X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD (Korean)
Free access
2015
- Patent / Electronic Resource
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Title:X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
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Additional title:X선 투과 검사 장치 및 X선 투과 검사 방법
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Patent number:KR101562680
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Patent family:
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2015-10-22
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Korean
- New search for: G01N / G01V / H01M
- Further information on International Patent Classification
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Classification:
IPC: G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften, INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES / G01V Geophysik, GEOPHYSICS / H01M Verfahren oder Mittel, z.B. Batterien, für die direkte Umwandlung von chemischer in elektrische Energie, PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY -
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