X-ray diffraction and reflectometry studies of porous silicon: n-type layers and holographic gratings (English)
- New search for: Chamard, V.
- New search for: Dolino, G.
- New search for: Lerondel, G.
- New search for: Setzu, S.
- New search for: Rutherford Appleton Laboratory
- New search for: Daresbury Laboratory
- New search for: Chamard, V.
- New search for: Dolino, G.
- New search for: Lerondel, G.
- New search for: Setzu, S.
- New search for: Norman, D.
- New search for: Webster, J. R. P.
- New search for: Rutherford Appleton Laboratory
- New search for: Daresbury Laboratory
In:
Surface X-ray and neutron scattering: SXNS-5
;
101-103
;
1998
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ISSN:
- Conference paper / Print
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Title:X-ray diffraction and reflectometry studies of porous silicon: n-type layers and holographic gratings
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Contributors:Chamard, V. ( author ) / Dolino, G. ( author ) / Lerondel, G. ( author ) / Setzu, S. ( author ) / Norman, D. / Webster, J. R. P. / Rutherford Appleton Laboratory / Daresbury Laboratory
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Conference:International conference; 5th, Surface X-ray and neutron scattering: SXNS-5 ; 1997 ; Oxford
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Published in:PHYSICA B ; 248 ; 101-103
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Publisher:
- New search for: North-Holland
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Publication date:1998-01-01
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Size:3 pages
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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