System and Method For Gradient Measurement Using Single-Point Imaging (English)
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- New search for: MCMILLAN ALAN B
- New search for: JANG HYUNGSEOK
- New search for: MCMILLAN ALAN B
- New search for: JANG HYUNGSEOK
2017
- Patent / Electronic Resource
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Title:System and Method For Gradient Measurement Using Single-Point Imaging
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Patent number:US2017102439
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Patent applicant:
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Patent family:
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Contributors:MCMILLAN ALAN B ( author ) / JANG HYUNGSEOK ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2017-04-13
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Type of media:Patent
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Type of material:Electronic Resource
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Language:English
- New search for: G01R
- Further information on International Patent Classification
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Classification:
IPC: G01R Messen elektrischer Größen, MEASURING ELECTRIC VARIABLES -
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