X-ray diffraction and reflectometry studies of porous silicon: n-type layers and holographic gratings (English)
- New search for: Chamard, V.
- New search for: Dolino, G.
- New search for: Lerondel, G.
- New search for: Setzu, S.
- New search for: Chamard, V.
- New search for: Dolino, G.
- New search for: Lerondel, G.
- New search for: Setzu, S.
- New search for: Norman, D.
- New search for: Webster, J. R. P.
In:
Surface X-ray and Neutron Scattering
;
101-103
;
1998
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ISSN:
- Article (Journal) / Print
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Title:X-ray diffraction and reflectometry studies of porous silicon: n-type layers and holographic gratings
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Contributors:Chamard, V. ( author ) / Dolino, G. ( author ) / Lerondel, G. ( author ) / Setzu, S. ( author ) / Norman, D. / Webster, J. R. P.
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Published in:Surface X-ray and Neutron Scattering ; 101-103PHYSICA B ; 248 ; 101-103
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Publisher:
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Publication date:1998-01-01
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Size:3 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 530
- Further information on Dewey Decimal Classification
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Classification:
DDC: 530 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 248
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Epitaxial clusters studied by synchrotron X-ray diffraction and scanning tunneling microscopyNielsen, M. et al. | 1998
- 9
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Measurement of the magnetism of a single atomic plane with X-ray diffractionFerrer, S. et al. | 1998
- 14
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Surface and interfacial magnetic diffuse scatteringTakeda, Masayasu et al. | 1998
- 25
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Investigation of strain relaxation in GaInAs-GaAs superlattices by X-ray diffuse scatteringUlyanenkov, A. et al. | 1998
- 31
-
Non-specular X-ray reflection from sputtered Ni3Al-Ni multilayersTixier, S. et al. | 1998
- 34
-
Strain relaxation in thin films of Cu grown on Ni(0 0 1)Rasmussen, Frank Berg et al. | 1998
- 39
-
Fe-Au multilayer growth fronts: Comparison of X-ray diffuse scattering results with atomic-force microscopy profilesPaniago, R. et al. | 1998
- 48
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High resolution X-ray scattering investigation of Pt-LaF3-Si(1 1 1) structuresFanchenko, S.S. et al. | 1998
- 53
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On the reflectivity of reactively sputtered Ni-Ti multilayersKumar, M.Senthil et al. | 1998
- 56
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A high-resolution synchrotron X-ray scattering study of the surface and interface structures of YBa2Cu3Ox thin filmsLin, W.J. et al. | 1998
- 62
-
X-ray reflection and diffuse scattering from sputtered gold filmsSchug, C. et al. | 1998
- 67
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On the growth process of a layered material on a covalent substrate: GaSe-SiJedrecy, Nathalie et al. | 1998
- 74
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An X-ray diffraction study of direct-bonded silicon interfaces: A model semiconductor grain boundaryHowes, P.B. et al. | 1998
- 79
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On the interface strain distribution in Si-on-sapphire systemGartstein, E. et al. | 1998
- 83
-
Surface effects in displacive phase transformations studied by X-ray specular reflectivityKlemradt, U. et al. | 1998
- 90
-
Hydrogen segregation at the Al-Si(1 1 1) interfaceFelcher, G.P. et al. | 1998
- 95
-
Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia: Structural evolution with temperatureDmowski, W. et al. | 1998
- 101
-
X-ray diffraction and reflectometry studies of porous silicon: n-type layers and holographic gratingsChamard, V. et al. | 1998
- 104
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Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffractionDarowski, N. et al. | 1998
- 109
-
In situ fixed angle X-ray reflectivity study of sputter-deposited amorphous LaNiO3 thin film on Si substrateLee, Chih-Hao et al. | 1998
- 115
-
Depth-dependent investigation of the distribution of the spin density waves in thin chromium films with surface X-ray and neutron scatteringBödeker, P. et al. | 1998
- 121
-
Magnetic anisotropy and exchange biasing in heterojunctions studied by transverse magnetic circular X-ray dichroismvan der Laan, G. et al. | 1998
- 127
-
Sensitivity of magnetic X-ray dichroism for chemical order in MBE-grown FEPD layersKamp, P. et al. | 1998
- 133
-
Resonant X-ray magnetic scattering from the twisted states of an Fe-Gd multilayerHashizume, H. et al. | 1998
- 140
-
Structural and magnetic properties of ion beam sputtered NiMnSb filmsSchlomka, J.-P. et al. | 1998
- 146
-
Resonant X-ray reflectivity measurements of a magnetic multilayer (Gd-Fe)10Lee, D.R. et al. | 1998
- 152
-
X-Ray and neutron reflectivity investigations of Co-Cu multilayersJoyce, D.E. et al. | 1998
- 157
-
Non-specular spin-flipped neutron reflectivity from a cobalt film on glassFredrikze, Henk et al. | 1998
