The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Volume 46,
Issue 12
Volume 46,
Issue 11
Volume 46,
Issue 10
Volume 46,
Issue 9
Volume 46,
Issue 8
Volume 46,
Issue 7
Volume 46,
Issue 6
Volume 46,
Issue 5
Volume 46,
Issue 4
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 12
Volume 45,
Issue 11
Volume 45,
Issue 10
Volume 45,
Issue 9
Volume 45,
Issue 8
Volume 45,
Issue 7
Volume 45,
Issue 6
Volume 45,
Issue 5
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 12
Volume 44,
Issue 11
Volume 44,
Issue 10
Volume 44,
Issue 9
Volume 44,
Issue 8
Volume 44,
Issue 7
Volume 44,
Issue 6
Volume 44,
Issue 5
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 12
Volume 43,
Issue 11
Volume 43,
Issue 10
Volume 43,
Issue 9
Volume 43,
Issue 8
Volume 43,
Issue 7
Volume 43,
Issue 6
Volume 43,
Issue 5
Volume 43,
Issue 4
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue 12
Volume 42,
Issue 11
Volume 42,
Issue 10
Volume 42,
Issue 9
Volume 42,
Issue 8
Volume 42,
Issue 7
Volume 42,
Issue 6
Volume 42,
Issue 5
Volume 42,
Issue 4
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 12
Volume 41,
Issue 11
Volume 41,
Issue 10
Volume 41,
Issue 9
Volume 41,
Issue 8
Volume 41,
Issue 7
Volume 41,
Issue 6
Volume 41,
Issue 5
Volume 41,
Issue 4
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 12
Volume 40,
Issue 11
Volume 40,
Issue 10
Volume 40,
Issue 9
Volume 40,
Issue 8
Volume 40,
Issue 7
Volume 40,
Issue 6
Volume 40,
Issue 5
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 12
Volume 39,
Issue 11
Volume 39,
Issue 10
Volume 39,
Issue 9
Volume 39,
Issue 8
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 12
Volume 36,
Issue 11
Volume 36,
Issue 10
Volume 36,
Issue 9
Volume 36,
Issue 8
Volume 36,
Issue 7
Volume 36,
Issue 6
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 10
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 7
Volume 35,
Issue 6
Volume 35,
Issue 5
Volume 35,
Issue 4
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 12
Volume 34,
Issue 11
Volume 34,
Issue 10
Volume 34,
Issue 9
Volume 34,
Issue 8
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 10
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
>
Table of contents
463
Evaluation of hot-carrier degradation of n-channel MOSFETs at low gate bias
Meehan, Alan
/ O'Sullivan, Paula
/ Hurley, Paul
et al.
| 1994
463
Evaluaton of hot-carrier degradation of n-channel MOSFETs at low gate bias
Meehan, A.
/ O'Sullivan, P.
/ Hurley, P.
et al.
| 1994
469
A model for hot-electron and hot-hole injection in flash EEPROM programming
Concannon, A.
/ Mathewson, A.
/ Piccinini, F.
et al.
| 1994
475
Characterization and manufacturability of a 200 Å gate oxide
Whiston, S.
/ Stakelum, R.
/ O'Neill, M.
et al.
| 1994
475
Characterization and manufacturability of a 200 °A gate oxide
Whiston, S.
et al.
| 1994
475
Characterization and manufacturability of a 200 A.U. gate oxide
Whiston, S.
/ Stakelum, R.
/ O'Neill, M.
et al.
| 1994
485
Plasma-grown oxides on silicon with extremely low interface state densities
Kennedy, G.P.
/ Taylor, S.
/ Eccleston, W.
et al.
| 1994
491
Characterization of flash structures erased with ultra-short pulses
Lanzoni, Massimo
/ Riva, Carlo
/ Olivo, Piero
et al.
| 1994
495
Thin SiO2 films nitrided in N2O
Bellafiore, N.
/ Pio, F.
/ Riva, C.
et al.
| 1994
501
SIMS study of rapid nitridation of silicon dioxide thick films in an ammonia ambient
Bréelle, E.
