proton, and Neutron IrradiationsNuns, T. / Inguimbert, C. / Barbero, J. et al. | 2020
- 1273
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Simulation of Single Particle Displacement Damage in Si₁₋ₓGeₓ Alloys—Interaction of Primary Particles With the Material and Generation of the Damage StructureJarrin, Thomas / Jay, Antoine / Raine, Melanie et al. | 2020
- 1284
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Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing DosesDewitte, H. / Rizzolo, S. / Paillet, P. et al. | 2020
- 1293
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DCR Performance in Neutron-Irradiated CMOS SPADs From 150- to 180-nm TechnologiesRatti, L. / Brogi, P. / Collazuol, G. et al. | 2020
- 1302
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Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh DosesBonaldo, Stefano / Mattiazzo, Serena / Enz, Christian et al. | 2020
- 1312
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Total-Ionizing-Dose Effects in InGaAs MOSFETs With High-k Gate Dielectrics and InP SubstratesBonaldo, Stefano / Zhang, En Xia / Zhao, Simeng E. et al. | 2020
- 1320
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TID Response of Bulk Si PMOS FinFETs: Bias, Fin Width, and Orientation DependenceRen, Zhexuan / An, Xia / Li, Gensong et al. | 2020
- 1326
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On-Chip Total Ionizing Dose Digital Monitor in Fully Depleted SOI TechnologiesAbouzeid, Fady / Gasiot, Gilles / Soussan, Dimitri et al. | 2020
- 1332
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Total Dose Effects on Negative and Positive Low-Dropout Linear RegulatorsPrivat, A. / Davis, P. W. / Barnaby, H. J. et al. | 2020
- 1339
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High-Fluence Proton-Induced Degradation on AlGaN/GaN High-Electron-Mobility TransistorsYue, Shaozhong / Lei, Zhifeng / Peng, Chao et al. | 2020
- 1345
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Comparison of X-Ray and Proton Irradiation Effects on the Characteristics of InGaN/GaN Multiple Quantum Wells Light-Emitting DiodesWang, Lei / Liu, Ningyang / Li, Bo et al. | 2020
- 1351
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A Proton Sensor for Energies From 2 to 20 MeVRuffenach, M. / Bourdarie, S. / Mekki, J. et al. | 2020
- 1360
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Mechanism Analysis of Proton Irradiation-Induced Increase of 3-dB Bandwidth of GaN-Based Microlight-Emitting Diodes for Space Light CommunicationWang, Lei / Pan, Zhangxu / Li, Bo et al. | 2020
- 1365
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Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFETNiskanen, K. / Touboul, A. D. / Germanicus, R. Coq et al. | 2020
- 1374
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Estimation of Residual Radioactivity and Radiation Damage in SiC After Neutron IrradiationLee, Ki-Man / Park, Byung-Gun et al. | 2020
- 1381
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Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETsMartinella, C. / Ziemann, T. / Stark, R. et al. | 2020
- 1390
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TID-Induced Breakdown Voltage Degradation in Uniform and Linear Variable Doping SOI p-LDMOSFETsShu, Lei / Zhao, Yuan-Fu / Galloway, Kenneth F. et al. | 2020
- 1395
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COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field IrradiationsFerraro, Rudy / Foucard, Gilles / Infantino, Angelo et al. | 2020
- 1404
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Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced TransientsPossamai Bastos, R. / Dutertre, J.-M. / Garay Trindade, M. et al. | 2020
- 1412
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Thermal Neutron-Induced SEUs in the LHC Accelerator EnvironmentCecchetto, Matteo / Garcia Alia, Ruben / Wrobel, Frederic et al. | 2020
- 1421
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Characterizing High-Energy Ion Beams With PIPS DetectorsBagatin, M. / Ferlet-Cavrois, V. / Gerardin, S. et al. | 2020
- 1428
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Atmospheric Neutron Radiation Response of III–V Binary Compound SemiconductorsAutran, Jean-Luc / Munteanu, Daniela et al. | 2020
- 1436
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SE Response of Guard-Gate FF in 16- and 7-nm Bulk FinFET TechnologiesCao, Jingchen / Xu, Lyuan / Bhuva, Bharat L. et al. | 2020
- 1443
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A Statistical Method for MCU Extraction Without the Physical-to-Logical Address MappingWang, Xun / Ding, Lili / Luo, Yinhong et al. | 2020
- 1452
