METHOD FOR SCANNING A SAMPLE BY A CHARGED PARTICLE BEAM SYSTEM (English)
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- New search for: LYONS ADAM
- New search for: WALLOW THOMAS I
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2022
- Patent / Electronic Resource
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Title:METHOD FOR SCANNING A SAMPLE BY A CHARGED PARTICLE BEAM SYSTEM
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Patent number:US2022084784
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Patent applicant:
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Patent family:
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Contributors:LYONS ADAM ( author ) / WALLOW THOMAS I ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2022-03-17
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Type of media:Patent
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Type of material:Electronic Resource
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Language:English
- New search for: H01J / G01N
- Further information on International Patent Classification
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Classification:
IPC: H01J Elektrische Entladungsröhren oder Entladungslampen, ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS / G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften, INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES -
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