/ Rigo, S.
/ Kilner, J.A.
et al.
| 1994
507
Charge build-up and oxide wear-out during Fowler-Nordheim electron injection in irradiated MOS structures
Brożek, Tomasz
/ Jakubowski, Andrzej
et al.
| 1994
515
MOSFET degradation during substrate hot electron stress
Zhao, S.P.
/ Taylor, S.
/ McPhie, A.
et al.
| 1994
523
Quantum effects in accumulated MOS thin dielectric structures
Olivo, Piero
/ Suñé, Jordi
et al.
| 1994
523
Quantum effects in accumulation MOS thin dielectric structures
Olivo, P.
/ Sune, J.
et al.
| 1994
533
Electrical properties of thin high- dielectric Ta2O5 films
Rausch, N.
/ Burte, E.P.
et al.
| 1994
539
Thin SiO2 films nitrided by rapid thermal processing in NH3 or N2O for applications in EEPROMs
Dutoit, M.
/ Bouvet, D.
/ Mi, J.
et al.
| 1994
539
Thin SiO2 films nitrided by rapid thermal processing in NH(sub 3) or N2O for applications in EEPROMs
Dutoit, M.
et al.
| 1994
553
Evaluation of the lifetime and failure probability for inter-poly oxides from RVS measurements
Martin, Andreas
/ O'Sullivan, Paula
/ Mathewson, Alan
et al.
| 1994
553
Evaluation of the lifetime and failure probability for inter-poly oxides form RVS measurements
Martin, A.
/ O'Sullivan, P.
/ Mathewson, A.
et al.
| 1994
559
Relaxational polarization and charge injection in thin films of silicon nitride
Homann, M.
/ Kliem, H.
et al.
| 1994
567
Analysis of low energy boron implants in silicon through SiO2 films: implantation damage and anomalous diffusion
Kaabi, L.
/ Gontrand, C.
/ Remaki, B.
et al.
| 1994
577
Impact of furnace nitridation time in N2O ambient on the quality of the Si/SiO2 system
Le Bihan, R.
/ André-Benoit, E.
/ Papadas, C.
et al.
| 1994
583
Influence of ionizing radiation on the conduction properties of ultra-thin silica layers
Sarrabayrouse, G.J.
/ Salace, G.
/ Aasime, A.
et al.
| 1994
589
The impact of source composition evolution on optical coating characteristics
Piccirillo, A.
/ Moro, L.
/ Natta, D.
et al.
| 1994
601
Designer's guide to testable ASIC devices
Harris, M.S.
et al.
| 1994
601
Book Reviews
| 1994
601
System designs into silicon
Harris, M.S.
et al.
| 1994
602
The economics of automatic testing
Dislis, Chryssa
et al.
| 1994
603
Fuzzy reasoning in information, decision and control systems
Osborn, C.
et al.
| 1994
604
Asynchronous circuit design for VLSI signal processing
Harris, M.S.
et al.
| 1994
604
Optical transmission for the subscriber loop
Marincic, A.
et al.
| 1994
606
Heterojunction transistors and small size effects in devices
Henini, Mahomed
et al.
| 1994
607
Designing with FPGAs and CPLDs
Harris, M.S.
et al.
| 1994
608
Sensor technology and devices
Janković, N.D.
et al.
| 1994
iii
The gigabit generation
Szweda, Roy
et al.
| 1994
vi
Japanese companies maintain lead in semiconductor memory technologies
| 1994
xv
US companies dominate SEMICON West 94
| 1994
xxi
The 5th ESPRIT workshop on the characterization and growth of thin dielectrics in microelectronics
Mathewson, Alan
/ O'Sullivan, Paula
et al.
| 1994
Memory update: Japanese companies maintain lead in semiconductor memory technologies
Harris, Trish
et al.
| 1994
Show report: US Companies Dominate SEMICON West 94
Szweda, Roy
et al.
| 1994
Guest Editorial
Mathewson, Alan
et al.
| 1994
Editorial: The Gigabit Generation
Szweda, Roy
et al.
| 1994