Reliability Physics and Engineering : time-to-failure modeling — Third edition (English)
- New search for: McPherson, Joe W.
- Further information on McPherson, Joe W.:
- http://d-nb.info/gnd/1054944563
- New search for: McPherson, Joe W.
- Further information on McPherson, Joe W.:
- http://d-nb.info/gnd/1054944563
2019
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ISBN:
- Book / Print
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Title:Reliability Physics and Engineering : time-to-failure modeling
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Contributors:McPherson, Joe W. ( author )
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Edition:Third edition
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Publisher:
- New search for: Springer
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Place of publication:Cham
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Publication date:2019
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Size:xvii, 463 Seiten
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Remarks:23.5 cm x 15.5 cm
Illustrationen, Diagramme, Tabellen -
ISBN:
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Type of media:Book
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Type of material:Print
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Language:English
- New search for: 51.32 / 33.05
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Keywords:
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Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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IntroductionMcPherson, J. W. et al. | 2018
- 5
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Physics of DegradationMcPherson, J. W. et al. | 2018
- 33
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Time-Dependence of Materials and Device DegradationMcPherson, J. W. et al. | 2018
- 59
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From Material/Device Degradation to Time-to-FailureMcPherson, J. W. et al. | 2018
- 67
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Time-to-Failure ModelingMcPherson, J. W. et al. | 2018
- 81
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Gaussian Statistics: An OverviewMcPherson, J. W. et al. | 2018
- 93
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Time-to-Failure StatisticsMcPherson, J. W. et al. | 2018
- 109
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Failure Rate ModelingMcPherson, J. W. et al. | 2018
- 125
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Accelerated DegradationMcPherson, J. W. et al. | 2018
- 137
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Acceleration Factor ModelingMcPherson, J. W. et al. | 2018
- 149
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Ramp-to-Failure TestingMcPherson, J. W. et al. | 2018
- 165
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Time-to-Failure Models for Selected Failure Mechanisms in Integrated CircuitsMcPherson, J. W. et al. | 2018
- 227
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Time-to-Failure Models for Selected Failure Mechanisms in Mechanical EngineeringMcPherson, J. W. et al. | 2018
- 305
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Conversion of Dynamical Stresses into Effective Static ValuesMcPherson, J. W. et al. | 2018
- 331
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Resonance and Resonance-Induced DegradationMcPherson, J. W. et al. | 2018
- 353
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Increasing the Reliability of Device/Product DesignsMcPherson, J. W. et al. | 2018
- 365
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ScreeningMcPherson, J. W. et al. | 2018
- 381
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Heat Generation and DissipationMcPherson, J. W. et al. | 2018
- 419
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Sampling Plans and Confidence IntervalsMcPherson, J. W. et al. | 2018