Write/Erase Degradation in Source Side Injection Flash EEPROM's: Characterization Techniques and Wearout Mechanisms (Unknown)
- New search for: Wellekens, D.
- New search for: Van Houdt, J.
- New search for: Faraone, L.
- New search for: Groeseneken, G.
- New search for: Wellekens, D.
- New search for: Van Houdt, J.
- New search for: Faraone, L.
- New search for: Groeseneken, G.
In:
IEEE TRANSACTIONS ON ELECTRON DEVICES ED
;
42
, 11
;
1992
;
1995
-
ISSN:
- Article (Journal) / Print
-
Title:Write/Erase Degradation in Source Side Injection Flash EEPROM's: Characterization Techniques and Wearout Mechanisms
-
Contributors:Wellekens, D. ( author ) / Van Houdt, J. ( author ) / Faraone, L. ( author ) / Groeseneken, G. ( author )
-
Published in:IEEE TRANSACTIONS ON ELECTRON DEVICES ED ; 42, 11 ; 1992
-
Publisher:
- New search for: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
-
Publication date:1995-01-01
-
Size:1992 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:Unknown
- New search for: 621.3 / 621
- Further information on Dewey Decimal Classification
-
Classification:
-
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 42, Issue 11
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1877
-
Epitaxial Lift-Off GaAs HEMT'sShah, D.M. et al. | 1995
- 1882
-
Analytical bias development noise model for InP HEMT'sKlepser, B.U.H. / Bergamaschi, C. / Schefer, M. / Diskus, C.G. / Patrick, W. / Bächtold, W. et al. | 1995
- 1882
-
Analytical Bias Dependent Noise Model for InP HEMT'sKlepser, B.-U.H. et al. | 1995
- 1890
-
1 W Ku-Band AlGaAs-GaAs Power HBT's with 72% Peak Power-Added EfficiencyShimura, T. et al. | 1995
- 1897
-
Analysis of Carrier-Blocking Effect in AlGaAs-GaAs HBT's with Insulating External Collector and Design Criteria for Collector-Up HBT'sHorio, K. et al. | 1995
- 1903
-
Dry Etching Topography Simulator with a New Surface Reaction Model: MODERNHarafuji, K. et al. | 1995
- 1912
-
A Technique to Measure Trap Characteristics in CCD's Using X-raysGendreau, K.C. et al. | 1995
- 1918
-
Planarization of Amorphous Silicon Thin Film Transistors by Liquid Phase Deposition of Silicon DioxideChen, M.-S. et al. | 1995
- 1924
-
Two-Dimensional Analysis of a Test Structure for Lifetime Profile MeasurementsDaliento, S. et al. | 1995
- 1929
-
A Normal Amorphous Silicon-Based Separate Absorption and Multiplication Avalanche Photodiode (SAMAPD) with Very High Optical GainLee, K.H. et al. | 1995
- 1934
-
CAD-Compatible High-Speed CMOS-SIMOX Gate Array Using Field-Shield IsolationIwamatsu, T. et al. | 1995
- 1940
-
Analytical Models for n+-p+ Double-Gate SOI MOSFET'sSuzuki, K. et al. | 1995
- 1949
-
Threshold Voltage Model for Deep-Submicrometer Fully Depleted SOI MOSFET'sBanna, S.R. et al. | 1995
- 1956
-
Temperature-Dependent Hole and Electron Mobility Models for CMOS Circuit SimulationMin, K.-S. et al. | 1995
- 1962
-
Measurement Method for Accurate Extraction of the Base-to-Emitter Intrinsic and Peripheral Capacitances of Bipolar TransistorsWang, C.H. et al. | 1995
- 1968
-
Dynamic SPICE-Simulation of the Electrothermal Behavior of SOI MOSFET'sBielefeld, J. et al. | 1995
- 1975
-
Comparative Study of Fully Depleted and Body-Grounded Non Fully Depleted SOI MOSFET's for High Performance Analog and Mixed Signal CircuitsChan, M. et al. | 1995
- 1982
-
Performance of the 3-D PENCIL Flash EPROM Cell and Memory ArrayPein, H. et al. | 1995
- 1992
-
Write-Erase Degradation in Source Side Injection Flash EEPROM's: Characterization Techniques and Wearout MechanismsWellekens, D. et al. | 1995
- 1999
-
Binary-Decision-Diagram DeviceAsahi, N. et al. | 1995
- 2004
-
Observation and Characterization of Near-Interface Oxide Traps with C-V TechniquesCohen, N.L. et al. | 1995
- 2010
-
Device Simulation of Submicrometer Gate p+-i-p+ Diamond TransistorsMiyata, K. et al. | 1995
- 2015
-
Simulation of Cold-Test Parameters and RF Output Power for a Coupled-Cavity Traveling-Wave TubeWilson, J.D. et al. | 1995
- 2021
-
Investigations of Two-Stage-Pseudospark Switches for High-Current ApplicationsGörtler, A. et al. | 1995
- 2028
-
Early Voltage in Double Heterojunction Bipolar TransistorsJahan, M.M. et al. | 1995