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Error Detection and Mitigation of Data-Intensive Microprocessor Applications Using SIMD and Trace MonitoringPena-Fernandez, M. / Lindoso, A. / Entrena, L. et al. | 2020
- 1461
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Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static ModeFabero, Juan Carlos / Mecha, Hortensia / Franco, Francisco J. et al. | 2020
- 1470
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Evaluation of Soft-Error Tolerance by Neutrons and Heavy Ions on Flip Flops With Guard Gates in a 65-nm Thin BOX FDSOI ProcessEbara, Mitsunori / Yamada, Kodai / Kojima, Kentaro et al. | 2020
- 1478
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Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAsLibano, F. / Wilson, B. / Wirthlin, M. et al. | 2020
- 1485
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Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs With Comparison to 20-nm Planar SRAMsKato, Takashi / Hashimoto, Masanori / Matsuyama, Hideya et al. | 2020
- 1494
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Analysis of SET Propagation in a System in Package Point of Load ConverterRajkowski, T. / Saigne, F. / Pouget, V. et al. | 2020
- 1503
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Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effectsde Oliveira, Adria B. / Tambara, Lucas A. / Benevenuti, Fabio et al. | 2020
- 1511
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Empirical Mathematical Model of Microprocessor Sensitivity and Early Prediction to Proton and Neutron Radiation-Induced Soft ErrorsSerrano-Cases, Alejandro / Reyneri, Leonardo Maria / Morilla, Yolanda et al. | 2020
- 1521
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Tradeoffs Between RF Performance and SET Robustness in Low-Noise Amplifiers in a Complementary SiGe BiCMOS PlatformIldefonso, Adrian / Tzintzarov, George N. / Lourenco, Nelson E. et al. | 2020
- 1530
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Longitudinal Direct Ionization Impact of Heavy Ions on See Testing for Ultrahigh EnergiesWyrwoll, Vanessa / Alia, Ruben Garcia / Roed, Ketil et al. | 2020
- 1540
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Nonstable Latchups in CMOS ICs Under Pulsed Laser IrradiationShvetsov-Shilovskiy, Ivan I. / Chumakov, Alexander I. / Pechenkin, Alexander A. et al. | 2020
- 1547
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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation TestsFranco, Francisco J. / Clemente, Juan A. / Korkian, Golnaz et al. | 2020
- 1555
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Irradiation Test of 65-nm Bulk SRAMs With DC Muon Beam at RCNP-MuSIC FacilityMahara, Takumi / Manabe, Seiya / Watanabe, Yukinobu et al. | 2020
- 1560
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Impact of Tensor Cores and Mixed Precision on the Reliability of Matrix Multiplication in GPUsBasso, Pedro Martins / Santos, Fernando Fernandes dos / Rech, Paolo et al. | 2020
- 1566
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Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMsLiao, Wang / Hashimoto, Masanori / Manabe, Seiya et al. | 2020
- 1573
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Improving Selective Fault Tolerance in GPU Register Files by Relaxing Application AccuracyGoncalves, Marcio M. / Lamb, Ivan Peter / Rech, Paolo et al. | 2020
- 1581
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Exploiting Transistor Folding Layout as RHBD Technique Against Single-Event TransientsAguiar, Y. Q. / Wrobel, F. / Autran, J.-L. et al. | 2020
- 1590
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Heavy Ion Nuclear Reaction Impact on SEE Testing: From Standard to Ultra-high EnergiesWyrwoll, Vanessa / Alia, Ruben Garcia / Roed, Ketil et al. | 2020
- 1599
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Measurement of Single-Event Upsets in 65-nm SRAMs Under Irradiation of Spallation Neutrons at J-PARC MLFKuroda, Junya / Manabe, Seiya / Watanabe, Yukinobu et al. | 2020
- 1606
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The Pion Single-Event Effect Resonance and its Impact in an Accelerator EnvironmentCoronetti, Andrea / Alia, Ruben Garcia / Cecchetto, Matteo et al. | 2020
- 1614
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Reliability Analysis of Ethernet-Based Solutions for Data Transmission in the CERN Radiation EnvironmentGnemmi, G. / Tsiligiannis, G. / Masi, A. et al. | 2020
- 1623
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Simulating Charge Deposition by Cosmic Rays Inside Astronomical Imaging DetectorsLucsanyi, David / Prod'homme, Thibaut et al. | 2020
- 1629
