패널 형상 또는 빔 형상 샘플의 굽힘 테스트를 위한 장치 (Korean)
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2019
- Patent / Electronic Resource
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Title:패널 형상 또는 빔 형상 샘플의 굽힘 테스트를 위한 장치
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Patent number:KR20190134698
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Patent applicant:
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Patent family:
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Contributors:SANDER CHRISTOPH ( author ) / GALL MARTIN ( author ) / MACHER FRANK ( author ) / CLAUSNER ANDRE ( author ) / ZSCHECH EHRENFRIED ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2019-12-04
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Korean
- New search for: G01N
- Further information on International Patent Classification
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Classification:
IPC: G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften, INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES -
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