WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques (English)
- New search for: Liao, Peter Yi-Yu
- New search for: Li, Katherine Shu-Min
- New search for: Li-Yang, Leon
- New search for: Wang, Sying-Jyan
- New search for: Huang, Andrew Yi-Ann
- New search for: Chau-Cheung, Ken
- New search for: Tsai, Nova Cheng-Yen
- New search for: Chou, Leon
- New search for: Liao, Peter Yi-Yu
- New search for: Li, Katherine Shu-Min
- New search for: Li-Yang, Leon
- New search for: Wang, Sying-Jyan
- New search for: Huang, Andrew Yi-Ann
- New search for: Chau-Cheung, Ken
- New search for: Tsai, Nova Cheng-Yen
- New search for: Chou, Leon
In:
2021 IEEE International Test Conference (ITC 2021)
;
309-313
;
2021
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ISSN:
- Conference paper / Print
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Title:WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques
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Contributors:Liao, Peter Yi-Yu ( author ) / Li, Katherine Shu-Min ( author ) / Li-Yang, Leon ( author ) / Wang, Sying-Jyan ( author ) / Huang, Andrew Yi-Ann ( author ) / Chau-Cheung, Ken ( author ) / Tsai, Nova Cheng-Yen ( author ) / Chou, Leon ( author )
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Conference:2021 IEEE International Test Conference (ITC 2021)
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Published in:Proceedings ; 2021 ; 309-313
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Publisher:
- New search for: IEEE Computer Society Press
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Publication date:2021-01-01
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Size:5 pages
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Source:
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