Intercomparison of Scanning Probe Microscopes (English)
- New search for: Breil, R.
- New search for: Fries, T.
- New search for: Gamaes, J.
- New search for: Haycocks, J.
- New search for: Huser, D.
- New search for: Joergensen, J.
- New search for: Kautek, W.
- New search for: Koenders, L.
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- New search for: Koopos, K. R.
- New search for: European Society for Precision Engineering and Nanotechnology
- New search for: Breil, R.
- New search for: Fries, T.
- New search for: Gamaes, J.
- New search for: Haycocks, J.
- New search for: Huser, D.
- New search for: Joergensen, J.
- New search for: Kautek, W.
- New search for: Koenders, L.
- New search for: Kofod, N.
- New search for: Koopos, K. R.
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In:
European Society for Precision Engineering and Nanotechnology
;
510-513
;
2001
- Conference paper / Print
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Title:Intercomparison of Scanning Probe Microscopes
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Contributors:Breil, R. ( author ) / Fries, T. ( author ) / Gamaes, J. ( author ) / Haycocks, J. ( author ) / Huser, D. ( author ) / Joergensen, J. ( author ) / Kautek, W. ( author ) / Koenders, L. ( author ) / Kofod, N. ( author ) / Koopos, K. R. ( author )
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Conference:International conference; 2nd, European Society for Precision Engineering and Nanotechnology ; 2001 ; Turin, Italy
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Published in:PROCEEDINGS OF THE EUSPEN INTERNATIONAL CONFERENCE ; 1 ; 510-513
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Publisher:
- New search for: euspen
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Publication date:2001-01-01
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Size:4 pages
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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