- 163
-
Penetration depth of YBa2Cu3O7 measured by polarised neutron reflectometryReynolds, J.M. et al. | 1998
- 166
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Determination of the magnetic field penetration depth in YBa2Cu3O7 superconducting films by polarized neutron reflectometryLauter-Pasyuk, V. et al. | 1998
- 171
-
Some improvements and extensions of the application of specular neutron reflection to the study of interfacesLi, Z.X. et al. | 1998
- 184
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Surface activity of modified dendrimers at high compressionKirton, G.F. et al. | 1998
- 191
-
Thinning transitions and fluctuations of freely suspended smectic-A films as studied by specular and diffuse X-ray scatteringMol, E.A.L. et al. | 1998
- 199
-
Binary phase diagram of monolayers of simple 1,2-diol derivativesDeWolf, C. et al. | 1998
- 204
-
Neutron reflectivity study of a chemically end-grafted polystyrene brush in a binary solvent mixtureSatija, S.K. et al. | 1998
- 208
-
Comparison between macroscopic and microscopic measurements of the shear elastic constant of alcohol monolayers at the air-water interfaceZakri, C. et al. | 1998
- 211
-
Phase behaviour of a methyl branched phosphatidylethanolamine in two and three-dimensional systemsBringezu, F. et al. | 1998
- 217
-
Liquid-like interfacial correlation in LB filmsSanyal, M.K. et al. | 1998
- 223
-
The structure and composition of mixed cationic and non-ionic surfactant layers adsorbed at the hydrophilic silicon surfacePenfold, J. et al. | 1998
- 229
-
Dewetting of thin polymer films: an X-ray scattering studyMüller-Buschbaum, P. et al. | 1998
- 238
-
Surfaces of tricontinuous structure formed by an ABC triblock copolymer in bulkMatsushita, Yushu et al. | 1998
- 243
-
Neutron reflectivity studies of composite nanoparticle - copolymer thin filmsLauter-Pasyuk, V. et al. | 1998
- 246
-
Organic monolayers: Interface between 8CB liquid crystals and MoS2 monocrystalLacaze, E. et al. | 1998
- 250
-
Ordering of diblock PS-PBMA thin films: An X-ray reflectivity studyVignaud, G. et al. | 1998
- 258
-
Investigation of the vertical molecular exchange in a complex organic multilayer systemEnglisch, U. et al. | 1998
- 263
-
The interface structure of thin liquid hexane filmsDoerr, A.K. et al. | 1998
- 269
-
Structure studies of a phospholipid monolayer coupled to dextran sulfatede Meijere, K. et al. | 1998
- 274
-
Specular and non-specular X-ray reflection from inorganic and organic multilayersde Boer, D.K.G. et al. | 1998
- 280
-
X-ray reflectivity study of fine structure of thin polymer films and polymer assembly at interfaceYamaoka, H. et al. | 1998
- 284
-
Microphase-separated interface of a two-component triblock copolymer with a lamellar structureTorikai, Naoya et al. | 1998
- 289
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The structure of block copolymers at the fluid-fluid interfaceClifton, B.J. et al. | 1998
- 297
-
Neutron scattering studies of the structure and dynamics of methane absorbed on MgO(1 0 0) surfacesLarese, J.Z. et al. | 1998
- 304
-
Neutron reflection studies of titanium segregation to metal-ceramic interfacesDerby, Brian et al. | 1998
- 310
-
Investigating liquid surfaces down to the nanometer scale using grazing incidence X-ray scatteringFradin, C. et al. | 1998
- 316
-
High temperature neutron reflection spectroscopy of liquid metal-ceramic interfacesEdwards, R.T. et al. | 1998
- 322
-
SANS investigations of benzene adsorption on porous silica gelRamsay, John D.F. et al. | 1998
- 327
-
The Bayesian approach to reflectivity dataSivia, D.S. et al. | 1998
- 338
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Phase determination and inversion in specular neutron reflectometryMajkrzak, C.F. et al. | 1998
- 343
-
Grazing incidence diffraction by epitaxial multilayered gratingsBaumbach, G.T. et al. | 1998
- 349
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ADAM, the new reflectometer at the ILLSchreyer, A. et al. | 1998
- 355
-
Neutron double multilayer monochromator-polarizer Co-TiSyromyatnikov, V.G. et al. | 1998
- 358
-
X-Ray diffraction under surface acoustic wave excitationSauer, W. et al. | 1998
- 366
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Surface profiles from polarization measurements in neutron reflectometryLipperheide, R. et al. | 1998
- 372
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A white beam neutron spin splitterKrist, Thomas et al. | 1998
- 377
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About using double multilayer monochromators in reflectometrySyromyatnikov, V.G. et al. | 1998
- 381
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X-ray reflection by multilayer surface gratingsMikulik, Petr et al. | 1998
- 387
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Surface morphology by reflectivity of coherent X-raysRobinson, I.K. et al. | 1998
- 395
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Synchrotron X-ray reflectivity study of Co-Cu multilayer structureTang, C.C. et al. | 1998
- 399
-
X-ray scattering with partial coherent radiation: The exact relationship between "resolution" and "coherence"Tolan, M. et al. | 1998
- 405
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Texture determination by energy-dispersive XRDPlayer, M.A. et al. | 1998