Improved asymmetric peak parameter refinement (English)
- New search for: Hester, J. R.
- New search for: Hester, J. R.
In:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
;
46
, 4
;
1219-1220
;
2013
-
ISSN:
- Article (Journal) / Print
-
Title:Improved asymmetric peak parameter refinement
-
Contributors:Hester, J. R. ( author )
-
Published in:JOURNAL OF APPLIED CRYSTALLOGRAPHY ; 46, 4 ; 1219-1220
-
Publisher:
- New search for: Blackwell Publishing Ltd
-
Publication date:2013-01-01
-
Size:2 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 548
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 548 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 46, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 841
-
High-resolution X-ray diffraction and imagingFewster, Paul F. / Baidakova, Marina V. / Kyutt, Reginald et al. | 2013
- 842
-
Three-dimensional rocking curve imaging to measure the effective distortion in the neighbourhood of a defect within a crystal: an ice examplePhilip, Armelle / Meyssonnier, Jacques / Kluender, Rafael T. / Baruchel, José et al. | 2013
- 849
-
Crack propagation and fracture in silicon wafers under thermal stressDanilewsky, Andreas / Wittge, Jochen / Kiefl, Konstantin / Allen, David / McNally, Patrick / Garagorri, Jorge / Elizalde, M. Reyes / Baumbach, Tilo / Tanner, Brian K. et al. | 2013
- 856
-
Dose optimization approach to fast X-ray microtomography of the lung alveoliLovric, Goran / Barré, Sébastien F. / Schittny, Johannes C. / Roth-Kleiner, Matthias / Stampanoni, Marco / Mokso, Rajmund et al. | 2013
- 861
-
Three-wave X-ray diffraction in distorted epitaxial structuresKyutt, Reginald / Scheglov, Mikhail et al. | 2013
- 868
-
X-ray characterization of Ge dots epitaxially grown on nanostructured Si islands on silicon-on-insulator substratesZaumseil, Peter / Kozlowski, Grzegorz / Yamamoto, Yuji / Schubert, Markus Andreas / Schroeder, Thomas et al. | 2013
- 874
-
A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXSSuturin, S. M. / Fedorov, V. V. / Korovin, A. M. / Valkovskiy, G. A. / Konnikov, S. G. / Tabuchi, M. / Sokolov, N. S. et al. | 2013
- 882
-
Defect structure transformation after thermal annealing in a surface layer of Zn-implanted Si(001) substratesShcherbachev, Kirill / Privezentsev, Vladimir / Kulikauskas, Vaclav / Zatekin, Vladimir / Saraykin, Vladimir et al. | 2013
- 887
-
Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beamsBussone, Genziana / Schott, Rüdiger / Biermanns, Andreas / Davydok, Anton / Reuter, Dirk / Carbone, Gerardina / Schülli, Tobias U. / Wieck, Andreas D. / Pietsch, Ullrich et al. | 2013
- 893
-
Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]BDavydok, Anton / Rieger, Torsten / Biermanns, Andreas / Saqib, Muhammad / Grap, Thomas / Lepsa, Mihail Ion / Pietsch, Ullrich et al. | 2013
- 898
-
Characterization of SiGe thin films using a laboratory X-ray instrumentUlyanenkova, Tatjana / Myronov, Maksym / Benediktovitch, Andrei / Mikhalychev, Alexander / Halpin, John / Ulyanenkov, Alex et al. | 2013
- 903
-
In situ X-ray crystallographic study of the structural evolution of colloidal crystals upon heatingZozulya, A. V. / Meijer, J. M. / Shabalin, A. / Ricci, A. / Westermeier, F. / Kurta, R. P. / Lorenz, U. / Singer, A. / Yefanov, O. / Petukhov, A. V. et al. | 2013
- 908
-
Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating techniqueAli, Kamran / Pietsch, Ullrich / Grigorian, Souren et al. | 2013
- 912
-
Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructuresShreeman, P. K. / Dunn, K. A. / Novak, S. W. / Matyi, R. J. et al. | 2013
- 919
-
Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structuresZhylik, A. / Benediktovitch, A. / Feranchuk, I. / Inaba, K. / Mikhalychev, A. / Ulyanenkov, A. et al. | 2013
- 926
-
Nonlinear continuum growth model of multiscale reliefs as applied to rigorous analysis of multilayer short-wave scattering intensity. I. GratingsGoray, Leonid / Lubov, Maxim et al. | 2013
- 933
-
