Depth profiles and resolution limits in accelerator-based solid state analysis (English)
- New search for: Fischer, R.
- New search for: Fischer, R.
In:
ANALYTICAL AND BIOANALYTICAL CHEMISTRY
;
374
, 4
;
619-625
;
2002
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ISSN:
- Article (Journal) / Print
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Title:Depth profiles and resolution limits in accelerator-based solid state analysis
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Contributors:Fischer, R. ( author )
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Published in:ANALYTICAL AND BIOANALYTICAL CHEMISTRY ; 374, 4 ; 619-625
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Publisher:
- New search for: Springer
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Publication date:2002-01-01
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Size:7 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 543
- Further information on Dewey Decimal Classification
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Classification:
DDC: 543 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 374, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 579
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Eleventh International Conference on Solid State AnalysisMarx, Günter et al. | 2002
- 581
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Analysis of corrosion layers on protective coatings and high temperature materials in simulated service environments of modern power plants using SNMS, SIMS, SEM, TEM, RBS and X-ray diffraction studiesNickel, H. / Quadakkers, W. / Singheiser, L. et al. | 2002
- 588
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Diffusion studies in non-oxide ceramics: analytical aspects of the use of ion implanted stable tracers and SIMSSchmidt, H. / Fielitz, P. / Borchardt, G. / Weber, S. / Scherrer, H. / Baumann, H. et al. | 2002
- 592
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SIMS investigation of CrN sputtercoatingsHeinisch, C. / Ramminger, P. / Hutter, H. et al. | 2002
- 597
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2D- and 3D SIMS investigations on hot-pressed steel powder HS 6–5-3–8Rosner, M. / Pöckl, G. / Danninger, H. / Hutter, H. et al. | 2002
- 602
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Adhesion promotion of Cu on C by Cr intermediate layers investigated by the SIMS methodMayerhofer, Karl E. / Neubauer, Erich / Eisenmenger-Sittner, Christoph / Hutter, Herbert et al. | 2002
- 608
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Chemical solution-deposited PbZr0.53Ti0.47O3 on La0.5Sr0.5CoO3. SIMS investigation of the effect of different precursor additives on the layer structurePollak, C. / Malic, B. / Kosec, M. / Javoric, S. / Hutter, H. et al. | 2002
- 614
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TOF-SIMS and XPS-investigations of ion implanted single crystal 1b-diamondsSchlett, V. / Fladung, T. / Dieckhoff, S. / Stock, R. et al. | 2002
- 619
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Depth profiles and resolution limits in accelerator-based solid state analysisFischer, R. et al. | 2002
- 626
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Non-destructive 3D-characterization of Zn2–2xCuxInxS2-thin films with ion beam analysisSpemann, D. / Vogt, J. / Butz, T. / Oppermann, D. / Bente, K. et al. | 2002
- 631
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Electron probe microanalysis (EPMA) measurement of thin-film thickness in the nanometre rangeProcop, M. / Radtke, M. / Krumrey, M. / Hasche, K. / Schädlich, S. / Frank, W. et al. | 2002
- 635
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Investigation of interfacial interaction between uncoated and coated carbon fibres and the magnesium alloy AZ91Dorner-Reisel, A. / Nishida, Y. / Klemm, V. / Nestler, K. / Marx, G. / Müller, E. et al. | 2002
- 639
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High-resolution analytical TEM of nanostructured materialsSchneider, R. et al. | 2002
- 646
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Calibration of XPS – energy scale for determination of the oxidation states of doping elements in SnO2 powdersDobler, D. / Oswald, S. / Wetzig, K. et al. | 2002
- 650
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Synchrotron-induced photoemission of GaAs electrodes after electrochemical treatment in aqueous electrolytesBeerbom, M. / Mayer, Th. / Jaegermann, W. / Batchelor, D. / Schmeißer, D. et al. | 2002
- 654
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Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazaneHimcinschi, C. / Friedrich, M. / Frühauf, S. / Streiter, I. / Schulz, S. / Gessner, T. / Baklanov, M. / Mogilnikov, K. / Zahn, D. et al. | 2002
- 658
-
Characterization of thin polymer and biopolymer layers by ellipsometry and evanescent field technologyMutschler, T. / Kieser, B. / Frank, R. / Gauglitz, G. et al. | 2002
- 665
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Infrared ellipsometric view on monolayers: towards resolving structural detailsKorte, E. / Schade, U. / Peatman, W. / Röseler, A. / Tsankov, D. / Hinrichs, K. et al. | 2002
- 672
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Infrared-optical properties of vapour-deposited metal filmsBuskühl, Martin / Korte, Ernst-Heiner et al. | 2002
- 676
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Characterization of wet-chemically treated silicon interfaces by surface photovoltage measurementsAngermann, H. et al. | 2002
- 681
-
Characterization of laser-irradiated YNi2B2C surfaces by Auger electron spectroscopyBaunack, S. / Plotnikov, A. / Wrobel, R. / Vogt, C. / Wetzig, K. et al. | 2002
- 685
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STM and STS of coronene on HOPG(0001) in UHV – adsorption of the smallest possible graphite flakes on graphiteLackinger, Markus / Griessl, Stefan / Heckl, Wolfgang M. / Hietschold, Michael et al. | 2002
- 688
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Study by scanning tunneling microscopy of hydrogen adsorption and desorption on Si(111)7×7 at room temperature and at high temperatureKraus, A. / Hanbücken, M. / Koshikawa, T. / Neddermeyer, H. et al. | 2002
- 688
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Study by scanning tunneling microscopy of hydrogen adsorption and desorption on Si(111)7x7 at room temperature and at high temperatureKraus, A. / Hanbucken, M. / Koshikawa, T. / Neddermeyer, H. et al. | 2002
- 695
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Nanostructure and thermoelectric properties of ReSi2±x thin filmsThomas, J. / Hofman, D. / Kleint, C. / Schumann, J. / Wetzig, K. et al. | 2002
- 699
-
Phase discrimination by automated BKDSchwarzer, Robert et al. | 2002
- 703
-
Potential of cathodoluminescence (CL) microscopy and spectroscopy for the analysis of minerals and materialsGötze, Jens et al. | 2002
- 709
-
Influence of the composition of BCN films deposited by reactive magnetron sputtering on their propertiesMartínez, C. / Kyrsta, S. / Cremer, R. / Neuschütz, D. et al. | 2002
- 712
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Structure and composition studies of chemical vapour-deposited BCN fibre coatingsDietrich, Dagmar / Roll, Ulrich / Stöckel, Sabine / Weise, Kathrin / Marx, Günter et al. | 2002
- 715
-
Study of the structure of passivated vanadium–titanium alloys and their semiconductor propertiesBachmann, T. / Vonau, W. / John, P. et al. | 2002
- 720
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Kinetic aspects of the formation of aluminium oxide by use of a microwave-induced plasmaQuade, A. / Steffen, H. / Hippler, R. / Wulff, H. et al. | 2002
- 724
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Formation and nitridation of vanadium–aluminum intermetallic compoundsLewalter, H. / Bock, W. / Kolbesen, B. et al. | 2002
- 732
-
Electron beam induced changes in transition metal oxidesSu, D. et al. | 2002
- 736
-
Model investigations on the effect of Si transport on the nanocrystallization of amorphous FeSiB-(Cu,Nb)Oswald, S. / Baunack, S. / Henninger, G. / Hofman, D. et al. | 2002
- 742
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In situ surface analysis of annealed Fe-1.5%Mn and Fe-0.6%Mn low alloy steelsMartínez, C. / Cremer, R. / Neuschütz, D. / von Richthofen, A. et al. | 2002
- 746
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The supramolecular structure of ultrafiltration membranes synthesized by electropolymerizationKolzunova, L. / Barinov, N. et al. | 2002
- 749
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A new attempt to study biomineralised silica bodies in Dactylis glomerata L.Dietrich, Dagmar / Hemeltjen, Steffen / Meyer, Norbert / Bäucker, Ernst / Rühle, Gebhardt / Wienhaus, Otto / Marx, Günter et al. | 2002
- 753
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Diamond-like carbon coatings with Ca-O-incorporation for improved biological acceptanceDorner-Reisel, A. / Schürer, C. / Irmer, G. / Simon, F. / Nischan, C. / Müller, E. et al. | 2002
- 756
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Sliding-spark spectrometry of sediment samplesAngeyo, H. / Flórían, K. / Golloch, A. / Vojtekovà, V. et al. | 2002