10th International Symposium on Measurement and Quality Control (ISMQC 2010) : Osaka, Japan, 5 - 9 September 2010 (English)
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2010
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ISBN:
- Conference Proceedings / Print
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Title:10th International Symposium on Measurement and Quality Control (ISMQC 2010) : Osaka, Japan, 5 - 9 September 2010
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Contributors:
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Conference:International Symposium on Measurement and Quality Control ; 10 ; 2010 ; Osaka
ISMQC ; 10 ; 2010 ; Osaka -
Publisher:
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Place of publication:Red Hook, NY
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Publication date:2010
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Size:590 S.
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Remarks:Ill., graph. Darst.
Literaturangaben -
ISBN:
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Type of media:Conference Proceedings
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Type of material:Print
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Language:English
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Keywords:
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Classification:
BKL: 52.71 Qualitätssicherung -
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Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 5
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Multi scale morphological metrology of piston-ring-textured cylinder liner assembly in relation to their tribological propertiesNinove, F.P. / Mathia, T.G. / Mazuyer, D. / Pawlus, P. / Carras, S. / Gruszka, J. et al. | 2010
- 14
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3D natural surface features of nodular spheroidal cast iron and its morphological behaviour in abrasive manufacturingNinove, F.P. / Rapiejko, C. / Mathia, T.G. et al. | 2010
- 18
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Evaluation of spreading behavior of liquids on surfaces with function-oriented 3D parametersTan, Özgür / Weckenmann, Albert et al. | 2010
- 26
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High-resolution imaging technique based on active shift of optical axisUsuki, Shin / Miura, Kenjiro T. et al. | 2010
- 47
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3D measurements of microstructures with large lateral dimensionsBretschneider, Martin / Krauß, Moritz / Kästner, Markus / Reithmeier, Eduard et al. | 2010
- 55
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Autocollimator characterization and calibration at the PTB: current status and future progressGeckeler, Ralf D. / Just, Andreas / Krause, Michael / Bosse, Harald et al. | 2010
- 59
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Reflective property of typical micro structures under white light interferometerSun, Z. / Weckenmann, A. et al. | 2010
- 67
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Naturally grown silicon structures as an intercomparison standard for multisensor data fusion in geometrical surface characterizationGröger, Sophie / Dietzsch, Michael et al. | 2010
- 79
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Fast algorithms for in-line gearwheel measurementsPahlke, A. / Kästner, M. / Reithmeier, E. et al. | 2010
- 104
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Focus and dose control for lithography of semiconductor manufacturing using many kind measurement tools respectivelyIna, Hideki / Sentoku, Koichi et al. | 2010
- 124
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Tactile-optical microprobes for three dimensional measurements of micropartsTutsch, Rainer / Andraes, Matthias / Neuschaefer-Rube, Ulrich / Petz, Marcus / Wiedenhoefer, Thomas / Wissmann, Mark et al. | 2010
- 168
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Resolution characteristics of super-resolution optical inspection using standing wave illuminationKudo, Ryota / Usuki, Shin / Takahashi, Satoru / Takamasu, Kiyoshi et al. | 2010
- 176
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Optical 3D-characterization for multiscale workpiecesShaw, Laura / Weckenmann, Albert et al. | 2010
- 200
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Sustainable quality assurance by assuring competence of employeesWerner, Teresa / Weckenmann, Albert et al. | 2010
- 204
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Introducing quality control loops for the integrated analysis and design of stable production systemsSchmitt, Robert / Pfeifer, Tilo / Stiller, Sebastian T. / Beaujean, Patrick et al. | 2010
- 208
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Capable production processes by dynamic tolerancingHernandez, Carlos / Tutsch, Rainer et al. | 2010
- 216
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Method for a traceable geometry assessment of arbitrarily shaped sculptured surfacesBartscher, Markus / Neukamm, Marko / Krystek, Michael et al. | 2010
- 224
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Mobile multi-lateration measuring system for high accurate and traceable 3D measurements of large objectsWendt, Klaus / Franke, Matthias / Härtig, Frank et al. | 2010
- 254
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Proposal of a cylindrical standard to evaluate the uncertainty of measurement for micro gear measurementsLanza, Gisela / Viering, Benjamin et al. | 2010
- 344
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Surface shape measurement for small lens using phase shift shearing interferometerHanayama, Ryohei / Ishii, Katsuhiro et al. | 2010
- 400
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In-situ microscopic surface profilometry by lateral confocal scanning (LCS) for roll-to-roll thin-film fabricationChen, Liang-Chia / Chang, Yi-Wei / Chen, Sheng-Han / Li, Zhi-Kai / Kuo, Shih-Hsuan / Lai, Huang-Wen et al. | 2010
- 420
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Experimental evaluation of techniques for outlier recognition and elimination on form measurement profilesProbst, Felipe L. / Arenhart, Francisco A. / Donatelli, Gustavo D. / Schmitt, Robert / Nisch, Susanne et al. | 2010
- 457
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Photonic biosensor for lab-on-a-chip applicationsDemming, Stefanie / Llobera, Andreu / Cadarso, Victor Javier / Orozco, Jahir / Fernandez-Sanchez, Cesar / Wilke, Ralph / Büttgenbach, Stephanus et al. | 2010
- 469
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Hard- and software systems for evaluation of new multi channel image processing algorithmsCorrens, Martin / Schumann, Maik / Rosenberger, Maik / Rückwardt, Matthias / Göpfert, Andre / Linß, Gehard et al. | 2010
- 516
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Closed-loop control for a parallel microrobot based on integrated capacitive position sensorsBoese, Christoph / Feldmann, Marco / Büttgenbach, Stephanus et al. | 2010
- 551
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Combination of multi-sensor technology and multiple measurement strategies in micro- and nanometrologyManske, Eberhard / Jäger, Gerd / Hausotte, Tino et al. | 2010
- 567
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The factors affecting surface roughness measurements of the machined flat and spherical surface structures - the geometry and the precision of the surfaceDurakbasa, M. Numan / Osanna, P. Herbert / Demircioglu, Pinar et al. | 2010