Scanning electron microscopy : physics of image formation and microanalysis — 2., completely rev. and updated ed. (English)
- New search for: Reimer, Ludwig
- Further information on Reimer, Ludwig:
- http://d-nb.info/gnd/13230130X
- New search for: Reimer, Ludwig
- Further information on Reimer, Ludwig:
- http://d-nb.info/gnd/13230130X
1998
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ISBN:
- Book / Print
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Title:Scanning electron microscopy : physics of image formation and microanalysis
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Contributors:Reimer, Ludwig ( author )
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Published in:
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Edition:2., completely rev. and updated ed.
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Publisher:
- New search for: Springer
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Place of publication:Berlin , Heidelberg [u.a.]
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Publication date:1998
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Size:XIV, 527 S
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Remarks:Ill., graph. Darst
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ISBN:
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Type of media:Book
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Type of material:Print
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Language:English
- New search for: 33.18 / 35.25 / 33.05
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- New search for: 502/.8/25 / 535/.3325 / 502.825
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Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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IntroductionReimer, Ludwig et al. | 1998
- 2
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Electron Optics of a Scanning Electron MicroscopeReimer, Ludwig et al. | 1998
- 3
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Electron Scattering and DiffusionReimer, Ludwig et al. | 1998
- 4
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Emission of Backscattered and Secondary ElectronsReimer, Ludwig et al. | 1998
- 5
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Electron Detectors and SpectrometersReimer, Ludwig et al. | 1998
- 6
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Image Contrast and Signal ProcessingReimer, Ludwig et al. | 1998
- 253
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Electron-Beam-Induced Current and CathodoluminescenceProfessor Dr. Reimer, Ludwig et al. | 1998
- 8
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Special Techniques in SEMReimer, Ludwig et al. | 1998
- 9
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Crystal Structure Analysis by DiffractionReimer, Ludwig et al. | 1998
- 10
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Elemental Analysis and Imaging with X-RaysReimer, Ludwig et al. | 1998