Automatic chromatic aberration measuring and positioning system and automatic chromatic aberration measuring assembly (Chinese)
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- New search for: ZHANG WEI
- New search for: ZHANG WEI
2023
- Patent / Electronic Resource
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Title:Automatic chromatic aberration measuring and positioning system and automatic chromatic aberration measuring assembly
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Additional title:一种自动色差测量定位系统及自动色差测量总成
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Patent number:CN116465494
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Patent applicant:
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Patent family:
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Contributors:ZHANG WEI ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2023-07-21
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Chinese
- New search for: G01J / B25B / B25J / G01B
- Further information on International Patent Classification
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Classification:
IPC: G01J Messen der Intensität, der Geschwindigkeit, der spektralen Zusammensetzung, der Polarisation, der Phase oder der Pulscharakteristik von infrarotem, sichtbarem oder ultraviolettem Licht, MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT / B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING, Werkzeuge oder Werkbankvorrichtungen zum Befestigen, Verbinden, Lösen oder Halten, soweit nicht anderweitig vorgesehen / B25J Manipulatoren, MANIPULATORS / G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS, Messen der Länge, der Dicke oder ähnlicher linearer Abmessungen -
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