THICKNESS MEASURING DEVICE (Japanese)
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- New search for: SAITO SHUNSUKE
- New search for: SAITO SHUNSUKE
2022
- Patent / Electronic Resource
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Title:THICKNESS MEASURING DEVICE
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Additional title:測厚装置
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Patent number:JP2022043625
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Patent applicant:
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Patent family:
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Contributors:SAITO SHUNSUKE ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2022-03-16
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Japanese
- New search for: G01B
- Further information on International Patent Classification
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Classification:
IPC: G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS, Messen der Länge, der Dicke oder ähnlicher linearer Abmessungen -
Source: