Measurement data acquisition method and device of chip testing machine, and computer equipment (Chinese)
Free access
- New search for: WEI CHONG
- New search for: WEI CHONG
2023
- Patent / Electronic Resource
-
Title:Measurement data acquisition method and device of chip testing machine, and computer equipment
-
Additional title:一种芯片测试机的量测数据获取方法、装置、计算机设备
-
Patent number:CN115561619
-
Patent applicant:
-
Patent family:
-
Contributors:WEI CHONG ( author )
-
Publisher:
- New search for: Europäisches Patentamt
-
Publication date:2023-01-03
-
Type of media:Patent
-
Type of material:Electronic Resource
-
Language:Chinese
- New search for: G01R
- Further information on International Patent Classification
-
Classification:
IPC: G01R Messen elektrischer Größen, MEASURING ELECTRIC VARIABLES -
Source: