The role of deep level traps in barrier height of 4H-SiC Schottky diode (English)
- New search for: Zaremba, G.
- New search for: Adamus, Z.
- New search for: Jung, W.
- New search for: Kaminska, E.
- New search for: Borysiewicz, M. A.
- New search for: Korwin-Mikke, K.
- New search for: Zaremba, G.
- New search for: Adamus, Z.
- New search for: Jung, W.
- New search for: Kaminska, E.
- New search for: Borysiewicz, M. A.
- New search for: Korwin-Mikke, K.
In:
MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS
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177
, 15
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1323-1326
;
2012
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ISSN:
- Article (Journal) / Print
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Title:The role of deep level traps in barrier height of 4H-SiC Schottky diode
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Contributors:Zaremba, G. ( author ) / Adamus, Z. ( author ) / Jung, W. ( author ) / Kaminska, E. ( author ) / Borysiewicz, M. A. ( author ) / Korwin-Mikke, K. ( author )
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Published in:MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 177, 15 ; 1323-1326
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Publisher:
- New search for: Elsevier Science B.V., Amsterdam
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Publication date:2012-01-01
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Size:4 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 620.11
- Further information on Dewey Decimal Classification
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Classification:
DDC: 620.11 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 177, Issue 15
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1233
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Impact of scaling on the DC/RF thermal behavior of SiGe HBTs for high-frequency applicationsSasso, Grazia / d’Alessandro, Vincenzo / Costagliola, Maurizio / Russo, Salvatore / Rinaldi, Niccolò et al. | 2012
- 1239
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Defect detection in wire welded joints using thermography investigationsŚwiątczak, T. / Tomczyk, M. / Więcek, B. / Pawlak, R. / Olbrycht, R. et al. | 2012
- 1243
-
Cyclic voltammetry response of an undoped CVD diamond electrodesFabisiak, K. / Torz-Piotrowska, R. / Staryga, E. / Szybowicz, M. / Paprocki, K. / Popielarski, P. / Bylicki, F. / Wrzyszczyński, A. et al. | 2012
- 1248
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Electrothermal model of choking-coils for the analysis of dc–dc convertersGórecki, Krzysztof / Detka, Kalina et al. | 2012
- 1254
-
Quartz crystal unit modeling at cryogenic temperaturesBalik, F. / Dziedzic, A. / Świetlik, T. et al. | 2011
- 1261
-
Application of lock-in thermography for failure analysis in integrated circuits using quantitative phase shift analysisSchmidt, Ch. / Altmann, F. / Breitenstein, O. et al. | 2012
- 1268
-
Thermal properties of high-power diode lasers investigated by means of high resolution thermographyKozłowska, Anna / Maląg, Andrzej / Dąbrowska, Elżbieta / Teodorczyk, Marian et al. | 2012
- 1273
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The favorable and unfavorable effects of oxide and intermetallic phases in conductive materials using laser micro technologiesPawlak, R. / Tomczyk, M. / Walczak, M. et al. | 2012
- 1281
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Effect of the post-deposition annealing on electrical characteristics of MIS structures with HfO2/SiO2 gate dielectric stacksTaube, Andrzej / Mroczyński, Robert / Korwin-Mikke, Katarzyna / Gierałtowska, Sylwia / Szmidt, Jan / Piotrowska, Anna et al. | 2011
- 1286
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Influence of laminate type on tin whisker growth in tin-rich lead-free solder alloysSkwarek, Agata / Pluska, Mariusz / Czerwinski, Andrzej / Witek, Krzysztof et al. | 2012
- 1292
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Comparison of ZnO:Al, ITO and carbon nanotube transparent conductive layers in flexible solar cells applicationsSibiński, Maciej / Znajdek, Katarzyna / Walczak, Sylwia / Słoma, Marcin / Górski, Michał / Cenian, Adam et al. | 2012
- 1299
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Technology of ZnO nanofibers based devicesStafiniak, A. / Boratyński, B. / Baranowska-Korczyc, A. / Macherzyński, W. / Fronc, K. / Paszkiewicz, R. / Tłaczała, M. / Elbaum, D. et al. | 2012
- 1304
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New packages for disc type power diodesRaj, Ewa / Lisik, Zbigniew / Gozdur, Roman / Fiks, Włodzimierz et al. | 2012
- 1310
-
Influence of series resistance and cooling conditions on I–V characteristics of SiC merged PiN Schottky diodesHapka, Aneta / Janke, Wlodzimierz / Krasniewski, Jaroslaw et al. | 2012
- 1314
-
The influence of oxygen ambient annealing conditions on the quality of Al/SiO2/n-type 4H-SiC MOS structureKról, Krystian / Kalisz, Małgorzata / Sochacki, Mariusz / Szmidt, Jan et al. | 2011
- 1318
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Investigation of microstructure and chemical composition of Ni contacts to n-type 4H–SiCRogowski, Jacek / Kubiak, Andrzej et al. | 2012
- 1323
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The role of deep level traps in barrier height of 4H–SiC Schottky diodeZaremba, G. / Adamus, Z. / Jung, W. / Kamińska, E. / Borysiewicz, M.A. / Korwin-Mikke, K. et al. | 2012
- 1327
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Investigation of gate edge effect on interface trap density in 3C–SiC MOS capacitorsGutt, T. / Małachowski, T. / Przewłocki, H.M. / Engström, O. / Bakowski, M. / Esteve, R. et al. | 2012
- 1331
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Relaxation of stresses in polystyrene–carbon microcomposite resistive layersŁukasik, Andrzej / Sibiński, Maciej / Walczak, Sylwia et al. | 2012
- 1336
-
Thermal characterization of screen printed conductive pastes for RFID antennasJaneczek, Kamil / Jakubowska, Małgorzata / Młożniak, Anna / Kozioł, Grażyna et al. | 2012
- 1343
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Analysis of the thermal behavior of AlGaN/GaN HEMTsRusso, Salvatore / d’Alessandro, Vincenzo / Costagliola, Maurizio / Sasso, Grazia / Rinaldi, Niccolò et al. | 2012
- 1352
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The influence of working gas on CVD diamond qualityFabisiak, K. / Torz-Piotrowska, R. / Staryga, E. / Szybowicz, M. / Paprocki, K. / Banaszak, A. / Popielarski, P. et al. | 2011
- 1358
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A promising solution using CVD diamond for efficient cooling of power devicesZhang, Zhongda / Schneider, Henri / Tounsi, Patrick et al. | 2012
- 1362
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Power MOSFET quality and robustness enhancement with a new Q BD characterization performed at probe–die–wafer levelPomès, Emilie / Reynès, Jean-Michel / Tounsi, Patrick / Dorkel, Jean-Marie et al. | 2012
- 1367
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OM4 bend insensitive multi-mode fibers’ usefulness for MCM integrationGuzowski, Bartłomiej / Lisik, Zbigniew / Tosik, Grzegorz / Ciupa, Emilia et al. | 2012
- 1373
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Analysis of polymer foil heaters as infrared radiation sourcesWitek, Krzysztof / Piotrowski, Tadeusz / Skwarek, Agata et al. | 2012
- 1378
-
A comparative study of EVA with and without thermal history for different lamination process parametersDrabczyk, Kazimierz / Panek, Piotr et al. | 2012
- 1384
-
International Conference Microtechnology and Thermal Problems in Electronics June 25th - June 28th 2013, Lodz, Poland| 2012
- 1385
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Author index| 2012
- 1391
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Subject index| 2012
- CO2
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Editorial Board| 2012