Processing of projections containing phase contrast in laboratory micro-computerized tomography imagingZápražný, Zdenko / Korytár, Dušan / Mikulík, Petr / Áč, Vladimír et al. | 2013
- 939
-
High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzersHönnicke, Marcelo Goncalves / Huang, Xianrong / Cusatis, Cesar / Koditwuakku, Chaminda Nalaka / Cai, Yong Q. et al. | 2013
- 945
-
Potential use of V-channel Ge(220) monochromators in X-ray metrology and imagingKorytár, D. / Vagovič, P. / Végsö, K. / Šiffalovič, P. / Dobročka, E. / Jark, W. / Áč, V. / Zápražný, Z. / Ferrari, C. / Cecilia, A. et al. | 2013
- 953
-
Ordered stacking of crystals with adjustable curvatures for hard X- and γ-ray broadband focusingNeri, Ilaria / Camattari, Riccardo / Bellucci, Valerio / Guidi, Vincenzo / Bastie, Pierre et al. | 2013
- 960
-
Representative reduction of crystallographic orientation dataJöchen, Katja / Böhlke, Thomas et al. | 2013
- 972
-
Identifying multiple forms of lateral disorder in cellulose fibresThomas, L. H. / Altaner, C. M. / Jarvis, M. C. et al. | 2013
- 980
-
Heterocyclic and aromatic based polyurethane scaffolds: morphology and crystallinity studied by X-ray diffraction, small-angle X-ray scattering and differential scanning calorimetryMadkour, Tarek M. / Mohamed, Sahar K. et al. | 2013
- 993
-
Unidirectional growth and characterization of L-tartaric acid single crystalsMoovendaran, K. / Natarajan, S. et al. | 2013
- 999
-
Pair distribution function analysis of X-ray diffraction from amorphous spheres in an asymmetric transmission geometry: application to a Zr58.5Cu15.6Ni12.8Al10.3Nb2.8 glassBendert, J. C. / Mauro, N. A. / Kelton, K. F. et al. | 2013
- 1008
-
Approximation of the structure factor for nonspherical hard bodies using polydisperse spheresHansen, Steen et al. | 2013
- 1017
-
Using FOCUS to solve zeolite structures from three-dimensional electron diffraction dataSmeets, Stef / McCusker, Lynne B. / Baerlocher, Christian / Mugnaioli, Enrico / Kolb, Ute et al. | 2013
- 1024
-
Computer studies on reflection high-energy electron diffraction from the growing surface of Ge(001)Mitura, Zbigniew et al. | 2013
- 1031
-
A novel small-angle neutron scattering detector geometryKanaki, Kalliopi / Jackson, Andrew / Hall-Wilton, Richard / Piscitelli, Francesco / Kirstein, Oliver / Andersen, Ken H. et al. | 2013
- 1038
-
A prototype direct-detection CCD for protein crystallographyGreen, Katherine S. / Szebenyi, Doletha M. E. / Boggs, Kasey / Bredthauer, Richard / Tate, Mark W. / Gruner, Sol M. et al. | 2013
- 1049
-
Combined X-ray diffraction and solid-state 19F magic angle spinning NMR analysis of lattice defects in nanocrystalline CaF2Abdellatief, Mahmoud / Abele, Matthias / Leoni, Matteo / Scardi, Paolo et al. | 2013
- 1058
-
A scanning CCD detector for powder diffraction measurementsToby, B. H. / Madden, T. J. / Suchomel, M. R. / Baldwin, J. D. / Von Dreele, R. B. et al. | 2013
- 1064
-
Composition-dependent structure of polycrystalline magnetron-sputtered V–Al–C–N hard coatings studied by XRD, XPS, XANES and EXAFSKrause, Bärbel / Darma, Susan / Kaufholz, Marthe / Mangold, Stefan / Doyle, Stephen / Ulrich, Sven / Leiste, Harald / Stüber, Michael / Baumbach, Tilo et al. | 2013
- 1076
-
Microstructure and interdiffusion behaviour of β-FeSi2 flat islands grown on Si(111) surfacesCho, Sung Pyo / Nakamura, Yoshiaki / Yamasaki, Jun / Okunishi, Eiji / Ichikawa, Masakazu / Tanaka, Nobuo et al. | 2013
- 1081
-
A new mechanism of anionic substitution in fluoride boratesRashchenko, Sergey V. / Bekker, Tatyana B. / Bakakin, Vladimir V. / Seryotkin, Yurii V. / Kokh, Alexander E. / Gille, Peter / Popov, Arthur I. / Fedorov, Pavel P. et al. | 2013
- 1085
-
Symmetry-mode analysis of the phase transitions in SrLaZnRuO6 and SrLaMgRuO6 ordered double perovskitesIturbe-Zabalo, E. / Igartua, J. M. / Gateshki, M. et al. | 2013
- 1094
-
Solving complex open-framework structures from X-ray powder diffraction by direct-space methods using composite building unitsInge, A. Ken / Fahlquist, Henrik / Willhammar, Tom / Huang, Yining / McCusker, Lynne B. / Zou, Xiaodong et al. | 2013
- 1105
-
Evolution of order in amorphous-to-crystalline phase transformation of MgF2Mu, Xiaoke / Neelamraju, Sridhar / Sigle, Wilfried / Koch, Christoph T. / Totò, Nico / Schön, J. Christian / Bach, Andreas / Fischer, Dieter / Jansen, Martin / van Aken, Peter A. et al. | 2013
- 1117
-
Advances in in situ powder diffraction of battery materials: a case study of the new beamline P02.1 at DESY, HamburgHerklotz, Markus / Scheiba, Frieder / Hinterstein, Manuel / Nikolowski, Kristian / Knapp, Michael / Dippel, Ann Christin / Giebeler, Lars / Eckert, Jürgen / Ehrenberg, Helmut et al. | 2013
- 1128
-
Tunnel-dependent supercapacitance of MnO2: effects of crystal structureSun, Congting / Zhang, Yuanjian / Song, Shuyan / Xue, Dongfeng et al. | 2013
- 1136
-
Application of immune and genetic algorithms to the identification of a polymer based on its X-ray diffraction curveRabiej, Małgorzata et al. | 2013
- 1145
-
Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterizationSyha, Melanie / Trenkle, Andreas / Lödermann, Barbara / Graff, Andreas / Ludwig, Wolfgang / Weygand, Daniel / Gumbsch, Peter et al. | 2013
- 1151
-
Diffraction studies under in situ electric field using a large-area hybrid pixel XPAD detectorFertey, Pierre / Alle, Paul / Wenger, Emmanuel / Dinkespiler, Bernard / Cambon, Olivier / Haines, Julien / Hustache, Stephanie / Medjoubi, Kadda / Picca, Frederic / Dawiec, Arkadiusz et al. | 2013
- 1162
-
xrayutilities: a versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectorsKriegner, Dominik / Wintersberger, Eugen / Stangl, Julian et al. | 2013
- 1171
-
Rapid and accurate calculation of small-angle scattering profiles using the golden ratioWatson, Max C. / Curtis, Joseph E. et al. | 2013
- 1178
-
Relationship between performance and microvoids of aramid fibers revealed by two-dimensional small-angle X-ray scatteringZhu, Caizhen / Liu, Xiaofang / Guo, Jing / Zhao, Ning / Li, Changsheng / Wang, Jie / Liu, Jianhong / Xu, Jian et al. | 2013
- 1187
-
SASET: a program for series analysis of small-angle scattering dataMuthig, Michael / Prévost, Sylvain / Orglmeister, Reinhold / Gradzielski, Michael et al. | 2013
- 1196
-
CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant celluloseOliveira, Rafael P. / Driemeier, Carlos et al. | 2013
- 1211
-
An accidental visualization of the Brillouin zone in an Ni–W alloy via diffuse scatteringMaisel, Sascha B. / Schindzielorz, Nils / Müller, Stefan / Reichert, Harald / Bosak, Alexei et al. | 2013
- 1216
-
Phase determination of the crystal structure factor by measuring rocking curves from a polar crystalNegishi, Riichirou / Fukamachi, Tomoe / Jongsukswat, Sukswat / Hirano, Kenji / Hirano, Keiichi / Kawamura, Takaaki et al. | 2013
- 1219
-
Improved asymmetric peak parameter refinementHester, James R. et al. | 2013
- 1221
-
GBgeom: a computer program for visualizing texture parameters and simulating grain boundary structures in cubic crystalsKarthikeyan, Thangaraj / Saroja, Saibaba et al. | 2013
- 1225
-
RADDOSE-3D: time- and space-resolved modelling of dose in macromolecular crystallographyZeldin, Oliver B. / Gerstel, Markus / Garman, Elspeth F. et al. | 2013
- 1231
-
EXPO2013: a kit of tools for phasing crystal structures from powder dataAltomare, Angela / Cuocci, Corrado / Giacovazzo, Carmelo / Moliterni, Anna / Rizzi, Rosanna / Corriero, Nicola / Falcicchio, Aurelia et al. | 2013
- 1236
-
Safety interlock and vent system to alleviate potentially dangerous ice blockage of top-loading cryostat sample sticksPangelis, S. / Olsen, S. R. / Scherschligt, J. / Leão, J. B. / Pullen, S. A. / Dender, D. / Hester, J. R. / Imperia, P. et al. | 2013
- 1240
-
Graphene: Carbon in Two Dimensions. By Mikhail I. Katsnelson. Cambridge University Press, 2012. Price (hardcover) GBP 45.00. ISBN-13: 9780521195409.Paufler, Peter et al. | 2013