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Intercomparison of Ionizing Doses From Space Shielding Analyses Using MCNP, Geant4, FASTRAD, and NOVICEJun, Bongim / Zhu, Brian Xiaoyu / Martinez-Sierra, Luz Maria et al. | 2020
- 1637
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Radiation-Response of Fiber Bragg Gratings at Low TemperaturesMorana, A. / Girard, S. / Marin, E. et al. | 2020
- 1643
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Combined Temperature and Radiation Effects on Radiation-Sensitive Single-Mode Optical FibersCampanella, C. / Morana, A. / Girard, S. et al. | 2020
- 1650
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Steady-State X-Ray Radiation-Induced Attenuation in Canonical Optical FibersDe Michele, Vincenzo / Morana, Adriana / Campanella, Cosimo et al. | 2020
- 1658
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Remote Measurements of X-Rays Dose Rate Using a Cerium-Doped Air-Clad Optical FiberBahout, Jessica / Ouerdane, Youcef / Hamzaoui, Hicham El et al. | 2020
- 1663
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Investigation of Thermoluminescence Properties of Potential Fibered-OSL Dosimeter MaterialsBenabdesselam, M. / Mady, F. / Guttilla, A. et al. | 2020
- 1669
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Modeling of Near Zero-Field Magnetoresistance and Electrically Detected Magnetic Resonance in Irradiated Si/SiO2 MOSFETsHarmon, Nicholas J. / Mcmillan, Stephen R. / Ashton, James P. et al. | 2020
- 1674
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Spin-Transfer Torque Magnetic Tunnel Junction for Single-Event Effects Mitigation in IC DesignCoi, Odilia / Di Pendina, Gregory / Prenat, Guillaume et al. | 2020
- 1682
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Radiation Environment in the LHC Arc Sections During Run 2 and Future HL-LHC OperationsBilko, Kacper / Castro, Cristina Bahamonde / Brugger, Markus et al. | 2020
- 1691
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Development of a 3-D Scintillator Detector for Compton Imaging Based on Laser EngravingZhang, Jipeng / Li, Chunmiao / Pang, Xiaoyu et al. | 2020
- 1699
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Introducing IEEE Collabratec| 2020
- 1700
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Member Get-A-Member (MGM) Program| 2020
- 1702
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Longitudinal and Transverse Measurement to Evaluate the Beam Impedance on a Ceramic Ring-Loaded Thin-Wall Vacuum Chamber in BRing at HIAFZhu, Guangyu / Wu, Junxia / Chen, Xiaoqiang et al. | 2020
- 1710
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A Method to Restrain Parameter Drift in Trapezoidal Pulse ShapingWengang, Song / Lijun, Zhang / Guanying, Wang et al. | 2020
- 1715
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Detector Upgrade for Fast MeV X-Ray Imaging for Severe Accidents ExperimentsTisseur, D. / Eck, D. / Estre, N. et al. | 2020
- 1722
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Quantitative Study of Pulsed X-Ray-Induced Electromagnetic Response in Coaxial CablesRibiere, M. / de Dortan, F. de Gaufridy / Delaunay, R. et al. | 2020
- 1732
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Wavelet Analysis of RTS Noise in CMOS Image Sensors Irradiated With High-Energy PhotonsHendrickson, Ben / Widenhorn, Ralf / Blouke, Morley et al. | 2020
- 1738
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Radiation-Hardened Sensor Interface Circuit for Monitoring Severe Accidents in Nuclear Power PlantsJeon, Hyuntak / Kwon, Inyong / Je, Minkyu et al. | 2020
- 1746
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TERA: Throughput-Enhanced Readout ASIC for High-Rate Energy-Dispersive X-Ray DetectionHafizh, Idham / Carminati, Marco / Fiorini, Carlo et al. | 2020
- 1760
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A Photomultiplier With an AlGaN Photocathode and Microchannel Plates for BaF2 Scintillator Detectors in Particle PhysicsAtanov, Nikolay / Davydov, Yuri / Glagolev, Vladimir et al. | 2020
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Onset of Fogging and Degradation in Polyvinyl Toluene-Based ScintillatorsRose, Paul B. / Okowita, Alex / Lance, Michael J. et al. | 2020
- 1772
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Front-End Electronics for the SiPM-Readout Gaseous TPC for Neutrinoless Double-Beta Decay SearchNakamura, K. Z. / Ban, S. / Ichikawa, A. K. et al. | 2020
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Front Cover| 2020
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IEEE Transactions on Nuclear Science publication information| 2020
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IEEE Transactions on Nuclear Science information for authors| 2020
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2020