Investigation of relative sputtering yields during ionoluminescence of Si (English)
- New search for: Bhattacharyya, S.R.
- New search for: Brinkmann, U.
- New search for: Hippler, R.
- New search for: Bhattacharyya, S.R.
- New search for: Brinkmann, U.
- New search for: Hippler, R.
In:
APPLIED SURFACE SCIENCE
;
150
, 1-4
;
107-114
;
1999
-
ISSN:
- Article (Journal) / Print
-
Title:Investigation of relative sputtering yields during ionoluminescence of Si
-
Contributors:
-
Published in:APPLIED SURFACE SCIENCE ; 150, 1-4 ; 107-114
-
Publisher:
- New search for: ELSEVIER SCIENCE PUBLISHERS
-
Publication date:1999-01-01
-
Size:8 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 621.35
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 621.35 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 150, Issue 1-4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Secondary electron emission data of cesiated oxygen free high conductivity copperHopman, H.J. et al. | 2000
- 8
-
The electronic structures of epitaxial CrSi2 film prepared on Si(111) substrateKim, K.H. et al. | 2000
- 13
-
Structural and compositional stability of Co oxide grown on (001) bct CoBorghi, A. et al. | 2000
- 19
-
Ar plasma treated and Al metallised polycarbonate: a XPS, mass spectroscopy and SFM studySeidel, C. et al. | 2000
- 34
-
The effect of nitrogen ion implantation on tungsten surfacesZhang, H.L. et al. | 2000
- 39
-
Binding energies of elements at the interface between oxygen-ion-irradiated ZrO2-Y2O3 films and an iron substrateRen You, L. et al. | 2000
- 43
-
The effect of boron ion implantation and annealing on the microstructure and electrical characteristics of the diamond filmsZhang, H.-X. et al. | 2000
- 47
-
Surface morphological changes induced in catalysts by acoustic wavesKelling, S. et al. | 2000
- 58
-
Stability of silver clusters in mordenites with different SiO2-Al2O3 molar ratioBogdanchikova, N.E. et al. | 2000
- 65
-
Adsorption and decomposition of H2S on the Ge(100) surfaceNelen, L.M. et al. | 2000
- 73
-
An examination of the initial oxidation of a uranium-base alloy (U-14.1 at.% Nb) by O2 and D2O using surface-sensitive techniquesManner, W.L. et al. | 2000
- 89
-
Atomic layer epitaxy of AlP and (AlP)n(GaP)n superlattice using ethyldimethylamine alane as a new aluminum sourceHirose, S. et al. | 2000
- 95
-
In-situ thin film growth-etch measurement and control by laser light reflectance analysisSingh, B.P. et al. | 2000
- 101
-
Surface damage threshold and structuring of dielectrics using femtosecond laser pulses: the role of incubationAshkenasi, D. et al. | 2000
- 107
-
Investigation of relative sputtering yields during ionoluminescence of SiBhattacharyya, S.R. et al. | 2000
- 115
-
Zirconium nitrides deposited by dual ion beam sputtering: physical properties and growth modellingPichon, L. et al. | 2000
- 125
-
Measurement of surface defects on thin steel wires by atomic force microscopySánchez-Brea, L.M. et al. | 2000
- 131
-
Laser surface cleaning of organic contaminantsFeng, Y. et al. | 2000
- 137
-
Characterization of SiO2 layers thermally grown on 4H-SiC using high energy photoelectron spectroscopyJohansson, L.I. et al. | 2000
- 143
-
Chemically deposited copper oxide thin films: structural, optical and electrical characteristicsNair, M.T.S. et al. | 2000
- 152
-
Temporal evolution of laser-ablated Co+ ions probed by time-of-flight mass spectrometryChoi, Y.-K. et al. | 2000
- 161
-
Growth mode and effect of carrier gas on In0.53Ga0.47As-InP surface morphology grown with trimethylarsine and arsineDumont, H. et al. | 2000
- 171
-
Pulsed laser ablation of La0.5Sr0.5CoO3Span, E.A.F. et al. | 2000
- 178
-
Thermal behaviour of Co-Si-W-Si multilayers under rapid thermal annealingLuby, S. et al. | 2000
- 185
-
ArF-excimer laser ablation experiments on Cycloolefin Copolymer (COC)Sabbert, D. et al. | 2000
- 190
-
Structural properties of TiN films grown on stainless steel substrates by a reactive radio-frequency sputtering technique at low temperatureKang, T.W. et al. | 2000
- 195
-
Secondary ion mass spectrometry and optical characterization of Ti:LiNbO3 optical waveguidesCaccavale, F. et al. | 2000
- 202
-
Microstructural analysis of hard amorphous carbon films deposited with high-energy ion beamsBrusa, R.S. et al. | 2000
- 211
-
A simplified cavity analysis for estimating energy coupling during laser ablation and drilling of solids - experimentLi, C. et al. | 2000
- 227
-
Oxidation and annealing of thin FeTi layers covered with PdHeller, E.M.B. et al. | 2000
- 235
-
Low sputter damage of metal single crystalline surfaces investigated with medium energy ion scattering spectroscopyMoon, D.W. et al. | 2000
- 244
-
Quantification routines for adsorption studies in static secondary ion mass spectrometry and the effect of ionisation probabilityVickers, P.E. et al. | 2000
- 255
-
XPS investigation of preferential sputtering of S from MoS2 and determination of MoSx stoichiometry from Mo and S peak positionsBaker, M.A. et al. | 2000