Beams of short lived nuclei produced by selective laser ionization in a gas cell (English)
- New search for: Kudryavtsev, Y.
- New search for: Andrzejewski, J.
- New search for: Bijnens, N.
- New search for: Franchoo, S.
- New search for: Gentens, J.
- New search for: Huyse, M.
- New search for: Piechaczek, A.
- New search for: Szerypo, J.
- New search for: Reusen, I.
- New search for: Van Duppen, P.
- New search for: Kudryavtsev, Y.
- New search for: Andrzejewski, J.
- New search for: Bijnens, N.
- New search for: Franchoo, S.
- New search for: Gentens, J.
- New search for: Huyse, M.
- New search for: Piechaczek, A.
- New search for: Szerypo, J.
- New search for: Reusen, I.
- New search for: Van Duppen, P.
- New search for: Andersen, H. H.
- New search for: Rehn, L. E.
In:
Beam Interactions with Materials and Atoms
3/4
;
350-365
;
1996
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ISSN:
- Article (Journal) / Print
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Title:Beams of short lived nuclei produced by selective laser ionization in a gas cell
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Contributors:Kudryavtsev, Y. ( author ) / Andrzejewski, J. ( author ) / Bijnens, N. ( author ) / Franchoo, S. ( author ) / Gentens, J. ( author ) / Huyse, M. ( author ) / Piechaczek, A. ( author ) / Szerypo, J. ( author ) / Reusen, I. ( author ) / Van Duppen, P. ( author )
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Published in:Beam Interactions with Materials and Atoms , 3/4 ; 350-365NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B ; 114, 3/4 ; 350-365
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Publisher:
- New search for: ELSEVIER
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Publication date:1996-01-01
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Size:16 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 539.7
- Further information on Dewey Decimal Classification
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Classification:
DDC: 539.7 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 114, Issue 3/4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 203
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Measurements and Monte Carlo calculations of hydrogen and deuterium depth distributions into silicon carbide implanted in the energy range from 0.25 to 1.75 keVLeblanc, L. et al. | 1996
- 208
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The ionization of helium by 1.5-7.5 MeV partially stripped Cq+ ionsCai, X. et al. | 1996
- 213
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K-shell ionization of molybdenum by electron bombardmentHe, F.Q. et al. | 1996
- 217
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Gamma-ray attenuation coefficients in some heavy metal oxide borate glasses at 662 keVKhanna, A. et al. | 1996
- 221
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Characterization of a 292 MeV-n 19F beam after passage through a thick Plexiglas targetGolovchenko, A.N. et al. | 1996
- 225
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On the accuracy of the L-subshell ionization cross sections for proton impact. I. Spectrum fittingPapp, T. et al. | 1996
- 232
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K-shell ionization of V, Cr, Mn, Fe, Co, Ni and Cu by 5-12 MeV carbon ionsFazinic, S. et al. | 1996
- 237
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Brilliance of coherent peaks for type-B photo-production of electron-positron pairs in a crystalKunashenko, Yu P. et al. | 1996
- 245
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Fragmentation of cluster ions in SIMS: Cluster distributions over lifetime, excitation energy and kinetic energy releaseDzhemilev, N.Kh et al. | 1996
- 252
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Multiple beam ion channeling patternsBreese, M.B.H. et al. | 1996
- 259
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Spin rotation of charged particles in crystals caused by parity nonconserving interactionSilenko, A.J. et al. | 1996
- 263
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Alloying of austenitic stainless steel with nitrogen using high-intensity pulsed beams of nitrogen plasmaPiekoszewski, J. et al. | 1996
- 269
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High fluence implantation of Cu, Fe and Ti in AIN: Depth profiling by RBS and RNRABorowski, M. et al. | 1996
- 269
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High fluence implantation of Cu, Fe and Ti in AlN: depth profiling by RBS and RNRABorowski, M. / Traverse, A. et al. | 1996
- 276
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Luminescence of sapphire and ruby induced by He and Ar ion irradiationAoki, Y. et al. | 1996
- 281
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Optical and infrared studies of Ti, Au, O ion implanted fused silicaPan, Z. et al. | 1996
- 288
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An equivalent circuit and its effective impedance of a plasma load during a high voltage pulseQin, S. et al. | 1996
- 293
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Multiple cascades regime in fcc metals Molecular dynamics simulations and calculated HREM imagingMattei, G. et al. | 1996
- 302
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ESR analysis of gamma radiation dose rate effects on scintillator light outputBiagtan, E. et al. | 1996
- 307
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Electron transport: Lateral and longitudinal correlation algorithmKawrakow, I. et al. | 1996
- 327
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Radiation damage study of a fast bipolar monolithic charge sensitive preamplifierBaschirotto, A. et al. | 1996
- 332
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Study of the composition of vacuum deposited thin films of CuInSe2 using PIXE and their propertiesKhaliquzzaman, M. et al. | 1996
- 337
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Integrated oscillator strengths for multi-ionization processes under the Bethe-Born formulationAlmeida, D.P. et al. | 1996
- 341
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An evaluation of the sources of air pollution in the city of Chandigarh, India: A study using EDXRF techniqueBandhu, H.K. et al. | 1996
- 345
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Importance of matrix changes in PIXE elemental analysisKwiatek, W.M. et al. | 1996
- 350
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Beams of short lived nuclei produced by selective laser ionization in a gas cellKudryavtsev, Yu et al. | 1996
- 366
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Novel SANS instrument using Neutron Spin EchoRekveldt, M.T. et al. | 1996
- 371
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Scattering and recoiling imaging code (SARIC)Bykov, V. et al. | 1996
- 379
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Performance of a Ge-BGO Compton-suppression spectrometer and its application to photon activation analysisFukuda, K. et al. | 1996
- 387
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Neutron induced gamma-ray emission tomographyBalogun, F.A. et al. | 1996
- 394
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Accelerator-based fullerene depth profilingFink, D. et al. | 1996
- 397
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Erratum to: "Ion bombardment into inner wall surfaces of tubes and their biomedical applications" (Nucl. Instr. and Meth. B 106 (1995) 618)Iwaki, M. et al. | 1996
- 397
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"Ion bombardment into inner wall surfaces of tubes and their biomedical applications" [Nucl. Instr. and Meth. B 106 (1995) 618]Iwaki, M. / Nakao, A. / Kaibara, M. / Sasabe, H. / Kaneko, S. / Nakajima, H. / Suzuki, Y. / Kusakabe, M. / Fujihana, T. et al. | 1996
- 403
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Erratum to: "Ion-beam-induced epitaxial crystallisation of metastable Si1 - x- yGexCy layers fabricated by Ge and C ion implantation (Nucl. Instr. and Meth. B 106 (1995) 289)Kobayashi, N. et al. | 1996
- 403
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"Ion-beam-induced epitaxial crystallisation of metastable Si1-x-yGe~xC~y layers fabricated by Ge and C ion implantation" [Nucl. Instr. and Meth. B 106 (1995) 289]Kobayashi, N. / Hasegawa, M. / Hayashi, N. / Tanoue, H. / Shibata, H. / Makita, Y. et al. | 1996
- 408
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"Damage of M-type baryum hexaferrites induced by GeV-heavy ion irradiations" [Nucl. Instr. and Meth. B 106 (1995) 567-572]Costantini, J. M. / Brisard, F. / Meftah, A. / Toulemonde, M. / Studer, F. et al. | 1996
- 408
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Erratum to: "Damage of M-type baryum hexa-ferrites induced by GeV-heavy ion irradiations" (Nucl. Instr. and Meth. B 106 (1995) 567-572)Costantini, J.M. et al. | 1996
- 409
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Calendar| 1996
- 413
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Author index| 1996
- 419
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Subject index| 1996