Electron microscopy and analysis 1993 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Liverpool, 14 - 17 September 1993 (English)
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1993
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Title:Electron microscopy and analysis 1993 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Liverpool, 14 - 17 September 1993
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Additional title:EMAG 93
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Conference:Institute of Physics Electron Microscopy and Analysis Group Conference (EMAG) ; 1993 ; 1993 ; Liverpool
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- New search for: Institute of Physics
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Place of publication:Bristol [u.a.]
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Publication date:1993
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Size:XVI, 546 S
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Remarks:Ill., graph. Darst
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Type of media:Conference Proceedings
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Type of material:Print
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Language:English
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Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Micromagnetics, microstructure and microscopyChapman, J. N. / Ferrier, R. P. / Heyderman, L. J. / McVitie, S. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 9
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Heterogeneous catalysis: the ultimate challenge for electron microscopy?Joyner, R. W. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 17
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UHV microscopy of surfaces and thin fim growthTakayanagi, K. et al. | 1993
- 17
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UHV microscopy of surfaces and thin film growthTakayanagi, K. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 25
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High spatial resolution mapping of EELS fine structuresColliex, C. / Lefevre, E. / Tence, M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 31
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Determination of the crystal field strength in manganese compounds by parallel electron energy loss spectroscopyGarvie, L. A. J. / Craven, A. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 35
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Electron energy loss near edge spectroscopy of oxygen in amorphous and crystalline WO~3 and MoO~3Mountjoy, G. / Yuan, J. / Gaskell, P. H. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 39
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Microanalysis of an oxidized cobalt oxide-zirconia eutecticBentley, J. / McKernan, S. / Carter, C. B. / Revcolevschi, A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 43
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The orientation dependence of the Cu L loss as assessed by PEELS for YBa~2Cu~3O~7~-~Botton, G. A. / Boothroyd, C. B. / Ul Hamid, A. / Newcomb, S. B. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 47
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PEELS of crystalline and amorphous silicon oxidesWallis, D. J. / Gaskell, P. H. / Brydson, R. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 51
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A comparative electron energy-loss spectroscopy study of cuprous and cupric chromitesCadete Santos Aires, F. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 55
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Cobalt, nickel and copper aluminates characterised by parallel EELSCadete Santos Aires, F. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 59
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Quantitative electronic structure analysis of -Al~2O~3 using spatially resolved valence electron energy-loss spectraMuellejans, H. / Bruley, J. / French, R. H. / Morris, P. A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 63
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Relationship between electron energy loss and interparticle dispersion forceYuan, J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 67
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The effect of grain size on electron beam hole drilling in CaF~2Zanetti, R. / Bleloch, A. L. / Grimshaw, M. / Paterson, J. H. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 71
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Electron beam induced nanoscale chemical reactionsMurooka, Y. / Yuan, J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 75
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An investigation of the mass loss from chlorinated copper phthalocyanines using PEELSCraven, A. J. / Smith, J. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 79
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Investigations of structure and degradation of carbon nanotubes by EELS and HREMCullen, S. L. / Botton, G. / Kirkland, A. I. / Brown, P. D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 83
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Three-dimensional morphology and microstructure of graphite shellsVincent, R. / Burton, N. / Lister, P. M. / Wright, J. D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 87
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A study of sample thickness dependence in electron beam hole-drilling of inorganic materialsAllen, R. M. / Lloyd, S. J. / Humphreys, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 91
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Coincidence experiments on the secondary electron emission from copper particles and oxidised aluminiumOverdick, M. / Bleloch, A. L. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 95
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The application of multivariate ALCHEMI to materials containing light elementsWalls, M. G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 99
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X-ray mapping without a STEM?Brock, J. M. / Rees, J. A. / Kayser, M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 103
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X-ray microanalysis of thin films using Monte Carlo simulationsFitzgerald, A. G. / Gillies, A. D. / Ploessl, A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 107
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A pre-viewing method for determining homogeneity of a metal bulk sample prior to quantification of the EDS-spectraGustafsson, T. E. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 111
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Intensity distribution in defocused STEM probesGranleese, S. J. R. / Ito, Y. / Brown, L. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 115
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The information from bright field images of small particlesSethi, S. A. / Thoelen, A. R. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 119
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Advances in coherent electron diffractionVincent, R. / Midgley, P. A. / Spellward, P. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 125
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Accurate structure factor refinement from zone-axis CBED patternsSaunders, M. / Bird, D. M. / Zaluzec, N. J. / Burgess, W. G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 129
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Structure factors and charge density of gammaTiAl: a comparison of ab initio local density calculations with data from electron diffraction experimentsFox, A. G. / Zhi Wei Lu / Zunger, A. / De Fontaine, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 133
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Structure determination of organic crystals by electron crystallographyFryer, J. R. / Gilmore, C. J. / Springett, S. / Bricogne, G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 137
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Structure factor determination by zone axis CBEDBurgess, W. G. / Saunders, M. / Bird, D. / Botton, G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 141
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Debye-Waller factor measurements in TiAl from HOLZ line intensitiesHolmestad, R. / Weickenmeier, A. L. / Zuo, J. M. / Spence, J. C. H. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 145
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Debye-Waller factor determination from LACBED patternsPreston, A. R. / Burgess, W. G. / Pickup, C. J. / Humphreys, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 149
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Dynamical effects of high-energy electron diffraction observed in ZnSMatsuhata, H. / Gjonnes, J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 153
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Characterisation of the Burgers vectors of partial dislocations by large angle convergent beam electron diffractionMorniroli, J. P. / Cherns, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 157
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Determination of beam directions and axis/angle pairs for grain boundaries in hexagonal materialsMacLaren, I. / Aindow, M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 161
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Fast calibration of CBED patterns for structure factor refinementGribelyuk, M. A. / Ruehle, M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 165
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Determination of the space group of hydrothermally synthesised K~2MgSi~5O~1~2 leucite by electron diffractionChampness, P. E. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 167
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Information in Ronchigrams of a superlattice from defocused microdiffraction in STEMAitchison, P. R. / Rodenburg, J. M. / Brown, L. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 171
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Speckle interference in selected area transmission electron diffraction patternsDaykin, A. C. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 175
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Multiple inelastic scattering contributions to CBED contrastHoeier, R. / Marthinsen, K. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 179
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Principles of the measurement of composition and strain in epitaxial layers using convergent beam electron diffractionBeanland, R. / Goodhew, P. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 183
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Application of Dyson and Bethe-Salpeter equations to high-energy electron diffractionDudarev, S. L. / Peng, L.-M. / Whelan, M. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 187
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Multi-source imaging in photoelectron spectromicroscopyCoath, C. D. / Plummer, I. R. / Turner, D. W. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 193
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UV photoelectron microscopy using Fresnel zone platesAnjum, S. / Lee, J. / Tournas, A. D. / Potts, A. W. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 197
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Biassed secondary electron imaging of Cs/Si(100)Azim, M. / Milne, R. H. / Persaud, R. / Venables, J. A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 201
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Auger imaging from rough, chemically inhomogeneous, materialsCrone, M. / Barkshire, I. R. / Prutton, M. / Kenny, P. G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 205
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Hydrogenated amorphous silicon (a-Si:H) films containing tungstenPloessl, A. / Fitzgerald, A. G. / Gibson, R. A. G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 209
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High resolution profile imaging of (Hg, Mn)TeBrown, P. D. / Kirkland, A. / Humphreys, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 213
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Internal scattering of electrons in a CMAEl Bakush, T. A. / El Gomati, M. M. / Liu, X. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 217
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Surface resonance scattering of high energy electrons by crystals: exact analytical solutionDudarev, S. L. / Whelan, M. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 221
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THEED of sub-monolayer phases of xenon adsorbed on graphiteZerrouk, T. E. A. / Hamichi, M. / Milne, R. H. / Pilkington, J. D. H. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 225
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Ultra-resolution on a FEG-TEM by phase retrieval through focus variationCoene, W. / Janssen, A. / Op de Beeck, M. / Van Dyck, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 231
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Simple focal series integration for optimized phase contrast in TEMBuist, A. H. / Kruit, P. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 235
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Below the 1 coherent resolution limit: does the future lie with STEM?Rodenburg, J. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 235
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Below the 1 A.U. coherent resolution limit: does the future lie with STEM?Rodenburg, J.M. et al. | 1993
- 239
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Image resolution improvement using coherent microdiffraction in STEMNellist, P. D. / Rodenburg, J. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 243
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Thickness limitations of aberration-free projection imagingPlamann, T. / Rodenburg, J. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 247
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Experimental super resolution via tilt series reconstruction in the CTEMKirkland, A. I. / Rodenburg, J. / Saxton, W. O. / Tsuno, K. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 251
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Direct complex transfer function reconstruction by processing of near-focus shadow images in STEMLandauer, M. N. / Rodenburg, J. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 255
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Applications of the optical moire technique in HREMHetherington, C. J. D. / Brown, P. D. / Dunin-Borkowski, R. E. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 259
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HREM structure characterization of interfaces in epitaxial MBE grown multilayers based on GaAs and GaSbScheerschmidt, K. / Ruvimov, S. / Werner, P. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 263
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HREM studies of CVD-diamond filmsHutchison, J. L. / Shechtman, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 267
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An HREM investigation of the diamond hexagonal phase in a silicon cone from a vacuum microelectronic deviceMorgan, C. J. / Kirkland, A. I. / Humphreys, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 271
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The characterisation of delta-doping in gallium arsenide by Fresnel contrastDunin-Borkowski, R. E. / Perovic, D. D. / Wasilewski, Z. R. / Stobbs, W. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 275
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The study of conjugated polymers by STM and related methodsBond, S. F. / Howie, A. / Friend, R. H. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 279
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An ECSTM study of the electrodeposition of Ni onto HOPG substratesRiddell, K. N. / Tong, X. Q. / Aindow, M. / Farr, J. P. G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 283
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TEM and STM studies of growth spirals on laser-ablated epitaxial YBa~2Cu~3O~7~-~Yeadon, M. / Aindow, M. / Wellhoefer, F. / Abell, J. S. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 287
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The combination of low resolution STM and conventional TEM in the study of nanoindentation plasticity on tungsten single crystalsStelmashenko, N. A. / Oezkaya, D. / Brown, L. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 291
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Scanning tunneling and atomic force microscopy studies on organometallic compoundsMulley, S. / Moret, M. / Sironi, A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 295
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The modern SEM: an increasingly versatile and integrated tool for the microstructural and microchemical analysis of engineering ceramics, coatings and compositesPage, T. F. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 301
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Dislocation stand-off and its effect on orientation relationshipTricker, D. M. / Somekh, R. E. / Stobbs, W. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 305
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Electron microscopy studies of epitaxial CuInSe~2 layers grown on GaAs by a hybrid magnetron sputtering processMullan, C. A. / Kiely, C. J. / Devenish, R. W. / Chung Yang, L. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 309
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Electron microscopy studies of epitaxial InGaAlAs layers grown on InP(001) by molecular beam epitaxyMurray, R. T. / Kiely, C. J. / Goodhew, P. J. / Hopkinson, M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 313
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TEM and PL study of strain relaxation in InGaAs/GaAs MQW structuresGonzalez, D. / Araujo, D. / Aragon, G. / Molina, S. I. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 317
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Characterization of the GaP/Si(001) interface by transmission electron microscopyPacheco, F. J. / Kiely, C. J. / Molina, S. I. / Aragon, G. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 321
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TEM and PL imaging characterization of MOVPE grown multiple quantum well laser structures with tensile strained Ga~xIn~1~-~xAs wellsZhou, X. / Charsley, P. / Smith, A. D. / Briggs, A. T. R. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 325
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TEM investigation of the magnetic structures present in amorphous ribbonsHeyderman, L. J. / Dick, F. / Chapman, J. N. / Gibbs, M. R. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 329
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The characterisation of thin films of MBE grown La~2~-~xSr~xCuO~4~~ by transmission electron microscopyWilliams, E. J. / Locquet, J.-P. / Maechler, E. / Jaccard, Y. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 333
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Growth and microstructure of aluminium substituted YBa~2Cu~3O~7~-~ single crystalsDrake, A. / Hirst, P. / Aindow, M. / Abell, J. S. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 337
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Low temperature SEM studies of beam-induced voltage contrast in YBCO thin filmsHollin, C. A. / Hall, M. G. / Abell, J. S. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 341
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Dislocation parity analysis applied to unify the Burgers vector determination by TEMRuvimov, S. S. / Scheerschmidt, K. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 345
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Phase transformations in UPt~3 revealed by in-situ heatingMidgley, P. A. / Hayden, S. M. / Taillefer, L. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 349
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TEM specimen preparation of nanophase materials by ultramicrotomyMcMahon, G. / Malis, T. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 353
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Electron microscopy of silicon nitride whiskersKorgul, P. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 357
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Ternary phase formation in flip-chip solder bondsMockler, A. J. / Goodhew, P. J. / Logan, E. A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 361
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The stability of dispersoids in mechanically alloyed ferritic ODS alloysCama, H. / Hughes, T. A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 365
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A STEM/PEELS-study of debris produced by friction of a diamond stylus on CVD diamondVan Bouwelen, F. M. / Brown, L. M. / Field, J. E. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 369
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Electron-induced crystallisation in aluminium trifluorideChen, G. S. / Boothroyd, C. B. / Humphreys, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 373
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Orientation changes during sintering of nickelDingley, D. J. / Preece, C. / Stemp, P. W. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 377
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The orientation of grain boundaries in annealed copperDingley, D. J. / Boal, T. / Phillips, P. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 381
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Application of electron microscopy and microanalysis to the development of advanced structural composite materialsImeson, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 387
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Transmission electron microscopy of BN inclusions in Si~3N~4-SiC compositesTuran, S. / Knowles, K. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 391
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Interfacial reaction products and matrix microstructures in SCS-6/-Ti metal matrix compositesStrangwood, M. / Fox, K. M. / Bowen, P. / Cotterill, P. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 395
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Electron microscopy of AlN-SiC interfaces and solid solutionsBentley, J. / Tanaka, S. / Davis, R. F. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 399
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Surface and interface segregation in nickel-based alloysTatlock, G. J. / Ritherdon, J. / El-Barasi, N. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 405
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Cooling induced segregations to grain boundaries in 2 1/4Cr1Mo steel and submerged arc weld metalVorlicek, V. / Flewitt, P. E. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 409
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Compositional segregation at fault interfaces in gamma'Chen, C. Y. / Dunin-Borkowski, R. E. / Stobbs, W. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 413
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A comparison of assessments of grain boundary segregation using the Fresnel method and HAADF imagingOezkaya, D. / Stobbs, W. M. / Brown, L. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 417
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STEM analysis of impurity segregation during high temperature oxidationFox, P. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 421
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The study of grain boundary void development in an Al-3wt% Li alloyOezkaya, D. / Prangnell, P. B. / Stobbs, W. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 425
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A TEM investigation of sub-micron precipitate dispersions in laser welded Al-Li based alloy 8090Whitaker, I. R. / Calder, N. J. / McCartney, D. G. / Steen, W. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 429
