Universal chip testing system and method (Chinese)
Free access
- New search for: CHENG XIANG
- New search for: ZHANG YIFAN
- New search for: CHENG XIANG
- New search for: ZHANG YIFAN
2023
- Patent / Electronic Resource
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Title:Universal chip testing system and method
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Additional title:通用的芯片测试系统及方法
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Patent number:CN116430198
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Patent applicant:
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Patent family:
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Contributors:CHENG XIANG ( author ) / ZHANG YIFAN ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2023-07-14
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Chinese
- New search for: G01R
- Further information on International Patent Classification
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Classification:
IPC: G01R Messen elektrischer Größen, MEASURING ELECTRIC VARIABLES -
Source: