Method for eliminating morphology crosstalk in conductive atomic force microscope (Chinese)
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- New search for: ZHENG HAIWU
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- New search for: ZHENG HAIWU
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2024
- Patent / Electronic Resource
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Title:Method for eliminating morphology crosstalk in conductive atomic force microscope
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Additional title:一种消除导电原子力显微镜中形貌串扰的方法
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Patent number:CN117517716
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- New search for: Europäisches Patentamt
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Publication date:2024-02-06
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Chinese
- New search for: G01Q
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Classification:
IPC: G01Q Rastersondentechniken oder Vorrichtungen hierfür, SCANNING-PROBE TECHNIQUES OR APPARATUS -
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