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Intermediate compounds in gamma/gamma' alloy coatingsDent, A. / Newcomb, S. B. / Stobbs, W. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 433
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Ordering in Nb-Al alloys with 10 to 25 atomic % AlSmith, L. S. / Aindow, M. / Loretto, M. H. / Shyue, J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 437
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Planar defects in a gamma-based Ti48A12Mo alloyLi, Y. G. / Loretto, M. H. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 441
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A HREM investigation of dislocation pinning by 1/6(112)dipolesInkson, B. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 445
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Determination of stacking fault energies of the intermetallic Ti-52at.% AlWiezorek, J. M. K. / Humphreys, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 449
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The nature of the gamma allotriomorph/~2 + gamma lamellae interface for elevated temperature transformations in Ti-48Al-2Mn-2NbGodfrey, S. P. / Strangwood, M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 453
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The stability of melt-spun Al-transition metal alloysDuggan, M. A. / Loretto, M. H. / Smallman, R. E. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 457
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Nanostructure investigation of rapidly solidified NdFeB hard magnetic alloysAl-Khafaji, M. A. / Manaf, A. / Zhang, P. / Ahmed, I. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 461
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Controlled environment TEM of a 5% Pt/Al~2O~3 model catalystBithell, E. G. / Doole, R. C. / Goringe, M. J. / Parkinson, G. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 465
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In-situ oxidation and reduction of complex oxidesHutchison, J. L. / Hilton, D. / Doole, R. C. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 469
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Transmission electron microscopy and energy dispersive x-ray spectroscopy studies of Pt-Re/gammaAl~2O~3 catalystsHuang, Z. / Fryer, J. R. / Park, C. / Stirling, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 473
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Transmission electron microscopy and energy dispersive x-ray spectroscopy studies of Pt-Sn/gammaAl~2O~3 catalystsHuang, Z. / Fryer, J. R. / Park, C. / Stirling, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 477
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Preparation and characterisation of platinum group metal nanoparticlesCea, F. / Devenish, R. W. / Goulding, T. / Heaton, B. T. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 481
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A structural study of the WO~3/TiO~2 (anatase) monolayer catalyst using high resolution electron microscopyBurrows, A. / Devenish, R. W. / Joyner, R. W. / Kiely, C. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 485
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HREM study of the phases resulting from the preparation of ceria supported rhodium catalystsBernal, S. / Botana, F. J. / Calvino, J. J. / Cifredo, G. A. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 489
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Orientation imaging microscopyAdams, B. L. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 495
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New generation SEM integrating 0.5 nm image resolution and sub-micron low voltage EDX chemical microanalysisBoyes, E. D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 499
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First results of a 300 kV high resolution field-emission STEMVon Harrach, H. S. / Nicholls, A. W. / Jesson, D. E. / Pennycook, S. J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 503
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The new CM-series TEMS: integration of a five-axis motorized, fully computer-controlled goniometerEmile, P. / Asselbergs, S. J. / Brock, J. / De Jong, M. J. C. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 507
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Electron phase gratings by electron beam nanolithographyIto, Y. / Bleloch, A. L. / Granleese, S. J. R. / Brown, L. M. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 511
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Beam stabiliser for an electron spectrometerMcMullan, D. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 515
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Energy resolved microscopy using the Gatan imaging PEELSMidgley, P. A. / Trevor, C. G. / Vincent, R. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 519
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An automated parallel EELS and digital image acquisition system for a VG HB501 STEMPaterson, J. H. / Fallon, P. J. / Granleese, S. J. R. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 523
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A critical comparison of first- and second-order finite element methods in electron opticsTahir, K. / Zhu, X. / Mulvey, T. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 527
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X-ray detection performance of a 300 kV field emission analytical electron microscopeNicholls, A. W. / Von Harrach, H. S. / Lyman, C. E. / Goldstein, J. I. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 531
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On-line alignment system for TEM using a TV and personal computerHosokawa, F. / Kondo, Y. / Honda, T. / Critchell, J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993
- 535
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Development of a 300 kV field emission ATEMTomita, T. / Honda, T. / Critchell, J. / Institute of Physics; Electron Microscopy and Analysis Group / Royal Microscopical Society / Institute of Materials et al. | 1993