The effects of pattern screen surface deformation on deflectometric measurements - A simulation study (English)
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- New search for: Allgeier, Stephan
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- New search for: Allgeier, Stephan
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Title:The effects of pattern screen surface deformation on deflectometric measurements - A simulation study
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Contributors:Allgeier, Stephan ( author ) / Gengenbach, Ulrich ( author ) / Köhler, Bernd ( author ) / Reichert, Klaus-Martin ( author ) / Hagenmeyer, Veit ( author )
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Publication date:2021-07-15
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Remarks:ISSN: 0277-786X
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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DDC: 004 -
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