Microstructure and contact-resistance temperature dependence of Pt/Ti/Ge/Pd ohmic contacts to GaAs (English)
- New search for: Cole, M. W.
- New search for: Han, W. Y.
- New search for: Eckart, D. W.
- New search for: Casas, L. M.
- New search for: Microscopy Society of America
- New search for: Microbeam Analysis Society
- New search for: Cole, M. W.
- New search for: Han, W. Y.
- New search for: Eckart, D. W.
- New search for: Casas, L. M.
- New search for: Microscopy Society of America
- New search for: Microbeam Analysis Society
In:
Joint Annual meeting
52
;
866-867
;
1993
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ISSN:
- Conference paper / Print
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Title:Microstructure and contact-resistance temperature dependence of Pt/Ti/Ge/Pd ohmic contacts to GaAs
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Contributors:Cole, M. W. ( author ) / Han, W. Y. ( author ) / Eckart, D. W. ( author ) / Casas, L. M. ( author ) / Microscopy Society of America / Microbeam Analysis Society
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Conference:Joint Annual meeting ; 1994 ; New Orleans; LA
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Published in:Joint Annual meeting , 52 ; 866-867
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Publisher:
- New search for: San Francisco Press
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Publication date:1993-01-01
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Size:2 pages
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Remarks:Joint meeting incorporating the 52nd Annual meeting of the Microscopy Society of America and the 29th Annual meeting of the Microbeam Analysis Society
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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