Reactivity of thermally oxidized and unoxidized SiC particulates with aluminium-silicon alloys (Unknown)
- New search for: Narciso, J.
- New search for: Garcia-Cordovilla, C.
- New search for: Louis, E.
- New search for: Narciso, J.
- New search for: Garcia-Cordovilla, C.
- New search for: Louis, E.
In:
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B
;
15
, 2
;
148
;
1992
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ISSN:
- Article (Journal) / Print
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Title:Reactivity of thermally oxidized and unoxidized SiC particulates with aluminium-silicon alloys
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Contributors:
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Published in:MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 15, 2 ; 148
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Publisher:
- New search for: ELSEVIER
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Publication date:1992-01-01
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Size:148 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 620.11
- Further information on Dewey Decimal Classification
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Classification:
DDC: 620.11 -
Source:
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Table of contents – Volume 15, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 105
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Structural stability of Sm2Fe17 and its nitrideTan, Ming et al. | 1992
- 108
-
Temperature dependence of conductivity of mixed-phase composite polymer solid electrolytesWieczorek, Władysław et al. | 1992
- 115
-
An apparatus for in situ high temperature pretreatment of materials and measurement of their magnetic properties at cryogenic temperaturesKrishnankutty, Nalini / Mulay, Laxman N. / Albert Vannice, M. et al. | 1992
- 115
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An apparatus for in situ high temperature pretreatment of materials and measurement of their magnetic properties at cryogenic temperarturesKrishnankutty, N. / Mulay, L. N. / Vannice, M. A. et al. | 1992
- 121
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Creep-induced magnetic anisotropy and anelastic strain of an iron-rich amorphous alloyKraus, L. / Vlasák, G. et al. | 1992
- 121
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Creep-induced magnetic anisotropy and inelastic strain of an iron-rich amorphous alloyKraus, L. / Vlasak, G. et al. | 1992
- 126
-
Crystallization kinetics and phase evolution in amorphous SbSGe thin filmsMorii, K. / Wanaka, S. / Nakayama, Y. et al. | 1992
- 133
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High quality amorphous CuCl films and their annealing behaviour which exhibits a quantum size effect on excitonsKondo, S. / Seki, T. et al. | 1992
- 138
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Characterization of thin BiSrCaCuO superconducting filmsPerrière, J. / Chéenne, A. / Defourneau, R.M. / Nanot, M. / Queyroux, F. / Dupouy, P. / Faulques, E. / Dufour, G. / Roulet, H. et al. | 1991
- 148
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Reactivity of thermally oxidized and unoxidized SiC particulates with aluminium-silicon alloysNarciso, J. / García-Cordovilla, C. / Louis, E. et al. | 1992
- 156
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Silicon on insulator optical waveguides formed by direct wafer bondingReed, G.T. / Jinhua, Li / Tang, C.K. / Chenglu, Lin / Hemment, P.L.F. / Rickman, A.G. et al. | 1992
- 156
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Silicon on insulator optical waveguides formed by direct water bondingReed, G. T. / Li, J. / Tang, C. K. / Lin, C. et al. | 1992
- 160
-
Nitrides of intermetallic compounds prepared from mixtures of oxides using sintering and reactive gas treatment, in a single stepCohen, Yoel / Riess, Ilan et al. | 1992
- 164
-
Micronic n-channel MOSFET degradation under strong and short-time hot-carrier stressDjahli, F. / Plossu, C. / Balland, B. et al. | 1992
- 169
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Application of the Meyer-Neldel rule to the electrical conductivity of NasiconBogusz, W. / Kony, D.E. / Krok, F. et al. | 1992
- 173
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Dislocation formation in silicon implanted at different temperaturesLiefting, J.R. / Custer, J.S. / Schreutelkamp, R.J. / Saris, F.W. et al. | 1992
- 187
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An analytical formula for high energy ion rangesMartan, J. / Hecking, N. / Fahrner, W.R. et al. | 1992
- 192
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High-frequency dielectric relaxation in oxyfluoride perovskite ceramicsElissalde, C. / Ravez, J. / Kazaoui, S. / Etourneau, J. et al. | 1992
- 197
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Erratum| 1992
- L5
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Electrical and magnetic properties of LaCaCoO system compoundsWatanabe, Koichi / Mineshima, Katsuji / Yamamoto, Yasushi et al. | 1992
- L9
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Chemimechanical polishing of cadmium telluride with bromine-methanol solutionsRiedinger, S.L. / Snyder, D.W. / Ko, E.I. / Sides, P.J. et al. | 1992